Table Of Contents

PXIe-5170 Specifications

Definitions

Warranted specifications describe the performance of a model under stated operating conditions and are covered by the model warranty.

Characteristics describe values that are relevant to the use of the model under stated operating conditions but are not covered by the model warranty.

Typical specifications describe the expected performance met by a majority of the models.

Nominal specifications describe parameters and attributes that may be useful in operation.

Specifications are Warranted unless otherwise noted.

Conditions

Specifications are valid under the following conditions unless otherwise noted.

All vertical ranges

Sample rate set to 250 MS/s

Onboard Sample Clock locked to onboard Reference Clock

Calibration IP is used properly when using LabVIEW Instrument Design Libraries for Reconfigurable Oscilloscopes (instrument design libraries) to create FPGA bitfiles. Refer to the NI Reconfigurable Oscilloscopes Help for more information about the calibration API.

Warranted specifications are valid under the following conditions unless otherwise noted.

Ambient temperature range of 0 °C to 45 °C

The PXIe-5170 module is warmed up for 15 minutes at ambient temperature. Warm-up begins after the chassis is powered, the device is recognized by the host, and the ADC clock is configured using either instrument design libraries or the NI-SCOPE device driver.

External calibration cycle is maintained

The PXI Express chassis fan speed is set to HIGH, the foam fan filters are removed if present, and the empty slots contain PXI chassis slot blockers and filler panels. For more information about cooling, refer to the Maintain Forced-Air Cooling Note to Users available at http://www.ni.com/manuals.

External calibration is performed at 23 °C ± 3 °C

Typical specifications are valid under the following conditions unless otherwise noted.

Voltage Levels

Accuracy

Caution

Electromagnetic interference can adversely affect the measurement accuracy of this product. The coaxial channel inputs of this device (CH 0 to CH 7) are not protected for electromagnetic interference. As a result, this device may experience reduced measurement accuracy or other temporary performance degradation when connected cables are routed in an environment with radiated or conducted radio frequency electromagnetic interference. To limit radiated emissions and to ensure that this device functions within specifications in its operational electromagnetic environment, take precautions when designing, selecting, and installing measurement probes and cables.

Roundup(Roundup((Coerced number of samples + Number of samples per sample word) / Number of samples per memory word) * Number of samples per memory word + 3 * Number of samples per memory word) * Bytes Per Sample * Number of channels

Memory Sanitization

For information about memory sanitization, refer to the letter of volatility for your device, which is available at ni.com/manuals.

FPGA

FPGA support

Xilinx Kintex-7 XC7K325T FPGA

Xilinx Kintex-7 XC7K325T FPGA Resources

Slice registers

407,600

Slice look-up tables (LUT)

203,800

DSPs

840

18 Kb block RAMs

890

Note

Note that some of these resources are consumed by the logic necessary to operate the device and integrate with software, and are thus out of the control of users.

Calibration

External Calibration

External calibration corrects for gain, offset, and timing errors at all input ranges.

All calibration constants are stored in nonvolatile memory.

Self-Calibration

Self-calibration is done on software command. The calibration corrects for intermodule synchronization errors.

Calibration Specifications

Software

Driver Software

This device was first supported in LabVIEW Instrument Design Libraries for Reconfigurable Oscilloscopes 14.0 and NI-SCOPE 15.1. NI-SCOPE is an IVI-compliant driver that allows you to configure, control, and calibrate the device. NI-SCOPE provides application programming interfaces for many development environments.

Related Topics

Application Software

NI-SCOPE provides programming interfaces, documentation, and examples for the following application development environments:

LabVIEW

LabWindows™/CVI™

Measurement Studio

Microsoft Visual C/C++

.NET (C# and VB.NET)

LabVIEW Instrument Design Libraries for Reconfigurable Oscilloscopes allows the use of the LabVIEW FPGA Module to customize the device FPGA to create application-specific instrument designs.

Interactive Soft Front Panel and Configuration

The NI-SCOPE Soft Front Panel (SFP) allows interactive control of the PXIe-5170.

Interactive control of the PXIe-5170 was first available in NI-SCOPE SFP version 15.1. The NI-SCOPE SFP is included on the instrument design libraries or NI-SCOPE media.

NI Measurement Automation Explorer (MAX) also provides interactive configuration and test tools for the PXIe-5170. MAX is included on the NI-SCOPE media.

