Functional Design Errors in Digital Circuits

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Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow: from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes: (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.To achieve this goal, circuits become larger and more complicated with each
generation, and designing them correctly becomes more and more difficult. ... in a
design [49], essentially becoming the bottleneck that hampers the improvement
of modern electronic devices. ... masked by changes in Basic Input/Output
System (BIOS) and operating systems, while some may be exploited by malicious
software.

Title

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Functional Design Errors in Digital Circuits

Author

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Kai-hui Chang, Igor L. Markov, Valeria Bertacco

Publisher

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Springer Science & Business Media - 2008-12-02

ISBN-13

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