Abstract:

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Well-crystallized SrBi2Nb2O9 (SBN) thin films with good surface morphology were fabricated
on quartz glass substrates by RF magnetron sputtering technique at a deposition temperature of 600°C
under the O2/Ar(3:1) pressure of 2.4 Pa for 2 hour. The films exhibited bismuth-layered perovskite phase
structure without pyrochlore phase and the ratio of Sr:Bi:Nb is about 1:1.92:1.98. The nonlinear optical
properties of the films were determined by a single beam Z-scan technique at a wavelength of 532 nm
with laser duration of 25 ps. The measured values of the real and imaginary parts of the third-order
nonlinear optical susceptibility were 4.324×10-8esu and 1.278×10-8esu, respectively. The large nonlinear
optical effect shows that the SrBi2Nb2O9 thin films have great potential application in designing nonlinear
optical devices.