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Richardson, TX – November 18, 2011 – Anritsu Company, a worldwide leader in LTE test solutions, announces that its ME7834A/L Mobile Device Test Platform has been named the winner of the Best Network/Device Testing Products for LTE category, announced as part of the LTE North America Awards Dinner held in Dallas. By earning the award, Anritsu strengthens its position as a leader in LTE test solutions, and the ME7834A/L is recognized as an innovative product that is helping in the successful roll out and implementation of LTE technology worldwide.

“The LTE Awards recognize the best in LTE technology. Earning an LTE Award signifies that Anritsu is committed to providing innovative test solutions and establishing itself as a leader in LTE,” said Wade Hulon, Vice President and General Manager, Anritsu Americas. “The award is especially significant because it was given after extensive review by a panel of industry experts who recognized that the ME7834A/L meets the needs of chipset and device manufacturers in a manner unlike any other test solution on the market.”

Independently judged by an operator-led panel, the LTE North America Awards are a celebration of growth and success across the globe. The ME7834A/L was selected by the panel after extensive evaluation of countless entries in the Best Network/Device Testing category.

The ME7834A/L is a scalable system for protocol conformance and carrier acceptance testing of 2G, 3G, and 4G/LTE wireless technologies. Wireless device OEMs, carriers, test houses, and other elements of the device ecosystem are able to use this system to quickly and easily determine a device’s conformance to 3GPP and carrier-specific standards.