Abstract

Thin films of ethyl polyhedral oligomeric silsesquioxane (ethyl-POSS) containing polymers at different compositions were chemically modified using laser irradiation at 157 nm. The irradiation caused photodissociation of C–O and C–H bonds followed by the formation of new chemical bonds. The content of Si–O and C–O bonds increased, as did the surface hardness. Vacuum ultraviolet (VUV) absorption, mass spectrometry, x-ray photoelectron spectroscopy, and atomic force microscopy imaging and indentation were used to evaluate the effects of the 157 nm irradiation. The chemical modification was restricted to a thin surface layer. The layer depth was determined by the penetration depth of the 157 nm VUVphotons inside the thin copolymer layer. With prolonged VUVirradiation, the absorbance of the polymers increased, eventually becoming saturated. The chemical changes were accompanied by surface hardening, as evidenced by the increase in the Young’s modulus from 4 to 24 GPa due to glassification of the irradiated parts. The chemically modified layer acts as a shield against photodissociation and degradation of the deeper portion of the POSS polymer by VUVradiation. Applications include the protection of solar cells on low orbit satellites from solar VUVphotons.