D8 Discover with GADDS Multipurpose X-Ray Diffractometer

Bruker AXS’ D8 Discover with GADDS is a multipurpose X-Ray Diffractometer capable of performing a variety of analytical techniques with minimal reconfiguration. X-Ray Diffraction (XRD) is an extremely powerful technique utilizing non-destructive analysis to study a wide range of materials. CNSE’s in-house D8 Discover plays a significant role in the analysis and characterization of sputtered thinfilms and synthesized crystallineand semicrystalline materials. XRD is best known for phase identification of crystalline solids. However, this particular instrument can be configured to perform X-Ray Reflectometry experiments allowing thorough characterization of films or film stacks with a total thickness less than 1μm. The D8 Discover is also equipped to perform crystallite size, stress, and texture analyses.

Analytical Techniques

General X-Ray Diffraction Analysis

Grazing Incidence Diffraction

Microdiffraction

Phase Identification

X-Ray Reflectometry

High Throughput Screening

Features

Highest flux density provided to the x-ray by third generation Göbel Mirrors

Different optics can be selected and switched in order to obtain the best resolution for each specific application and sample type

Advanced software makes complex measurements simple and insures that data analysis is up to date with the most recent technology and science

Fully automated operations are possible with the system which is designed for easy and fail safe operation