A profilometer measures the vertical depth of a material across a horizontal length.
A diamond stylus is transverse laterally across the sample with a specified distance
and contact force. The stylus moves vertically with the surface variations, and the
displacement can be measured as a function of position. This equipment can be employed
to measure etch depth, deposited film thickness, and surface roughness. TOP OF PAGE

4-Point Probe (Sheet Resistant)

4-point probe measures the sheet resistance of a thin film. It is an electrical impedance
measuring technique that has a pair of current-carrying (driving force) and voltage-sensing
(sensing) contacts that is more accurate than the traditional two terminal methods,
because it eliminates the impedance contribution of the wiring and the contact resistances.
A current is supplied by a pair of force connections, and a pair of sense connections.
TOP OF PAGE

Solar Simulator (IV Curve System)

Our solar simulator is a Class A Solar Simulator, so it maintains a exceptionally
tight uniformity, output stability, and spectral match. The solar simulator provides
repeatable light conditions, equal to “one sun”. The device uses a xenon arc lamp
with an ellipsoidal mirror, filtering, and beam collimation. The cell (or diode) is
connected to a multi-meter and a voltage sweep occurs. That is then plotted verses
the current produced. TOP OF PAGE

External Quantum Efficiency (EQE) System

External Quantum Efficiency (EQE) is known as the ratio of the number of photons (of
a given energy shining on the solar cell) to the number of charge carriers collected.
It reports the response of a photovoltaic cell to the precise wavelengths in the spectrum
of light shining on the cell. For example, if all of the photons of a certain wavelength
were collected, the quantum efficiency would be 100%. TOP OF PAGE

UV-VIS-NIR Spectrophotometer (Lamda 1050)

The Spectrophotometer uses a photometer to measure the intensity of light as a function
of the source wavelength.It evaluates the sample with visible light, near-ultraviolet, and near-infrared (or any combination) and ranges for 190nm
to 3300nm. Our double beam spectrophotometer compares the light intensity between
two paths (one as a reference and the other the test). It measures the transmission
of light through a sample, reflection off of the sample (diffuse and specular), and
pseudo absorption. TOP OF PAGE