New Family of Electron Microscopes Combines Ultra-High Resolution and Analytical Performance for the Widest Range of Materials

FEI Company
(Nasdaq:FEIC), a leading scientific instrumentation company providing electron
microscope systems for nanoscale applications across many industries, announced
today the availability of its new Nova(TM) NanoSEM 50 Series of ultra-high resolution
scanning electron microscopes (UHR SEMs). It is designed to provide industry-leading,
nanometer-scale resolution and ultra-precise analysis on the widest range of
samples. Initial shipments are planned for the fourth quarter of this year.

"This newest generation of the well-established Nova NanoSEM offers a
unique combination of capabilities unequalled by any other UHR SEM," said
George Scholes, FEI's Research Division vice president and general manager.
"In one instrument, you get imaging down to the nanometer level, high beam
current for fast and precise analysis, and low vacuum capability to extend the
range of sample types and minimize preparation requirements. Customers no longer
have to choose between ultra-high resolution (at high and low kV) and analytical
performance. The Nova NanoSEM makes no compromise--it delivers both in one system."

In low vacuum, the Nova NanoSEM can examine highly insulating samples, up to
nearly the same resolution that can be achieved in high vacuum, with little
or no preparation, eliminating artifacts and saving time.

The Nova NanoSEM 50 Series builds on the success of previous Nova NanoSEM instruments,
and adds technological innovations from FEI's other industry-leading product
families:

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