The influences of the spacer-layer Ta on the structures and magnetic properties of NdFeB/NdCeFeB multilayer films are investigated via DC sputtering under an Ar pressure of 1.2 Pa. An obvious ( 00l) texture of the hard phase is observed in each of the films, which indicates that the main phase of the film does not significantly change with Ta spacer-layer thickness. As a result, both the remanence and the saturation magnetization of the magnet first increase and then decrease, and the maximum values of 4 pi M-r and H-cj are 10.4 kGs ( 1 Gs = 10(-4) T) and 15.0 kOe ( 1 Oe = 79.5775 A.m(-1)) for the film with a 2-nm-thick Ta spacer-layer, respectively, where the crystalline structures are columnar shape particles. The measured relationship between irreversible portion D(H) = Delta M-irr/2M(r) and H indicates that the nucleation field of the film decreases with spacer-layer thickness increasing, owing to slightly disordered grains near the interface between different magnetic layers.