Kenji Imura, Toyohashi-Shi JP

Kenji Imura, Toyohashi-Shi JP

Patent application number

Description

Published

20080212092

WAVELENGTH DISPLACEMENT CORRECTING SYSTEM - In a wavelength displacement correcting system and method of the invention, a monochromatic beam from a light emitting diode driven by a constant current is incident through an incident slit of a spectral device. The incident beam is diffracted on a diffraction grating to form a dispersed light image, and information relating to the dispersed light image of the incident slit is outputted from the spectral device. A wavelength displacement amount of the monochromatic beam is calculated, using a forward voltage value corresponding to the constant current, and a forward voltage initial value. Wavelength displacement amounts of at least two diffracted beams are calculated, using output values of the at least two diffracted beams, and diffracted beam output initial values with respect to the dispersed light image. A dispersion width displacement amount of the spectral device is calculated, using the calculated wavelength displacement amount of the monochromatic beam, and the calculated wavelength displacement amounts of at least two diffracted beams, whereby a wavelength displacement of the spectral device is corrected.

09-04-2008

20080225291

CONCAVE DIFFRACTION GRATING DEVICE, REFLECTIVE DISPERSION DEVICE, AND SPECTRAL DEVICE - A concave diffraction grating device, a reflective dispersion device, and a spectral device of the invention include a diffraction grating plane having an aspherical configuration, wherein the diffraction grating plane is symmetrical in a predetermined direction, and asymmetrical in a direction orthogonal to the predetermined direction in such a manner that the curvature of one end portion of the diffraction grating plane in the direction orthogonal to the predetermined direction is gradually decreased, and the curvature of the other end portion thereof is gradually increased. The concave diffraction grating device, the reflective dispersion device, and the spectral device with the above arrangement have desirable slit image forming performance with respect to all the wavelengths in a visible region, and are suitable for mass-production.

09-18-2008

20080246969

Apparatus and method for measuring optical property - An optical property measuring apparatus and an optical property measuring method of the invention determine a specified optical property of a sample by using a distribution function indicating a distribution of the amounts of reflected light incident on an optical sensor along a coordinate axis defined on a light-sensing surface of the optical sensor. Therefore, even when the optical sensor is a light-sensing device provided with a relatively small number of photosensitive elements, it is possible to measure the specified optical property regardless of a position error of the sample, if any, and reduce errors in measurement values caused by such a sample position error.

Light receiving optical system, and spectrophotometer incorporated with the same - A light receiving optical system includes: a relay optical system for converging light to be measured which has been converged on an image plane of an objective optical system on a view angle defining aperture for incidence through the view angle defining aperture. The light receiving optical system has the relay optical system with a relay lens operable to be selectively switched between a first and a second conjugated positions, and a first and a second light flux limiting aperture members disposed in proximity to the relay lens in the case where the relay lens is selectively switched between the first and the second conjugated positions. The relay optical system selectively forms, on the image plane of the objective optical system, an enlarged image and a reduced image of the view angle defining aperture in the case where the relay lens is selectively switched between the first and the second conjugated positions to define an incident light flux through the view angle defining aperture by a first and a second light flux limiting apertures, respectively, in the case where the relay lens is selectively switched between the first and the second conjugated positions. A spectrophotometer has the light receiving optical system.

01-15-2009

20090051910

Calibration reference light source and calibration system using the same - In a calibration reference light source and a sensitivity calibration system using the same, a plurality of single-wavelength light sources for emitting reference lights having mutually different single-wavelengths are used instead of a black body radiation source for radiating a white light, and not only the intensities of the single-wavelength reference lights, but also the wavelengths thereof are measured to obtain sensitivity correction coefficients of intensity-to-radiance conversion data. Thus, obtained reference radiance are highly reliable and sensitivity correction of spectrophotometers and spectral illuminometers can be performed with high accuracy and reliability at a user side, whereby the calibration reference light source and the calibration system using the same can be obtained at low cost.

