While graphene's distinctive Dirac-cone electronic structure and
simple 2D
atomic structure have attracted major interest in the physics
community, the
inherent limitations of isolated graphene samples mounted on an
insulating
substrates have made it difficult to study such systems with
typical UHV
probes such as photoemission and low energy electron diffraction
(LEED).~
While most single layer graphene transport measurements are done on
micro-mechanically extracted samples on SiO$_{2}$, all
photoemission and
LEED measurements of graphene performed so far have used films
grown on SiC
substrates.~ In this talk, we will discuss the first results of
UHV probes
carried out exfoliated graphene bonded to SiO$_{2}$. Using the
high spatial
resolution of the nanospectroscopy beamline at the ELETTRA
synchrotron light
source, we have been able to overcome the size limitations, which
have
prevented previous UHV study of this system. We will discuss the
results of
our X-ray photoemission (XPS), UV photoemission (UPS) and LEED
measurements
on single and multilayer graphene samples.

To cite this abstract, use the following reference: http://meetings.aps.org/link/BAPS.2008.MAR.J30.15