XSeries II ICP-MS

Related Links

The NEW XSeriesII ICP-MS is the most productive quadrupole ICP-MS available for routine and high performance analytical work. The ease of use and practical design of the XSeriesII means that laboratories can acheive their analytical objectives faster, with greater confidence and less 'hands-on' time from the operator.The XSeriesII is a major update the to highly successful X Series ICP-MS, featuring:
3rd Generation Collision Cell Technology
Protective Ion Extraction
Xt Interface
Xs Interface
Product Details
The XSeriesII ICP-MS is an ergonomically designed quadrupole ICP-MS taking up little more bench space than many competitive AAS systems. The innovative Protective Ion Extraction and Infinity II ion optics, based upon a hexapole design with chicane ion deflector,...Read more

"This instrument works very well for the application that we need. The software is easy to use. The technical support is very good; they are always there if you have any questions about any technical or application."

"Easy to use. Even if it is an old one, it still works very well for the application that we need. The software is pretty easy to use. We can see the stabitlity of the plasma by doing long term stability analysis."

Description

The NEW XSeriesII ICP-MS is the most productive quadrupole ICP-MS available for routine and high performance analytical work. The ease of use and practical design of the XSeriesII means that laboratories can acheive their analytical objectives faster, with greater confidence and less 'hands-on' time from the operator.

The XSeriesII is a major update the to highly successful X Series ICP-MS, featuring:

3rd Generation Collision Cell Technology

Protective Ion Extraction

Xt Interface

Xs Interface

Product Details

The XSeriesII ICP-MS is an ergonomically designed quadrupole ICP-MS taking up little more bench space than many competitive AAS systems. The innovative Protective Ion Extraction and Infinity II ion optics, based upon a hexapole design with chicane ion deflector, provides the lowest background specification of any quadrupole ICP-MS. This ion lens design uniquely enables simple field upgrade to Collision Cell Technology performance without affecting the normal (non-CCT mode) sensitivity or background.

The XSeriesII ICP-MS is available in tailored configurations to suit all applications with user interchangeable Xt and Xs interface options. Peltier cooling and third generation Collision Cell Technology options provide enhanced performance leading to the highest signal / background of any quadrupole ICP-MS with collision cell capability.

The high performance quadrupole analyzer is pumped by a novel split flow turbo pump backed by a single rotary. The high capacity pumping system enables the use of diluted reactive gases such as 7% H2 in He or 1% NH3 in He to be used in CCT mode rather than undiluted H2 or NH3 thereby eliminating potential corrosion problems and enhancing instrument reliability and operator safety.

The simultaneous analog/PC detector with real time multi-channel analyzer electronics provides >8 orders of dynamic range ensuring the spectrometer is suitable for both steady state and transient signal analysis.

The instrument and accessories are fully computer controlled by the field proven PlasmaLab software.