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Abstract

In this paper, a method of domain wall characterization in ferroelectrics through Cherenkov second harmonic generation by localized nonlinearities is proposed. By this method, domain wall width is estimated to be less than 10nm. High spatial angular resolution of about 10mrad in the experiment reveals the fine structures of the domain walls. Combined with scanning techniques, this method can reconstruct domain wall patterns with high resolution. This method has advantages of being nondestructive, noncontact, in situ as well as of high resolution.

Figures (5)

(a) Schematic of CSHG patterns of different ratio of beam width over domain wall width rb/rdw; and (b) Calculated CSHG’s angular distribution changes with the increasing of rb/rdw. When rb/rdw = 1, the CSHG should be conical, so its angular distribution is 2π, as indicated as 360°. When rb/rdw>100, this pair of CSHGs are well-collimated.

(a) and (b) are straight domain walls with high and low qualities respectively; (c) two high-quality domain walls with 150° angle; (d), (e) and (f) are corresponding CSHGs to domain walls in (a), (b) and (c).