Bibtex

@article{d20023fee498447290b7328ae1c94816,

title = "Development and characterization of coatings on Silicon Pore Optics substrates for the ATHENA mission",

abstract = "We present description and results of the test campaign performed on Silicon Pore Optics (SPO) samples to be used on the ATHENA mission. We perform a pre-coating characterization of the substrates using Atomic Force Microscopy (AFM), X-ray Re ectometry (XRR) and scatter measurements. X-ray tests at DTU Space and correlation between measured roughness and pre-coating characterization are reported. For coating development, a layer of Cr was applied underneath the Ir/B4C bi-layer with the goal of reducing stress, and the use of N2 during the coating process was tested in order to reduce the surface roughness in the coatings. Both processes show promising results. Measurements of the coatings were carried out at the 8 keV X-ray facility at DTU Space and with synchrotron radiation in the laboratory of PTB at BESSY II to determine re ectivity at the grazing incidence angles and energies of ATHENA. Coating development also included a W/Si multilayer coating. We present preliminary results on X-ray Re ectometry and Cross-sectional Transmission Electron Microscopy (TEM) of the W/Si multilayer.",

RIS

T1 - Development and characterization of coatings on Silicon Pore Optics substrates for the ATHENA mission

AU - Ferreira,Desiree Della Monica

AU - Jakobsen,Anders Clemen

AU - Christensen,Finn Erland

AU - Shortt,Brian

AU - Krumrey,Michael

AU - Garnæs,Jøregen

AU - Simonsen,Ronni B.

PY - 2012

Y1 - 2012

N2 - We present description and results of the test campaign performed on Silicon Pore Optics (SPO) samples to be used on the ATHENA mission. We perform a pre-coating characterization of the substrates using Atomic Force Microscopy (AFM), X-ray Re ectometry (XRR) and scatter measurements. X-ray tests at DTU Space and correlation between measured roughness and pre-coating characterization are reported. For coating development, a layer of Cr was applied underneath the Ir/B4C bi-layer with the goal of reducing stress, and the use of N2 during the coating process was tested in order to reduce the surface roughness in the coatings. Both processes show promising results. Measurements of the coatings were carried out at the 8 keV X-ray facility at DTU Space and with synchrotron radiation in the laboratory of PTB at BESSY II to determine re ectivity at the grazing incidence angles and energies of ATHENA. Coating development also included a W/Si multilayer coating. We present preliminary results on X-ray Re ectometry and Cross-sectional Transmission Electron Microscopy (TEM) of the W/Si multilayer.

AB - We present description and results of the test campaign performed on Silicon Pore Optics (SPO) samples to be used on the ATHENA mission. We perform a pre-coating characterization of the substrates using Atomic Force Microscopy (AFM), X-ray Re ectometry (XRR) and scatter measurements. X-ray tests at DTU Space and correlation between measured roughness and pre-coating characterization are reported. For coating development, a layer of Cr was applied underneath the Ir/B4C bi-layer with the goal of reducing stress, and the use of N2 during the coating process was tested in order to reduce the surface roughness in the coatings. Both processes show promising results. Measurements of the coatings were carried out at the 8 keV X-ray facility at DTU Space and with synchrotron radiation in the laboratory of PTB at BESSY II to determine re ectivity at the grazing incidence angles and energies of ATHENA. Coating development also included a W/Si multilayer coating. We present preliminary results on X-ray Re ectometry and Cross-sectional Transmission Electron Microscopy (TEM) of the W/Si multilayer.

KW - X-rays

KW - ATHENA mission

KW - Coating optimization

KW - Multilayers

KW - Ray-tracing

U2 - 10.1117/12.927290

DO - 10.1117/12.927290

M3 - Conference article

VL - 8443

SP - 84435E

JO - Proceedings of SPIE, the International Society for Optical Engineering

T2 - Proceedings of SPIE, the International Society for Optical Engineering

JF - Proceedings of SPIE, the International Society for Optical Engineering