20080024110 - Circuit configuration and method for measuring humidity: A circuit configuration for measuring air humidity includes a measuring system which includes an oscillator unit and a signal-processing unit, as well as a frequency-determining impedance, which is determined largely by a parallel connection of a capacitive humidity sensor and a parasitic resistance. The frequency-determining impedance is connected to the... Agent: Kenyon & Kenyon LLP

20080024111 - Resistive particle sensors having measuring electrodes: A sensor for determining the concentration of particles in gases, in particular of soot particles, has at least one substrate element, and a measuring area between at least one first and one second measuring electrode, the two measuring electrodes being configured so that by applying a voltage between the measuring... Agent: Kenyon & Kenyon LLP

20080024159 - Compensation for voltage drop in automatic test equi0pment: Providing reliable testing of a device under test (DUT) by compensating for a reduced voltage inside the device without changing the internal circuitry of the device. The DUT has multiple connection terminals for connecting to the test equipment including at least first and second power connection terminals that both connect... Agent: Fitzpatrick Cella (marvell)

20080024113 - System of phenon spectroscopy: A system for phonon spectroscopy for attaining a phonon spectrum of a sample of a material. Current may be injected into the material to result in electrical noise in the material. The electrical noise may be processed to result in information revealing a phonon spectrum of the material. The phonon... Agent: Honeywell International Inc.

20080024114 - Method and system for transformer control: A method to balance transformer flux among a plurality of transformers is disclosed. The plurality of transformers is connected to a plurality of converters, each transformer having an associated converter. The method comprises determining a reference flux value, measuring an actual flux value for each transformer, and developing a plurality... Agent: General Electric Company Global Research

20080024117 - Ultra-sensitive magnetoreduction measurement system and ultra-sensitive, wash-free assay using the same: An ultra-sensitive SQUID-based magnetoreduction measurement system for performing an assay is provided, wherein the system is capable of measuring the concentration of multiple-active-epitope biomolecules, single-active-epitope biomolecules, or small biomolecules with high sensitivity. The sensitivity of the ultra-sensitive magnetoreduction measurement system is 1 ppt or below. The system includes a sample... Agent: J C Patents, Inc.

20080024118 - Magneto-resistive sensor for high sensitivity depth probing: A sensor device (40) and a method for detection of the presence of at least one magnetic particle (46) are described. More particularly, a sensor device (40) comprising at least one magnetic field generating means (41) and at least one magnetic sensor element (42) is provided. The sensor device (40)... Agent: Philips Intellectual Property & Standards

20080024119 - Temperature compensated resonant transmission line sensor: A position sensing system uses a resonant transmission line having a moveable dielectric as a position sensor. The system includes circuitry that supplies an RF drive signal to the resonant transmission line, which reflects the drive signal. Based on a standing wave signal, which is generated from the drive signal... Agent: Honeywell International Inc.

20080024120 - Magnetic sensor including bridge circuit having fixed resistance like structure of element: A magnetic sensor uses a magnetoresistance element which can be driven in a stable manner with a dipole irrespective of a polarity of an external magnetic field. A resistance value R of first magnetoresistance elements varies, and a resistance value of second magnetoresistance elements does not vary with a variation... Agent: Brinks Hofer Gilson & Lione

20080024121 - Rotation detection sensor: A vehicle wheel speed sensor 10 includes a cover member 21 having a mounting hole 26, a detection unit 31, a connector terminal 38, and a connector 61. The connector 61 is arranged on a surface of the cover member 21 at a side opposite to a rotor 17. The... Agent: Reed Smith LLP

20080024122 - Sensor including sensing areas delivering signals of differential amplitude: A pseudo-sinusoidal signal includes a plurality of sensing areas each of which are capable of delivering a signal Si representative of the signal to be detected. The sensing areas are arranged such that, for the same detected signal, at least one sensing area delivers a signal Si of a different... Agent: Bachman & Lapointe, P.C.

20080024123 - Methods for measuring magnetostriction in magnetoresistive elements: A method for measuring a magnetostriction value of a magnetoresistive element according to one embodiment includes placing a substrate carrying one or more magnetoresistive elements on a fixture; applying a first magnetic field about parallel to the substrate; applying a second magnetic field about perpendicular to the substrate and about... Agent: Zilka-kotab, PC

20080024124 - Systems for measuring magnetostriction in magnetoresistive elements: A system for use when measuring a magnetostriction value of a magnetoresistive element according to one embodiment includes a mechanism for applying a first magnetic field about parallel to a substrate having one or more magnetoresistive elements, and for applying a second magnetic field about perpendicular to the substrate and... Agent: Zilka-kotab, PC

20080024125 - Method for positioning a probe: A method for detecting substructure includes the steps of: nondestructively scanning an assembly using a substructure scanning system including a precision motion carriage and a nondestructive scanning sensor, positioning the assembly under the substructure scanning system, positioning the scanning sensor on the outer skin, moving the scanning sensor over the... Agent: Ingrassia Fisher & Lorenz, P.C. (boeing)

20080024126 - Beam measuring equipment and beam measuring method using the same: A measuring device includes a magnetic shielding part for shielding an outer magnetic field, and a plurality of magnetic field sensors which are arranged in a shielding space which is formed by the magnetic shielding part, wherein the magnetic field sensor includes a plurality of magnetic field collection mechanisms which... Agent: Pearne & Gordon LLP

20080024127 - Magnetic resonance imaging apparatus and method: A magnetic resonance imaging apparatus comprises static magnetic field generating means for generating a static magnetic field in an imaging space, a gradient magnetic field generating means for generating a gradient magnetic field in the imaging space, high-frequency magnetic field generating means for generating a high-frequency magnetic field so as... Agent: Cooper & Dunham, LLP

20080024128 - Nuclear magnetic resonance measurement techniques in non-uniform fields: Methods and pulse sequences for facilitating nuclear magnetic resonance (NMR) measurements in grossly inhomogeneous fields. Methods and pulse sequences according to the invention may be used to accurately measure variables such as transverse relaxation time, longitudinal relaxation time, and diffusion, without the need for data at long recovery time, thereby... Agent: Schlumberger-doll Research Attn: Intellectual Property Law Department

