Welcome Letter

Inverse problems arise from the need to interpret indirect measurements. Such situations are common in many application areas such as medical imaging, nondestructive testing, underground prospecting, astronomical imaging, remote sensing, image processing, and data mining. Scientific research of inverse problems is multidisciplinary and involves for example mathematics, physics, engineering and signal processing.

The Applied Inverse Problems (AIP) conference series is the premier scientific meeting of the field, organized by Inverse Problems International Association (IPIA) every two years. The upcoming conference is the ninth in the series. Previous venues have been: