Verigy Issues Call for Papers for VOICE 2008
Verigy (NASDAQ: VRGY), a premier semiconductor test company, has issued the call-for-papers for VOICE 2008, the third annual conference for Verigy customers and partners using the V93000 SOC Series and the V5000 Series of memory testers. VOICE 2008 will be held Sept. 23 – 24, 2008, in San Jose, Calif.

IP-XACT 1.4 Supports IP Transactional Modeling, Features TGI
The SPIRIT Consortium, a global non-profit organization focused on establishing multi-faceted IP/tool integration standards that drive sustainable growth in electronic design, has added 2 key features to its IP-XACT specification: support for IP using transactional modeling styles and a new tight generator Interface (TGI).

Atrenta Introduces SpyGlass-DFT DSM for Deep Submicron Testing
Atrenta Inc. announced an addition to its SpyGlass® design analysis platform – SpyGlass-DFT DSM. The new SpyGlass-DFT DSM solution is the industry’s first tool which will accelerate design turnaround times by identifying timing closure issues caused by at-speed testing – early at RTL.

Actel Fusion PSC Features Enhanced Calibration Capability
Enabling lower system power and higher accuracy for intelligent system management and industrial control applications, Actel Corporation (Nasdaq: ACTL) announced an enhanced software-based calibration capability for its mixed-signal Fusion programmable system chips (PSCs).

Pentek Rolls Out Model 7150 High Speed Data Converter
Pentek, Inc., one of the pioneers of VME board-level technology, released its Model 7150 High Speed Data Converter, featuring four 200 MHz, 16-bit A/Ds and a pair of high-performance Xilinx Virtex-5 FPGAs. The 7150 connects directly to the RF or IF inputs of a communications system,.

International Rectifier Introduces IR3502 XPhase Control IC
International Rectifier, IR (NYSE:IRF), a leader in power management technology, introduced the IR3502 XPhase control IC for Intel® VR11.0 and VR11.1 processors. The IR3502 provides overall system control and interfaces with any number of IR’s XPhase phase ICs, each driving and monitoring a single phase.