AXIS Supra (XPS) surface analysis

Based on patented AXIS technology the AXIS Supra is an instrument with unrivalled spectroscopic and imaging performance. The mu-metal analysis chamber is designed to accommodate optional excitation sources such as an achromatic Al/Mg X-ray source, UV He discharge lamp for ultra-violet photoelectron spectroscopy (UPS) and field-emission electron source for scanning Auger electron spectroscopy (AES) and secondary electron microscopy (SEM). Sample preparation and surface modification options are easily fitted to the sample introduction chamber, also referred to as the Flexi-lock. Options available for this chamber include sample heating and cooling, air sensitive sample transporter, broad spot ion source, crystal cleaver and glove box. An optional third chamber, the surface science station, provides a dedicated UHV chamber which can be configured with a manual sample stage and a range of options for surface science studies and in-situ sample preparation.

Ion mobility is a powerful extension to mass spectrometry that delivers information about the three dimensional structure of an ion, and increases peak capacity and confidence in compound characterization.

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