Critical state measurements of single and binary thin film systems
have been measured as a function of transport current density, magnetic field,
temperature, and degree of annealing. Results are interpreted in terms of
the present understanding of the mixed state in thin films. Studies of vorteK
guiding, the Hall angle in the mixed state, and ac versus dc measurement methods
are reported. An unusual fluctuation effect in the resistive superconducting
transition in many of our films is reported. The failure of the Aslamazov-
Larkin theory to fit our resistive transition data is noted and compared with
other recent experimental data on thin films.