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Abstract

This paper characterizes transparent current mirrors with n-type amorphous
gallium–indium–zinc–oxide (a-GIZO) thin-film transistors (TFTs). Two-TFT current mirrors with
different mirroring ratios and a cascode topology are considered. A neural model is developed
based on the measured data of the TFTs and is implemented in Verilog-A; then it is used to
simulate the circuits with Cadence Virtuoso Spectre simulator. The simulation outcomes are
validated with the fabricated circuit response. These results show that the neural network can
model TFT accurately, as well as the current mirroring ability of the TFTs.

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