XRF Analyser

X-100

The X-100 is the same hardware platform as the X-200, except with calibration and software omitted for certain element/app combinations. For the alloy app, the X-100 excludes Mg, Al, Si, P and S. For exploration and environmental, the X-100 excludes Mg, Al, Si, P, S, Cl, K, and Ca. For other applications, in general, the X-100 hardware is not configured for elemental analysis below atomic number 20 (Ca).

The X-100 does feature the same state of the art X-ray tube and silicon drift detector as the X-200. It is the ideal configuration for operators that want high performance for transition metals (Sc and higher), precious metals and heavy metals. As such it is widely used for many alloy applications, base metal exploration and mining, and heavy metal contamination or analysis in a wide variety of sample types. The LOD and precision data stated above for X-200s applies to the X-100 for the applicable elements.

Also available is the SciAps Empirical App for users that want to test other types of materials and generate their own calibration models. Analysers may be factory calibrated with fundamental parameters, Compton Normalization (EPA Method 6200), or user defined empirical calibrations.

Applications

Offers high speed and precision and excellent limits of detection on transition metals (base metals) and heavy metals, SDD technology.

Test SS, high temps, red metals with speed, precision comparable to top end competing brands, but NOT analyse elements Mg, Si, Al, P and S.

Perfect for locations requiring the speed and precision of an SDD detector, but with no need for 2 beam, light element analysis.