Abstract

(CZTSe) thin films are grown by coevaporation. Composition depth profiles reveal that a Zn rich phase is present at the CZTSe/Mo interface. Raman measurements on the as grown films are used to study the near surface region and the CZTSe/Mo interface, after mechanically removing the thin film from the Mo coated glass. These measurements provide direct experimental evidence of the formation of a ZnSe phase at the CZTSe/Mo interface. While the Raman spectra at the surface region are dominated by CZTSe modes, those measured at the CZTSe/Mo interface are dominated by ZnSe and modes.

Received 29 October 2010Accepted 10 January 2011Published online 09 March 2011

Acknowledgments:

The authors acknowledge the use of the SEM and XRD apparatus through the CRP Gabriel Lippmann (Luxembourg) and funding through TDK Corporation in the framework of the TDK Europe Professorship and FNR Luxembourg via the research Project No. C08/MS/20 (KITS).