SEM & EDS

Our scanning electron microscope coupled with x-ray analysis (EDS) is used to examine microscopic details of surfaces and sectioned samples, to identify and analyse features of interest for a wide range of investigations:

The Oxford Isis 300 EDS system is coupled to a thin-window detector for simultaneous analysis of elements boron to uranium. The system has both qualitative and quantitative x-ray analysis capabilities, X-ray map acquisition, high-resolution digital imaging and image analysis.