20080024132 - Method and appraratus of multi-coil mr imaging with hybrid space calibration: The present invention provides a system and method for parallel imaging that performs auto-calibrating reconstructions with a 2D (for 2D imaging) or 3D kernel (for 3D imaging) that exploits the computational efficiencies available when operating in certain data “domains” or “spaces”. The reconstruction process of multi-coil data is separated into... Agent: Ziolkowski Patent Solutions Group, Sc (gems)

20080024131 - Method for measuring the microarchitecture of complex tissue with mri: A diffusion-weighted MRI pulse sequence employs a two-dimensional diffusion weighting gradient that is sensitive to spin diffusion in a plane defined by two orthogonal gradients to acquire an image. The resulting magnitude image indicates the location of neuronal fibers perpendicular to this plane and by repeating the acquisition with the... Agent: Quarles & Brady LLP

20080024130 - System and method for providing a rotating magnetic field: Disclosed herein are systems and methods for generating a rotating magnetic field. The rotating magnetic field can be used to obtain rotating-field NMR spectra, such as magic angle spinning spectra, without having to physically rotated the sample. This result allows magic angle spinning NMR to be conducted on biological samples... Agent: Knobbe Martens Olson & Bear LLP

20080024133 - Cavity resonator for magnetic resonance systems: An magnetic resonance apparatus in embodiments of the invention may include one or more of the following features: (a) a coil having at least two sections, (b) the at least two sections having a resonant circuit, (c) the at least two sections being reactively coupled or decoupled, (d) the at... Agent: Intellectual Property Group Fredrikson & Byron, P.A.

20080024134 - Gradient coil cooling device and method for the manufacture thereof: In a method for manufacturing a cooling device for a gradient coil, the cooling device having at least one flexible cooling tube arranged on a carrier plate configured in accordance with a predetermined pattern, the at least one cooling tube originally having a circular cross section, is laid in accordance... Agent: Schiff Hardin, LLP Patent Department

20080024135 - Electronic humidity chamber for vapor desorption to determine high capillary pressures: The present invention relates to the use of an electronically controlled humidity chamber with temperature controls: to determine, by vapor desorption, high capillary pressures of core samples; to produce core samples with a high capillary pressure for testing electrical properties; and, using a curve of high capillary pressures from vapor... Agent: G. Alan Witte Law Offices Of G. Alan Witte

20080024136 - Measuring pixel current in display device: Pixel current flowing in each pixel of a display panel is efficiently measured. The display panel 20 includes pixels arranged in a matrix, and performs display by writing pixel data in these pixels. By turning on one pixel alone within a screen for a period of a limited number of... Agent: Frank Pincelli Patent Legal Staff

20080024137 - Pulse-discharge battery testing methods and apparatus: A method for evaluating the conditions a battery comprises applying a discharge pulse to the battery and monitoring a response of the battery to the discharge pulse. In some embodiments a measure of battery condition is based at least in part on at least one of first and second parameters.... Agent: Oyen, Wiggs, Green & Mutala LLP 480 - The Station

20080024138 - Identifying apparatus for ac power supply arrangement: An identifying apparatus for an arrangement of an alternating current (AC) power supply includes a detecting circuit and a control circuit. The AC power supply includes a hot line and a neutral line. The detecting circuit is electrically coupled to the hot line and the neutral line of the AC... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20080024140 - Devices, systems, and methods for adaptive rf sensing in arc fault detection: Certain exemplary embodiments comprise a method, which can comprise automatically generating an output signal responsive to an input signal. The input signal can be indicative of an arc fault. The output signal can be configured to cause an electrical circuit to open. The output signal can be generated responsive to... Agent: Siemens Corporation Intellectual Property Department

20080024141 - Method and apparatus for insulating riggers: A method and apparatus for insulating riggers includes coupling a first end of an insulator body to a load and coupling a second end of the insulator body to a tag line. The insulator body includes an outer surface comprising at least one rib. The at least one rib extends... Agent: Fitch Even Tabin And Flannery

20080024143 - Closed-grid bus architecture for wafer interconnect structure: An interconnect structure employs a closed-grid bus to link an integrated circuit tester channel to an array of input/output (I/O) pads on a semiconductor wafer so that the tester channel can concurrently communicate with all of the I/O pads. The interconnect structure includes a circuit board implementing an array of... Agent: N. Kenneth Burraston Kirton & Mcconkie

20080024142 - High current capable circuit testing closer apparatus and method: A circuit testing closer may include a fault isolating switching device coupled between a supply side and a load side of a power distribution system and a current pulse generator coupled in parallel to the switch to generate a current pulse within the power distribution system subsequent to a fault... Agent: James V. Lapacek S & C Electric Co.

20080024144 - Method and apparatus for dry testing non-conductive containers for carrying people: A method and apparatus for dry testing non-conductive containers for carrying people are disclosed. Two conductive materials placed on opposite sides of a material being tested. High voltage is applied to one of the conductive materials while a ground lead is attached to the other conductive material. Electric current is... Agent: Volpe And Koenig, P.C.

