ZEISS presents a new generation of focused ion beam scanning electron microscopes (FIB-SEMs) for high-end applications in research and industry. ZEISS Crossbeam 550 features a significant increase in resolution for imaging and material characterization and a speed gain in sample preparation. Nanostructures such as composites, metals, biomaterials or semiconductors can be investigated with analytical and imaging methods in parallel. ZEISS Crossbeam 550 allows simultaneous modification and monitoring of samples, resulting in fast sample preparation and high throughput e.g. for cross-sectioning, TEM lamella preparation or nano-patterning.

ZEISS Crossbeam 550 provides best image quality in 2D and 3D. The new Tandem decel mode enables enhanced resolution together with a maximization of image contrast at low landing energies. The pioneering Gemini II electron optics delivers optimum resolution at low voltage and high probe current simultaneously. The FIB column combines the highest available FIB current of 100 nA with the new FastMill mode, allowing for highly precise and more efficient material processing and imaging in parallel. Additionally, the new process for automated emission recovery increases the user-friendliness and optimizes the FIB column for reproducible results during long-term experiments.

Material scientists profit from excellent 3D analytical properties, especially thanks to the also new, fully integrated module for 3D EDS analyses with ZEISS Atlas 5. In the life sciences, ZEISS Crossbeam 550 convinces with its enhanced resolution at low voltages and an outstanding stability for long-term 3D tomography. Moreover, it is possible to optimally integrate the new workstation into correlative workflows and to combine it with light, X-ray or ion beam microscopy.

ZEISS Crossbeam 550 replaces its predecessor ZEISS Crossbeam 540 and is available in a variation with a large chamber for the first time.

This story is reprinted from material from Zeiss, with editorial changes made by Materials Today. The views expressed in this article do not necessarily represent those of Elsevier.

]]>Mon, 14 Aug 2017 14:45:00 GMThttps://www.materialstoday.com/characterization/products/zeiss-crossbeam-550-3d-analytics/What makes your Single Stage Vacuum Pump worth buying?https://www.materialstoday.com/mechanical-properties/products/single-stage-vacuum-pump-worth-buying/
When it comes to selecting any vacuum pump for your operational needs, it becomes essential to consider the important criteria that help you to choose the right type of single stage vacuum pump. There are several industries where one stage vacuum pumps utilize for different application areas such as Sterilizing, Evaporation & Drying, Evaporation & Drying, and filtration Processes as well as Dehydrates, Conveying and several more. There are several factors that make your choice better such as performance, capacity, material, etc.

In addition, there are several other factors essential to consider when buying a one stage vacuum pump as follows.

A quality of the pump is a very important factor that you need to consider. It gives you sturdy operation as manufactured using the best standards that makes it higher quality pumps. Such pumps normally comprise rugged construction with high performance and provide trouble-free operations. High quality one stage vacuum pumps are specifically designed for broad applications for different industries.

A pump brand is also essential. When you consider buying a pump, you should ensure all about its warranty period and manufacturer details. It is recommended to buy from a reputed manufacturer in order to get good quality products with consistent support. In general, a leading vacuum pump manufacturer utilizes high grade material to manufacture their products that give assurance of durability with robust construction. When you find some good vacuum pump manufacturing company, you can check reviews of their customers on their site in order to know the reliability of products. You should not rely on it completely, but you will get a rough idea about the product quality and durability.

When purchasing a one stage vacuum pump, consider buying branded or non-branded products become very essential. It depends on your budget limit. When it comes to purchasing a vacuum pump from a renowned vacuum product manufacturing company, even though it becomes somewhat expensive compared to a non-branded pump, but it gives many benefits for using it. Branded vacuum pumps give you assurance for durability, higher performance, and better quality as well as make your processes hassle-free and convenient. On other way, non-branded pumps will not give any assurance and it can stop working any time. As there is no warranty on such products, you will have no option other than make your search again to find a better product.

You should also consider other features of pump such as range of application. Ensure that the vacuum pump is capable to accomplish your application purpose. Moreover, you should select a pump that require minimum maintenance and easy to maintain. In addition, also make sure that the pump size is precisely fits at your place. You should study the technical specification of single stage vacuum pump before you finalize the deal. With the help of technical speciation, you can ensure the precise model number, capacity, water requirement and speed that most suitable for your operational needs.

The German nanotechnology company WITec has announced the launch of the new alpha300 access micro-Raman system in conjunction with a thorough revision of the long-established alpha300 series.

