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Abstract

In static timing analysis (STA), hold and setup time violation checks requires accurate delay measurements of combinational circuits. Look up table (LUT) based methods for delay measurements of these circuits are quite common. These LUTs are pre-characterized for various values of input rise time (TR) and output loads (CL) at various supply voltage and chip temperature nodes. The choice of TR and CL is either completely random or by uniform spacing method. Researchers [1] observed that delay varies linearly with TR up to some break point (TRB). In this paper we analyze the behavior of this break point (TRB) and calculate it for various loads, MOSFET widths, on chip supply voltages and temperature variations and provide a model for (TRB) calculations.

Country

India

Language

English (United States)

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This is the abbreviated version, containing approximately
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In static timing analysis (STA), hold and setup time
violation checks requires accurate delay measurements of combinational
circuits. Look up table (LUT) based methods for delay measurements of these
circuits are quite common. These LUTs are pre-characterized for various values
of input rise time (TR) and output loads (CL) at various supply voltage and
chip temperature nodes. The choice of TR and CL is either completely random or
by uniform spacing method. Researchers [1] observed that delay varies linearly
with TR up to some break point (TRB). In this paper we analyze the behavior of
this break point (TRB) and calculate it for various loads, MOSFET widths, on
chip supply voltages and temperature variations and provide a model for (TRB)
calculations.

Methodology

Fast LUT characterization by exploiting linear
region in delay versus input rise time curve up to an extent (TRB). We
model the behavior of TRB with various load (CL), VDD
and Temperature. Once we
have TRB, we remove the requirements of simulation in the linear
region (where TR is less than TRB).

Delay
of a CMOS Based NOT Gate with Input Rise Time (TR) for various CL
Showing Linear Regions