Abstract

A method has been developed for analyzing the structure of crystalline nanowires deposited on a crystal surface. It combined in-air grazing-incidence surface scattering with high-energy synchrotron x-ray scattering. The technique has allowed a direct reciprocal-lattice space mapping of the x-ray intensities scattered from ultrathin nanowires. Using this method, the sheet-shape diffraction emanating from ultrathin NiO wires was observed. The average nanowire–nanowire distance of 46 nm and a crystallographic domain size of approximately 7.5 nm across the nanowire were evaluated.