Optional and Free Services

Low engineering charges — it is very easy to get started with prototypes and then production.

Test Systems

We use Genesis Test System exclusively.

The Gen1000 for Larger and Mixed Signal devices.

The well known TREG system for simpler devices.

Probers

We use fully automatic probers with up to 8” capability. We can test your die in any order and in such a way that only possible good die
are ever probed. In this way, the percentage yield reported is based on actual die (No edge die or Test Patterns).

Handlers

We have the capability of handling 0.15” and 0.3” SOIC devices as well as .3” and .6” DIPs.

Test Data

We supply complete data logs which include:

Full read and record data for each test.

Binning summary for each wafer

Binning analysis summary for the lot.

A file containing read and record data for the entire lot.

Data can be analyzed per wafer and per lot.

Data logs are already in the correct format for evaluation by your spreadsheet program. In addition, we have software tools designed to make full use of the data we supply. With this software, you may never need to use a spreadsheet program on our data.