Inventory Number: 58267

Retail (USD):
$950.00

Now (USD):
$950.00

Gaertner L2W16D.830 Multiwavelength 200mm Ellipsometer. Has a software disk but no cables or controls. Missing computer and stage driver. Two wavelength ellipsometers use additional laser sources to analyze difﬁcult ﬁlms. 8 in. dia. stage with motorized stage, no controller. Sold As Is with 30 day ROR.

Inventory Number: 62308

Retail (USD):
$12,000.00

Now (USD):
$12,000.00

KLA Tencor P-6 Surface Profiler. Unit does not have a PC. The P-6 surface profiler features an unprecedented range of features and capabilities in a mid-range general purpose instrument. A variety of options are available to enhance the capabilities of the standard system. Stylus Profiling: The precision scan stage design enables high quality scans over the entire 6 in. sample stage area with up to 150 mm scan length and 1 mm Z range. This design ensures the highest quality 2D scans resulting in a higher level of metrology quality. Step Height Repeatability: A step height repeatability of 6 angstrom or 0.1 percent (1s ), a noise floor below 1nm RMS as measured on the scan stage, and a sub-Angstrom resolution capacitance sensor translates into the most repeatable, and sensitive ultra-thin film step measurements,roughness/waviness measurements and accurate curvature reproduction. Sold As Is. Unit does not have a PC. Parts not working.

Inventory Number: 62025

Retail (USD):
$39,000.00

Now (USD):
$39,000.00

Nanometrics Nanospec 6100 Automated Film Thickness Measurement System. Tabletop film thickness measurement and mapping tool. Designed to measure the thickness of films deposited on various substrates including those used in semiconductor and magnetic head fabrication. Uses non-contact spectroreflectometry on sites as small as 10 micrometers. A computer sample stage and a robust autofocus system allows the automatic generation of film thickness uniformity maps. 115V, 50/60 Hz, 5A.

Inventory Number: 62660

Retail (USD):
$39,000.00

Now (USD):
$39,000.00

Nanometrics Nanospec 6100 Automated Film Thickness Measurement System. Tabletop film thickness measurement and mapping tool. Designed to measure the thickness of films deposited on various substrates including those used in semiconductor and magnetic head fabrication. Uses non-contact spectroreflectometry on sites as small as 10 micrometers. A computer sample stage and a robust autofocus system allows the automatic generation of film thickness uniformity maps. 115V, 50/60 Hz, 5A.

Inventory Number: 62774

Retail (USD):
$19,500.00

Now (USD):
$19,500.00

Nanometrics 3000 Tabletop Thin Film Analysis System. Film thickness measurement system that utilizes a modern small spot spectroscopic reflectometer that is built on a simple to use tabletop platform. The rugged, solid state linear diode array provides fast, precise measurements of single-layer films such as oxide, nitride and photoresist, as well as the top layer on film stacks of up to 3 layers in the thickness range of 250 angstrom to 35 micrometers. Simple and easy for the user to configure measurement programs and recipes for both simple and advanced measurement applications. Data management features include a database, statistical analysis, histograms and the ability to export data files.

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