5.1 This procedure is suitable for manufacturing control and for verifying that the product meets specifications. It provides rapid, multi-element determinations with sufficient accuracy to assure product quality. The analytical performance data included may be used as a benchmark to determine if similar X-ray spectrometers provide equivalent precision and accuracy, or if the performance of a particular spectrometer has changed.

1. Scope

1.1 This test method covers the analysis of Ni-base alloys by wavelength dispersive X-ray Fluorescence Spectrometry for the determination of the following elements:

Element

Composition Range

Manganese

0.06 % to 1.6 %

Phosphorus

0.008 % to 0.015 %

Silicon

0.08 % to 0.6 %

Chromium

1.6 % to 22 %

Nickel

23 % to 77 %

Aluminum

0.20 % to 1.3 %

Molybdenum

0.03 % to 10 %

Copper

0.007 % to 2.5 %

Titanium

0.11 % to 3.0 %

Niobium

0.55 % to 5.3 %

Iron

0.17 % to 46 %

Tungsten

0.06 % to 0.50 %

Cobalt

0.04 % to 0.35 %

Note 1—Unless exceptions are noted, concentration ranges can be extended by the use of suitable reference materials. Once these element ranges are extended they must be verified by some experimental means. This could include but not limited to Gage Repeatability and Reproducibility studies and/or Inter-laboratory Round Robin studies. Once these studies are completed, they will satisfy the ISO 17025 requirements for capability.

1.2 The values stated in SI units are to be regarded as standard. No other units of measurement are included in this standard.

1.3 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and to determine the applicability of regulatory limitations prior to use.