Design of Ramp-Stress Accelerated Life Test Plans for a Parallel System with two Dependent Components

Volume 12, Number 3, May 2016 - Paper 4 - pp. 241-248

PREETI WANTI SRIVASTAVAand SAVITA

Department of Operational Research, Faculty of Mathematical Sciences, University of Delhi, Delhi, INDIA.

(Received on February 22, 2016; Revised on April 10, 2016)

Abstract:

In this paper, we have formulated optimum Accelerated life test(ALT) plan for a parallel system with two dependent components under ramp-stress loading scheme and Type-I censoring. The dependency between the two components is modeled by Gumbel-Hougaard copula evaluated at two Weibull survival (reliability) marginals. The stress-life relationship is modeled using inverse power law, and cumulative exposure model is assumed to model the effect of changing stress. The optimal plan consists in finding out the optimum stress rate using D-optimality criterion. The method developed has been explained using a numerical example.