Sample Enviroment for SKADI, ESS Lund

Details: In the framework of the development of the European Spallation Source (ESS) in Lund a
sample environment combining in-situ dynamic light scattering (DLS), diffusing wave spectroscopy (DWS)
and small angle neutron scattering (SANS) will be developed using an universal carrier system.
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Atomic Force Microscope

Details: The FlexAFM from Nanosurf is an atomic force microscope that can measure the
topography of surfaces with nanometer resolution. The AFM supports several contact and non-contact
modes to measure the topography, amplitude and phase. The maximum image size is 80x80 µm.

Ellipsometry

Details: The SE 400adv from Sentech is a laser ellipsometer with a sabilized HeNe laser.
The ellipsometer can be used to measure the thickness of a single layer film with a precision of
up to 0.1 Å. For multiple angle measurements the angle of incidence can be varied from 40° - 90°
in 5° steps. Furthermore the ellipsometer can be mounted with a liquid cell.