Abstract

Speckle Pattern Correlation Interferometry (SPCI) is a well-established technique in the visible-light regime for observing surface disturbances. Although not a direct imaging technique, SPCI gives full-field, high-resolution information about an object’s motion. Since x-ray
synchrotron radiation beamlines with high coherent flux have allowed the observation of x-ray
speckle,
x-ray SPCI could provide a means to measure strains and other quasi-static motions in disordered systems. This paper therefore examines the feasibility of an x-ray
speckle correlation interferometer.