Power Math for Power Circuits How Maple’s 3D capabilities helped solve the mystery of gate resistance on shoot through

Desktop Engineering, October 2006

Alan Elbanhawy, a director at Fairchild Semiconductor International, examined the effects of lumped and distributed gate resistance on the phenomenon of shoot through (also known as cross conduction) in synchronous buck.

He concludes: “Using Maple allowed us to investigate the interaction of all the important parameters in 3D representations that helped us understand the extent of the interdependencies. The 3D capability offers a very powerful visualization tool of the complete results. To achieve the same results using any other numerical simulation environment requires enormous amount of batch simulation, data compiling, and graphing.”