Tom is the Executive Director and Principal Scientist at ICDD. Before joining ICDD he was a Senior Principal Scientist at Eastman Kodak Company where he worked in industrial applications of X-ray diffraction and X-ray fluorescence for 31 years. He was responsible for the operation of the X-ray Spectroscopy Laboratory, utilizing diffractometers for powder, pole figure, nonambient, high-resolution, reflectivity, and two-dimensional XRD. Materials analyzed included inorganics, organics, solid state devices, thin films, corrosion products, ceramics, pharmaceuticals, polymers, and nanomaterials. Tom was also the Technical Leader in the Specialty Materials Development Laboratory. His area of focus was utilization of XRD for microstructure characterization resulting in new materials development for intellectual property and product development. Tom has 180+ publications including 4 book chapters, 46 U.S. Patents and 57 international patents.

Tom has served as a member of the ICDD Board of Directors for the terms 1992-1998 and 2004-2013, serving as Chairman 2008-2012. He has also received the honor of being named an ICDD Distinguished Fellow. Tom has been an instructor at the SUNY Albany and ICDD XRD Clinics for more than 30 years, and has served as a lecturer at the University of Rochester.