Atomic Force Microscopy, Scanning Tunneling Microscopy, AFM ...

Microscopy ListServer Instructions

The Microscopy Listserver/Mailreflector System is a telecommunication (Email) based discussion forum giving members of the scientific community a centralized Internet address to which questions/comments/answers in the various fields of Microscopy or Microanalysis can be rapidly distributed to a list of (subscribed) individuals by electronic mail.

microscope - English-Spanish Dictionary -

Manipulating single atoms with an electron beam

An electron beam focused on a carbon atom next to a silicon impurity atom can controllably make it jump to where the beam was placed. Step by step this allows the silicon to be moved with atomic ...

Transmission electron microscope | instrument |

Transmission electron microscope: Transmission electron microscope (TEM), type of electron microscope that has three essential systems: (1) an electron gun, which produces the electron beam, and the condenser system, which focuses the beam onto the object, (2) the image-producing system, consisting of the objective lens, movable

Field electron emission - Wikipedia

Field electron emission (also known as field emission (FE) and electron field emission) is emission of electrons induced by an electrostatic field. The most common context is field emission from a solid surface into vacuum.

Center for Nanoscale Materials | Argonne National Laboratory

The Center for Nanoscale Materials (CNM) at Argonne National Laboratory is a premier user facility providing expertise, instrumentation, and infrastructure for interdisciplinary nanoscience and nanotechnology research.

Electron microscope | instrument |

Electron microscope: Electron microscope, microscope that attains extremely high resolution using an electron beam instead of a beam of light to illuminate the object of study.

Columbia University - Department of Physics

Scanning Tunneling Microscopy image of a single nitrogen atom bonded to monolayer graphene

Scanning electron microscope - Wikipedia

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons.The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample.

Plenary & Invited Speakers | 19th International Microscopy ...

The 19th International Microscopy Congress Organising Committee are pleased to announce the following speakers have confirmed their participation at the Congress.