White Beam Synchrotron Radiation Topography

Abstract

White beam X-ray topography (Laue Technique) is probably the simplest available X-ray imaging technique. Pioneering work by Guinier and Tennevin [1] and Schultz [2] was however followed with little applications due to the lack of intense, low divergence white beam X-ray sources. Synchrotron sources possess both of these qualities. They therefore appear as ideal sources for such experiments.