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Abstract

High-sensitivity, automatic grating interferometry (AGI) system is shown as the effective experimental tool for the material microstructure studies. Two interferometers, laboratory AGI for static and portable AGI for dynamic loading of the specimen are presented. The full methodology of a sample preparation, measurement and data analysis process with special attention paid to combining the information about grain borders and displacement/strain fields distribution is described. The experimental displacement fields obtained at the borders between grains in bicrystal, tricrystal, and polycrystal aluminum alloy are presented. The strain maps of tricrystal sample are presented and discussed.

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Journal of Applied Remote SensingJournal of Astronomical Telescopes Instruments and SystemsJournal of Biomedical OpticsJournal of Electronic ImagingJournal of Medical ImagingJournal of Micro/Nanolithography, MEMS, and MOEMSJournal of NanophotonicsJournal of Photonics for EnergyNeurophotonicsOptical EngineeringSPIE Reviews