Automatic Defect Review AFM for Hard Disk Media and Substrates

Park Systems, Nanotechnology Solutions Partner for HDD Industry

Park Systems serves the hard disk drive (HDD) industry with automated nanotechnology measurement solutions including atomic force microscopes, software, and global service and support. Partnering with world leaders in HDD industry, Park Systems has been successfully delivering optimized solutions for the most challenging imaging and measurement needs in the industry.

The company's HDD-Optimize program is the state-of the-art nanotechnology solution service for the hard disk drive industry. Under the systematic approach of the program, Park Systems ensures rapid alignment and performance of the XE nanotechnology measurement platform with the specific requirement of its customers.

Continuing the company’s impressive track record of developing optimized solutions, Park Systems introduces XE-HDM, an automatic defect review AFM which revolutionizes the way defects in HDD substrates and media are searched, scanned and analyzed. The new XE-HDM significantly increases throughput for the defect review process.