20080024145 - Independent reference pulse generation: In fill-level measuring devices according to the pulse-transit-time method, a reflection that is generated internally in a microwave module is used as a reference for transit time measuring. For generating the reference pulse, the microwave module comprises its own sampling mixer or its own oscillator. Subsequently, the echo signal and... Agent: Fay Kaplun & Marcin, LLP

20080024146 - Resistance compensation circuit and memory device and method thereof: A resistance compensation circuit and a method thereof for tuning frequency, includes several resistors serially connected to one another, several transistors, each of which connects across one of the corresponding resistances, and a register electrically connected to the gates of the transistors. A control signal controls the switching of the... Agent: Rosenberg, Klein & Lee

20080024148 - Probe card assembly with a dielectric strip structure: A probe card assembly for providing electrical interconnection between a semiconductor device to be tested and a test system is provided. The probe card assembly includes a plurality of probes supported by a support substrate, each of the plurality of probes including an end portion extending away from the support... Agent: Hickman Palermo Truong & Becker, LLP

20080024149 - Probe for testing a device under test: A probe measurement system for measuring the electrical characteristics of integrated circuits or other microelectronic devices at high frequencies.... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080024152 - System and method for reducing heat dissipation during burn-in: Systems and methods for reducing temperature dissipation during burn-in testing are described. A plurality of devices under test are each subject to a body bias voltage. The body bias voltage reduces leakage current associated with the devices under test. Accordingly, heat dissipation is reduced during burn-in.... Agent: Murabito Hao & Barnes LLP

20080024154 - High density cantilevered probe for electronic devices: Probes for electronic devices are described. The probe is formed by ball bonding a plurality of wires to contact locations on a fan out substrate surface. The wires are cut off leaving stubs. A patterned polymer sheet having electrical conductor patterns therein is disposed over the stubs which extend through... Agent: Daniel P. Morris IBM Corporation

20080024155 - High density cantilevered probe for electronic devices: Probes for electronic devices are described. The probe is formed by ball bonding a plurality of wires to contact locations on a fan out substrate surface. The wires are cut off leaving stubs. A patterned polymer sheet having electrical conductor patterns therein is disposed over the stubs which extend through... Agent: Daniel P. Morris IBM Corporation

20080024156 - Inspection system, inspection method, and method for manufacturing semiconductor device: The present invention provides an inspection system of ID chips that can supply a signal or power supply voltage to an ID chip without contact, and can increase throughput of an inspection process and an inspection method using the inspection system. The inspection system according to the present invention includes... Agent: Cook, Alex, Mcfarron, Manzo, Cummings & Mehler Ltd

20080024157 - Array testing method using electric bias stress for tft array: A method of detecting thin film transistor (TFT) defects in a TFT-liquid crystal display (LCD) panel, includes, in part, applying a stress bias to the TFTs disposed on the panel; and detecting a change in electrical characteristics of the TFTs. The change in the electrical characteristics of the TFTs may... Agent: Townsend And Townsend And Crew, LLP

20080024158 - Rf sensor clamp assembly: A clamp assembly for bringing an RF sensor into electrical contact with an RF current carrier is provided herein. The clamp assembly (101) comprises a first wedge-shaped element (103), and a second wedge-shaped element (105) which is slidingly engaged with said first wedge-shaped element. Preferably, the clamp assembly also comprises... Agent: Fortkort & Houston P.C.

01/24/2008 > patent applications in patent subcategories.

20080018322 - Phase measurement device, method , program, and recording medium: The phases of distortions of a signal outputted from an amplifier are measured. A phase measurement device measures an output of an amplifier when an input signal having input frequency components ω10 and ω20 is fed to the amplifier. The phase measurement device includes multipliers for orthogonally transforming the output... Agent: Greenblum & Bernstein, P.L.C

20080018323 - Apparatus for measuring electric characteristics of semiconductor: An apparatus for measuring electric characteristics of a semiconductor includes a light irradiating means for irradiating light to a characteristic measured semiconductor, an alternating-current voltage source, an electric potential measuring means and an impedance regulator wherein impedance is regulated by an impedance regulator in such a manner that electric potential... Agent: William S Frommer Frommer Larwrence & Haug

20080018324 - Voltage-impressed current measuring apparatus and current buffers with switches used therefor: A voltage-impressed current measuring apparatus, wherein the voltage from a direct-current power supply portion (220) is impressed on the terminal of a device under test (DUT) via a range switching portion (210) and the current flowing in the same terminal is measured; wherein the range switching portion (210) has a... Agent: Gallagher & Lathrop, A Professional Corporation

20080018325 - Apparatus and method for measuring an output power of a power supply: An assembly includes a power supply and a meter. The power supply has a cable with a plurality of pins providing different voltages to a corresponding plurality of receiving pins. Each pin is connected to one of the receiving pins by a resistor of known value. The meter measures voltages... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20080018326 - multifunctional detector for engine: The multifunctional detector for an engine according to the present invention is configured such that a sensor for detecting the rotational speed of the gear within a transmission for a vehicle and a sensor for detecting the temperature of the surrounding transmission oil are mounted on the same circuit board... Agent: Westerman, Hattori, Daniels & Adrian, LLP

20080018327 - Methods and apparatus for rfid tag placement: Systems and methods for placing RFID tags on objects are shown and described. The method includes scanning an object and analyzing one or more reflected signals from the to determine a suggested location for placement of an RFID tag. The scan can be accomplished using a scanning device having an... Agent: Choate, Hall & Stewart LLP

20080018328 - Inductive position sensor: An inductive position sensor has a spatially periodic scale with a series of conducting or permeable features of pitch T and a reading head with drive windings and sense windings, facing the scale with a spatial period 2T along the scale. The windings are each divided in two identical winding... Agent: Leydig Voit & Mayer, Ltd

20080018329 - Rotation angle detector: The present invention relates to a rotation angle detector for use mainly in detecting rotation angles of a vehicle's steering shaft with a simplified and low-cost configuration. For the purpose, the first detection head and the second detection head are disposed perpendicularly to the rotor, and the spur gear formed... Agent: Wenderoth, Lind & Ponack L.L.P.

20080018331 - Omni-directional electric current perturbation probe: An electric current perturbation probe includes at least one driver coil and at least one receiver. The at least one driver coil produces an omni-directional magnetic field. The at least one receiver is decoupled from the omni-directional magnetic field. In one example, the at least one driver coil includes a... Agent: Carlson, Gaskey & Olds/pratt & Whitney

20080018332 - Method and apparatus for detection of quadrupole nuclei in motion relative to the search region: A method and apparatus for detecting quadrupole nuclei in motion relative to a search region, during the sensing operation, provides a system for decreasing the throughput time of quadrupole resonance (QR) detection systems. The apparatus uses a single QR probe, or a plurality of QR probes, which may be formed... Agent: Weingarten, Schurgin, Gagnebin & Lebovici LLP

20080018334 - Method and apparatus for well-bore proximity measurement while drilling: A rotating, transversely magnetized, magnet on a drill collar induces magnetization in a casing of a preexisting well. A coil rotating synchronously with the magnet produces a current at twice the frequency of rotation and having an amplitude that depends upon the distance from the magnet to the preexisting well.... Agent: Madan, Mossman & Sriram, P.C.

