Specifications

Specifications include,
but are not limited to: 1. The spectrometer
shall achieve minimum detection limits for thin
films on Teflon substrates (3-sigma) of 15
ng/cm2 for cadmium (Cd), 0.9 ng/cm2 for arsenic
(As), 1.6 ng/cm2 for lead (Pb), 0.9 ng/cm2 for
nickel (Ni), 1.5 ng/cm2 for manganese (Mn), 1.4
ng/cm2 for cobalt (Co), 4.5 ng/cm2 for mercury
(Hg). 2. The spectrometer shall show counting
stability of better than 0.3% RSD (relative
standard deviation) during an 8-hour testing
period under typical analytical conditions in a
controlled laboratory environment. 3. The
spectrometer shall not use cooling water or
require any external connections or utilities,
such as gas or water, other than electrical
power. 4. The X-ray tube shall be powered only
during sample analysis and automatically
turn-off after analysis completion. 5. The
spectrometer shall have available
user-selectable collimators or aperture
available down to 1 mm to reduce X-ray spot size
for analysis of small features or samples.