Decharat, Adit

Abstract [en]

Infrared (IR) imaging devices based on energy detection has shown a dramatic development in technology along with an impressive price reduction in recent years. However, for a low-end market as in automotive applications, the present cost of IR cameras is still the main obstacle to broadening their usage. Ongoing research has continuously reduced the system cost. Apart from decreasing the cost of infrared optics, there are other key issues to achieve acceptable system costs, including wafer-level vacuum packaging of the detectors, low vacuum level operation, and the use of standard materials in the detector fabrication. This thesis presents concepts for cost reduction of low-end IR cameras.

The thesis presents a study of detector performance based on the thermal conductance design of the pixel. A circuit analog is introduced to analyze the basic thermal network effect from the surrounding environment on the conductance from the pixel to the environment. A 3D simulation model of the detector array conductance has been created in order to optimize the performance of the arrays while operated in low vacuum. In the model, Fourier's law of heat transfer is applied to determine the thermal conductance of a composite material pixel. The resulting thermal conductance is then used to predict the performance of the detector array in low vacuum.

The investigations of resist as the intermediate bonding material for 3D array integration are also reported in the thesis. A study has been made of the nano-imprint resists series mr-I 9000 using a standard adhesive wafer bonding scheme for thermosetting adhesives. Experiments have been performed to optimize the thickness control and uniformity of the nano-imprint resist layer. The evaluation, including assessment of the bonding surface uniformity and planarizing ability of topographical surfaces, is used to demonstrate the suitability of this resist as sacrificial material for heterogeneous detector array integration.

Moreover, the thesis presents research in wafer-level packaging performed by room temperature bonding. Sealing rings, used to create a cavity, are manufactured by electroplating. The cavity sealing is tested by liquid injection and by monitoring the deflection of the lid membrane of the cavities. A value for the membrane deflection is calculated to estimate the pressure inside the cavities.

Abstract [en]

In this paper, we present a comprehensive calculational model for the noise equivalent temperature difference (NETD) of infrared imaging systems based on uncooled bolometer arrays. The equations are presented in a new and convenient form. The NETD model is validated and benchmarked using published performance data of a state-of-the-art uncooled infrared bolometer array. The NETD model is used to evaluate possible system and bolometer design improvements. The results of the calculations suggest that infrared imaging systems based on uncooled bolometer arrays with a bolometer pixel pitch of 28 mu m x 28 mu m have the potential to reach NETDs on the order of 12 mK. The calculations also suggest that NETDs on the order of 200 mK can be achieved with infrared imaging systems based on uncooled bolometer arrays that operate in air at atmospheric pressure.

Abstract [en]

In this paper, we present the use of thermosetting nano-imprint resists in adhesive wafer bonding. The presented wafer bonding process is suitable for heterogeneous three-dimensional (3D) integration of microelectromechanical systems (MEMS) and integrated circuits (ICs). Detailed adhesive bonding process parameters are presented to achieve void-free, well-defined and uniform wafer bonding interfaces. Experiments have been performed to optimize the thickness control and uniformity of the nano-imprint resist layer in between the bonded wafers. In contrast to established polymer adhesives such as, e.g., BCB, nano-imprint resists as adhesives for wafer-to-wafer bonding are specifically suitable if the adhesive is intended as sacrificial material. This is often the case, e.g., in fabrication of silicon-on-integrated-circuit (SOIC) wafers for 3D integration of MEMS membrane structures on top of IC wafers. Such IC integrated MEMS includes. e.g., micro-mirror arrays, infrared bolometer arrays, resonators, capacitive inertial sensors, pressure sensors and microphones.

Abstract [en]

In this paper, we present a wafer-to-wafer attachment and sealing method for wafer-level manufacturing of micro-cavities using a room-temperature bonding process. The proposed attachment and sealing method is based on plastic deformation and cold welding of overlapping metal rings to create metal-to-metal bonding and sealing. We present the results from experiments using various bonding process parameters and metal sealing ring designs including their impact on the resulting bond quality. The sealing properties against liquids and vapor of different sealing ring structures have been evaluated for glass wafers that are bonded to silicon wafers. In addition, wafer-level vacuum sealing of microcavities was demonstrated when bonding a silicon wafer to another silicon wafer with the proposed room-temperature sealing and bonding technique.