DesignCon 2019 Presentation Viewer

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S-parameter measurement and fixture de-embedding are critical tasks especially when measurements and models are shared across multiple teams. In this session we will present a review of best practices for VNA measurements and fixture de-embedding. We will also present the results of a study performed in the context of the IEEE P370 standard analyzing the variation of results across multiple teams for the measurement and fixture de-embedding of the same set of PCB test coupons.

Takeaway

Best practices for the reliable and repeatable measurement of S-parameters with a VNA and fixture de-embedding.