Answer: a
Explanation: The main problem in this iterative test generation technique is that a simple fault in the sequential machine is manifest as N multiple faults during test.

11. In this iterative test generation method, sequential logic is
a) used in the same pattern
b) converted to test logic
c) converted to combinational logic
d) converted to asynchronous logicView Answer

Answer: c
Explanation: In this iterative test generation method, the main approach of testing is sequential logic is converted into combinational logic by cutting the feedback lines, thus creating pesudo inputs and outputs.

12. For a NAND gate, struck-at 1 fault in second input line cannot be detected if
a) Q is 1
b) Q is 0
c) Q changes from 1 to 0
d) Q changes from 0 to 1View Answer

Answer: b
Explanation: In a NAND gate, struck-at 1 fault in second input line cannot be detected if the output Q is reset (Q=0) prior to applying the test sequence.