Atomic Force Microscopy at the Nano Research Facility

Atomic Force Microscopy

Bruker DIMENSION 3100 AFM

The Dimension 3100 AFM is a multi-mode atomic force microscope, equipped with a NanoScope IIIa controller for topological imaging of surfaces on the micro and nano scale. Our purpose built AFM lab is equipped with a vibration isolation platform and the instrument is housed in an isolation hood to reduce noise.

The sample stage allows for large samples sizes, with a scan size of up to 100 µm in the X & Y and 6 µm in the Z. As it operates in air, sample preparation is minimal and the instrument is suitable for a large range of applications:

Bruker Dimension ICON AFM

The Dimension ICON AFM provides additional AFM capabilities with low noise and high speed imaging.The advance control hardware provides quality images in a fraction of the time. This system has two additional imaging modes; Peak Force Tapping and Quantitative Nano Mechanical Mapping, which can provide height images and mechanical properties maps at the same time.