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Algorithm to Detect Soldering Defects Due to Lifted Lead

Publishing Venue

IBM

Related People

Nakano, H: AUTHOR

Abstract

This article describes an apparatus and an algorithm to detect soldering defects of surface mount components due to lifted lead. The apparatus features the use of oblique two cameras above the printed circuit board and lighting devices below the cameras. The algorithm features rule-based defect judgement based upon four areas of interest in two images captured by the two cameras.

Country

United States

Language

English (United States)

This text was extracted from an ASCII text file.

This is the abbreviated version, containing approximately
70% of the total text.

Algorithm to Detect Soldering Defects Due to Lifted Lead

This article
describes an apparatus and an algorithm to
detect soldering defects of surface mount components due to lifted
lead. The apparatus features the use of
oblique two cameras above
the printed circuit board and lighting devices below the cameras.
The algorithm features rule-based defect judgement based upon four
areas of interest in two images captured by the two cameras.

Two images
are captured by the following sequence (Fig. 1):
1. Turn on light 1.
2. Capture image by using camera 1.
3. Turn off light 1 and turn on light
2.
4. Capture image by using camera 2.

Camera 1
views one side of the lead, and camera 2 views the
other side of the lead. Two windows (area
of interest) are set for
each of the images. Windows 11 and 12
are set for image 1, and
windows 21 and 22 are set for image 2.
The windows 11 and 21 are
set to include substrate regions adjacent to the lead ends and the
windows 12 and 22 are set to include lead foot portions (Fig. 2).

Lifted lead
has thick solder between the lead and substrate
which results in a larger bright portion in the image than that for
good lead. Also, lifted lead tends to
cause solder to spread over
beyond the lead end. In each of the
windows, the number of pixels
which are brighter than a predetermined threshold are counted. The
value is called "feature value" herein. By using four feature values
ob...