Advantest Expands Application Coverage of TAS7500 Series of Spectroscopic Imaging Systems with 2 New Systems; Transmittance Polarization Analysis Module Also Developed

Advantest Corporation (TSE: 6857, NYSE: ATE), a global leader in test
and measurement sciences, has developed two new spectroscopy systems and
a new transmittance polarization analysis module for its TAS7500 product
series of systems, which employ terahertz waves to perform
non-destructive imaging and analysis of samples.

The new systems and module dramatically expand the range of applications
of the TAS7500 series to include chemicals and materials for high-speed
communications components, in addition to the pharmaceutical
applications covered by existing systems, while also delivering the
ability to analyze the polarization characteristics of samples. The new
products are scheduled for launch in March, 2013.

Advantest Enables New Applications for Terahertz Technology

In recent years the terahertz frequency range has increasingly been
utilized in non-destructive measurement and spectroscopic analysis
applications. Advantest has led the development of this technology,
launching its 3D Imaging Analysis System, the TAS7000, in April 2010,
followed in September 2011 by the groundbreaking TAS7500, a
non-invasive, non-destructive analysis system for pharmaceutical
applications. The company has continued to invest in expanding the
analysis capabilities and applications coverage of its terahertz
technology, leading to the development of the new TAS75000SU and
TAS7500SL systems.

In combination with the previously launched TAS7500SP, these three
systems, each covering a different bandwidth, greatly expand the TAS7500
series’ analysis range, and provide enhanced measurement quality in each
frequency region. Further, Advantest’s newly developed transmittance
polarization analysis module for spectroscopic analysis enables
polarization characteristics analysis of optically anisotropic
materials,* among others.

The new systems and module expand the applications of the TAS7500 series
beyond the pharmaceutical arena, to fields including terahertz wireless
communications, biotechnology, and research applications utilizing
terahertz waves.

The TAS7500 series boasts an industry-best scan time of 8 milliseconds,
ensuring speedy measurement results unaffected by exterior changes in
humidity and temperature.

* Advantest’s new Cherenkov THz radiation source, which generates a
superior range of frequencies, was announced in September 2012, as was
the company’s terahertz time-of-flight (TOF) tomography analysis system,
which employs the Cherenkov radiation source.

In the field of terahertz wireless communications—a technology expected
to find practical applications in the near future—it is crucial for
engineers to accurately analyze the characteristics of the materials
they work with, such as permittivity and absorptiveness. The TAS7500SL
is specialized for the 30GHz – 2THz band of the spectrum, optimizing it
for R&D in the area of materials to be used for packages, boards, and
other communications components, as well as spectroscopic analysis at
these bandwidths.

In common with Advantest’s existing spectroscopic measurement modules
(transmission, reflection, and ATR), the new transmittance polarization
analysis module is easy to install and remove, aiding ease of operation
in any measurement environment.

Advantest will exhibit at SPIE Photonics West at the Moscone Center, San
Francisco on February 5-7, 2013.

About Advantest Corporation

A world-class technology company, Advantest is the leading producer of
automatic test equipment (ATE) for the semiconductor industry and a
premier manufacturer of measuring instruments used in the design and
production of electronic instruments and systems. Its leading-edge
systems and products are integrated into the most advanced semiconductor
production lines in the world. The company also focuses on R&D for
emerging markets that benefit from advancements in nanotech and
terahertz technologies, and has recently introduced multi-vision
metrology scanning electron microscopes essential to photomask
manufacturing, as well as a groundbreaking 3D imaging and analysis tool.
Founded in Tokyo in 1954, Advantest established its first subsidiary in
1982, in the USA, and now has subsidiaries worldwide. More information
is available at www.advantest.com.

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