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Abstract

Here we describe a method to partition scan chains into multiple scan groups, each controlled by independent scan enable signal, to achieve higher delay fault coverage using broadside scan test. The proposed technique can be easily adopted by existing design methodologies and can be used for implementation in industrial designs. Experimental results obtained from the implementation of this technique on industrial designs are also presented.

Country

India

Language

English (United States)

This text was extracted from a Microsoft Word document.

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This is the abbreviated version, containing approximately
33% of the total text.

Here we describe a method to
partition scan chains into multiple scan groups, each controlled by
independent scan enable signal, to achieve higher delay fault coverage using
broadside scan test. The proposed technique can be easily adopted by existing design
methodologies and can be used for implementation in industrial designs. Experimental
results obtained from the implementation of this technique on industrial designs
are also presented.

Introduction:

To increate quality of test patterns and reduce
defect-per-million (DPM) at-speed tests are becoming a necessity in today’s DSM
designs. There are two widely accepted methods of performing at-speed tests: Launch-off-shift (LoS) and Launch-off-capture (LoC or broadside).

a)
Launch-off-Capture
(LoC)

In this method, the second pattern of the two pattern
test is obtained from the circuit response of the first pattern [1], i.e. the launch patterns are obtained from the
circuit response of the last shifted pattern. As the design can take only a
limited number of states, numbers of launch patterns are limited.

b)
Launch-off-Shift (LoS)

In this method, the second pattern of the two-pattern
tests required for testing delay faults is obtained by a one-bit shift of the
first pattern [1], i.e. the launch patterns are generated from the
shift path. This enables generation of more launch patterns compared to broadside
test, and hence helps achieve higher coverage.

Why LoC?

Though LoS can achieve higher delay
fault coverage, it requires an at-speed scan enable signal for proper launch
and capture operations. This requires significant design and routing
effort. Due to the resulting design and area overhead broadside approach is
preferred over LoS in industrial designs.

Prior Arts

The proposed method is based on the
work done in [1], [2] & [3], which achieve higher delay fault coverage by
controlling a group of flip flops by independent scan enable signals. Work done
in [3] suggests using multiple scan enable signals to
control alternate, group or a subset of scan elements in a scan chain. Although the
approaches proposed in [1], [2] & [3] would provide greater controllability to launch
vector but they may not be suitable for use in industrial design flows due to
overheads resulting from routing and they also required repeated prior analysis
of design in order to identify groups of flips flops that are to be controlled
by independent scan enable signals.

Proposed Methodology:

The proposed method as described uses multiple scan
enables signals to control a subset of scan chains. Each such subset of
scan chains is defined as a separate scan group. Alternate scan chains can be
grouped together to form a scan group, each controlled by an independent scan
enable (SEN) signal.