Scanning Force Microscopy / Atomic Force Microscopy

The scanning or atomic force microscope SFM/AFM is a special type of scanning probe microscopy (SPM). It uses the mechanic forces between a surface and a sharp tip to image the surface with nanometer resolution. The surface is scanned with the tip which is adjusted on a cantilever. The mechanical deflection of the cantilever detected by a reflected laser beam delivers the height of each point of the surface. From the height values of all points, a topography image of the surface is constructed. With a special conductive tip additionally charges on the surface can be imaged (electric force microscopy EFM). A similar contactless method to image surfaces on the micrometer scale ist the MicroGlider.

The Multimode AFM allows to investigate samples with a size of up to 1x1cm². An area of maximum 50x50µm² size can be imaged. The Multimode SFM can be run in an environmental chamber under defined environmental conditions (temperature, humidity, composition of the atmosphere) as well as with a closed liquid cell and a heating stage to enable imaging or force measurements in liquids or at elevated temperatures.In the Dimension AFMs, larger samples can be used. They are equipped with open fluid cells.