20080018336 - Electric potential measuring device and image forming apparatus: An electric potential measuring device comprises a detection electrode of a conductive material disposed in opposition to an object and a movable structure comprised of a first solid material portion of a dielectric and a second solid material portion of another dielectric or a conductive material. A charge induced on... Agent: Fitzpatrick Cella Harper & Scinto

20080018337 - Method and apparatus for maintaining emission capabilities of hot cathodes in harsh environments: A method and apparatus for operating a multi-hot-cathode ionization gauge is provided to increase the operational lifetime of the ionization gauge in gaseous process environments. In example embodiments, the life of a spare cathode is extended by heating the spare cathode to a temperature that is insufficient to emit electrons... Agent: Hamilton, Brook, Smith & Reynolds, P.C.

20080018343 - Line-reflect-reflect match calibration: A method of compensating a calibration for a vector network analyzer includes performing calibrations on at least a pair of ports to determine error terms associated with each port wherein at least one of the error terms is based upon selecting the reactance of the load standard from a set... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080018344 - Rf bridge circuit without balun transformer: An RF bridge circuit without a balun transformer. The RF bridge circuit may include a resistive bridge and a differential detector. The resistive bridge may generate a differential signal that is indicative of a differential imbalance across the resistive bridge. Specifically, the differential signal may be indicative of the ratio... Agent: Jeffrey C. Hood Meyertons Hood Kivlin Kowert & Goetzel PC

20080018345 - Electric circuit and test apparatus: There is provided an electric circuit that outputs a timing signal and a recovered clock. The electric circuit includes a delay circuit that delays a reference signal, a PLL section that delays an oscillation signal synchronized with the delayed reference signal by an offset delay amount to output the delayed... Agent: Osha Liang L.L.P.

20080018346 - System for detecting an interface between first and second strata of materials: A system for detecting an interface defined between first and second materials (each with a different dielectric loss factor) disposed in a stratified manner in a volume of materials having a predetermined depth is disclosed. The system includes a sensing apparatus, a source of radio frequency signal, a receiver including... Agent: Medwick, George M. E.i.du Pont De Nemours And Company

20080018347 - Capacitance type sensor: In a capacitance type sensor, capacitive elements are formed between a displacement electrode 104 and capacitance electrodes E1 and E2. When an external force is applied, the displacement electrode 104 is displaced to come into contact with a switch electrode E3 or E4 kept at a ground potential. The displacement... Agent: Osha Liang L.L.P.

20080018348 - Spatially distributed guarded impedance: A guarded sense impedance for use in a measurement instrument includes a sense impedance adapted to have a spatially distributed electrical potential and at least one guard structure adapted to have the spatially distributed electrical potential. The guard structure is arranged to provide a spatially distributed guard potential for the... Agent: Pearne & Gordon LLP

20080018349 - Method for testing electrical elements using an indirect photoelectric effect: A method for testing or measuring electric elements uses at least one electron-discharging electrode, at least one electron-collecting electrode and at least one source of a beam of particles. The method includes ejecting electrons present in the discharging electrode by use of the beam of particles and injecting into an... Agent: Akin Gump Strauss Hauer & Feld L.L.P.

20080018350 - Test probe for integrated circuits with ultra-fine pitch terminals: An interposer for converting pitches includes an interconnect structure over the semiconductor substrate, an active circuit formed on the semiconductor substrate, wherein the active circuit is electrically connected to the interconnect structure, a first plurality of pads with a first pitch over the interconnect structure, a second plurality of pads... Agent: Slater & Matsil, L.L.P.

20080018352 - Prober and probe contact method: A prober and a probe contact method for reducing errors in the contact position between a probe and an electrode without lowering throughput when conducting a probing test of a wafer at a high or low temperature have been disclosed. The prober comprises: a wafer chuck that holds a wafer;... Agent: Christie, Parker & Hale, LLP

20080018354 - Test handler: A test handler is disclosed in the present invention. The test handler may include a test tray on which a plurality of inserts are arrayed for loading at least one semiconductor device, at least one opening unit for simultaneously opening one part of the plurality of inserts which are arrayed... Agent: JeffersonIPLaw, LLP

20080018356 - A system for acquiring device parameters: A system for performing device-specific testing and acquiring parametric data on custom integrated circuits, for example ASICs, such that each chip is tested individually without excessive test time requirements, additional silicon, or special test equipment. The testing system includes a device test structure integrated into unused backfill space in an... Agent: Ibm Microelectronics Intellectual Property Law

20080012547 - Detection circuit for sensing the input voltage of transformer: A circuit for detecting an input voltage of a transformer is provided. The circuit includes a current source circuit coupled to a winding of a transformer. A current-to-voltage circuit is coupled to the current source circuit to generate a first voltage in response to a current outputted from the current... Agent: Jianq Chyun Intellectual Property Office

20080012548 - Measuring device of an hf plasma system: A measuring device of an HF plasma system includes an uncoupling device for uncoupling one or a plurality of signals related to a power and at least one filter arrangement to which such a signal is transmitted. The filter arrangement is designed as a band pass filter arrangement and includes... Agent: Fish & Richardson PC

20080012550 - Reducing power consumption of electrical meters: The invention contemplates an electrical power meter and method of operating the electrical power meter. The inventive power meter includes a power supply for converting alternating current (AC) voltage to a direct current (DC) voltage for powering the electronic components, and an optical diode in series with the power supply.... Agent: Woodcock Washburn LLP

20080012552 - Calibration device in magnetic sensor for inducting magnetic scale: The disclosed invention is a calibration device in magnetic sensor for inducting a magnetic scale which primarily comprises: a sensor unit which includes a Hall sensor to produce square signals when detecting the magnetic field generated by a magnetic scale; a signal display unit for presenting signals from said sensor... Agent: Charles E. Baxley, Esq.

