Microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the sample's surface topography and composition.

Image Analysis

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AIF provides two high-end computer workstations and supports several image analysis packages that can be used for visualization, quantification and restoration of light microscope and electron microscopy image data. The AIF advises and trains users on proper ways to generate data and perform quantitative data analysis on their own. Image analysis can also be conducted on an assisted basis by the AIF staff.