White Paper

Enabling High Volume Test For Millimeter Wave RF Devices

As the market for millimeter wave devices prepares for exponential growth, one of the issues to be addressed is whether or not testing can be performed at sufficiently high volume and low cost to enable growth in consumer applications. This white paper discusses how DUT interface boards (DIB) address these issues with proven testing volumes exceeding 10 million units per year. Download the full paper for more information.

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