20080012553 - Probe for assessment of metal distortion: Apparatus for assessing field distortion includes a probe and a processor. The probe includes a mechanical fixture for placement at a location to be tested, and one or more field generators, which are attached to the mechanical fixture and are arranged to generate respective magnetic fields. The probe further includes... Agent: Philip S. Johnson Johnson & Johnson

20080012554 - Rotary angle sensing system: The present invention includes a rotary sensing system that includes a shaft, a magnet encircling the shaft, a pair of plates, each of which is positioned near distal ends of the magnet, and at least one sensing device. The magnet generates a magnetic field, the angle of which changes as... Agent: Siemens Corporation Intellectual Property Department

20080012555 - Rotational angle detecting devices: A rotational angle detecting device has a pair of permanent magnets and an angle sensor. Electrical connecting terminals are connected to the angle sensor and further connected to conductors. The conductors have seconds ends opposite to the first ends and serving as connector terminals of the connector. In one embodiment,... Agent: Dennison, Schultz & Macdonald

20080012558 - Magnetic field sensor device: A magnetic field sensor device includes at least two magneto-resistive sensor elements and one switch which is connected to the at least two magneto-resistive sensor elements, and makes at least one magneto-resistive sensor element of the at least two magneto-resistive sensor elements electrically connectable into a magnetic field detection arrangement.... Agent: Eschweiler & Associates LLC

20080012557 - Sensor device: A sensor device has a sensor assembly with at least one sensor element, an additional sensor assembly having at least one additional sensor element, and a switch-in element which couples the additional sensor assembly to the sensor assembly responsive to a switch-in signal to obtain an overall sensor assembly having... Agent: Eschweiler & Associates LLC

20080012559 - Magnetic filed compensation system with increased bandwidth: The invention relates to a device for compensating for magnetic fields which has two sensors which are active in different frequency ranges and thus allows regulation with a bandwidth from 0 to 20 kHz.... Agent: Demont & Breyer, LLC

20080012560 - Passenger screening system and method: A screening system including a first modality comprising at least one inductive sensor, and a second modality including at least one metal detection coil configured to generate a magnetic field, said induction sensor configured to detect a change in the magnetic field generated by the metal detection coil.... Agent: Patrick W. Rasche (22697) Armstrong Teasdale LLP

20080012561 - System and method for assessing contrast response linearity for dce-mri images: A phantom has a casing in which vials are arranged, preferably in rows and columns. The vials are filled with solutions of a substance which appears in the imaging modality to be tested. The solutions are of different concentrations; for example, the concentration can increase row by row. The solutions... Agent: Blank Rome LLP

20080012564 - Dynamic magnetic resonance inverse imaging: An fMRI scan is performed using a multi-element head coil and multi-channel receiver to acquire time course image data. One imaging gradient is eliminated from the pulse sequence used to acquire the time course image data enabling images to be acquired at a very high frame rate. The multi-channel NMR... Agent: Quarles & Brady LLP

20080012568 - Physiological sensor system: The invention relates to a physiological sensor system for recording electric measuring signals in a magnetic resonance device, comprising at least one measuring electrode, a signal amplifier unit in a shielded housing that is placed in close proximity to a patient and a signal processing unit for preparing the measuring... Agent: Siemens Corporation Intellectual Property Department

20080012569 - Downhole coils: In one aspect of the invention, a downhole tool string component comprises a tubular body with at least one end adapted for threaded connection to an adjacent tool string component. The end comprises at least one shoulder adapted to abut an adjacent shoulder of an adjacent end of the adjacent... Agent: Tyson J. Wilde Novatek International, Inc.

20080012570 - Monitoring battery cell voltage: A battery monitoring circuitry is provided. The battery monitoring circuitry includes a plurality of voltage detection paths and a logic device. Each voltage detection path is coupled to a battery cell and is operable for comparing a cell voltage of the battery cell with a switch threshold of a switch.... Agent: Patent Prosecution O2mirco , Inc.

20080012571 - Measuring device and measuring procedure for determining battery cell voltages: With a measuring device (1) for determining a voltage of at least one battery cell (14) in a battery (15), it is provided in order to achieve a precise, highly accurate measurement, that a voltage which is applied to an integration circuit (2) is integrated up and in a first... Agent: Continental Teves, Inc.

20080012572 - Semiconductor device having a function of detection breakages on a periphery thereof: A resistance wiring (12) and a judgement circuit (14) for judging a potential in a middle of a path of the resistance wiring (12) are provided on a periphery of a semiconductor chip (11). One end of the resistance wiring (12) is connected to a power supply (Vcc) and the... Agent: Mcginn Intellectual Property Law Group, PLLC

20080012574 - Qualifying of a detector of noise peaks in the supply of an integrated circuit: A method and a system for qualifying an integrated circuit according to a parasitic supply peak detector that it contains, including: supply of the integrated circuit to be tested under at least a first voltage; checking of a starting of the circuit; application of at least one first noise peak... Agent: Stmicroelectronics Inc. C/o Wolf, Greenfield & Sacks, P.C.

20080012575 - Systems and techniques for radio frequency noise cancellation: Various embodiments for radio frequency (RF) noise cancellation are described. In one embodiment, an apparatus may comprise an RF noise cancellation system arranged to sense platform noise observed by a radio subsystem, create an inverse version of the sensed platform noise, and add the inverse version of the sensed platform... Agent: Kacvinsky LLC C/o Intellevate

20080012576 - Test apparatus, adjustment method and recording medium: There is provided a test apparatus that tests a device under test including a plurality of data terminals and a clock output terminal, the test apparatus including a plurality of first variable delay circuits that delays a reference clock, a plurality of timing clock generating sections that outputs a timing... Agent: Osha Liang L.L.P.

