Scanning Electron Microscopy

This image of a partially reacted rubidium cluster, which appeared on the cover of the Journal of Applied Physics, was taken on SMIF's scanning electronic microscope (SEM) by Chris Flower—a Duke undergraduate.

The Shared Materials Instrumentation Facility (SMIF) at Duke University is an interdisciplinary, shared resource open to Duke University researchers from all schools and departments—as well as to users from other universities, government laboratories and industry.