WITec’s line of microscopes for Raman spectroscopy and imaging, atomic force microscopy and near-field microscopy all share a unique modularity that allows for single-technique solutions as well as correlative imaging configurations. Additional methods of analysis can be integrated with any instrument in the series at any time. Sophisticated analysis techniques and high-quality components maintain the alpha300 series’ position at the worldwide market’s leading-edge.

The newly-developed alpha300 access microscope is an entry-level system for micro-Raman single-spot analysis and Raman mapping that extends WITec’s product portfolio to lower price segments. “It was specifically engineered for budget-conscious customers with high demands on instrument performance.” says Dr. Joachim Koenen, CEO and Head of Sales & Marketing at WITec. Its outstanding spectral quality, optical throughput and signal sensitivity are ensured by the WITec’s renowned optical element design. “As with other WITec products, the alpha300 access is fully upgradable and expandable with additional functions.” clarifies Koenen “This way our customers stay flexible and are able to keep pace with the evolving state of the art.”

The latest, most comprehensive overhaul of the alpha300 series to date has made it more flexible, more sensitive and even quicker than ever. Both outright performance and enhanced user-friendliness were prioritized in tandem. “We used our long-term experience and knowledge to optimize the alpha300 series.” explains Dr. Olaf Hollricher, CEO and Head of Development at WITec “The focus during development was clearly on quality and performance improvements, usability and flexibility.”

Vital to the most recent wave of technical innovation at WITec is the latest optical fiber technology; guaranteeing an extremely high light transmission rate while augmenting the inherent modularity of the alpha300 series. The WITec UHTS spectrometer series with an array of focal lengths and spectral ranges provides optimized spectroscopic systems for individual applications. Together with an extensive collection of microscope components and accessories, including many excitation sources and CCD cameras, WITec has greatly expanded its capabilities in providing customized solutions for specialized application requirements.

This story is reprinted from material from WITec, with editorial changes made by Materials Today. The views expressed in this article do not necessarily represent those of Elsevier.

]]>Fri, 27 May 2016 10:45:00 GMThttps://www.materialstoday.com/characterization/products/developments-in-raman-microscope-range-at-witec/Nanomechanics introduces remote video option for iNanohttps://www.materialstoday.com/mechanical-properties/products/nanomechanics-introduces-remote-video-option/
Nanomechanics Inc., a leading provider of tools used to test mechanical properties at the micro- and nano-levels, has introduced a new function for the iNano nanoindenter, the Remote Video Option. From the product’s inception, the iNano has allowed users to operate the system remotely, but this upgrade will allow users to view the tests from anywhere.

“Our customers run their experiments around the clock for optimal results,” said John Swindeman, CEO at Nanomechanics Inc. “With the Remote Video Option, the user can observe both test setup and sample-and-tip interaction, whether they’re in the lab or on the road.”

The product can be easily retrofitted to any existing iNano system, improving usability on the already user-friendly iNano device.

“Users get everything they need to begin recording out of the box, including a high-resolution USB camera with a magnification lock and adjustable polarizer ring,” said Swindeman. “They can mount the system and have it up and running in less than five minutes.”

A USB camera gives users two views, one of which monitors the sample and microscope during test setup, and another that focuses on the indenter tip during the test. Both views work seamlessly with the straightforward InView Review Data software.

The Remote Video Option gives labs even more freedom to measure material properties and understand test results. The easily-operated, cutting-edge tool has the benefit of being affordable, which gives more organizations access to this convenient technology.

For more information on the Remote Video Option call Nanomechanics, Inc., at 865-978-6490 or send an email to info@nanomechanicsinc.com

This story is reprinted from material from Nanomechanics Inc., with editorial changes made by Materials Today. The views expressed in this article do not necessarily represent those of Elsevier.

Mad City Labs has announced the release of MCL-NSOM, a versatile near field scanning optical microscope (NSOM).

The MCL-NSOM leverages MCL's expertise with high-resolution SPM instrumentation and their core business of closed loop nanopositioning systems to design an NSOM that meets the performance criteria and versatility demanded by leading researchers. The MCL-NSOM is an aperture NSOM built on Mad City Labs RM21™ inverted optical microscope, which allows users to convert to aperture-less NSOM, AFM and fluorescence optical microscopy.

