AFM5000II Atomic Force Microscope Controller

Hitachi AFM5000II includes the control system and software package to allow a wealth of advanced imaging and data analysis. Its superb function RealTune enables the automatic and self-optimizing data acquisition for easier, faster, and more consistent collection of high-quality AFM images regardless of user skill level. It also provides a wide range of uncommon features such as Q control, tip calibration, and 3D overly for enhanced measurements and data processing.

The all new ARM5000II SPM controller from Hitachi offers an advanced auto-tuning function for measurement parameters with a new GUI enabling simple nano-imaging.

The improved auto-tuning function systematically and efficiently monitors sample topography, scanning area, the cantilever, and the scanner to determine the best operating conditions. As the measurement parameters are optimized, the cantilever's vibration amplitude and operation frequency are automatically adjusted based on the sample and cantilever types. The new and improved auto-tuning algorithm offers reliable and precise imaging with a simple point-and-click!

Improved algorithm
A stable observation of crystal steps by the improved tuning function.

2. New Graphical User Interface (GUI)

Intuitive and logical control icons balance the screen layout with information provided for ultra-efficient, productive, and easy AFM operation for all levels of users.

Measurement and analysis tabs provide organized and spacious work areas on the monitor display.

3. Analysis Functions

The 3D Overlay Function enables the observation of "cause-and-effect relationship" between topography and physical properties. A variety of other functions, such as roughness and cross-section analysis, are also standard tools.

3D Overlay

Roughness and Cross-Section Profile Analysis

4. Compact Design for Desktop Use

The AFM5000II's small footprint allows flexible and efficient space usage.