With the Olympus LEXT OLS5000 laser scanning confocal microscope, noncontact, nondestructive 3D observations and measurements are easy to produce.
Simply by pushing the Start button, users can measure fine shapes at the submicron level. Ease of use is combined with leading-edge features to deliver an acquisition speed four times faster than our previous model. For customers with larger samples, LEXT long working distance objectives and an extended frame option allow the system to accommodate samples as large as 210 mm.

LEXT OLS4500 is Nano Search Microscope which is combined a laser microscope and scanning probe microscope (SPM) in the same instrument to allow observation and measurement over a wide range of magnifications (from around 50x up to 1,000,000x)