The MCL-NSOM includes XYZ closed loop nanopositioning for sample and fiber scanning providing sub-nanometer precision and exceptional low noise performance. Six axes of automated positioning are provided, including independent automation for fiber alignment to the optical axis, and are controlled with LabVIEW based software. The MCL-NSOM includes fiber launch with excitation source, alignment camera, and detection avalanche photodiode (APD) but can also easily accommodate user ancillary excitation and detection optics further enhancing the versatility of this microscope.

Mad City Labs announces the release of MCL-NSOM, a versatile near field scanning optical microscope (NSOM).

The MCL-NSOM leverages our expertise with high-resolution SPM instrumentation and our core business of closed loop nanopositioning systems to design an NSOM that meets the performance criteria and versatility demanded by leading researchers. The MCL-NSOM is an aperture NSOM built on Mad City Labs RM21™ inverted optical microscope, which allows users to convert to aperture-less NSOM, AFM and fluorescence optical microscopy.

The MCL-NSOM includes XYZ closed loop nanopositioning for sample and fiber scanning providing sub-nanometer precision and exceptional low noise performance. Six axes of automated positioning are provided, including independent automation for fiber alignment to the optical axis, and are controlled with LabVIEW based software. The MCL-NSOM includes fiber launch with excitation source, alignment camera, and detection avalanche photodiode (APD) but can also easily accommodate user ancillary excitation and detection optics further enhancing the versatility of this microscope.

Technical specifications for the MCL-NSOM can be found at http://www.madcitylabs.com/nsom.html

This story is reprinted from material from Mad City Labs, with editorial changes made by Materials Today. The views expressed in this article do not necessarily represent those of Elsevier.

The new inVia Qontor is Renishaw’s most advanced Raman microscope. Building on the market-leading inVia Reflex, the inVia Qontor adds a new dimension to the performance and ease of use for which inVia is renowned.

The inVia Qontor sees the addition of Renishaw’s latest innovation, LiveTrack™ focus tracking technology, which enables users to analyse samples with uneven, curved or rough surfaces. Optimum focus is maintained in real time during data collection and white light video viewing. This removes the need for time consuming manual focusing, pre-scanning or sample preparation.

The inVia Qontor, equipped with LiveTrack, enables the acquisition of accurate and reproducible spectra from samples with extensive topographic variations. Because a sample’s topography no longer limits Raman imaging capability, LiveTrack opens up the analysis of a whole new range of samples and applications.

With LiveTrack, focusing is dynamic. LiveTrack provides continuous feedback to the sample stage which adjusts to follow the height of the sample. This ensures the laser maintains focus during data collection and when manually moving the sample during white light video viewing. Optimum focus is maintained across uneven, sloping or dynamic samples, limited only by the maximum travel of the stage.

The inVia Qontor enables the analysis of samples that were previously impractical to study, or would have required extensive sample preparation. For example, uneven geological samples that normally require sectioning and polishing can now be analysed without any sample preparation.

Tim Smith, Renishaw Applications Scientist, said: “Acquiring in-focus Raman images of your whole sample is now a reality. Users can track the surface live while acquiring surface or even subsurface Raman data and later view the Raman image and surface topography of their sample in 3D. This innovation not only saves time but, in some cases, allows us to analyse samples that were previously impossible to study.”

The inVia range of microscopes is trusted worldwide to deliver outstanding performance and reliable results, for even the most challenging experiments. The inVia Qontor Raman microscope’s cutting-edge technology reduces overall experiment times and makes analysing even the most complex samples easy.

Despite its compact dimensions, the stage can handle payloads of more than 20 lbs. Available with travel ranges of 26mm (1”), 52mm (2”), and 102mm (4”) and velocity to 20mm/sec, the L-509 delivers high accuracy and smooth motion with unidirectional repeatability down to 0.1 microns. Long service life and excellent guiding accuracy with minimum backlash are guaranteed by the precision crossed roller bearings with anti-creep cage assist. For the highest precision requirements, a linear encoder with 1 nanometer resolution is available.

What Drives It?

A compact DC servo motor with gearhead is offered for high torques and resolution, while a 2-phase direct-drive stepper motor delivers higher velocity. Encoder options include an integrated rotary sensor mounted on the motor shaft and the above mentioned integrated linear version that provides direct position measurement not influenced by mechanical play or hysteresis in the drive train.

Noncontact, optical limit switches and reference point switches with direction sensing in the middle of the travel range simplify use in automation tasks.

