PH-EP Technical Notes

IBL Thermal Mockup Bake-Out Tests
/ Nuiry, FX (CERN PH-DT) ; Feigl, S (CERN, PH-DT)
This note summarizes different bake-out tests that have been performed with the ATLAS Insertable B-Layer (IBL) mockup. Two beam pipe configurations have been tested: one with the aerogel insulation layer all along the pipe and one without insulation over 622 mm around Z0. [...] PH-EP-Tech-Note-2014-001.-
Geneva : CERN, 2014 - 27 p. Fulltext:PDF;

Study of a Digital SiPM for TOF-PET
/ Heller, M (CERN)
The digital Silicon Photomultipliers (dSiPM) from Philips have been used in a study aiming at the proof of principle of an axial positron emission tomography detector with time of flight capabilities. These novel detectors provide various features not present in analog devices. [...] PH-EP-Tech-Note-2013-003.-
Geneva : CERN, 2013 - 12 p. Fulltext:PDF;

Interstrip resistance measurement
/ Chilingarov, Alexandre (Lancaster University)
In ATLAS SCT community two methods of interstrip resistance measurements are used: a) measuring the resistance between two strips and comparing it with a separately measured strip-to bias-rail resistance and b) applying DC voltage to one strip and measuring the current flowing to another strip. The method a) will further be referred to as Resistance Method and method b) as Induced Current Method. [...] PH-EP-Tech-Note-2011-001.-
Geneva : CERN, 2010 - 33 p. Fulltext:PDF;

CONTRIBUTION TO THE WLS STUDIES FOR THE AXIAL PET
/ Chesi, E ; Rudge, A ; Seguinot, J ; Weilhammer, PMeasurements were performed with 2 LYSO bars and 6 WLS strips mounted with the same topological configuration used for the AX-PET demonstrator. The main purposes of the measurements were threefold: (1) to investigate the influence of operational parameters (threshold, gain), (2) to study the effect of the surface property of a screen behind the WLS strips on the photoelectric yield and cluster multiplicity of the WLS strips, and (3) to measure the dependence of the WLS strip response on the gamma energy..PH-EP-Tech-Note-2010-014.-
Geneva : CERN, 2010 - 30 p. Fulltext:PDF;