Abstract

We review the use of atomic force microscopy (AFM) in liquids to measure oscillatory solvation forces. We find solvation layering can occur for all the liquids studied (linear and branched alkanes) but marked variations in the force and dissipation may arise dependent on: a) the temperature, b) the tip shape/radius of curvature, and c) the degree of molecular branching. Several findings (e.g., the strong temperature dependence in measured solvation forces, solvation oscillations using branched molecules) differ from those observed using the Surface Force Apparatus, because of the nanoscale area probed by AFM. Conduction AFM is used to explore how liquid is squeezed out of the tip sample gap, and enables the change in contact area of the tip sample junction to be monitored and compared to mechanical models. We find elastic models provide a good description of the deformation of ordered, solid-like solvation layers but not disordered, liquid-like layers. (C) 2010 The Japan Society of Applied Physics