20080012577 - System and method for monitoring parameters in containers: A system for measuring parameters in a container is disclosed. A system for measuring multiple parameters includes a container having a solution, at least one sensor in conjunction with a tag is in proximity to an impedance analyzer and a reader that constitute a measurement device. The at least one... Agent: Ge Healthcare Bio-sciences Corp. Patent Department

20080012578 - System for detecting molecular structure and events: The molecular structure of a medium and the occurrence of events effecting the molecular structure of a medium are determined by measuring the effect on the resonant frequency and/or the dissipated current of an oscillating electric field when a sample of a medium under test occupies a portion of the... Agent: Chernoff, Vilhauer, Mcclung & Stenzel

20080012579 - Systems and methods for remote sensing using inductively coupled transducers: A remote sensing device includes a sensor and reference circuit. A resonant circuit of the sensor has a resonant characteristic modifiable by exposure to an external condition. The sensor is configured to produce a sensor signal associated with the modifiable resonant characteristic. A reference circuit of the remote sensing device... Agent: 3m Innovative Properties Company

20080012580 - Sensor: A sensor of this comprises a receiving section that receives a signal that is sent from outside, a circuit whose impedance changes irreversibly in accordance with an environmental change, a measurement section that measures the impedance of the circuit in an event that a signal is received by the receiving... Agent: Oliff & Berridge, PLC

20080012582 - Apparatus to measure skin moisture content and method of operating the same: A method of measuring skin moisture content, the method including: measuring a differential rate of a skin impedance of a predetermined skin area of a user for a predetermined period of time; and determining that the skin area is a moist area when the differential rate of skin impedance is... Agent: Staas & Halsey LLP

20080012585 - Apparatus and method of adjusting system efficiency: Apparatus and methods of adjusting system efficiency for a current-consuming system are disclosed. In the disclosed apparatus, a system current detector receives a system current from the current-consuming system and calculates a system current variation accordingly. A system efficiency adjustment module is coupled to the system current detector to receive... Agent: Thomas, Kayden, Horstemeyer & Risley, LLP

20080012586 - Offset voltage measuring apparatus: An offset voltage measuring apparatus includes an offset voltage measuring unit including a plurality of measurement nodes having a current variation in response to a feedback voltage. An offset voltage amplifying unit outputs an output voltage amplified in response to an output signal of the offset voltage measuring unit, changes... Agent: Venable LLP

20080012583 - Power grid structure to optimize performance of a multiple core processor: A reduced number of voltage regulator modules provides a reduced number of supply voltages to the package. The package includes a voltage plane for each of the voltage regulator modules. Each core or other component on the die is tied to a switch on the package, and each switch is... Agent: Ibm Corp. (wip) C/o Walder Intellectual Property Law, P.C.

20080012584 - Real-time load current detecting circuit for cpu: A real-time load current detecting circuit composed of a power supply circuit, a delay circuit, a current sensing circuit, and a current feedback circuit. The power supply circuit is adapted for providing the CPU with a power source. The delay circuit includes a resistor and a capacitor, connected to the... Agent: Bacon & Thomas, PLLC

20080012587 - Method for measuring work function: A method for measuring work function includes the steps of: (a) providing a field emission electron source having a carbon nanotube tip as a cathode electrode and a spaced anode electrode, having a predetermined spaced distance therebetween; (b) applying a voltage between the cathode electrode and the anode electrode and... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20080012589 - Wafer test card applicable for wafer test: A wafer test card applicable for testing all the chips on a wafer in one time simultaneously comprising a base board carrying testing circuit thereon and an electric conductive spring-rubber assembly connected to the underside of the base board; the electric conductive spring-rubber assembly has an electric insulating soft rubber... Agent: Bacon & Thomas, PLLC

20080012590 - Probe assembly with multi-directional freedom of motion and mounting assembly therefor: An improved test probe assembly has an improved mounting assembly which provides the test probe multi-directional freedom of movement with respect to a base in order to resist damage frequently caused to the test probe. The improved mounting assembly may, for example, include at least a first resilient mount disposed... Agent: Eckert Seamans Cherin & Mellott

20080012588 - Silicon wafer for probe bonding and probe bonding method using thereof: Disclosed herein are a silicon wafer for probe bonding and a probe bonding method using the same. The silicon wafer for probe bonding is improved in structure to facilitate probe bonding on a probe substrate. The probe bonding method involves bonding supporting beams on the silicon wafer to bumps on... Agent: Daly, Crowley, Mofford & Durkee, LLP

20080012592 - Device and method for testing semiconductor packages: A socket for testing a semiconductor package comprises two or more rubbers. Each rubber includes a chip-package contact portion configured to electrically connect with a chip package placed on the rubber and electrical wirings configured to electrically connect with the chip-package contact portion and having external contact ends configured to... Agent: Volentine & Whitt PLLC

20080012594 - Probe card with balanced lateral force: A novel method and structure for counter-balancing a lateral force exerted by a probe card onto a device under test (“DUT”) is disclosed. Many DUTs (particularly memory devices) are tested in parallel (i.e., many die at a time) and have unequal numbers of contact pads on top vs. bottom and/or... Agent: Manuel F. De La Cerra

20080012595 - Wafer test card using electric conductive spring as wafer test interface: A wafer test card for testing the electric property of the chips on a wafer comprising a base board and a group of electric conductive springs or electric conductive spring pins connected to the base board and functioned as a wafer test interface to the wafer test card, the base... Agent: Bacon & Thomas, PLLC

20080012596 - Method and system for trimming voltage or current references: Trim codes are determined for semiconductor devices under test (DUTs), wherein the trim codes correspond to voltage or current reference value adjustments that cause the DUTs to generate desired voltage or current reference values. The technique involves supplying respective trim codes simultaneously to the DUTs to cause them to generate... Agent: Edell, Shapiro & Finnan, LLC

01/10/2008 > patent applications in patent subcategories.

20080007248 - Non-invasive electric-filed-detection device and method: The invention relates to a device which is used for the non-invasive detection of an electric potential or field, of the spatial and/or the temporal derivatives thereof, in a medium with a linear or quadratic electrooptical effect. The inventive device comprises: an optical source which is used to illuminate at... Agent: Miller, Matthias & Hull

20080007247 - Filtering techniques to remove noise from a periodic signal and irms calculations: A signal filtering technique is designed to remove the effects of a periodic, low-frequency noise signal from a signal of interest. A signal waveform is sampled at different points of a number of consecutive periodic noise signal cycles and the collected samples are averaged to produce a corrected signal. The... Agent: Dority & Manning, P.A.

