The techniques related to TEM systems can be divided into two categories:
i) Diffraction based techniques such as convergent-beam-electron-diffraction (CBED) and nanobeam electron diffraction (NBD); ii) Image based techniques such as high-resolution electron microscopy (HREM) and dark-field electron holography (HoloDark).

Table 4311 lists the information which an analytical transmission electron microscope (TEM), equipped with EDS and EELS systems can produce due to a variety of beam-specimen
interactions.