Abstract

We reveal a correlated reduction in the cross sections of two neighboring micropipes (MPs) in the crystal growth of siliconcarbide using computer simulation of phase contrast images. The correlated reduction is explained by the exchange of full-core dislocations in a contact-free reaction between two parallel MPs. We develop a theoretical model that describes the energetics of this process.

Received 06 July 2008Accepted 18 September 2008Published online 13 October 2008

Acknowledgments:

The experimental part of this work is supported by the Creative Research Initiatives (Functional X-ray Imaging) of MEST/KOSEF, Korea. Support from the Russian Foundation of Basic Research (Grant Nos. 08-02-00304-a, 07-02-00067-a, and 06-02-16244), the Government of St. Petersburg, and the Russian Foundation of Scientific Schools (Grant No. 4110.2008.2) is also acknowledged.