20080007249 - Precision, temperature-compensated, shielded current measurement device: A current measurement device using a Rogowski coil having a generally toroidally shaped core with flattened faces, a first winding in one direction, a second winding forming a return loop, and a temperature compensation and scaling network coupled to the coil. The core has concentric cavities and a rough surface... Agent: Cook, Alex, Mcfarron, Manzo, Cummings & Mehler Ltd

20080007250 - Shaped mri coil array: An MRI rf coil array is comprised of a large number of separate coil elements that are supported on a substrate that is shaped to the contour of the anatomy being imaged. The coil elements overlap each other to reduce mutual inductance and their location is determined by tiling the... Agent: Quarles & Brady LLP

20080007251 - Steering angle sensor: An apparatus for determining an angular position of a shaft, such as a steering column, comprises a coil assembly, a coil support, and a coupler element having a coupler angular position correlated with the angular position of the shaft. The coil assembly includes a transmitter coil and at least one... Agent: Gifford, Krass, Sprinkle,anderson & Citkowski, P.c

20080007252 - Sliding element with position indicator: The position indicator for a stick shaped sensor is received in a particularly annular sliding element, comprised of wear resistant, slide capable material as e.g. plastic, with an extended guidance length, which additionally comprises axial flow channels for the pressure medium in order to avoid local pressure buildup.... Agent: Head, Johnson & Kachigian

20080007253 - Flexible inductive sensor: An inductive sensor includes an inductor comprising conductive loops and at least one hinge mechanically coupling the loops. Operation of the hinge changes the position of the loops and causes a change in the inductance of the sensor. A sensor material may be oriented with respect to the loops so... Agent: 3m Innovative Properties Company

20080007255 - Encoded linear position sensor: Multiple magnetic sensing transducers can detect the position of a target. For example, a linear array of transducers can detect a target's linear position. A master and slave arrangement can reduce the cost and size of a system containing multiple magnetic sensing transducers. The master contains circuitry for voltage regulation... Agent: Bryan Anderson Honeywell International Inc.

20080007256 - Method and apparatus for monitoring rotary machines: A method of determining the amount of travel of a rotating component that includes a rotor shaft includes providing a self-contained magnetically-powered encoder. The encoder includes an encoder rotor that extends outward from a sealed housing such that a clearance gap is defined between the rotor and housing. The encoder... Agent: John S. Beulick (17851)

20080007257 - Steam generator mapping system: A method to determine deposits in a steam generator having the steps of creating a calibration standard having at least two rings of deposit material, subjecting the calibration standard to an eddy current signal, wherein an amplitude of the signal reflected from the calibration standard is used to obtain a... Agent: Kenyon & Kenyon LLP

20080007259 - Head coil arrangement for a magnetic resonance device: A head coil arrangement for a magnetic resonance device has a housing on or in which a number of coils are arranged, the housing having at least two housing parts that can be moved toward each other for adjustment to different head sizes.... Agent: Schiff Hardin, LLP Patent Department

20080007258 - Sensor for measuring magnetic flux: A sensor for measuring the magnetic flux of a sample material includes a first pick-up coil for generating a pick-up signal and a second pick-up coil for generating another pick-up signal. The first and second pick-up coils are arranged such that they have a substantially equal sensitivity with respect to... Agent: Bacon & Thomas, PLLC

20080007260 - Selective excitation in earth's magnetic field nuclear magnetic resonance well logging tool: A downhole nuclear magnetic resonance method for measuring a property of a formation, the method includes applying a polarizing magnetic field to the formation, the field including a spatial distribution of magnitude; selecting an investigation region of the formation; decaying the polarizing magnetic field according to a decay shape to... Agent: Cantor Colburn LLP- Baker Atlas

20080007263 - Magnetic resonance imaging apparatus: A magnetic resonance imaging apparatus includes an array coil in which a plurality of element coils are arranged to receive magnetic resonance signals from a subject, a calculation unit which calculates projection data for the element coils regarding an arrangement direction of the plurality of element coils on the basis... Agent: Nixon & Vanderhye, PC

20080007266 - Engine abnormal condition detecting device: In an ignition system that includes an ignition coil having a primary coil and a secondary coil, a switching element connected between the primary coil and a ground, a battery and a spark plug connected to one end of the secondary coil, an engine abnormal condition detecting device includes a... Agent: Nixon & Vanderhye, PC

20080007267 - Electrostatic thin film chemical and biological sensor: A chemical and biological agent sensor includes an electrostatic thin film supported by a substrate. The film includes an electrostatic charged surface to attract predetermined biological and chemical agents of interest. A charge collector associated with said electrostatic thin film collects charge associated with surface defects in the electrostatic film... Agent: Greer, Burns & Crain

20080007268 - Direct physical generator of justice or injustice: This is a machine that creates modulated oscillations of attracting electrostaticly charged bodies so as to directly create time-space forms of acceleration of force that are intended to be conscious, and more particularly, to be sensations of justice and injustice. Justice consists of sensations of intent that are satisfied in... Agent: Bret Cummings

20080007269 - Testing method and testing device for an integrated circuit: A testing method for an integrated circuit which has at least one ground terminal and multiple signal terminals, a signal potential being applied to a signal terminal and a ground potential being applied to the at least one ground terminal. A floating potential is applied to each further signal terminal.... Agent: Kenyon & Kenyon LLP

20080007270 - Solenoid test device: A solenoid test device includes a clock circuit, a control circuit, and an output port configured for coupling to two ends of a solenoid. The clock circuit generates a clock signal and sends it to the control circuit. The control circuit periodically and alternately couples one of the two ends... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20080007271 - Methods and apparatuses for measuring vcm bemf at a vcm control update rate: Devices and methods for performing dynamic sampling of a back electromotive force (BEMF) measurement are provided. A device has hardware, including a voice coil motor (VCM) for receiving a VCM command signal and a correction circuit, for obtaining the VCM command signal and a coil voltage measurement from the hardware,... Agent: Foley & Lardner

20080007272 - On-chip detection of power supply vulnerabilities: On-chip sensor to detect power supply vulnerabilities. The on-chip sensor employs a sensitive delay chain and an insensitive delay chain to detect power supply undershoots and overshoots without requiring external off-chip components. Undershoots and overshoots outside a user-defined threshold are detected. The undershoots and overshoots are indicated by a relative... Agent: Heslin Rothenberg Farley & Mesiti P.C.

