The KNI is pleased to announce the arrival of our newest piece of equipment: an Atomic Force Microscope (AFM).

The AFM is one of the foremost tools for imaging, measuring, and manipulating matter at the Nano scale. The information is gathered by "feeling" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable the very precise scanning. In more advanced versions, currents can be passed through the tip to probe the electrical conductivity or transport of the underlying surface. Atomic force microscopy will measure a number of different forces depending on the situation and the sample that you want to measure.

Thanks to funding from the Moore Foundation, the KNI was able to purchase a Bruker Dimension Icon AFM with ScanAsyst®.

ScanAsyst® dramatically simplifies imaging in both air and liquids by automatically optimizing the main imaging parameters, including set point, gains, and scan rate. Ease of operation through multi-tiered software assures that novice to sophisticated user needs are met.

If you are currently a member of the KNI and would like to be trained on the AFM, please contact Bud Johnson.

If you are not currently a member of the KNI, but would like to get access to the AFM and other instruments within the KNI cleanroom facility, send an email to: kni@caltech.edu.