The IBM04368CBLBC and IBM04188CBLBC 8Mb SRAMs are synchronous pipeline-mode, high-per-formance CMOS static random-access memories that have wide I/O and achieve 2.5ns cycle times. Single differential CK clocks are used to initialize the read/write operation; all internal operations are self-timed. At the rising edge of the CK clock, addresses

and controls are registered internally. Data-outs are updated from output registers on the next rising and falling edges of the CK clock, hence the double data rate. Internal write buffers allow write data to follow one cycle after addresses and controls. The SRAM is operated with a single 2.5V power supply and is compatible with HSTL I/O interfaces.

.

IBM04368CBLBCIBM04188CBLBC8Mb (256K x 36 & 512K x 18) SRAM

Page 2 of 24

CBLBC_ds.fm.00

June 7, 2002

x36 BGA Bump Layout (Top View)

1

2

3

4

5

6

7

8

9

A

V

SS

V

DDQ

SA13

SA11

ZQ

SA10

SA8

V

DDQ

V

SS

B

DQ23

DQ20

SA14

V

SS

B1

V

SS

SA7

DQ15

DQ12

C

V

SS

V

DDQ

SA15

SA12

G

SA9

SA6

V

DDQ

V

SS

D

DQ24

DQ21

NC

V

SS

V

DD

V

SS

SA5

DQ14

DQ11

E

V

SS

V

DDQ

V

SS

V

DD

V

REF

V

DD

V

SS

V

DDQ

V

SS

F

DQ25

CQ

DQ18

V

DD

V

DD

V

DD

DQ17

CQ

DQ10

G

V

SS

V

DDQ

V

SS

V

SS

CK

V

SS

V

SS

V

DDQ

V

SS

H

DQ26

DQ22

DQ19

V

DD

CK

V

DD

DQ16

DQ13

DQ9

J

V

SS

V

DDQ

V

SS

V

DD

V

DD

V

DD

V

SS

V

DDQ

V

SS

K

DQ27

DQ31

DQ34

V

SS

B2

V

SS

DQ1

DQ4

DQ8

L

V

SS

V

DDQ

V

SS

LBO

B3

MODE

1

V

SS

V

DDQ

V

SS

M

DQ28

CQ

DQ35

V

DD

V

DD

V

DD

DQ0

CQ

DQ7

N

V

SS

V

DDQ

V

SS

V

DD

V

REF

V

DD

V

SS

V

DDQ

V

SS

P

DQ29

DQ32

NC

V

SS

V

DD

V

SS

SA4

DQ3

DQ6

R

V

SS

V

DDQ

V

DD

SA17

SA1

SA2

V

DD

V

DDQ

V

SS

T

DQ30

DQ33

SA16

V

SS

SA0

V

SS

SA3

DQ2

DQ5

U

V

SS

V

DDQ

TMS

TDI

TCK

TDO

NC

2

V

DDQ

V

SS

1. The MODE pin must be connected to V

SS

or floated. The MODE pin has a very small pull-down, less than 5

ľA current

at the V

DD

input.

2. ESD protection diodes reside on this NC bump.

x18 BGA Bump Layout (Top View)

1

2

3

4

5

6

7

8

9

A

V

SS

V

DDQ

SA13

SA11

ZQ

SA10

SA8

V

DDQ

V

SS

B

NC

DQ10

SA14

V

SS

B1

V

SS

SA7

NC

DQ5

C

V

SS

V

DDQ

SA15

SA12

G

SA9

SA6

V

DDQ

V

SS

D

DQ11

NC

NC

V

SS

V

DD

V

SS

SA5

DQ7

NC

E

V

SS

V

DDQ

V

SS

V

DD

V

REF

V

DD

V

SS

V

DDQ

V

SS

F

NC

CQ

NC

V

DD

V

DD

V

DD

DQ8

NC

DQ4

G

V

SS

V

DDQ

V

SS

V

SS

CK

V

SS

V

SS

V

DDQ

V

SS

H

DQ12

NC

DQ9

V

DD

CK

V

DD

NC

DQ6

NC

J

V

SS

V

DDQ

V

SS

V

DD

V

DD

V

DD

V

SS

V

DDQ

V

SS

K

NC

DQ15

NC

V

SS

B2

V

SS

DQ0

NC

DQ3

L

V

SS

V

DDQ

V

SS

LBO

B3

MODE

1

V

SS

V

DDQ

V

SS

M

DQ13

NC

DQ17

V

DD

V

DD

V

DD

NC

CQ

NC

N

V

SS

V

DDQ

V

SS

V

DD

V

REF

V

DD

V

SS

V

DDQ

V

SS

P

NC

DQ16

SA18

V

SS

V

DD

V

SS

SA4

NC

DQ2

R

V

SS

V

DDQ

V

DD

SA17

SA1

SA2

V

DD

V

DDQ

V

SS

T

DQ14

NC

SA16

V

SS

SA0

V

SS

SA3

DQ1

NC

U

V

SS

V

DDQ

TMS

TDI

TCK

TDO

NC

2

V

DDQ

V

SS

1. The MODE pin must be connected to V

SS

or floated. The MODE pin has a very small pull down, less than 5

ľA current at

the V

DD

input.

