AFM for Nanomechanical Measurements

Nanoscale mechanical properties are a key consideration in many applications, and atomic force microscopy is one of the only tools capable of measuring them. The NanomechPro™ Toolkit for Asylum Research AFMs lets you measure nanoscale mechanical properties on everything from cells to ceramics. This collection of techniques can accurately evaluate a wide range of nanomechanical behavior including elastic and viscous properties, adhesive forces, and hardness. The multiple techniques in the NanomechPro Toolkit offer greater flexibility for different applications and allow deeper insight through comparison of results. With exclusive modes that enable faster measurements of more properties, the NanomechPro Toolkit contains features for both the Cypher™ and MFP-3D™ family atomic force microscopes.

With the Interferometric Displacement Sensor (IDS)option for the Cypher AFM, nanomechanical characterization modes are now even more quantitative. With traditional optical beam deflection (OBD) detection, the OBD signal can be misinterpreted when the cantilever deviates from its expected or modelled shape. In contrast, the IDS provides an absolute measure of cantilever amplitude and deflection, improving accuracy for multi-frequency techniques, mode shape mapping, tip-sample contact mechanics, and on-and-off resonance contact techniques. Learn more from the white paper found in the gray tab below.