Services

Qualification Services

We offer a wide range of qualification procedures to qualify your products according to the latest international standards or to your specific requirements.

Electronic components for consumer and industrial applications are usually qualified according to the JEDEC standards. Components for automotive applications are usually qualified according to AEC Q100 standards. Components for military applications are usually qualified according to MIL standards. Electronic Modules and Systems are usually qualified according to IEC standards or other application-specific standards.

Please feel free to contact us when you need assistance to define an efficient qualification flow for your component, module or (sub)system.

ESD & Latch Up Test

ESD Test

ESD tests are an important item in the qualification procedure of new components or modules. We have automatic test equipment that supports the most common ESD test pulse models.

Test strategy advice

In-house design and manufacturing of ESD Interfaces

Support for MIL – JEDEC – ESDA – IEC standards

IC level Human Body Model

IC level Charged Device Model

System-level IEC 61000-4-2

Our Thermo Mk.2 systems can automatically test the ESD performance of small to high pin count devices (up to 512 channels).

The automotive industry has defined specific test modes. MASER Engineering has built and qualified this specific test setup for all AEC-Q100 device qualification tests.

For CDM test we operate a Thermo Keytek Orion-3 system.

The IEC 61000-4-2 test capability is focusing on conductive or field induced ESD pulses on modules and systems. In a dedicated environment, the TESEQ NSG-438 system can inject HBM pulses up to 30kV.

Latch-up Test

Test strategy advice

In-house design and manufacturing of Latch-up Interfaces

Static Latch-Up test

Dynamic Latch-Up test

Failure Analysis Services

We offer Failure Analysis Services to a wide range of customers within the electronics industry. For a successful F/A a combination of good equipment and skilled engineers/technicians is key. Throughout the years we have continuously extended our equipment capability to keep pace with the technology developments. Importantly, our staffing has similarly grown in size, experience and skills. Having this capability in a centralized lab is unique in Europe and our extensive offering and F/A outcome is highly appreciated by our customers.

Services Available

Your benefits

Depending on your product phase a successful failure analysis brings you at least one of the following benefits:

Quicker time to market

Reduction of manufacturing costs (yield improvements)

Reduction of product maintenance costs

Reduction of field return rates

Increased knowledge of your own product

So a Failure Analysis certainly adds value!

Focused Ion Beam (FIB)

With our Focused Ion Beam (FIB) system we can repair/modify your ICs.

We offer full front and backside FIB edit service using the latest FIB systems. We have state of the art sample decapsulation tools and know how to prepare the samples for the actual FIB edit. We have more than 20 years experience with FIB circuit edits and we have done several successful projects on process nodes down to 16nm.