Oxford Instruments (OI), and Zurich Instruments (ZI), have announced their joint technical collaboration primarily focused on demonstrating how the efficiency of combining equipment from both companies results in reduced time between installation and measurement. The collaboration will yield a series of joint application notes featuring low temperature measurement techniques and applications. The two companies will also exchange technical expertise in order to improve their customer support for the low temperature community.

Both companies are devoted to the objective of managing the increasing complexity and costs of low temperature research. “This collaboration continues to demonstrate the versatility of Oxford Instruments’ OptistatDry Cryofree®cryostat for optical and electrical applications. Our customers' demands for streamlined experiments and the joint demonstrations with ZI equipment provide the evidence for faster and more accurate measurements taken in less time,” said Dr Michael Cuthbert, Managing Director at Oxford Instruments Nanoscience. The OptistatDry comprises a range of compact cryostats with outstanding optical access, fast set-up and fast sample change, cooled by a closed cycle refrigerator.

This story is reprinted from material from Oxford Instruments NanoScience, with editorial changes made by Materials Today. The views expressed in this article do not necessarily represent those of Elsevier.

Oxford Instruments is pleased to announce that its TritonTMCryofree® dilution refrigerator has been chosen to support the development of quantum electronic technologies at the University of Oxford. The Triton dilution refrigerator enables scientists to cool samples and devices to a base temperature of less than 10 mK, and there are over 250 systems installed worldwide in leading Universities and research institutes. This is this third Triton system to be installed at the Materials Department in Oxford University, and like the previous systems it is equipped with a 6/1/1 Tesla vector rotation magnet and Oxford Instruments’ market leading bottom-loading sample exchange mechanism. The sample loading functionality substantially reduces the sample turnaround time of the system, from around two days to less than 8 hours without compromising the achievable temperature.

“We are happy to use Oxford Instruments’ considerable experience in application areas related to quantum technology. The Triton system is a quantum-ready cryogenic platform that allows us in our project to develop advanced quantum nanodevices using this technology. We are particularly keen on the inter-changeability of Oxford Instruments’ sample pucks between our various refrigerators”, says Professor Andrew Briggs.

Quantum science and technology provides new techniques for sensing, measurement, information processing, data transmission and storage. Oxford University researchers are aiming to set new standards for research and training, ranging from fundamental quantum physics to scalable quantum computers that will work with qubits (quantum bits) in place of classical bits of information. The core thrust of the research in Professor Briggs’ laboratory is to harness quantum effects in working devices, for practical quantum technologies. Some of the devices consist of a single carbon nanotube with contacts and gates, others consist of a gap only a couple of nanometres wide in a graphene ribbon with a single molecule inserted as the active element.

Oxford Instruments is proud to be a leading UK company providing state of the art research tools for the development of quantum technology applications, having extensive relationships with both the worldwide research community, and companies bringing new commercial applications to market.

This story is reprinted from material from Oxford Instruments NanoScience, with editorial changes made by Materials Today. The views expressed in this article do not necessarily represent those of Elsevier.

]]>Wed, 16 Sep 2015 09:45:00 GMThttps://www.materialstoday.com/characterization/products/oxford-instruments-triton-cryofree/Rice University boots up powerful microscopeshttps://www.materialstoday.com/characterization/products/rice-university-boots-up-powerful-microscopes/
Rice University, renowned for nanoscale science, has installed microscopes that will allow researchers to peer deeper than ever into the fabric of the universe.

The Titan Themis scanning/transmission electron microscope, one of the most powerful in the United States, will enable scientists from Rice as well as academic and industrial partners to view and analyze materials smaller than a nanometer — a billionth of a meter — with startling clarity.

The microscope has the ability to take images of materials at angstrom-scale (one-tenth of a nanometer) resolution, about the size of a single hydrogen atom.

Images will be captured with a variety of detectors, including X-ray, optical and multiple electron detectors and a 4K-resolution camera, equivalent to the number of pixels in the most modern high-resolution televisions. The microscope gives researchers the ability to create three-dimensional structural reconstructions and carry out electric field mapping of subnanoscale materials.

“Seeing single atoms is exciting, of course, and it’s beautiful,” said Emilie Ringe, a Rice assistant professor of materials science and nanoengineering and of chemistry. “But scientists saw single atoms in the ’90s, and even before. Now, the real breakthrough is that we can identify the composition of those atoms, and do it easily and reliably.” Ringe’s research group will operate the Titan Themis and a companion microscope that will image larger samples.

