Kratos X-ray Photoelectron Spectrometer – Axis Ultra DLD

Information the equipment can provide

Multi-technique Spectrometer with photoelectron and ion Spectroscopies, including surface-mapping capability

This multi-technique with photoelectron and ion spectroscopies, including surface-mapping capabilties, was purchased from Kratos Analytical in 2007 to determine surface elemental and composition analysis. Most samples can be analyzed in a non-invasize or non-distructive method. This instrument is equipped with additional techniques:

XPS mode is also capable of surface mapping to provide lateral distribution maps of elemental and chemical species at the surface.

Key Features

Signal detected: Photoelectron from near surface atoms

Elements detected: From Lithium to heavy metals

Detection limits: 0.1 to 1 atomic %.

Depth resolution: 2 to 8 nm

Depth Profile: 0.5 nm/second using Argon ions

Lateral resolution: 15 to 500 microns

Researcher manipulates air sensitive samples inside an inert glove box for loading them into the capsule of the Rox interface. The capsule will then be hand carried to the Kratos XPS or the Tof-SIMS.

The Kratos XPS is also equipped with a set of chambers and a capsule (collectively called ROX interface) to transfer air sensitive samples from an argon (or nitrogen) filled glove box to the XPS surface analysis chamber which is under ultra-high vacuum (UHV). The ROx Interface was designed and developed at the Texas Materials Institute (U.S. Patent Application Serial No. 14/445,650 filed July 29, 2014). Unlike commercial interfaces, the Rox interface was designed with a unique innovation: It has a built-in semi-quantitative method to monitor sample transfer reliability and validity.