Category

Published on

01 Dec 2005

Abstract

Atomic Force Microscopy is has become an indispensible tool in
nanoscience for the fabrication, metrology, manipulation and property
characterization of nanostructures. In this tutorial, we will review the
physics of the interaction forces between the nanoscale tip and sample,
the dynamics of the oscillating tip, and the basic theory of some of the
common modes of AFM operation. We will end with a summary of the some of
the exciting new applications of Atomic Force Microscopy.

Bio

Dr. Raman is an Associate Professor in Mechanical Engineering at Purdue
University. His research focuses on the nonlinear mechanics and
vibrations of microcantilevers, micromechanical resonators, and
nanoelectromechanical systems for applications in sensing, RF devices,
and atomic force microscopy. Professor Raman is the recipient of the
NSF CAREER award (2002), the Purdue Teaching for Tomorrow award, and the
Discovery in Mechanical Engineering Award. He serves as an office bearer
on the newly formed ASME Technical Committee on Micro- and Nanosystems.
He has co-authored 35 journal articles, and currently supervises 9
doctoral students. He is affiliated with the Birck Nanotechnology Canter
at Purdue University.