02-26-2009

20090059224

Polychrometer and method for correcting stray lights of the same - In a polychrometer and a method for correcting stray light of the polychrometer, relative spectral (inter-pixel) distribution of stray light independent of a spectral distribution of an incident light is obtained, intensity coefficient of the stray light is calculated according to spectral (inter-pixel) distribution of the incident light, spectral (inter-pixel) distribution of the stray light included in a spectral (inter-pixel) distribution of an incident light is estimated and corrected. Thus, the stray light can be more accurately corrected as compared with a conventional case where stray light distribution is directly estimated from an incident light.

Method and apparatus for measuring optical property of fluorescent sample - An optical property measuring method and an optical property measuring apparatus according to an aspect of the invention are operable to select bi-spectral characteristics relatively close to bi-spectral characteristics of a fluorescent sample, out of multiple bi-spectral characteristics stored in advance, based on a relative ratio between excitation efficiencies of the fluorescent sample illuminated by excitation illuminations whose spectral distributions are different from each other, in calculating an optical property of the fluorescent sample. The inventive optical property measuring method and optical property measuring apparatus are advantageous in calculating an optical property of a fluorescent sample easily and with high precision.

10-01-2009

20100091270

Optical property measurement apparatus - An optical property measurement apparatus includes: a main body which includes a plane-shape surface that is so disposed as to face the display portion; an optical sensor which receives light directed from an opening that is formed through the plane-shape surface; and a support portion which is disposed on a side of the plane-shape surface and keeps a constant distance between the display portion and the plane-shape surface; wherein a light shield portion that is so disposed as to enclose a circumferential area of the opening of the plane-shape surface and shields entrance of light from a region other than a measurement target region of the display portion when the optical property is measured.

04-15-2010

20100103407

Optical characteristic measuring apparatus - An optical characteristic measuring apparatus of the invention includes a sequentially-readable charge storage sensor array having a plurality of light receiving elements. Irradiation of first illumination light and second illumination light is controlled in such a manner that a period for irradiating the second illumination light onto a sample containing a fluorescent material is included in an integration period of each of the light receiving elements for receiving a wavelength component of fluoresced light from the sample in measuring an optical characteristic of the sample. The optical characteristic measuring apparatus having the above arrangement enables to accurately measure the optical characteristics of samples containing a fluorescent material in a short time by scanning the samples.

04-29-2010

20100277728

ILLUMINATION APPARATUS AND REFLECTIVE CHARACTERISTICS MEASURING APPARATUS EMPLOYING THE SAME - An illumination apparatus to illuminate a sample surface with excellent illumination efficiency and a reflective characteristics measuring apparatus using the illumination apparatus. The illumination apparatus includes a plane light source positioned on a normal at a center of the sample surface and a mirror having an internal reflective surface positioned between the plane light source and the sample surface. The internal reflective surface has a circular or polygonal shape in a section perpendicular to the normal and the circular or polygonal shape substantially corresponds to an imaginary circle centered on the normal and having a radius equal to half a distance between the plane light source and the sample surface. In place of the mirror, a plurality of reflective faces may be positioned.

11-04-2010

20130321802

SPECTRAL CHARACTERISTIC MEASURING DEVICE, METHOD FOR CORRECTING SPECTRAL CHARACTERISTIC MEASURING DEVICE AND PROGRAM - Wavelength information indicating a correspondence relationship between a plurality of light receiving elements of a light receiving unit and wavelengths of pieces of lights is stored. First and second intensity distributions of the light related to first and second dispersion images are acquired based on a signal outputted from each of the light receiving elements when a monochromatic light is passed through a opening of a light shielding body and first and second dispersion images related to primary and secondary diffracted light are formed on the light receiving unit. An estimated intensity distribution of the light related to the second dispersion image is calculated from the first intensity distribution according to a predetermined relational expression. A change amount related to the wavelength information is calculated based on the estimated intensity distribution and the second intensity distribution. The wavelength information is corrected according to the change amount.