License

Rigorous coupled wave analysis (RCWA) based on the scattering matrix (SM) algorithm is one of the most powerful tools for the electromagnetic simulation of patterned multilayer structures.
PPML - RCWA is a project which implements the SM-RCWA, based on the formalisms of [a-d].

Three groups of functions are available: one is for 1-d patterns under TM polarization, another is for 1-d anisotropic (biaxial) patterns, the third for certain 2-d patterns.

For 1-d TM patterns, currently available are functions for the calculation of
i) intensity reflectance, transmittance, and layer-by-layer absorbance
ii) the full 2x2 scattering matrix
iii) the E and S fields inside the structure

The proper factorization rules [c,d] make the code extremely performing, and fully suitable for the simulation of metal components (plasmonic gratings).
Out-of-plane uniaxial materials can be treated.

For 1-d biaxial media, the following function is available:
i) amplitude, phase and polarization of transmitted diffracted waves

For 2-d patterns, currently available are functions for the calculation of
i) polarization-resolved reflection coefficients

Allowed unit cell geometries are rectangular and L-shaped inclusions (see the Manual for details). The proper factorization rules are implemented [c,d], thus allowing for a fast convergence even in presence of metallic inclusions.

The present code is distributed for free, but we kindly ask you to cite its source and, if applies, the publications below.

Several publications are based on PPML 1.2 (see below). For some of them, you can find the corresponding tutorial in the software package.

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Publications based on PPML 1.2