Abstract

Magneto‐optical methods involving only strip domain patterns are proposed for the measurement of characteristic length l, saturation magnetization 4πMs, and domain wall energy density σw, in thin uniaxial magnetic films. Determination of l requires measurement of film thickness and the spatial period of the strip domain pattern in zero applied field as previously proposed by Fowlis and Copeland, while 4πMs and σw follow from additional measurements of M/Ms vs H as a hysteresis loop. The results of calculations which are necessary to put the methods to use are presented in detail. Experimental results are included which indicate reasonable agreement with other methods currently in use. The present method is of greater accuracy and convenience in certain cases. The effects of finite uniaxial anisotropy are quantitatively considered and shown to change the results by 6% or less for materials of practical interest.