Abstract

This letter reports a new source of dark current random telegraph signal in CMOS image sensors due to meta-stable Shockley-Read-Hall generation mechanism at oxide interfaces. The role of oxide defects is discriminated thanks to the use of ionizing radiations. A dedicated RTS detection technique and several test conditions (radiation dose, temperature, integration time, photodiode bias) reveal the particularities of this novel source of RTS.

Item Type:

Article

Additional Information:

Thanks to IEEE editor. The definitive version is available at http://ieeexplore.ieee.org/ The original PDF of the article can be found at IEEE Electron Device Letters website: http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=55