A near-field scanning optical microscope (NSOM) is used to perform structural and optical characterization of the surface layer after Zn diffusion in a channel waveguide fabricated on lithium niobate. A theoretical approach has been developed in order to extract refractive index contrast from...

Raman and luminescence spectroscopies are used for non destructive characterization of titanium-diffused LiNbO[sub 3] waveguides at the classical resolution of confocal microscopy (0.5Ã—0.5Ã—3 Î¼m). The broadening of Raman lines near the surface permits one to measure the depths of...

The luminescence properties of Neodymium ions in Zn diffused LiNbO3 channel waveguides have been studied with sub-micrometric spatial resolution. The analysis of the luminescence spectra suggests the existence of a local expansion and disordering associated to the presence of Zn in the LiNbO3...

Processes of diffusion zinc and zinc-copper-titanium-aluminum plating of steel 40Kh in a vibrofluidized bed are considered. Comparative analysis of the phase and chemical compositions, microhardness, microbrittleness, wear resistance, and corrosion resistance of diffusion layers is performed.

This work describes an approach to design a $$2\times 2$$ optoelectronic switch based on the Mach-Zehnder interferometer with a channel profile of Titanium (Ti) diffused in Potassium niobate ( $$\hbox {KNbO}_{3}$$ ) at a wavelength of $$1.3\,\upmu \hbox {m}$$ . The evaluation parameters used are...

We present recent developments on single mode mid-infrared Ti diffusion waveguides achieved in Lithium Niobate. The set of samples studied consist on planar, channel waveguides and Y junctions. We show the FTS spectra of the channels, allowing to study the modal cut-off, the propagation losses...

Investigates the diffusion characteristics of zinc dopants in organometallic vapor-phase epitaxy-grown InP. Contents of the epitaxial layer; Effects of spread of zinc dopants on indoped regions; Influence of concentration-dependence of the diffusion constant on the zinc incorporation during...