Electron Microscope Facility

Our state-of-the-art electron microscopy facilities allow researchers to see and measure things at the micro, nano and atomic scales

FEI Quanta 3D FEG FIB-SEM

The FEI Quanta 3D FEG FIB-SEM enables imaging, analysis and manipulation of microstructures using a combination of a field-emission gun scanning electron microscope with a gallium focused ion beam and a platinum gas-injection system.

Zeiss Supra 55VP FEG SEM

The Supra 55VP is a high resolution scanning electron microscope (SEM) that uses a Schottky-type field-emission gun (FEG). The microscope has variable pressure (VP) capability enabling the study of non-conductive materials.

JEOL NeoScope Tabletop SEM

The NeoScope is an easy to use compact tabletop SEM with low vacuum capability for imaging of non-conductive material. It has a secondary electron (SE) detector and backscatter electron (BSE) detector that can be used when the microscope is in a low vacuum condition.

JEOL JEM 2100 TEM

The JEOL JEM-2100 is a high-performance Transmission Electron Microscope (TEM) with a Lanthanum Hexaboride (LaB6) electron source for analyses at the sub-nanometre level in materials science, nanotechnology and life science.

Features:

High resolution imaging with specialist characterisation capabilities of EDS and Cryo Imaging.

JEOL JEM 2100F FEG TEM

The JEOL JEM-2100F is a high-performance Transmission Electron Microscope (TEM) with a field emission electron source for analyses at the atomic/molecular level in materials science, nanotechnology and life science.

Features:

High resolution imaging with specialist characterisation capabilities of EDS, EFTEM, EELS, and ACOM.

JEOL JSM 7800F FEG-SEM

The JSM-7800F is an ultrahigh resolution scanning electron microscope (SEM) that uses a Schottky-type field-emission gun (FEG). The system includes the JEOL Super Hybrid Lens (SHL) reducing the chromatic and spherical aberrations which leads to improved resolution, especially at low accelerating voltages.

Cameca LEAP 5000 XR Atom Probe

The LEAP 5000 XR is a cutting-edge local electrode atom probe instrument with a reflectron system for high resolution by time-of-flight mass spectroscopy. This technique offers atom by atom, 3D reconstruction of materials resulting in chemical analysis with near-atomic scale spatial resoltuion. The UV laser allows metals, semiconductors and insulators alike to be analysed.