Abstract

Dark-field images are formed from x-ray small-angle scattering signals. The
small-angle scattering signals are
particularly sensitive to
structural variation and density fluctuation on a length scale of several tens
to hundreds of nanometers, offering a unique contrast mechanism to reveal subtle
structural features of an object. In this study, based on the principle of
energy conservation, we develop a physical model to describe the relationship
between x-ray small-angle scattering coefficients of an object and dark-field
intensity images. This model can be used to reconstruct volumetric x-ray
small-angle scattering images of an object using classical tomographic
algorithms. We also establish a relationship between the small-angle scattering
intensity and the visibility function measured with x-ray grating imaging. The
numerical simulations and phantom experiments have demonstrated the accuracy and
practicability of the proposed model.

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