SEM Imaging & Spectroscopy

3View System

The 3View® system allows high-throughput, high-resolution imaging of a wide variety of samples in 3D. 32k x 24k image support and high-performance stages allow fully automated high-speed imaging of many different types of samples.

World-leading cathodoluminescence imaging and spectroscopy system compatible with conventional, low vacuum or field emission SEM, combined FIB/SEM, and ion microscopes.

Advantages:

The MonoCL4™ system is the leading cathodoluminescence (CL) microscopy system for scanning electron microscopes (SEM) and electron probe microanalyzers (EPMA). Its supremely efficient collection and detection ensures the ultimate performance in sensitivity and spatial resolution from a wide range of bulk and nanoparticle samples.

Designed from the ground up for cathodoluminescence microscopy, seamlessly integrating into an electron microscopy environment, and compatible with all major brand SEM

Ultimate sensitivity and spatial resolution across a broad range of wavelengths from deep UV to near infrared using achromatic collection optics with optimized collection efficiency and minimum optical losses using direct optical coupling

Cathodoluminescence imaging compatible with all scanning electron microscopes or microprobes.

Advantages:

Simple to use cathodoluminescence imaging system for use in scanning electron microscopes (SEM) and electron probe microanalyzers (EPMA). The MiniCL™ system is sensitive to luminescence from most geological specimens, and the detector is positioned close to the specimen boosting detection efficiency.

Sensitive to ultraviolet, visible and near infrared wavelengths enabling panchromatic cathodoluminescence imaging of a wide range of minerals, ceramics, and LED materials

Use at all SEM magnifications to reveal macro- and micro-texture in sedimentary rocks including: sediment source, degree of compaction, diagenetic history, differentiation of authigenic and detrital minerals, cementation history, and provenance

Convenient use with other SEM detectors including: secondary and backscattered electron detectors and energy or wavelength dispersive X-ray detectors

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