Bottom Line:
In order to analyze the influence of methods to design antireflection coatings (ARCs) on reflectivity of broadband solar cells, we provide detailed analyses about the ARC coupled with a window layer and the refractive index dispersion effect of each layer.By multidimensional matrix data simulation, two methods were employed to measure the composite reflection of a SiO2/ZnS double-layer ARC within the spectral ranges of 300-870 nm (dual junction) and 300-1850 nm (triple junction) under AM1.5 solar radiation.A comparison study, between the results obtained from the commonly used weighted average reflectance method (WAR) and that from the introduced effective average reflectance method (EAR), shows that the optimization of ARC by EAR method is convenient and feasible.

ABSTRACTIn order to analyze the influence of methods to design antireflection coatings (ARCs) on reflectivity of broadband solar cells, we provide detailed analyses about the ARC coupled with a window layer and the refractive index dispersion effect of each layer. By multidimensional matrix data simulation, two methods were employed to measure the composite reflection of a SiO2/ZnS double-layer ARC within the spectral ranges of 300-870 nm (dual junction) and 300-1850 nm (triple junction) under AM1.5 solar radiation. A comparison study, between the results obtained from the commonly used weighted average reflectance method (WAR) and that from the introduced effective average reflectance method (EAR), shows that the optimization of ARC by EAR method is convenient and feasible.

Mentions:
The four-dimensional images shown in Figures 5 and 6 depict the optimal parameters of the SiO2/ZnS ARC for the Ga0.5In0.5P/GaAs/Ge triple-junction SC under AM1.5 conditions. The reflectivity curves of SiO2/ZnS films optimized by Re and Rw are shown in Figure 7. The SiO2/ZnS ARC parameters for the triple-junction SC optimized by different methods are summarized in Table 2.

Mentions:
The four-dimensional images shown in Figures 5 and 6 depict the optimal parameters of the SiO2/ZnS ARC for the Ga0.5In0.5P/GaAs/Ge triple-junction SC under AM1.5 conditions. The reflectivity curves of SiO2/ZnS films optimized by Re and Rw are shown in Figure 7. The SiO2/ZnS ARC parameters for the triple-junction SC optimized by different methods are summarized in Table 2.

Bottom Line:
In order to analyze the influence of methods to design antireflection coatings (ARCs) on reflectivity of broadband solar cells, we provide detailed analyses about the ARC coupled with a window layer and the refractive index dispersion effect of each layer.By multidimensional matrix data simulation, two methods were employed to measure the composite reflection of a SiO2/ZnS double-layer ARC within the spectral ranges of 300-870 nm (dual junction) and 300-1850 nm (triple junction) under AM1.5 solar radiation.A comparison study, between the results obtained from the commonly used weighted average reflectance method (WAR) and that from the introduced effective average reflectance method (EAR), shows that the optimization of ARC by EAR method is convenient and feasible.

ABSTRACTIn order to analyze the influence of methods to design antireflection coatings (ARCs) on reflectivity of broadband solar cells, we provide detailed analyses about the ARC coupled with a window layer and the refractive index dispersion effect of each layer. By multidimensional matrix data simulation, two methods were employed to measure the composite reflection of a SiO2/ZnS double-layer ARC within the spectral ranges of 300-870 nm (dual junction) and 300-1850 nm (triple junction) under AM1.5 solar radiation. A comparison study, between the results obtained from the commonly used weighted average reflectance method (WAR) and that from the introduced effective average reflectance method (EAR), shows that the optimization of ARC by EAR method is convenient and feasible.