3D High-Speed
Nanoscale Imaging

Today's nano-scale imaging solutions,
such as AFM or SEM, suffer from long imaging times,
the lack of 3D information or the restrictions of using a vacuum chamber.
Rapid Probe Microscopy (RPM™) eliminates these restrictions by taking high-speed
3D images in the open atmosphere. The RPM™ has been developed to be compatible
with existing semiconductor industry automated tools and replace or work along
side existing imaging technologies.

Markets

Rapid Probe Microscopy (RPM) provides nano-scale
images with information in less than a second. It is useful in
numerous applications and all of the main market segments where
nano-scale imaging and metrology is required. For further information
on the markets served by our technology, select the appropriate link
below or contact
us directly to become a member of our Partner Program.