FEI breaks one angstrom barrier with electron microscope

HILLSBORO, Ore.--FEI Co. today (March 31) claimed that it has broken the one angstrom image resolution barrier with a 200-kV transmission electron microscope.
The sub-angstrom resolution was achieved using FEI's Tecnai F20 ST transmission electron microscope, based on advanced optics capabilities developed by FEI and by its partner, CEOS Co.

This enables novel TEM techniques such as 3D reconstruction with tomography, scanning probe applications, or in situ observation of specimen responses to variations in temperature, stress or chemical environments.