20080007273 - Device for measuring moisture in substrate and health of hair: A sensor for measuring moisture content of a substrate, comprising: a coplanar waveguide; a directional coupler having a pair of generally parallel first and second strips defining a coupling gap therebetween; and a high frequency signal generator electrically coupled to said first strip and operable to couple power to said... Agent: The Procter & Gamble Company Intellectual Property Division - West Bldg.

20080007274 - Sensor using the capacitive measuring principle: The invention relates to a sensor which uses the capacitive measuring principle which is used to detect the proximity of a dielectric medium, preferably for detecting a human body part, which is used in an anti-pinching system. Said sensor comprises a capacitor and an evaluation electronic system. The variation of... Agent: Alston & Bird LLP

20080007276 - Position sensor and position sensing method: A position sensor comprises a first part having several electrically conductive elements, a second part having an electrical conductor, and holding means holding the first part and the second part together with the conductive elements and the conductor being spaced apart and permitting relative movement between the conductive elements and... Agent: Leydig Voit & Mayer, Ltd

20080007277 - Method for measuring the insulation resistance in an it network: A method for measuring the insulation resistance in an IT network. The IT network has a DC voltage intermediate circuit and at least one self-commutated converter having at least one first and one second power switch. The IT network also includes a measuring arrangement for measuring the intermediate circuit voltage... Agent: Cohen, Pontani, Lieberman & Pavane

20080007278 - High-frequency probe card and transmission line for high-frequency probe card: A high-frequency probe card includes a circuit board having signal circuits and grounding circuits, transmission lines each having a bi-wire structure including a first lead wire for transmitting high-frequency signal and a second lead wire connected to the grounding circuits, and signal probes. High-frequency test signal provided by a test... Agent: Browdy And Neimark, P.l.l.c. 624 Ninth Street, Nw

20080007281 - Method of forming probe card assembly: A probe card assembly has a probe contactor substrate having a plurality of probe contactor tips thereon and a probe card wiring board with an interposer disposed between the two. Support posts contacting the probe contactor substrate are vertically adjustable until secured by a locking mechanism which is coupled to... Agent: Pillsbury Winthrop Shaw Pittman LLP

20080007280 - Probe card: In the present invention, an inspection contact structure is attached to a lower surface side of a circuit board of a probe card. The inspection contact structure has a silicon substrate, and sheets attached to upper and lower surfaces of the silicon substrate. Each of the sheets is elastic and... Agent: Finnegan, Henderson, Farabow, Garrett & Dunner LLP

20080007279 - Probe cards: A probe card for testing IC circuits is provided that comprises a probe member for each IC contact that comprises a flexible membrane structure secured at two points to a reverse surface of a substrate. A contact means can also be provided, which can be a probe bump or a... Agent: Drinker Biddle & Reath Attn: Intellectual Property Group

20080007282 - Probe assembly: A probe assembly having a plurality of probes, each of which is secured to an anchor portion on a probe base plate, extends in a direction apart from the anchor portion through a fulcrum, has a tip at the front end thereof, and the tip is elastically deformable at its... Agent: Ingrassia Fisher & Lorenz, P.C.

20080007283 - Pin fixture for glue dispenser: A glue/adhesive delivery pin fixture (100) includes a top board (10), a support board (30), a bottom/output board (40), and a plurality of pins (50). The top board defines a gate (i.e., conduit) (14) and a plurality of glue runners (16) extending from one end of the gate. The support... Agent: PCe Industry, Inc. Att. Cheng-ju Chiang Jeffrey T. Knapp

20080007285 - Handler and method of testing semiconductor device by means of the handler: An object of the present invention is to provide a handler and a testing method thereof which enable efficient measurements on a plurality of semiconductor devices. An arm control unit 106 controls, for each of contact arms 101a and 101b, the timing of control for performing contact control for bringing... Agent: Steptoe & Johnson LLP

20080007284 - Methods and systems for semiconductor testing using reference dice: Methods and systems of semiconductor testing where reference dice and non-reference dice in a wafer and/or lot are tested differently. In one embodiment of the invention, geography, lithography exposure, other characteristics, performance and/or behavior are taken into account when selecting reference dice, thereby improving the likelihood that the response of... Agent: Nath & Associates, PLLC

20080007286 - Probe of under side of component through opening in a printed circuit board: A test device includes an element having a surface for contacting a first plane, and a probe having a free end positioned in a second plane. The element of the test having the surface to contact the first plane includes features for contacting a ground plane. The length of the... Agent: Schwegman, Lundberg, Woessner & Kluth, P.A.

20080007287 - Panel and test method for display device: A panel for a display device includes a display area and a peripheral area. The display area comprises a plurality of pixels each comprising a switching element and gate lines and data lines connected to the pixels. The peripheral area comprises a plurality of gate driving integrated circuit regions, a... Agent: Macpherson Kwok Chen & Heid LLP

RSS FEED for 20150611:
Integrate FreshPatents.com into your RSS reader/aggregator or website to track weekly updates.
For more info, read this article.

######

Thank you for viewing Electricity: measuring and testing patents on the FreshPatents.com website. These are patent applications which have been filed in the United States. There are a variety ways to browse Electricity: measuring and testing patent applications on our website including browsing by date, agent, inventor, and industry. If you are interested in receiving occasional emails regarding Electricity: measuring and testing patents we recommend signing up for free keyword monitoring by email.