Alexander Gundlach Graham and Detlef Günther of ETH in Zurich have recently published a “trends” review detailing the latest developments in low dispersion laser ablation technology and fast ICPMS, and discussing applications of these technologies to fast LA-ICPMS imaging.

In experiments using TOFWERK’s ICP-TOFMS technology, time-of-flight mass spectrometry was found to provide lower detection limits than quadrupole MS for single-spot analysis and to enable the application of spot-resolved quantification strategies.

The authors conclude that the combination of low dispersion LA and high speed simultaneous ICPMS detection provide elemental imaging characteristics that are not (and are not foreseen to be) available elsewhere; thus, as demand for high resolution, high-speed elemental imaging increases, so too will the necessity of this instrumentation.

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