Impedance measurement allows to control operation of photonic integrated circuits, thanks to electrical probe for local inspection of the photonic integrated circuits status.
The concept of the electrical probe is based on the measurement of the light-induced change of the electric conductance of waveguides without perturbing the characteristics of the optical field.
The aim of the research is to develop low noise, wide band, front-end electronics for high detection sensitivity to extract conductance variation information plunged in high spurious signal. Detection electronic in a CMOS chip enables multichannel parallelization and reduction of connection parasitics that results in significant performance improvement.
At a later stage, development of a feedback control system allows to adjusts the operating conditions of optical devices making check/refresh operations, and correcting against temporal drifts thanks to thermo-optic actuators. The main advantage is the possibility of locally inspecting and adjusting the working point of a generic elementary device in complex photonic systems such as the resonant wavelength of microring resonator or the bias condition of a Mach-Zehnder interferometer.