Detection of heavy ions by secondary electron emission is of great importance in precise implantation of ions in matter or in nanoholes production in different polymers. In this paper an experimental setup was made with two channeltrons (electron multiplier) in front of the target and one silicon detector behind the target. Four targets were used: gold, diamond, mylar and silicon-nitride. Before the measurements were made the efficiency tests were performed. The efficiency of secondary electron detection was made on four targets with four different blocks: E = 4MeV (E = 1MeV), H+(E = 1MeV) and O+ (E = 4MeV). The efficiency of this setup is not good for polymers such as well as for ceramics such as siliconnitride. The measurements are imprecise due to their structure and the number of secondary electrons emitted per ion impacted on such material is lower than that of gold or diamond. Using one specific target would give significantly better results because perfect symmetry could then be achieved. It is also noticeable that the setting is extremely sensitive to geometry and symmetry between the two detectors. As expected, it was confirmed that greater the stopping power is the number of secondary electrons emitted is greater.