Abstract:
A quick and easy way to take 3D images at the nanoscale with a single measurement has been developed by US researchers. The process works by bouncing a single beam of x-rays off an object, then collecting the scattered wave pattern using a curved detector. Since the process is accurate enough to pick up individual atoms, it is hoped the technique will become an important analytical tool.

'There has been no way to take 3D pictures from a single view until now,' says Jianwei Miao, who led the research at the University of California in Los Angeles, US.