초록

This paper presents the implementation of online test scheme for RFID memories based on Memory Built in Self Test (MBIST) architecture. This paper also presents the, Symmetric transparent version of March SS algorithm, implementation of Memory BIST. The comparison between the different march algorithms and the advantage of the March SS algorithm over all other is also presented. The solution was implemented using Verilog HDL and was, in turn, verified on Xilinx ISE 13.2 simulator, and synthesized.