The atomic force microscope (AFM) was invented by Binnig, Quate and Gerber quarter-century ago. The tools turned to be one of the prominent tools in Science and Nanotechnology nowadays. Among others, non-contact Atomic Force Microscopy (nc-AFM) is probably one of the most promising AFM-family tools. This technique already demonstrated capability to achieve the true atomic resolution or nanoscale manipulation on all kind of surfaces. The technique has matured and now is widely spread in the scientific community especially in physics, nanosciences and biology. For example, it enables the detailed analysis of material properties like structure, elasticity, friction and force fields down to the atomic and molecular scale.

The conference welcomes contributions for oral and poster presentations on the following topics: