Irtronµ sample compartment microscopy system by JASCO (USA)

The Irtronµ sample compartment microscopy system is designed to provide affordable analysis of microscopic samples with the high performance features of an external FT-IR microscope accessory.
The Irtronµ offers unprecedented convenience and ease of use, compatible with the JASCO FT/IR-4000 and 6000 series FT-IR instruments. The microscope accessory installs into the spectrometer sample compartment in seconds without optical alignment. The state-of-the-art optical design guarantees high throug... Read more

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The Irtronµ sample compartment microscopy system is designed to provide affordable analysis of microscopic samples with the high performance features of an external FT-IR microscope accessory.

The Irtronµ offers unprecedented convenience and ease of use, compatible with the JASCO FT/IR-4000 and 6000 series FT-IR instruments. The microscope accessory installs into the spectrometer sample compartment in seconds without optical alignment. The state-of-the-art optical design guarantees high throughput for highly sensitive measurements of samples approaching 20 microns. The Irtronµ can be operated with the integrated touch panel or via a PC using the Spectra ManagerTM II software interface. The sample is observed with the integrated color CCD camera and a 5 inch TFT color LCD monitor. JASCO’s unique ATOS (Aperture Through Optical System) provides simultaneous viewing of the sample image and sampling location specified by the aperture.