The article “Probabilistic estimation of the application-level impact of precision scaling in approximate computing applications” has been published on the Microelectronics Reliability Journal and is now available online”.

On behalf of the DFT19 Program Committee, we are delighted to inform you that your paper “Combining Cluster Sampling and ACE analysis to improve fault-injection based reliability evaluation of GPU-based systems” has been ACCEPTED for ORAL presentation at the 32th IEEE Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems.