We present a method for using solid state detectors with directional sensitivity to dark matter interactions to detect low-mass Weakly Interacting Massive Particles (WIMPs) originating from galactic sources. In spite of a large body of literature for high-mass WIMP detectors with directional sensitivity, there is no available technique to cover WIMPs in the mass range <1 GeV. We argue that single-electron resolution semiconductor detectors allow for directional sensitivity once properly calibrated. We examine commonly used semiconductor material response to these low-mass WIMP interactions.