Help with X-Ray Fluorescence Spectrometers specifications:

Energy dispersive spectroscopy is the measurement x-ray energies emitted from the bombardment of an energy source impinged upon the material, producing characteristic x-rays. This non-destructive analysis technique is used for the identification and quantification of elements in a material.

Wavelength dispersive spectroscopy is the measurement x-ray energies emitted from the bombardment of an energy source impinged upon the material, producing characteristic x-rays. This non-destructive analysis technique is used for the identification and quantification of elements in a material.

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Background correction is a technique usually employed relative to the determination of trace metals to compensate for stray light emission and various spectral interferences, which would bias analytical results.

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4-20mA or any other analog current output. Often called a transmitter. A current is imposed on the output circuit proportional to the measurement. Feedback is used to provide the appropriate current regardless of line noise, impedance, etc. Useful when sending signals long distances.

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Portable spectrometers are modular devices that are designed for ease of transport and assembly. Rugged enclosures, PC interfaces, and customizable software packages are common features for the portable device.

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User may specify either, both, or neither of the limits in a "From - To" range; when both are specified, matching products will cover entire range. Products returned as matches will meet all specified criteria.

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A monochromator is a spectrometer optical system capable of measuring a single wavelength, which can be scanned through a wide wavelength range. A common form of monochromator is the Czerny-Turner design, consisting of fixed entrance and exit slits, fixed focusing mirrors and a rotatable diffraction grating. As the grating rotates, a different wavelength is focused onto the exit slit. The wavelength range of a monochromator varies with the choice of grating, but commonly they can scan from 160 nm to 500 nm or ever wider ranges. The spectral resolution depends on the widths of the slits, the choice of grating and focal length, but commonly can be less than 10 pm for high resolution OES.

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Almost any solid element can be used as the source element. In choosing the element to be used for the target, it should be remembered that it is necessary for the energy of the x-rays emitted by the source to be greater than that required to excite the element being irradiated. As a simple rule of thumb, the target element of the source should have a greater atomic number than the elements being examined in the sample. This ensures that the energy of radiation from the source is more than sufficient to cause the sample element to fluoresce.

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Wavelength range refers to the dispersion of the grating across the linear array; also expressed as the "size" of the spectra on the array.

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Resolution is the width of an analytical peak at half its height expressed in nanometers. It's a measure of the instruments ability to separate two overlapping peaks. At the point of resolution, two peaks of equal height are said to be resolved if you can see a dip between the tops of the two peaks.

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Detection limit refers to the smallest amount of a substance that can be measured. Usually defined as a signal that is at least three times the standard deviation of the background signal. The measurement of any signal is not perfect; there is always a certain amount of noise in the signal. Three standard deviations are a measure in terms of a range, which, in a large number of measurements, would include 99% of all the measurements. So when it is stated that in order to be a detectable amount it must be a signal which measures higher than 3 standard deviations, it means that that signal is higher than 99% of the noise in the background.

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Can detect elements lighter than Beryllium, but the detector can be damaged.

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