Microscopy Across Systems - Correlative Workflows for Materials Analysis, Tuesday 2nd of May at 4pm CEST

Martin Kuttge, Tim Schubert, and Dominic Hohs from Carl Zeiss Microscopy and Aalen University will present tomorrow on the best way to correlate different kinds of microscopy for research and materials analysis.

They will discuss the most effective way to combine light and scanning electron microscopy, and explore ways to combine these two complementary techniques that will improve your research and analysis work.In more detail, they will cover:

Correlative microscopic workflows in material science and engineering

A selection of use cases investigated with high-performance light, digital, and scanning electron microscopes (SEM) including energy dispersive spectrometry (EDS)