IEEE Symposium on Visual Analytics Science and Technology
(IEEE VAST), founded in 2006, is the first international
symposium dedicated to advances in Visual Analytics Science and
Technology. The scope of the symposium, co-located with the
annual IEEE Visualization
Conference (IEEE Vis)
and the IEEE Information
Visualization Conference
(IEEE InfoVis), includes
both fundamental research contributions within visual analytics as
well as applications of visual analytics, including applications in
science, security and investigative analysis, engineering, medicine,
health, media, business, and social interaction. We invite you to
participate in IEEE VAST 2009 by joining us
in Atlantic City, New Jersey,
in Atlantic City, New Jersey,
October 11 - 16, 2009.

We solicit papers in the traditional core of the visualization area.
Topics of interest include, but are not restricted to:

Visual representations and interaction techniques including the
principles for depicting information, new visual paradigms,
statistical graphics, geospatial visualizations, the science of
interaction, and approaches for generating visual analytic
visualization and interactions,

Data management and knowledge representation including scalable data
representations for high volume and stream data, statistical and
semantic signatures, and synthesis of information from diverse data
sources,

Algorithms and technologies which are fundamental for visual
analytics, including user and device adaptivity, web interfaces and
mobile devices,

Applications of visual analysis techniques, including but not
limited to applications in science, engineering, humanities, business,
public safety, commerce, and logistics as far as they contribute to
Visual Analytics