Neaspec GmbH

neaSNOM combines the best of two worlds – the nanoscale resolution of atomic force microscopy (AFM) with the analytical power of visible, infrared and even THz imaging & spectroscopy. At a spatial resolution of only 10nm the method only requires standard AFM sample preparation. This opens a new era for modern nano-analytical applications such as chemical nano-identification (IR), nano-plasmonic field mapping (VIS & IR) or free charge carrier nano-mapping (THz).