Magnetic Force Microscopy (MFM)

High Resolution and High Sensitivity Imaging of Magnetic Properties

Our MFM mode measures the magnetic variations over a sample surface by detecting the interaction between a magnetized cantilever and sample surface. The cantilever measures surface topography on the first scan, then lifts and follows either the stored surface topography (lift mode, available only in selected countries) or a constant distance (or constant height) at a fixed height above the sample surface.

High Resolution and High Sensitivity Imaging of Magnetic Properties

Chemical Force Microscopy (CFM)

CFM measures the chemical interactions between functionalized tips and sample to determine the chemical nature of surfaces and facilitate studies of chemical bonding enthalpy and surface energy. Tips are typically gold-coated and functionalized with R-SH thiols, R being the functional groups of interest such as -CH, -COOH, -NH, and -OH.

Electrochemical Microscopy (EC-AFM, EC-STM)

In EC-STM/AFM, the nanoscale structures of electrochemical reactions on the electrode surface can be observed. Users typically perform voltammetry and corrosion experiments using an electrochemistry cell and a choice of potentiostat/galvanostat depending on the electrochemical application of interest.