Bench-top Energy Dispersive X-ray Fluorescence Spectrometer

Historic England: Fort Cumberland

Description

X-ray fluorescence spectrometer used for non destructive qualitative and quantitative elemental analysis. All elements from Z=11 (Na) to Z=92 (U) can be detected. The device allows point as well as line and area scans, for the latter two flat samples are required. As XRF is a surface technique, minimal preparation may be required to expose the material of interest (e.g. if metals are tarnished or corroded)

Specification

Item ID #15.

Last Updated: 3rd July, 2018

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