The paper presents the technique of qualitative assessment of the strength of graphene layers adhesion to the surface of a copper substrate, where they are formed. The technique uses a complex of approved analytical methods: electron backscatter diffraction (EBSD), Raman spectroscopy and optical microscopy. The technique was tested on multilayer graphene grown on a copper grain with crystal orientation (111). The presented method can be used to assess the effectiveness of the methods of graphene transfer from grains with different crystal orientation.

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