Diffraction Grating Solutions

Diffraction efficiency and dynamic range are critical parameters in many spectrometric instrument designs. Understanding why a particular reflective or transmission diffraction grating may have small yet necessary performance differentiation for instrument optimization success can be critical. Optometrics Corporation has added advanced scanning Atomic Force Microscopy (AFM) within their metrology capabilities, enabling new benchmarks for nano-scale measurement, characterization, and manipulation for diffraction grating design optimization. The addition of this AFM enhances the exceptional support and services offered to their OEM and research customers. The AFM is one of several precision manufacturing and engineering metrology tools utilized by Optometrics to understand why a grating behaves the way it does.

Typical uses include the confirmation of size, shape, and angle of the grooves on a grating while preparing to produce a new master, and also as a forensic tool to help discover why a grating may be performing in a slightly unexpected way. In addition to the AFM, Optometrics assures consistent quality using advanced metrology tools including:

This process understanding has established Optometrics as a leader in grating-to-grating performance consistency. Continuous investment and R&D into the control of variables which cause part-to-part deviation enables Optometrics to provide realistic guidance of what is achievable. Several precision ruling engines and holographic exposure laboratories support the design and production of optimized Master Diffraction Gratings. These ruling engines include real-time interferometric control for extreme groove frequency accuracy. Hundreds of Master Gratings are held in inventory for immediate selection for your replicated gratings, and production capacity exceeds 1,000 precision diffraction gratings daily. Contact Dynasil Optometrics to discover the mysteries of your diffraction grating optimization needs.

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