Abstract

Using a fluorescent particle glued at the end of a sharp tip, we observe the heating of a wide nickel nanoheater run by an alternating electrical current. The images clearly show the heating of the nickel structure, as well as the lateral heat diffusion in the dielectric layers underneath. By monitoring the fluorescence changes as the tip approaches the nanoheater, we have estimated the relative importance of the different heat transfer mechanisms between the device and the fluorescent particle. It is shown that, for the investigated structures, heat transfer occurs mainly by direct contact between the probe and the surface.

Received 31 October 2007Accepted 18 December 2007Published online 14 January 2008

Acknowledgments:

The authors thank the Agence Nationale de la Recherche for financial support. They also gratefully acknowledge the VLSI Design and Education Center (VDEC) at the University of Tokyo for the use of their Advantest F5112 e-beam lithography facilities.