A. Zigler
The Hebrew University of Jerusalem, The Racah Institute of Physics, Jerusalem, Israel

Electro-optic sampling (EOS) based temporal diagnostics allows to precisely measure the temporal profile of electron bunches with resolution of about 50 fs in a non-destructive and single-shot way. At SPARC_LAB we adopted the EOS in very different experimental fields. We measured for the first time the longitudinal profile of a train of multiple bunches at THz repetition rate, as the one required for resonant Plasma Wakefield Acceleration (PWFA) in a single-shot and non-intercepting way. By means of the EOS we demonstrated a new hybrid compression scheme that is able to provide ultra-short bunches (<90 fs) with ultra-low (<20 fs) timing-jitter relative to the EOS laser system. Furthermore, we recently developed an EOS system in order to provide temporal and energy measurements in a very noisy and harsh environment: electron beams ejected by the interaction of high-intensity (hundreds TW class) ultra-short (35fs) laser pulses with solid targets by means of the so-called Target Normal Sheath Acceleration (TNSA) method.