When it comes to imaging sample materials, Scanning Electron Microscopy (SEM) is one of the most widely used analytical tools providing profound depth of field and detail in images of microscopic materials.

Vivid images of the topography of a material’s surface provide very important information including process characterization, compositional differences, morphology and weathering processes. These are just a few of many applications available with the use of SEM imaging.

Information from SEM can stand alone as a powerful tool in the research and development of your material, or complement the data obtained through other physical characterization analyses such as particle size, porosity, BET surface area and other analysis offered at PTL. “We have found that using SEM analysis helps provide further insight for our clients as it can provide a visual representation of a particle’s characteristics and an orthogonal analytical survey technique to other commonly used particle sizing equipment. For our clients, a picture can truly be worth a thousand words when attempting to describe the size and shape of particles.” says Bill Kopesky, Director of Analytical Services.

Example of images generated using SEM analysis. A focused beam of electrons scans the surface of the sample, which in turn produces secondary and backscattered electrons. The instrument’s detector(s) collect these emitted electrons and translate the signal into a high-resolution, multi-dimensional image of the sample’s surface.