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Abstract

Fundamental to the design of an infrared sensor is controlling the stray light and internal radiation emission. A series of bidirectional reflectance distribution function (BRDF) measurements at two infrared bandpasses in the mid-wave infrared (MWIR) and long-wave infrared (LWIR) are acquired. Incident beams were oriented 10 and 60 deg from normal. Forward-scatter (key to baffles and cold shields) data are presented for infrared black surface preparations, including: anodizing, copper oxide, nickel oxide, black paints, and trademarked black surfaces. Comparison is also made between selected surfaces before and after exposure to 78 K (LN2) thermal cycles. This work also includes scanning electron microscope (SEM) images and discrete Fourier transform (DFT) measurements for selected black surfaces, including comparisons of damaged and undamaged nickel oxide.

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Journal of Applied Remote SensingJournal of Astronomical Telescopes Instruments and SystemsJournal of Biomedical OpticsJournal of Electronic ImagingJournal of Medical ImagingJournal of Micro/Nanolithography, MEMS, and MOEMSJournal of NanophotonicsJournal of Photonics for EnergyNeurophotonicsOptical EngineeringSPIE Reviews