Since Ge is not typically found in TEM columns, our calibration samples provide a material that cannot be mistaken for instrument components and their signal peaks. The regime in which system peaks normally occur [ 2-9 keV and 11-20 keV ] is devoid of peaks from the Ge.

The Ge is suspended across two micron pores that are patterned on a grid of 20 nm thick silicon nitride.

The single 500 x 500 micron window is compatible with high tilt angle tomography, since at 70 degrees of tilt, the thin and beveled 100 micron silicon frame allows you to use a ~50x50 micron region within the center of the window from any rotational orientation.

These EDX calibration standards were developed in partnership with Dr. Nestor J. Zaluzec from the Electron Microscopy Center and the Center for Nanoscale Materials at Argonne National Laboratory.