Applications include ore characterization, process optimization, remediation and the search for precious metals and rare earths. TESCAN’s unique technology is based on a completely integrated EDX system which performs full spectrum acquisition at very fast scan speeds. The level of hardware integration of SEM and EDX allows unprecedented acquisition speeds for fully automated data collection, resulting in fast, accurate and reliable results.

The TESCAN TIMA is based either on MIRA Schottky field emission or VEGA thermal emission scanning electron microscope. Special VEGA column design with permanent gun high-vacuum and the isolation valve significantly increases emission stability and tungsten filament lifetime. The system is available in high-vacuum version as the standard, low-vacuum version as an option.