Powered by a CMOS sensor, the Velocity™ EBSD camera combines indexing speeds greater than 3,000 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity™ uses 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with proven EDAX triplet indexing routines, provides orientation precision values of less than 0.1°.

The Velocity™ EBSD camera can be integrated with compatible EDAX EDS detectors to provide an analytical system for efficient simultaneous EDS-EBSD collection, even at the highest collection speeds. When combined with ChI-Scan™ analysis, this results in useful integrated data for accurate phase differentiation.

This new addition to the EDAX portfolio of EBSD cameras, offers users a further option for high-speed mapping and accurate indexing needed to resolve crystallographic microstructures and help solve materials characterization challenges quickly and easily.

Since 1962, EDAX has used its knowledge and experience to develop ultra-sensitive silicon radiation sensors, digital electronics and specialized application software that facilitate solutions to research, development and industrial requirements.

EDAX is a unit of the Materials Analysis Division of AMETEK, Inc., which is a leading global manufacturer of electronic instruments and electromechanical devices with annual sales of $4.3 billion. For further information about EDAX, contact: