The Akiyama-probe has been developed in cooperation with the Institute of Microtechnology (IMT) at the University of Neuchâtel for the NANOSENSORS™ brand that is specialized on cutting edge scanning probes for Atomic Force Microscopy (AFM) applications. The product is called the Akiyama-probe or A-probe to honour its inventor Dr. Terunobu Akiyama. It is a novel self-sensing and - actuating probe based on a quartz tuning fork combined with a micromachined cantilever for dynamic mode AFM.

It features a symmetrical arrangement of a U-shaped silicon cantilever attached to the two prongs of a quartz tuning fork. The tuning fork serves as an oscillatory force sensor that governs the tip vibration frequency as well as the amplitude and ensures a high mechanical Q-factor. The force constant of the probe is determined by the cantilever and can be adjusted independently from the resonance frequency.

The Akiyama-probe requires neither optical detection, nor an external shaker. A-Probe occupies only a small volume above the sample. These features make it very attractive for creating a new generation of scanning probe microscopy (SPM) instruments.

Up to now the probe was only available to and via AFM manufacturers who sell instruments with A-probe capability. Starting November 2008 the Akiyama-probe will also be available to end-customers via our regular distribution channels. For this occasion NANOSENSORS™ has dedicated a complete website www.akiyamaprobe.com which offers ample information on this very special product.