Precision Instruments

ProChek™ Semiconductor Reliability Characterization - This compact, precision system extracts semiconductor parameters from deep submicron parameters faster and more cost-effectively than any other method. Process parameters include TDDB, HCI, stress migration, NBTI, PBTI and others.Q-Star Test - This line of precision current measurement instruments has been adopted world-wide by over 70 firms involved in characterization and manufacturing of ICs across a broad range of electronics applicationsSIA Family of Signal Integrity Analyzers - General purpose Complete analysis of random, deterministic and total jitter, modulation, amplitude, Rise and fall times, amplitude, frequency, and pulse widths on clock signals up to 15GHzSSA Signal Source Analyzers - Speak the language of Phase Noise and more. This low cost, easy to use instrument lets you measure in three domains: Frequency, Amplitude and Time.

This line of precision current measurement instruments has been adopted world-wide by over 70 firms involved in characterization and manufacturing of ICs across a broad range of electronics applications. A wide array of product capabilities and design services are available.For more information on Q-Star Test products