Application-Specific Test Systems & Components

Ease system integration with Keysight System products and services. You can be sure you´re getting outstanding system-ready instruments, open software, and PC-standard I/O that give you the freedom to choose the best tools for your test, and the assurance that they´ll work together, every time.

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This application note is designed to help you quickly design a test system that produces reliable results and meets throughput requirements within budget. It explores the entire software development process, from gathering and documenting software requirements through design reuse considerations.

Application Note 1465-33. When you migrate to a hybrid system that includes LXI along with GPIB, VXI, PXI, or any other architecture, two scenarios are most typical, minimum development time and maximum overall performance

This note represents a brief history of SI, compares a rack-and-stack system to an SI-based system, descibes the initial applications of SIs, and illustrates the emulation of conventional instruments with SIs.

This set of application notes shows
you how to simplify test system
integration by utilizing open connectivity standards such as local area networking (LAN). The collective goal of these notes is to help you produce reliable results, meet your throughput requirements and stay within your budget.

Using SCPI and Direct I/O vs. Drivers,
the fifth note in the series, outlines
the relationship between input/output (I/O) software, application software and the ability to maximize instrument interchange and software reuse in present and future systems

The first application note in the series, Introduction to Test-System Design, covers test-system philosophy and planning and discusses how test is used in three sectors: R&D, design validation and manufacturing

Simplify test integration with USB interface. Whether you’re setting up an ad hoc system on a lab bench or designing a permanent solution for a manufacturing line, the three best choices today
for connecting modern instrumentation to computers are GPIB, LAN, and USB.

Using LAN in Test Systems: PC
Configuration,the third note in
the series, describes the additional
capabilities required to enable communication between a PC and LAN-enabled instrumentation. This note is a companion to Application Notes 1465-9 and 1465-10.

The decision to use LAN in a test system delivers important benefits to your company and your team.
From a business perspective, intense competition among equipment vendors has produced a wide selection of high quality, low-cost solutions for local area networking

The basic purpose of any test system is to characterize and validate the performance of electronic components, assemblies or products. The complexity of this task depends on variables such as the physical nature of the device under test (DUT), the number of tests to be performed, the number of signals to be measured and the desired time per test.