Electron microscopes use beams of electrons rather than rays of light to illuminate objects of interest. Because the wavelength of electrons is so much smaller than that of photons, the microscopes are able to capture images of much smaller things with greater detail than even the highest-resolution optical microscope.

“The beauty of these newer instruments is their analytical capabilities,” Ringe said. “Before, in order to see single atoms, we had to work a machine for an entire day and get it just right and then take a picture and hold our breath. These days, seeing atoms is routine.

“And now we can probe a particular atom’s chemical composition. Through various techniques, either via scattering intensity, X-rays emission or electron-beam absorption, we can figure out, say, that we’re looking at a palladium atom or a carbon atom. We couldn’t do that before.”

Ringe said when an electron beam ejects a bound electron from a target atom, it creates an empty site. “That can be filled by another electron within the atom, and the energy difference between this electron and the missing electron is emitted as an X-ray,” she said. “That X-ray is like a fingerprint, which we can read. Different types of atoms have different energies.”

She said the incident electron beam loses a bit of energy when it knocks an atom’s electron loose, and that energy loss can also be measured with a spectroscope to identify the atom. The X-ray and electron techniques are independent but complementary. “Typically, you use either/or, and it depends on what element you’re looking at,” Ringe said.

This story is reprinted from material from Rice University, with editorial changes made by Materials Today. The views expressed in this article do not necessarily represent those of Elsevier.

]]>Fri, 03 Jul 2015 10:30:00 GMThttps://www.materialstoday.com/characterization/products/rice-university-boots-up-powerful-microscopes/New Lake Shore Model 372 firmware for enhanced low temperature measurementshttps://www.materialstoday.com/materials-chemistry/products/new-lake-shore-model-372/
Lake Shore Cryotronics, a leading innovator in solutions for measurement over a wide range of temperature and magnetic field conditions, has released a Model 372 AC resistance bridge and temperature controller update that will enable more accurate measurements and increase the speed at which data can be collected by the instrument.

When introduced in 2014, the Model 372 already made it easier to reliably perform multiple tasks at very low temperatures, including temperature measurement, temperature control and sample impedance measurements. With the latest firmware update, the instrument goes further by increasing the number of simultaneous measurements that can be made and implementing a cubic-spline interpolation method to more accurately convert resistance measurements to temperature values.

When using three Model 372 units, for example, researchers can now run up to five measurement experiments in parallel. “In this setup, you can get excellent readings from different samples at the same time – without the risk of interference,” says Ryan Oliver, Lake Shore Product Manager. “This can be particularly useful if your experiment moves quickly and you aren’t given enough time to scan through separate measurement points individually.”

Plus the instrument now uses cubic-spline interpolation, a better method for calculating temperature values with calibrated sensors. This type of interpolation ensures that first and second derivatives are continuous across the entire temperature curve. “Compared with linear interpolation, it’s a more accurate way to calculate equivalent temperature values and can reduce interpolation error by as much as 0.2 mK,” Oliver explains.

These latest enhancements build on the existing industry-leading capabilities of the instrument, which is ideal for ultra-low temperature applications in the sub-1 K range (when used with the appropriate sensor). The Model 372 offers:

Oxford Instruments, the leading supplier of SEM-based particle analysis systems, has introduced its next generation particle analysis platform, AZtecFeature.

AZtecFeature can automatically detect and characterise particles present in a sample, reporting on each particle’s position, morphology and chemical composition with nanometre resolution. Typical applications of AZtecFeature include the analysis of particles trapped in filters to monitor air quality or determine engine health, the detection of asbestos, and production process cleanliness quality control. Other applications cover steel inclusion analysis and the non-destructive analysis of trace evidence collected at crime sites.

According to Solutions Business Manager, Dr. Christian Lang, “AZtecFeature is more accurate and much easier to use than our previous generation product. And due to the analytical and throughput benefits of the AZtec EDS platform, we’ve also made significant performance improvements, so that the job can be completed considerably faster.”

With AZtecFeature, setup is automated and basic particle sizing is available immediately. By clicking on one particle, others that are similar to it in size and morphology will be automatically detected and displayed. Adding chemical data and generating classes of particles is then just a click away. AZtecFeature supports multiple large area silicon drift detectors to increase throughput and reduce the effect of shadowing of small particles by larger particles.

This story is reprinted from material from Oxford Instruments, with editorial changes made by Materials Today. The views expressed in this article do not necessarily represent those of Elsevier.

