SIMS

IMS 7f-GEO

Compact, High Throughput SIMS for Geoscience Laboratories

The IMS 7f-GEO is a mono-collection SIMS model specifically designed to perform high precision / high throughput measurements in geological samples, i.e. stable isotopes, REE (Rare Earth Elements), trace elements... It is also used for material sciences analyses and environmental studies.

Product overview
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A unique detection system for high isotope ratio reproducibility
Derived from our proven IMS 7f instrument, the IMS 7f-GEO is equipped with a new, unique detection system combining a double Faraday cup detector system and an Electron Multiplier. Thanks to this configuration, acquisition time is shortened, and analyses are run in a pseudo bi-collection mode ensuring sub-permil precision for stable isotope ratio measurements. The double Faraday cup system is combined with a fast mass peak switching system (as fast as 0.3 sec at high mass resolving power) for further benefits in terms of precision and analysis throughput.

... And greatly improved analysis throughput
The IMS 7f-GEO achieves a major improvement in analysis throughput thanks to the implementation of the double Faraday cup detector system as demonstrated in the above example (top right, 18O/16O isotope ratio analysis in synthetic quartz).
For a required statistical precision better than 0.4 permil, measurement time could be >3000 sec. while it falls down to 56 sec using the IMS 7f-GEO pseudo bi-collection mode.

Do not hesitate to contact us at cameca.info@ametek.com if you can not access some pdf files on your own. You are also more than welcome to send us any missing references, pdf and supplements!

Links to IMS users around the world
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Several hundred CAMECA IMS 6f, 7f, 7f-Auto and 7f-GEO are installed worldwide, the list below is only a very short extract from our customer list!
Nanoscale Characterization and Fabrication Laboratory, Virginia Tech, USA
Operated by the University's Institute for Critical Technology and Applied Science (ICTAS), the Nanoscale Characterization and Fabrication Laboratory serves the needs of researchers from VirginiaTech and from the surrounding industrial community, facilitating research in nanoscale engineering and the environment, fuel cells, paleobiology... The NCFL was one the first lab in the world to be equipped with a CAMECA IMS 7f-GEO.
CalTech Center for Microanalysis, USA
The Center for Microanalysis at Caltech houses a IMS 7f-GEO and a NanoSIMS 50L, providing expertise for microanalysis of geological, meteoritic and synthetic materials. Research projects carried out at CCM are most varied, ranging from cosmochemistry to experimental studies on climate change, geochronology, in-situ studies of microbial communities, materials science engineering...

Helmholtz Zentrum Dresden Rossendorf, Germany
The CAMECA IMS series instrument in Rossendorf is coupled to an accelerator mass spectrometer at the core of the "Super-SIMS" initiative of the Helmholtz Institute Freiberg for Resource Technology.

University of Manitoba, Manitoba Regional Materials and Surface Characterization Facility, Canada
Equipped with a CAMECA IMS 7f and several other instruments for materials characterization, the Manitoba Regional Materials and Surface Characterization Facility provides a unique resource to regional government and industrial researchers and enables world-class research into the chemical, structural and morphological nature of surfaces and bulk materials.
CIM PACA, Arcsis, France
Located in the South East of France, a basin for semiconductor production, CIM PACA is the flagship characterization platform of ARCSIS, a consortium that unites world-ranking semiconductor groups including Philips, STMicroelectronics, Texas Instruments etc... as well as several dozens of small and mid-size companies, engineering schools, research laboratories and universities of the region. CIM-PACA is dedicated to the design, test and validation of new semiconductor technologies.
CC-MEM, Institut Jean Lamour / Ecole des Mines de Nancy, France
The Centre de Compétences en Microscopie Electronique et Microsondes (CC-MEM) is a collaborative research facility hosted by the Ecole des Mines de Nancy. The IMS 7f delivered in 2009 at CC-MEM contributes to cutting-edge research in material sciences, metallurgy, nanosciences.