(circuit design) A technique used to increase the controllability and observability of a logic circuit by incorporating “scan registers” into the circuit. Normally these act like flip-flops but they can be switched into a “test” mode where they all become one long shift register. This allows data to be clocked serially through all the scan registers and out of an output pin at the same time as new data is clocked in from an input pin. Using this technique, the state of certain points in the circuit can be examined and modified at any time by suspending normal operation and switching to test mode. If the scan path is placed adjacent to the circuit’s input and output pins then this is known as “boundary scan”. (1995-02-14)

(circuit design) A digital logic circuit which can act either as a flip-flop or as a serial shift register and which is used to form a scan path. The most common design is a multiplexed flip-flop: ___ ____ normal in –| \ | | | |——|D Q|—- normal/scan output scan in —-|___/ mux | | […]

noun, Prosody. 1. the metrical analysis of verse. The usual marks for scansion are ˘ for a short or unaccented syllable, ¯ or · for a long or accented syllable, ^ for a rest, | for a foot division, and ‖ for a caesura or pause. noun 1. the analysis of the metrical structure of […]

adjective, scanter, scantest. 1. barely sufficient in amount or quantity; not abundant; almost inadequate: to do scant justice. 2. limited; meager; not large: a scant amount. 3. barely amounting to as much as indicated: a scant two hours; a scant cupful. 4. having an inadequate or limited supply (usually followed by of): scant of breath. […]

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