]]>Fri, 12 Dec 2014 12:30:00 GMThttps://www.materialstoday.com/characterization/products/oxford-instruments-aztecfeature/Professional AFM images with a three step click SmartScan by Park Systemshttps://www.materialstoday.com/characterization/products/smartscan-by-park-systems/
Park Systems, a leader in Atomic Force Microscopy (AFM) since 1997 announced that they will debut an industry changing AFM auto image scanning mode for their AFM systems. The new SmartScan operating software for Park AFM systems will be provided at no cost to all existing Park NX AFM users and will be standard on all future equipment.

SmartScan fully automatizes AFM imaging making it very easy for anyone to take an image of a sample at nanoscale resolution and clarity comparable to one taken by an expert. SmartScan opens up the power of AFM nanoscopic tools to everyone and drastically boosts the productivity of all users. The new SmartScan operating software for Park AFM systems will be provided at no cost to all existing Park NX AFM user, and it will be standard on all future equipment from 2015.

Point and Click digital cameras revolutionized the photo world and now with the advent of SmartScan, the same is true for Atomic Force Microscopy, the powerful and versatile nanoscale microscopy technology. The easy-to-use auto mode feature eliminates the arduous operation that required a series of technically challenging and time consuming steps to moving the Z scanner down to the sample and approaching the tip few nanometers above it without crashing, and calculating the optimum scan speed that was more art than science.

“SmartScan is the next step in transformation for AFM equipment, and Park Systems is providing this upgrade at no cost to all of our existing users starting with Park NX series AFM systems,” comments Dr. Sang-il Park, CEO and founder of Park Systems. “With the Auto mode setting, AFM users can just concentrate on the data analysis and innovation that nanoscale images make available. Our mission as a leader in AFM technology is to create the simplest way to achieve accurate images, enhancing the process of enabling nanoscale advances.”

SmartScan completely automatizes all of the functions of setting up and taking the image once done manually by the operator. This means the AFM autonomously chooses the best settings for optimum scan speed for top quality image, and actuates automatically to generate the best image. With new SmartScan Auto mode, Park AFM users will get the images they need for their research without the laborious manual set up that previously hindered the set up process.

“We are so impressed with SmartScan’s capabilities to enhance our research methodology because it eliminates the extensive training and time consuming operations required to obtain AFM images. Now, we are able to just think of what we need and in the next instant, the image is available, making our AFM analytical services easier and the AFM more fun to work with,” comments, Dr. Byungman Kim, a Park AFM user.

With SmartScan mode, the AFM automatically does the frequency sweep and intelligently decides on the best amplitude/frequency setting. Then, automatically it uses this information to do FastApproach™ (patent pending) to get the Z-stage very close to the sample at shortest time, safely. From there during the scan, SmartScan utilizes Park’s patent pending AdaptiveScan™ to obtain the top quality image at much faster scan speed than conventional methods.

This story is reprinted from material from Park Systems, with editorial changes made by Materials Today. The views expressed in this article do not necessarily represent those of Elsevier.

The TGA-IR Module features a rugged gas cell optimized for the flow characteristics of a TGA and a precise system of temperature control.. The Thermo Scientific OMNIC Mercury TGA software provides powerful tools to simplify what was once a complex task of extracting information from a TGA-IR experiment substantially increasing productivity. The combination of the TGA-IR Module with the Mercury TGA software allows scientists working with polymers, pharmaceuticals, rubber and other materials to deformulate their samples with speed and confidence.

CAMECA, a world leader in scientific instrumentation and metrology solutions, is pleased to announce the release of its latest generation atom probe microscope. The LEAP 5000 offers unparalleled 3-dimensional nano-scale surface, bulk and interfacial materials analysis with atom-by-atom identification and accurate spatial positioning.

“CAMECA is very proud to introduce the LEAP 5000,” notes Dr. Tom Kelly, CAMECA Vice President for Innovation and New Technologies, and inventor of the Local Electrode™ Atom Probe (LEAP) technique. “This highly sophisticated materials analysis instrument integrates mature technologies from previous LEAP models and comes equipped with a redesigned detection system offering increased efficiency, advanced laser control, faster data collection and real-time monitoring capabilities, all housed in a more robust and ergonomic platform.”

Thanks to these advances along with greatly enhanced ease-of-use and productivity, the LEAP 5000 continues to set the industry standard in providing the ultimate in analytical accuracy, sensitivity, and 3D spatial resolution across a wide variety of metals, semiconductors and insulators. Most importantly, the LEAP 5000 will assist scientists and engineers around the world in accelerating discoveries and developing novel materials, products and devices.

