. Scan or image signal processing arrangements specially adapted for investigating the presence of flaws or contaminates, e.g., for scan signal adjustments, for detecting different kinds of defects, for compensating for structures (GO1N 21/88)

Any foreign patents or non-patent literature from subclasses that have been classified have been transferred directly to FOR Collection listed below. These collections contain ONLY foreign patents or non-patent literature. The parenthetical references in the Collection titles refer to the abolished subclasses from which these Collections were derived

FOR 100

INSPECTION FOR FLAWS OR IMPERFECTIONS (356/237)

FOR 101

. Cloth or thread inspection (356/238)

FOR 102

. Passing light through a transparent or translucent article (356/239)

FOR 103

. . Containers (e.g., bottles) or contents (356/240)

FOR 104

. Bore inspection (e.g., borescopes) (356/241)

FOR 105

THREAD COUNTING (356/242)

FOR 106

STANDARDS (356/243)

FOR 107

BY LIGHT INTERFERENCE (E.G., INTERFEROMETERS) (356/345)

FOR 108

. Spectroscopy (356/346)

FOR 109

. Holography (356/347)

FOR 110

. . For optical configuration (356/348)

FOR 111

. With light beams of different frequency (e.g., heterodyning) (356/349)