2. ESD protection diodes reside on this NC bump.

IBM04368CBLBCIBM04188CBLBC

8Mb (256K x 36 & 512K x 18) SRAM

CBLBC_ds.fm.00June 7, 2002

Page 3 of 24

Pin Description

SA0-SA18

Address Input (SA0-SA1 burst-control start-ing addresses)

TDO

IEEE 1149.1 Test Output (LVTTL level)

DQ0-DQ35 Data

I/O

G

Asynchronous Output Enable

CQ, CQ

Differential Echo Clocks

MODE

Mode Pin must be connected to V

SS

CK, CK

Differential Input Register Clocks

V

REF

HSTL Input Reference Voltage

B1

B1 = 0 initiates a Load operation

V

DD

Power Supply (+2.5V)

B2

B2 = 0 initiates a Write operation

V

SS

Ground

B3

B3 = 0 Double Data Rate,

B3 = 1 Single Data Rate

V

DDQ

Output Power Supply

LBO

Linear Burst Order (LBO = 1, interleave mode; LBO = 0, linear mode)

ZQ

Output Driver Impedance Control

TMS, TDI, TCK

IEEE

1149.1 Test Inputs (LVTTL levels)

NC

No Connect

Ordering Information

Part Number

Organization

Cycle Time (ns)

Package

IBM04368CBLBC-25

256K x 36

2.5

9 x 17 BGA

IBM04368CBLBC-28

256K x 36

2.8

9 x 17 BGA

IBM04368CBLBC-30

256K x 36

3.0

9 x 17 BGA

IBM04368CBLBC-35

256K x 36

3.5

9 x 17 BGA

IBM04188CBLBC-25

512K x 18

2.5

9 x 17 BGA

IBM04188CBLBC-28

512K x 18

2.8

9 x 17 BGA

IBM04188CBLBC-30

512K x 18

3.0

9 x 17 BGA

IBM04188CBLBC-35

512K x 18

3.5

9 x 17 BGA

IBM04368CBLBCIBM04188CBLBC8Mb (256K x 36 & 512K x 18) SRAM

Page 4 of 24

CBLBC_ds.fm.00

June 7, 2002

Block Diagram (x36 Double-Data-Rate Mode)

256K x 72

Buffer

Write

Decod

e

0

2:1

Mu

x

DQ0-DQ35

Read Add

Reg

Compar

e

CK,CK

B1-B3

SA0-SA17

Array

G

1

0

1

Buffer

Write

0

1

0

1

Reg

Output

Output

Reg

0

1

36

36

36

36

36

36

36

36

Reg

Output

Output

Reg

0

1

4

4

CQa,CQa

CQb,CQb

0

1

0

1

E

E

V

DD

V

SS

E

Write

Add Reg

E

BurstLogic

A2-A17

A0,A1

A0', A1'

A0'

A0

'

A0'

A0

'

Control

Logic

LOAD

Write

Output Enable

E

Advance

Match

36

36

IBM04368CBLBCIBM04188CBLBC

8Mb (256K x 36 & 512K x 18) SRAM

CBLBC_ds.fm.00June 7, 2002

Page 5 of 24

SRAM Features

DDR and SDR Modes

Timing Diagram: Double-Data-Rate and Single-Data-Rate Modes on page 6 shows input and output data placements for both DDR and SDR modes. In DDR read mode, two sets of data-outs are generated from the second rising and falling edges of the CK clock, assuming the first rising edge of the CK clock samples the base address. The first of the two data-out sets (DOUT-A) is generated from the sampled base address (Base-A). The second data-out set (DOUT-A') is generated from the next burst order address, according to the burst order definition. Similarly, a DDR write requires data-in placement on the second rising and falling CK edges. In SDR read mode, only one set of data-outs is generated from the second rising CK edge. In SDR write mode, one set of data-ins is sampled on the second rising CK edge. The user can switch from DDR to SDR mode (or from SDR to DDR mode) during any LOAD (B1 = 0) operation.

Late Write

The late-write function allows write data to be registered one cycle after addresses and controls. This feature eliminates one of two bus-turnaround cycles normally required when going from a read to a write operation. Late write is accomplished by buffering write addresses and data. The SRAM array update occurs during the third write cycle. Read-cycle addresses are monitored to determine if read data is to be supplied from the SRAM array or the write buffer. Full data coherency is maintained for both DDR and SDR operations. As a result, NOP (write buffer flush) operations are not required going from write cycles to read cycles.

Echo Clocks

Echo clocks CQ and CQ are generated from rising and falling edges of the CK clock, with access times repre-sentative of the data-outs. Echo clocks keep running during write and NOP operations. Echo-clock operation is identical for both DDR and SDR operations. The close tracking of echo clocks and data-out timings allows the echo clocks to be used as capture clocks for the data-outs by the receiving device.