2D Materials Characterization with nanoIR Spectroscopy

2D materials and nanophotonics provide an exciting area of materials research and development for a wide range of new applications. The nanoIR3-s scattering SNOM platform provides unique capabilities to characterize the nanoscale optical, chemical and material properties of a broad range of novel 2D and quantum materials. Applications include:

2D Metamaterials

Combine S-SNOM and AFM-IR to create remarkable new data: Complementary AFM-IR and Scattering SNOM images reveal, for the first time, the microscale origins of optical chirality on plasmonics structures. By accessing both the radiative (s-SNOM) and non-radiative (AFM-IR) information on plasmonics structures, unique and complementary plasmonic properties can be obtained. Khanikaev et al., Nat. Comm. 7, 12045 (‘16). Doi:10.1038/ncomms12045

Nano FTIR Spectroscopy

Ultrafast-broadband scattering SNOM spectroscopy probing molecular vibrational information. Laser interferogram of Polytetrafluoroethylene (PTFE) shows coherent molecular vibration in the form of free-induction decay in time domain (top). The highlighted feature in sample interferogram is due to the beating of symmetric and antisymmetric mode of C-F modes in the resulting the frequency domain (bottom left). Monolayer sensitivity of nano-FTIR is demonstrated on a monolayer pNTP (bottom right). Data courtesy of Prof. Markus Raschke, University of Colorado, Boulder, US.

s-SNOM Imaging of Multilayer Nylon and PE Sample

s-SNOM can be used to measured multi-layer polymeric films . Here absorption bands at 1640 and 1540 cm-1 were observed for nylon. Subsequent s-SNOM imaging at 1640 cm-1 showed contrast between the nylon layer and PE layer. Sample provided courtesy of DSM.