Imaging of micro- and nano-structures of opaque samples is demonstrated using hard X-rays. Two different methods are employed with an instrument recently built at the beamline 34 ID-C at the Advanced Photon Source. In-line phase contrast micro-imaging has been performed with highly coherent radiation. For the characterisation of structures as small as 50 nm, a hard X-ray microscope has been built....
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A bonding method for silicon wafers with unfilled and filled polymer components using `Black Silicon' is presented. The working principle is an interconnection of `Black Silicon' surfaces with ductile materials. Needles of nanostructured `Black Silicon' with their increased surface and undercut features penetrate the polymer when applying pressure. Plastic deformations of the polymer lead to a per...
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Piezoelectric tube scanners are the actuators of choice in scanning probe microscopy. These nanopositioners exhibit a dominant first resonant mode that is excited due to harmonics of the input scan signal. This introduces errors in the scan obtained. The presence of this resonant mode limits the upper bound of a triangular scan rate to around 1/100th of the first mechanical resonance frequency. Pa...
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The mechanical properties measurement of materials with submicron dimensions is extremely challenging, from the preparation and manipulation of specimens, to the application of small loads and extraction of accurate stresses and strains. A novel, versatile concept of micro and nano-machines to test films or beams with characteristic dimensions ranging between 10 and 1000 nm, allowing multiple load...
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Aims & Scope

Micro & Nano Lettersoffers express publication of short research papers presenting research conducted at the forefront of micro- and nanoscale science, engineering and technology, with at least one dimension ranging from a few tens of micrometres to a few nanometres.