Presenter

Dr. William Vanderlinde is IARPA’s Chief Scientist. He was a program manager from 2009 to 2012, leading the CAT and ATHENA programs. He re-joined IARPA in March 2015 as an office director, and became chief scientist in 2016. Dr. Vanderlinde’s work has focused on microelectronics and advanced microscopy, with applications to supply-chain assurance and high-performance computing. He hold two patents for high-resolution electron imaging and has published numerous peer-reviewed papers and book chapters. His previous positions include Technical Director of the DOD Microelectronics Research Laboratory and as Team Leader for Nanotechnology at the Laboratory for Physical Sciences. He was General Chair of the International Symposium for Testing and Failure Analysis in 2010 and serves on the Electron Device Failure Analysis Society Board of Directors. He holds a Ph.D. in materials science and engineering from Cornell University, an M.S. in electrical engineering from Johns Hopkins University and a B.S. in physics from the University of Virginia. He is a DNI Fellow and an elected Fellow of ASM International.