WITE32

Guzik software package for Read/Write Analyzer (RWA) control

WITE32 is the latest Guzik software package for Read/Write Analyzer (RWA) control. The open design architecture of the package provides flexibility and expendability to both user and designer. WITE32 is developed under Microsoft Windows 32-bit environment using Microsoft Visual Basic and Microsoft Visual C++. WITE32 has identical setups for engineering and production

Results Output

WITE32 displays test results (including user defined tests) in a user-configurable spreadsheet style. You control the decimal point precision, fonts, width, and sequence of each displayed result. By enabling a history database (either locally or on a network) the results of all tests are stored in that database for manipulation (using Microsoft Access, or the data can be exported to any format that Microsoft Access supports, such as Lotus or Excel). The run-time results are kept in memory, which allows for faster execution of the tests.

Grading and Normalization

WITE32 production environment supports an unlimited number of grades, which are color-coded for easy reading. Simply drag the grade definition line higher or lower in the stack to perform grade prioritization. The grades are defined for individual heads and entire head stacks. When a grade fails, you can easily check the failed parameters. WITE32 normalization system can be enabled to generate correction factors that correlate results to a set of goal measurement criteria. User defined tests are included in grading scheme.

WITE32™Standard Tests

Parametric Tests

TAA Test

Overwrite Test

Asymmetry Test

Pulse Width Test

Parametric Test

Read-Only Parametric Test

Signal-to-Noise Ratio Test

Spectral Integral Signal-to-Noise Test

Amplitude Stability Test

Sector Amplitude Stability Test

Resolution Delta Test

Pulse Width Stability Test

Composite Tests

Frequency Test

Saturation Test

Track Profile Test

MR Saturation Test

Pulse Profile Test

Comparator Error Rate Test

Off-Track Performance Test

Set RPM Test

Spectrum Analysis Test

Triple Track Test

MR Tests

TAA Asymmetry Test

Pulse Width Asymmetry Test

Pulse Stability Test

Write/Read Offset Test

MR-Impedance Test

WR-Impedance Test

Head Polarity Test

WCALC – WITE Calculator

WITE Calculator for Tests

Error Tests

Comparator Test

Popcorn Test

NLTS Tests

Pseudo-Random Sequences

Alternative Spectral Elimination Test

Third Harmonic Ratio Test

MR Transfer Curve Test

Alternate Overwrite Test

NLTS vs. Write Current Test

Signal/Noise Ratio Test

Digital Parametric Tests
(with D5000 or RWA-2585 family)

Digital Parametric Test

Signal Profile

PRML Tests (with RWA-2585 family)

Guzik Channel Optimization

Sequenced Amplitude Margin (SAM) Test

Sampled Values Distribution (SVD) Test

PRML Tests (with D5000)

Guzik PRML Channel Optimization

PRML Explorer

Sequenced Amplitude Margin (SAM) Test

Jitter Tests (with D5000)

Jitter Explorer

Media Noise Test

Optimization Tests

System Optimization

Spinstand Tests

Servo Position Error Signal Test (PES Test)

Off-track Modulation Test

Scale Correction Test (Optional Purchase)

WDCP Tests

Balancing (for 1701 and 312 spinstand families)

Spinstand 2002 Tests

Balancing (for V2002 spinstands)

XY Alignment

Head Alignment

WITE32™ Optional Purchase Tests

WESA – Write Excited
Sectored Amplitude Tests

Separate Amplitude Asymmetry Stability

Triple Amplitude Asymmetry Stability

Write Induced Instability

Pole Erasure

WATI – Adjacent Track
Interference Tests

Adjacent Track Interference Test

Adjacent Track Interference Multi-Track Test (WATI MT)

Micro-Actuator Tests

Stroke Test

Mechanical Frequency Response Test

Micro-Actuator Loop Setup Test

Micro-Actuator Loop Frequency Response Test

Perpendicular Parametric Tests

Differentiator Optimization

Roll-off

Rise and Fall Time

Saturation Asymmetry

Amplitude Asymmetry

3D Pulse Profile (with D5000)

3D Pulse Profile Test

Digital MSCAN – Media
Scanning (with D5000)

Missing Pulse Detection

Super Pulse Detection

Transition Shift Detection

Thermal Asperity Detection (written signal)

Thermal Asperity Detection (erased track)

MSCAN – Media PRML
Scanning Tests

Extra Pulse Detection

Missing Pulse Detection

Thermal Asperity Detection

Triple-Track Tests

Triple-Track Signal-to-Noise Test
(with 747 option)

747 Tests*

747 Comparator Error Test

Bit Error Rate (BER) Tests

BER 747A Test

BER Linear Density Test

BER Error Distribution Test

BER Performance Test

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* Deprecated test module, using BER 747A Test is recommended

WITE32™ Extensions

WDK32 – WITE Developer’s Kit

WDK32 is a software package that allows you to create external test modules for WITE32 using Microsoft Visual Basic or Visual C++ revision 6.0. The compiled custom external module can be used in both Engineering and Production environment.

WDK32 Script – A Script Version of WITE Developer’s Kit

A script version of Guzik WITE32 Developer’s Kit (WDK32) allows for interactive execution of all Guzik WDK32 functions including RWA and spinstand control functions, operations, and measurement functions. WDK Script, based on Microsoft Visual Basic for Applications (VBA) engine, is integrated into Microsoft Excel.

Using WDK Script you can execute any Guzik WDK32 function or subroutine interactively either from the VBA environment or directly from an Excel worksheet. You can write your own scripts, using all the functionality of Guzik WDK32 but without the complication associated with the WDK32 WITE external module interfaces, licensing, and the necessity to have Microsoft Visual Basic installed.

WDDR32 – WITE Device Driver Template

WDDR32 is a software package for developing device drivers for the third party spinstands and connecting them to
Guzik RWA and WITE32.

DDK – PRML Chip Driver Developer’s Kit

DDK is a software package that allows for developing software drivers for PRML chip channels integrated into Guzik Read-Write Analyzers. The PRML chip drivers are developed using Microsoft Visual C++ programming language.