Carl Zeiss Invites Users to Enter Nano Image Contest

Published on May 19, 2010 at 6:06 AM

Carl Zeiss,
one of the leading providers of electron and ion-beam microscopes, is organizing
a nano image competition for the first time. Entries to the online competition
can be submitted from May 19 to August 29, 2010, on the Nano Technology Systems
website of Carl Zeiss.

The competition is open to all users of ZEISS electron and ion microscopes
around the world. The website with the collection of the Nano-masterpieces is
open to anyone who wants to view and vote on the submitted images.

"Fascinating electron microscope images are sitting around in numerous
archives without an opportunity for recognition. With this competition, we want
to give users of our systems an innovative platform to present their images and
the underlying work to the public," explains Dr. Peter Fruhstorfer, Member of
the Management Board of the Nano Technology Systems Division at Carl Zeiss.

A picture says more than a thousand words. And images taken with electron and
ion microscopes frequently provide unique insights into the specimens and lead
to new scientific-technical knowledge. At the same time, these images often
feature outstanding aesthetic properties. "We are already anxiously awaiting
your images," adds Fruhstorfer.

Any images not more than two years old that were taken using particle beam
systems from Carl Zeiss are eligible. Images can be entered in any of four
categories: SEM, TEM, CrossBeam (FIB-SEM) and Helium-Ion Microscopy. The image
that receives the best score in each category will be honored with a pair of
cinemizer Plus 3D video glasses from Carl Zeiss. The contest website is open to
anyone that wants to view and assess the submitted images, whether they have
submitted an image or not. For more information, please go to:
www.smt.zeiss.com/nanocontest