Details

The NANOSENSORS™ PPP-QLC-MFMR AFM probe combines the low disturbance of magnetic samples by a soft magnetic coating with the high mechanical quality factor under ultra high vacuum conditions of the Q30K-Plus-Series. Low coercivity and a Q-factor of more than 35,000 enable magnetic force microscopy of soft magnetic samples and high operation stability under UHV conditions. Due to the low coercivity of the tip coating the magnetisation of the tip will easily get reoriented by hard magnetic samples.
The soft magnetic coating on the tip has a coercivity of app. 0.75 Oe and a remanence magnetization of app. 225 emu/cm3 (these values were determined on a flat surface).

Al coating on detector side of cantilever enhancing the reflectivity of the laser beam by a factor of about 2.5

excellent mechanical Q-factor under UHV conditions for high sensitivity

alignment grooves on backside of silicon holder chip

precise alignment of the cantilever position (within +/- 2 µm) when used with the Alignment Chip

compatible with PointProbe® Plus XY-Alignment Series

As both coatings are almost stress-free the bending of the cantilever due to stress is less than 3.5% of the cantilever length. For enhanced signal strength the magnetization of the tip by means of a strong permanent magnet prior to the measurement is recommended.