Light and dark conductivity as a function of illumination intensity and temperature.

Hall effect measurement system.

Sinton lifetime testing facility.

Device Analysis

Current-voltage testing as a function of illumination intensity, spectral content, and temperature.

Two Oriel Xenon solar simulators (AM1.5 global spectra).

Spectral response with light and voltage bias capabilities.

HP4274 LCR meter for capacitance measurements as a function of illumination intensity and temperature.

Laser scanning facility-optical beam induced current.

Four-pod accelerated stress exposure facility, allowing up to 16 samples to be independently monitored and maintained under different states of controlled atmosphere, illumination, electrical bias and temperature.

Two-chamber accelerated stress exposure facility for up to 2ft x 2ft illuminated area in controlled temperature and humidity ambient.
Other