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Abstract

Metal–dielectric coatings can be used successfully to design
broadband absorbers. However, the understanding of the designs is
not easy. Here we present a new analytical method using achromatic
three-layer stacks. Such metal–dielectric basic structures permit
movement from a fixed admittance value to another one over a wide
spectral range. Efficient designs are calculated and explained with
this method.

References

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a Calculated with a linear progression law
for intermediate admittance values, for a reference wavelength of
λo = 0.7 µm. The
intermediate admittance values reached after each pair of layers are
given in the last column. D and M correspond
to dielectric and metallic layer thicknesses, respectively.

a Calculated with a square-root progression
law for intermediate admittance values, for a reference wavelength of
λo = 0.7 µm. The
intermediate admittance values reached after each pair of layers are
given in the last column. D and M correspond
to dielectric and metallic layer thicknesses, respectively.

Table 3

Physical Thicknesses of Metal–Dielectric Absorbers
Designed with Three Three-Layer Achromatic
Structuresa

Design 1

Design 2

Design 3

—

Y = 3.84 - 4.37
i

—

—

D = 0.035399

—

—

M = 0.010633

—

—

D = 0.014441

—

—

Y = 1.718 - 2.047
i

—

—

D = 0.053809

—

—

M = 0.005803

—

—

D = 0.036589

—

—

Y = 1.112 - 0.839
i

—

D = 0.052724

D = 0.052724

D = 0.045423

M = 0.003031

D = 0.014980

M = 0.003192

D = 0.092792

M = 0.001036

D = 0.092792

Y = 1.076 - 0.001
i

Y = 1

Y = 1

a Design 1 is the original
design. Designs 2 and 3 are modified designs that permit the final
admittance Y = 1 at the reference wavelength of
λo = 0.7 µm to be
reached. In design 2, layers eight and nine are modified. In
design 3, layers seven and eight are modified. The admittance
values Y are given after each three-layer
stack. D and M correspond to dielectric and
metallic layer thicknesses, respectively.

a Calculated with a linear progression law
for intermediate admittance values, for a reference wavelength of
λo = 0.7 µm. The
intermediate admittance values reached after each pair of layers are
given in the last column. D and M correspond
to dielectric and metallic layer thicknesses, respectively.

a Calculated with a square-root progression
law for intermediate admittance values, for a reference wavelength of
λo = 0.7 µm. The
intermediate admittance values reached after each pair of layers are
given in the last column. D and M correspond
to dielectric and metallic layer thicknesses, respectively.

Table 3

Physical Thicknesses of Metal–Dielectric Absorbers
Designed with Three Three-Layer Achromatic
Structuresa

Design 1

Design 2

Design 3

—

Y = 3.84 - 4.37
i

—

—

D = 0.035399

—

—

M = 0.010633

—

—

D = 0.014441

—

—

Y = 1.718 - 2.047
i

—

—

D = 0.053809

—

—

M = 0.005803

—

—

D = 0.036589

—

—

Y = 1.112 - 0.839
i

—

D = 0.052724

D = 0.052724

D = 0.045423

M = 0.003031

D = 0.014980

M = 0.003192

D = 0.092792

M = 0.001036

D = 0.092792

Y = 1.076 - 0.001
i

Y = 1

Y = 1

a Design 1 is the original
design. Designs 2 and 3 are modified designs that permit the final
admittance Y = 1 at the reference wavelength of
λo = 0.7 µm to be
reached. In design 2, layers eight and nine are modified. In
design 3, layers seven and eight are modified. The admittance
values Y are given after each three-layer
stack. D and M correspond to dielectric and
metallic layer thicknesses, respectively.