Date and Time

Location

Description

The relationship between Reliability testing and Failure Analysis is vital and symbiotic. We do reliability testing for a wide variety of reasons and once failures are obtained the need to determine the cause(s) are many: validate the failure, verify the failure is related to the issues being tested, and understand the issue(s) for corrective actions. Without the FA the options would be: to live with the failures, retry the test and hope for better results, or make random changes to design and processing and repeat the testing. In this talk a variety of standard reliability test methods and the issues they stress will be discussed along with the typical failures found and the methods used to find them.

Bio

Daniel Sullivan, EAG lab

Daniel Sullivan is a chemist by education with a BS from U. C. Berkeley and a PhD from U. C. San Diego. He has worked in the valley staring with Surface Science Labs and has been involved in many service and internal labs from Philips Semiconductors to startups like SolFocus. He has worked setting up new labs and repairing ones in decline. Dan has written 19 papers and given several technical talks on FA and materials processes. Also, Dan is the father of two wonderful children.