Call For Papers

=== ABOUT DFT ===
DFT is an annual Symposium providing an open forum for presentations in the field of defect and fault tolerance in VLSI and nanotechnology systems inclusive of emerging technologies. One of the unique features of this symposium is to combine new academic research with state-of-the-art industrial data, necessary ingredients for significant advances in this field. All aspects of design, manufacturing, test, reliability, and availability that are affected by defects during manufacturing and by faults during system operation are of interest.

=== PAPER SUBMISSIONS ===
Prospective authors are invited to submit original and unpublished contributions. Two types of submissions are possible: (i) regular papers (6 pages), and (ii) short papers (4 pages). Both types will be included in the symposium proceedings and should adhere to the IEEE conference template, 2-columns style (available on conference web site), and submitted as a PDF file, electronically. Please refer to the symposium web page for updated information.

=== CALL FOR SPECIAL SESSIONS ===
Proposals for Special Sessions are also invited. For more information, visit symposium website and see the specific call.

=== PAPER PUBLICATION ===
Proceedings will be published by the IEEE Computer Society and will appear in the Digital Library. All papers will be considered for the DFT 2018 Best Paper Award. Furthermore, selected papers will be considered for a special issue/section of an archival journal.

=== VENUE ===
The symposium is going back to North America on its 31st edition and will take place in the USA at the Wyndam Grant Hotel, Chicago Waterfront, on the south end of the Magnificent mile, on Chicago river. The Chicago metropolitan area has nearly 10 million people and is the third-largest in the United States. Chicago has often been called a global architecture capital and is considered one of the most important business centers in the world.