Four Dimensions manufactures advanced semiconductor probing systems since 1978. Our Four Point Probe and CVmap systems are found in hundreds of fabs and research institutions around the world.

We provide four point probes with an extended measurement range or sophisticated probing for compound semiconductors. Our latest innovation is a Modified four point probe for measuring pn junction leakage and sheet resistivity in the same probing step meeting the requirements for ultra shallow junction probing.

We offer the widest range of Mercury probe geomertries and special capacitance measurement electronics. This permits our systems to probe and characterize a wide range of materials, including semi-conductors, oxides, dielectrics, SOI ( silicon on insulator ), and films on conducting or insulating substrates.

small low budget manually operated systems

research and development oriented desktop systems

production-line oriented fully automated cassette to cassette systems capable of handling wafers up to 300mm in diameter or flat panels

customized tools

In addition we provide measurement service using our advanced characterization tools.