Abstract

The morphology and electrical properties of orthorhombic β-WO3 nanoflakes with thickness of ~7 to 9 nm were investigated at the nanoscale with a
combination of scanning electron microscopy (SEM), energy dispersive X-ray spectroscopy
(EDX), current sensing force spectroscopy atomic force microscopy (CSFS-AFM, or PeakForce
TUNA™), Fourier transform infra-red absorption spectroscopy (FTIR), linear sweep voltammetry
(LSV) and Raman spectroscopy techniques. CSFS-AFM analysis established good correlation
between the topography of the developed nanostructures and various features of WO3 nanoflakes synthesized via a two-step sol-gel-exfoliation method. It was determined
that β-WO3 nanoflakes annealed at 550°C possess distinguished and exceptional thickness-dependent
properties in comparison with the bulk, micro and nanostructured WO3 synthesized at alternative temperatures.