Atom Probe Tomography (APT or 3D APT) is the only materials analysis technique offering extensive capability for both 3D imaging and chemical composition measurements at the atomic scale. Since its development in the 1960s, the technique has contributed to major advances in materials science.

Exclusively developed and manufactured by CAMECA, LEAP microscopes are used by the most prestigious research and development laboratories around the world, including seven of the ten largest computer chip manufacturers.

About CAMECA

CAMECA® has more than 60 years of experience in the design, manufacture and servicing of scientific instruments for material micro- and nano-analysis. Since pioneering Electron Probe Microanalysis (EPMA) instrumentation in the 1950s and Secondary Ion Mass Spectrometry (SIMS) in the 1960s, CAMECA has remained the undisputed world leader, while achieving numerous breakthrough innovations in such complementary techniques as Low-energy Electron-induced X-ray Emission Spectrometry (LEXES) and Atom Probe Tomography (APT).

Headquartered near Paris, CAMECA also has a production facility in Madison WI, USA (where the LEAP APT is designed and manufactured), and further locations in Brazil, China, England, Germany, India, Japan, Korea, and Taiwan. CAMECA is a business unit of the Materials Analysis Division of AMETEK® Inc., a leading global manufacturer of electronic instruments and electromechanical products.

This story is reprinted from material from Cameca, with editorial changes made by Materials Today. The views expressed in this article do not necessarily represent those of Elsevier.

Park Systems, a leading manufacturer of atomic force microscopy (AFM) products, proudly introduces its next generation NX-PTR, a fully automated system for hard disk drive slider manufacturing. Newly developed in collaboration with leaders in the hard disk drive (HDD) production, Park’s NX-PTR increases production yield by 200% with an enhanced automation routine, faster scan rate and recipe automation.

“Park Systems trademark AFM line demonstrates the accuracy and reliability in innovation required by the explosive nanotechnology companies as they shape the future for nanoscale products at the production level,” stated Ryan Yoo, VP of Global Sales and Marketing. “Park’s latest AFM system surpasses all other previous systems available for extremely accurate pole tip recession (PTR) measurements with sub-Angstrom gauge repeatability and reproducibility enhancing HDD production with dramatic improvements in automated measurements at the sub angstrom level.”

The hard disk industry uses AFM for Pole Tip Recession (PTR) measurements, a critical process for monitoring hard disk drive failures. Park Systems developed the PTR Series, a fully automated AFM with sub-Angstrom accuracy and repeatability for PTR measurements for HDD sliders and now announces the next generation design, for dramatic cost reduction in the manufacturing process.

“While most AFMs generate impressive three-dimensional images, many are not designed for advanced metrology. They function well as a qualitative imaging tool, but lack the accuracy required to monitor critical process parameters for manufacturing control. Proper monitoring of the PTR value requires a measurement accuracy of 0.1 nm, referenced against a surface which is 20µm away. This is equivalent to repeatedly measuring 1mm step heights from 20m away, down to the accuracy of a human hair (about 0.1mm),” explains Dr. Sang-il Park, CEO and Founder of Park Systems.

“Due to the design of traditional AFMs, they display intrinsic bowing in the range of 50nm over the 20µm scan. This can be corrected for by subtracting a best-fit second- or third-order plane, but this makes the measurement of PTR (typically around 1 nm) more of an art than a science for most instruments. Park NX-PTR is designed and optimized for inline slider metrology, providing a highly orthogonal and flat scan with adequate repeatability and accuracy for precision nanometrology. Also, in True Non-ContactTM mode, tip-sample interaction is very weak, which minimizes wear on both the tip and the sample during scanning.”

The new Park NX-PTR system is designed to be extremely mechanically and thermally stable, minimizing thermal drift, providing the highest degree of accuracy and precision in the measurements and nanoscale levels. In addition, the Park AFM trademarked True Non-Contact mode design preserves tip sharpness for prolonged high resolution imaging and much longer tip life. Typical tip life runs 1000 ~ 2000 images per tip. The new NX-PTR which is available now offers extremely powerful nanoscale automated measurements, powerfully improved capability in throughput, tip life and operation robustness and vastly increased throughput for HDD production manufacturing.

This story is reprinted from material from Park Systems, with editorial changes made by Materials Today. The views expressed in this article do not necessarily represent those of Elsevier.

