Israel-based SiOx RRAM developer Weebit Nano recently announced success in demonstrating a 4Kbit array in 300nm. Weebit now updates that it has successfully demonstrated the reliability of data retention and endurance in its 300 nm 4Kb memory cells. data retention lifetime extrapolation demonstrated the ability to maintain written data for 10 years at above room temperature. In addition the chips maintained their data after 30 minutes at 260 degrees, exceeding the soldering requirements of 15 minutes at that temperatures.

Weebit says that these results successfully conclude the 300 nm 4Kb characterization. Weebit says that the endurance results are significantly higher than the program/erase cycling of existing Flash technology.