The effect of the total reflection of the incident beam into the 222 reflected beam in the Renninger (222/113) case in Si was experimentally observed by using a highly monochromatic beam with high angular collimation in both the vertical and horizontal planes.

It is observed experimentally that nanocrystals from II–VI compounds like CdS have a high density of stacking faults. It is argued that these are not crystal defects but rather represent a characteristic feature for such materials.

A method for computing X-ray three-beam rocking curves is described. It is based on fast-Fourier-transforming X-ray amplitudes in pinhole topographs which were computer-simulated based on the Takagi–Taupin equation.

An appreciable beating of the X-ray intensities may be induced by a lattice distortion that produces interbranch transformations of the local dispersion surface. In X-ray plane-wave topography, this effect may be observed as interference fringes arising around the kinematical image of a defect.