Transition metal dichalcogenides exhibit strong quantum confinement effects and the electronic structure is strongly dependent on the number of layers. Resolving the electronic structure of atomically thin exfoliated samples is critical, yet it is a challenge for angle-resolved photoemission spectroscopy (ARPES) measurements due to the small sample size. Here I will present our recent experimental progress on the electronic structure of exfoliated 2H-MoTe2 flakes with different thickness by using nanospot ARPES (NanoARPES).