The main focus of this work is to compare thermal diffusivity and effusivity data resulting from thermal wave interferometry (TWI) experiments on tungsten coatings of different thicknesses with those obtained using reference techniques, namely, the laser flash method and scanning electron microscopy (SEM). The deviations between TWI and the latter techniques are discussed in terms of lack of data in the low frequency range. The investigation shows that the lack of data at low frequencies does not affect diffusivity measurements, while it has a strong effect on effusivity measurements for thermally thick coatings. The conclusions of this experimental study are in good agreement with theoretical predictions resulting from a sensitivity analysis reported in a previous study.

Publication date

2005-05-01

Language

English

Affiliation

National Research Council Canada (NRC-CNRC); NRC Industrial Materials Institute