]]>Mon, 02 Jun 2014 11:30:00 GMThttps://www.materialstoday.com/nanomaterials/products/park-systems-nx-ptr/Intelligent tool for optical inspection: Launch of ZEISS Smartzoom 5https://www.materialstoday.com/characterization/products/launch-of-zeiss-smartzoom-5/
The Microscopy business group of ZEISS has recently presented its first automated digital microscope. The device particularly stands out thanks to its one-of-a-kind operating concept, which makes operation as easy as possible for the user. In an industrial environment, optical inspection is an important part of production-related quality testing. Parts such as screws, printed circuit boards, and metal elements need to be examined for defects. Often companies have neither much time to inspect these parts, nor do they always have experts in using microscopes available, however. “In this context, the microscope is one of many tools, just like pliers or a wrench. And it must work just as intuitively and reliably,” says Wolf Jockusch, product manager for ZEISS Smartzoom 5. The device is the first integrated complete system from ZEISS comprised of an optical engine (which itself consists of a zoom, camera, and illumination), a stand with sample stage, objective lenses, the operating unit, and software.

ZEISS Smartzoom 5 is equally suited to conducting failure analyses, i.e. the close examination of a defective part, as well as to routine inspections, during which the same material sample needs to be repeatedly inspected using the same workflow. Once the quality inspector has placed the sample under the microscope, they no longer have to switch back and forth between the device and the software, but instead can carry out all the necessary steps right on the screen. They can also save this workflow so that it is always available at a later time: “This makes the analysis reproducible and independent of the user,” says Jockusch. Furthermore, the Best Image feature allows users without any prior knowledge to achieve optimal results – the system shows a preview of different illumination options, and the user only needs to select the best one. In addition, the device is calibrated at the factory and can be used immediately without requiring any further adjustment.

This story is reprinted from material from ZEISS, with editorial changes made by Materials Today. The views expressed in this article do not necessarily represent those of Elsevier.
]]>Thu, 29 May 2014 15:00:00 GMThttps://www.materialstoday.com/characterization/products/launch-of-zeiss-smartzoom-5/NanoWorld AG introduces ultra-short cantilevers for high-speed atomic force microscopy (HS-AFM)https://www.materialstoday.com/nanomaterials/products/nanoworld-ag-introduces-ultrashort-cantilevers/

NanoWorld AG announced the official commercialization of six types of Ultra-Short Cantilevers (USC) dedicated for use in High-Speed Atomic Force Microscopy (HS-AFM).

High Speed Atomic Force Microscopy is a quickly evolving technique within the field of Scanning Probe Microscopy that enables the users of dedicated instruments and AFM probes to visualize dynamic processes at the single molecule level. (See also www.highspeedscanning.com).

After a very successful beta-testing phase six types of AFM probes for high speed scanning will be commercially available from now on.

In order to provide a suitable probe for the complete range of high speed scanning applications, the Ultra-Short Cantilevers series consist of six different types of AFM probes divided in 2 categories.

Three types of Ultra-Short Cantilevers with very high resonance frequencies (1.2 MHz – 5 MHz) and high force constants are mainly meant for use in dynamic mode applications in air:

All AFM probes of the USC type feature a wear resistant tip made from High Density Carbon/Diamond Like Carbon (HDC/DLC) with a typical tip height of 2.5 µm and a radius of curvature typically < 10 nm. The aspect ratio is typically 5:1 and the tilt compensation is 8°.

The cantilevers are coated with gold on both sides but the tip remains uncoated.

A screencast on the new USC probes has already been uploaded on the NanoWorld YouTube Channel:

A dedicated website for HS-AFM www.highspeedscanning.com also shows not only the commercialized types of AFM probes for high speed scanning but also application examples by well-known researchers in the field as well as literature references on this growing field of research.

About NanoWorld:

Swiss-based NanoWorld AG is a leading manufacturer of high quality tips for Scanning Probe Microscopy (SPM) and Atomic Force Microscopy (AFM). The Atomic Force Microscope (AFM) is the vital instrument for the whole field of nanoscience and nanotechnology. It enables its user coming from research and commercial nanotechnology businesses to investigate materials on an atomic scale. Scanning probes for Atomic Force Microscopy produced by NanoWorld AG are the key consumable, the “finger” that enables the scientist to scan surfaces point-by-point on an atomic scale. The consistent high quality of the scanning probes is vital for reproducible results.

This story is reprinted from material from NanoWorld with editorial changes made by Materials Today. The views expressed in this article do not necessarily represent those of Elsevier.