Keysight E5260A Measurement Mainframe

The fast measurement speed and modular nature of the E5260A makes it an ideal choice for high-speed production test. For technologically advanced devices of today and tomorrow, the Keysight E5260A lowers your cost-of-test with a high-speed parametric test solution for semiconductor, RFIC, and optical component testing.

Based on well-proven Keysight 4070 Series system technology, the E5260A provides superior measurement throughput that is several times faster than earlier products such as the Keysight 4142B. The instrument is modular, which enables customization now and provides for future expansion as requirements change.

A number of innovative design elements help to improve the efficiency of complex testing, such as expanded program memory to accelerate the measurement process, and 16 digital I/O lines for sophisticated triggering requirements. Moreover, historically encountered power limitations on the instrument mainframe (such as often occur with the 4142B) have been eliminated.

Sophisticated triggering schemes involving multiple instruments can easily be created

All trigger signals are processed via hardware rather than firmware

Fastest possible trigger response from the instrument

Front panel control

Can conveniently perform and report spot measurements via a simple front-panel interface, without programming. View other items of interest, such as error messages, valuable when debugging the instrument performance under automated control.

When 4 HPSMUs are installed then each HPSMU can output 1 A

No power restrictions; no need to think about mainframe power restrictions when developing applications

4.0 Amp Ground unit (GNDU)

Sink the current output of 4 HPSMUs without worrying about resistive ground rise issues