The proper resolution will be ensured by SEM column improvements, a new SPM design and OM type of Raman microscopy in SEM. Implementation of nano-scale 3D imaging, manipulation and non-destructive optical analysis in one universal instrument will represent a real breakthrough allowing simple operations or analyses in nanotechnology that are problematic or impossible nowadays.

The fully functional prototype of the new tool will demonstrate its unique modularity, resolution, data acquisition and simplification of working environment. Direct application of this multimodal tool is expected in many industrial quality controls and in R&D sectors (e.g. photovoltaics, plasmonics and cell-nanoparticle interaction).