Identifier

Author

Degree

Doctor of Philosophy (PhD)

Department

Chemistry

Document Type

Dissertation

Abstract

X-ray and neutron imaging are convenient ways to non-destructively observe novel materials. X-rays provide advantages of low cost and high brilliance while neutrons show bulk and isotopic sensitivity. Imaging provides a way for observing chemical and physical properties of materials without the need for destruction. The way of the imaging future is utilizing imaging with grating-based interferometry. In comparison to traditional radiography and tomography, by using absorption and phase gratings in the beam path, the absorption, phase, and scattering of a sample can be detected. In essence, three image datasets can be obtained in one experiment, saving substantially on costs (especially at expensive neutron facilities), time and materials. With several methods of interferometry available, the focus in this work is Talbot-Lau interferometry and newer designs referred to as near-field and far-field interferometry. X-ray Talbot-Lau interferometry experiments were performed at the LSU synchrotron, Center for Advanced Microstructures and Devices (CAMD), using a microfocus X-ray tube and synchrotron X-rays (38 keV). Neutron Talbot-Lau experiments were performed at the CONRAD2 beamline (HZB, Berlin, Germany) and far-field experiments at the NG6 beamline (NIST, Gaithersburg, USA). Neutron imaging of the additive manufactured samples revealed pore structures and evi- dence of fracture as a function of fatigue. Battery imaging shows the migration of lithium across battery layers on a visual and quantitative level. X-ray and neutron imaging of potentially twinned crystals revealed the importance of preserving data in the 2D projection images that was lost in volume reconstruction. A comparison of Talbot-Lau, near-field, and far-field interferometry with application to additively manufactured samples, lithium-ion batteries, and geometrically twinned crystals is presented.

Date

2017

Document Availability at the Time of Submission

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