Power and Energy

Thin Film

Amorphous Silicon (a-Si)

Cadmium Telluride (CdTe)

Gallium Selenide (CIGS)

Polymer-Based

Silicon

Crystalline Silicon (c-Si) (Mono & Poly)

Amorphous Silicon (a-Si)

Consistency and precision in the thermal interface can be the difference between exceptional performance and early failure. Sonoscan's C-SAM® acoustic microscopes can precisely measure material thickness and bonding consistency in a solar application, detecting voids, delaminations and imperfections in bond materials before problems occur.

Tap or roll over the photos to see how they look with our instruments!

Solar Cell Cracking

A large crack is observed as an irregular dark feature propogating along the right side of this solar panel.

Solar Cell Bussbar

The bright white features along the bussbar represent delaminations in the attach between the bussbar and solar panel.

Thin Film Solar Cell

A missing interconnect can be seen in the lower left of the grid, along with delamination of the layers.

Solar Concentrator

The red areas indicate gaps in the cell-to-solder interface, which could cause loss of efficiency or failure of the structure.