TClk Specifications

You can use the NI TClk synchronization method and the NI-TClk driver to align the Sample clocks on any number of supported devices, in one or more chassis. For more information about TClk synchronization, refer to the NI-TClk Synchronization Help, which is located within the NI High-Speed Digitizers Help. For other configurations, including multichassis systems, contact NI Technical Support at ni.com/support.

Intermodule Synchronization Using NI-TClk for Identical Modules

Synchronization specifications are valid under the following conditions:

All modules are installed in one PXI Express chassis.

The NI-TClk driver is used to align the Sample clocks of each module.

All parameters are set to identical values for each module.

Modules are synchronized without using an external Sample Clock.

All filters are disabled.

Note

Although you can use NI-TClk to synchronize non-identical SMC-based modules, these specifications apply only to synchronizing identical modules.

Power

Note

Power consumed depends on the FPGA image and driver software used. Specifications for instrument design libraries reflect the performance of a device using the FPGA image from the Multirecord Acquisition sample project. Maximum power consumption occurs at highest operating temperature.

Electromagnetic Compatibility

This product meets the requirements of the following EMC standards for electrical equipment for measurement, control, and laboratory use:

EN 61326-2-1 (IEC 61326-2-1): Class A emissions; Basic immunity

EN 55011 (CISPR 11): Group 1, Class A emissions

EN 55022 (CISPR 22): Class A emissions

EN 55024 (CISPR 24): Immunity

AS/NZS CISPR 11: Group 1, Class A emissions

AS/NZS CISPR 22: Class A emissions

FCC 47 CFR Part 15B: Class A emissions

ICES-001: Class A emissions

Note

In the United States (per FCC 47 CFR), Class A equipment is intended for use in commercial, light-industrial, and heavy-industrial locations. In Europe, Canada, Australia, and New Zealand (per CISPR 11), Class A equipment is intended for use only in heavy-industrial locations.

Note

Group 1 equipment (per CISPR 11) is any industrial, scientific, or medical equipment that does not intentionally generate radio frequency energy for the treatment of material or inspection/analysis purposes.

CE Compliance

This product meets the essential requirements of applicable European Directives, as follows:

2014/35/EU; Low-Voltage Directive (safety)

2014/30/EU; Electromagnetic Compatibility Directive (EMC)

Online Product Certification

Refer to the product Declaration of Conformity (DoC) for additional regulatory compliance information. To obtain product certifications and the DoC for this product, visit ni.com/certification, search by model number or product line, and click the appropriate link in the Certification column.

Environmental Management

NI is committed to designing and manufacturing products in an environmentally responsible manner. NI recognizes that eliminating certain hazardous substances from our products is beneficial to the environment and to NI customers.

For additional environmental information, refer to the Minimize Our Environmental Impact web page at ni.com/environment. This page contains the environmental regulations and directives with which NI complies, as well as other environmental information not included in this document.

Waste Electrical and Electronic Equipment (WEEE)

EU Customers

At the end of the product life cycle, all NI products must be disposed of according to local laws and regulations. For more information about how to recycle NI products in your region, visit ni.com/environment/weee.

1 Signals exceeding the maximum input overload may cause damage to the device.

2 Verification of these specifications requires the DC Adjustment Device Temperature (°C) value. If you are using version 14.0 of the software, visit ni.com/info and enter the Info Code exxpmp for information on how to read this value. Otherwise, use instrument design libraries or NI-SCOPE to read the value.

3 When the reading from the Device Temperature sensor is within ±10 °C of the DC Adjustment Device Temperature (°C) value.

4 When the reading from the Device Temperature sensor is within ±38 °C of the DC Adjustment Device Temperature (°C) value. This increased temperature span encompasses the majority of temperature differences between the last external calibration environment and the operating environment.

Coerced number of samples is the number of pre-trigger samples rounded up to the next multiple of the number of samples per sample word + number of post trigger samples rounded up to the next multiple of the number of samples per sample word .

21 Warm-up begins after the chassis is powered, the device is recognized by the host, and the device is configured using the instrument design libraries or NI-SCOPE. Running an included sample project or running self-calibration using NI-MAX will configure the device and start warm-up.

22 Caused by clock and analog path delay differences. No manual adjustment performed. Tested with a NI PXIe-1082 chassis with a maximum slot-to-slot skew of 100 ps. Valid within ±1 °C of self-calibration.

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