Advantages of this microscope

Total Internal Reflectance Microscopy (TIRFM)

Structured Illumination Microscopy (SIM) - a widefield technique in which a grid pattern is generated through interference of diffraction orders and superimposed on the specimen while capturing images. The grid pattern is shifted or rotated in steps between the capture of each image set. High-frequency information can be extracted from the raw data to produce a reconstructed image having a lateral resolution approximately twice that of diffraction-limited instruments and an axial resolution ranging between 150 and 300 nanometers.