New large scale foundry processes continue to produce reliable products. These new large scale devices continue to use industry best practice to screen for failure mechanisms and validate their long lifetime. The Failure-in-Time analysis in conjunction with foundry qualification information can be used to evaluate large format device lifetimes. This analysis is a helpful tool when zero failure life tests are typical. The reliability of the device is estimated by applying the failure rate to the use conditions. JEDEC publications continue to be the industry accepted methods.

New foundry processes continue to produce smaller features and new designs. These new devices must be screened to
validate their usefulness for long lifetime use. The Failure-in-Time analysis in conjunction with foundry qualification
information can be used to evaluate foundry device lifetimes. This analysis is a helpful tool when zero failure life tests
are performed. The reliability of the device is estimated by applying the failure rate to the use conditions. JEDEC
publications.2,3,4 are the industry accepted methods.

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