Inventory Number: 39319

Retail (USD):
$10,000.00

Now (USD):
$10,000.00

Wyko BP2000W Bump Measurement Profiling System. The right inspection tool for flip-chip process control. Repeatably measures solder bump heights, from 150 micro-meters or more for standard flip-chip bumps down to a few microns for under-bump metalization pads, as well as provides volume data on all bump sizes. Non-contact 3-D data on all size bumps over the entire wafer. The system calculates bump height, width, volume and coplanarity. Automatically detects bump position, solder bridges, and missing and extra solder bumps, with prominent display of pass/fail results and position statistics at the bump, die,wafer and lot level. Powerful measurement analysis, generating output as 2-D cross sections, contour plots, bearing ratio plots, or 3-D images. A built in Wizard allows quick measurement set-up. Sold As Is.

Inventory Number: 46204

Retail (USD):
$12,500.00

Now (USD):
$12,500.00

Zygo SXM300 Multimode Scanning Probe Microscope. The Magnascope SXM300 is a multimode probe microscope that measures sub-micron features to near angstrom-level resolution. It is designed for critical-dimension measurements of height, width, roughness and sidewall angles of 300mm wafers and masks of up to 9 in x 9 in. Sold As Is.

Inventory Number: 58267

Retail (USD):
$950.00

Now (USD):
$950.00

Gaertner L2W16D.830 Multiwavelength 200mm Ellipsometer. Has a software disk but no cables or controls. Missing computer and stage driver. Two wavelength ellipsometers use additional laser sources to analyze difﬁcult ﬁlms. 8 in. dia. stage with motorized stage, no controller. Sold As Is with 30 day ROR.

Inventory Number: 62025

Retail (USD):
$39,000.00

Now (USD):
$39,000.00

Nanometrics Nanospec 6100 Automated Film Thickness Measurement System. Tabletop film thickness measurement and mapping tool. Designed to measure the thickness of films deposited on various substrates including those used in semiconductor and magnetic head fabrication. Uses non-contact spectroreflectometry on sites as small as 10 micrometers. A computer sample stage and a robust autofocus system allows the automatic generation of film thickness uniformity maps. 115V, 50/60 Hz, 5A.

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