Jordan Valley Semiconductors (JVS) Targets Quality Control in LED and Compound Semiconductor Manufacturing

... DURHAM England and MIGDAL HAEMEK... JVS continues to evolve the company's HRXRD product line which it... Isaac Mazor JVS's President and CE... The tool has been built with our customers' needs in mind. Custom...

DURHAM, England and MIGDAL HAEMEK, Israel, February 1 /PRNewswire/ --
Jordan Valley Semiconductors Ltd. (JVS), the market leader in X-ray metrology
tools, has introduced today the QC3(TM), a High Resolution XRD (HRXRD) system
which controls production quality at LED and compound semiconductors fabs.

JVS continues to evolve the company's HRXRD product line, which it
acquired from Bede in 2008, with the addition of the new tool. The QC3(TM)
HRXRD (High Resolution X-Ray Diffraction) system was developed on the basis
of Bede's industry-proven QC200(TM) and D1(TM) systems. The new system
improves hardware performance for higher productivity and system reliability,
and reduces both cost of ownership and system price by tailoring the
functionality to the specific needs of its customers. These improvements are
achieved through the optimization of both the hardware and software.

Isaac Mazor, JVS's President and CEO, said: "The new QC3(TM) HRXRD
production tool demonstrates JVS's commitment to LED manufacturing metrology
solutions that meet and exceed our customers' technical and cost of ownership
expectations."

"The tool has been built with our customers' needs in mind. Customers are
looking for accuracy, repeatability, low cost of operations, ease of service
and excellent price/performance - and our QC3(TM) system delivers all of
these requirements," added Mr. Mazor.

Dr. Paul Ryan, Corporate VP and UK site manager, said: "By optimizing the
configuration to the specific market segment needs, the QC3 meets our
customers' process technology needs at outstanding price/performance ratio.
With our field proven and popular control and analysis software tools, such
as RADS, our customers enjoy the ease of operation with outstanding accuracy
and repeatability that are key for today's demanding compound semiconductors
process control tasks."

The QC3(TM) has been configured to provide symmetric and asymmetric
measurements for all common semiconductor wafers, such as GaAs, InP, Si, GaN
(thick buffers). Additionally, skew symmetric measurements are possible on
the same hardware, to allow additional capability for GaN wafers in
particular. These reflections allow the thickness, composition, relaxation
and strain of multi-layer structures to be determined. Custom sample plates
can be defined with locations for multiple wafers, along with large
translation ranges, in order to maximize productivity by loading batches of
wafers at once into the tool. By using Jordan Valley's extensive knowledge of
in-line metrology, the full measurement cycle can be automated for multiple
wafers within a batch with results reported to the factory. The analysis is
performed through RADS, the oldest and still the best HRXRD analysis package,
which has been proven in industry and academic institutions alike.

The company offers a comprehensive family of solutions based on advanced
X-Ray Reflectivity (XRR), X-Ray Fluorescence (XRF), and High Resolution X-Ray
Diffractometry (HRXRD). These tools are fully automated, production ready and
ideal for both blanket and patterned wafers.

About Jordan Valley Semiconductors UK Ltd.

Jordan Valley Semiconductors UK was formed from the acquisition of Bede
Scientific Instruments Ltd. by Jordan Valley in 2008. Jordan Valley
Semiconductors UK is the leader in the production of solutions for High
Resolution X-ray Diffraction for Epi film characterization, with a long
history in products for both the Si and the compound semiconductor markets.
The company's solutions allow the control of Epi processes for a wide range
of products.

R&D and manufacturing of the D1 and QC3 products are based in Durham, UK.

With worldwide sales and support offices in Israel, US, Taiwan, China,
Korea, Japan and other locations.

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