RMS

In-Situ Roughness Monitoring of very rough surfaces such as those of diffusers for LED and Laser light sources, as well as silicon and compound semiconductor solar cells.

RMS

The FSM RMS In-Situ Roughness Monitoring System is a compact, robust, and easy to use system to measure the roughness of very rough surfaces such as those of diffusers for LED and Laser light sources, as well as silicon and compound semiconductor solar cells. FSM’s proprietary non-contact grazing angle scattering technology makes the system immune to stray light and vibration and easy to integrate.