High-Speed Digital Analysis

Perform detailed characterization with powerful analysis tools

Most serial data links begin and end with high-speed ICs designed for standards-compliant interoperability. As bit rates increase, the margins for jitter, interference and other imperfections make it increasingly difficult to achieve BER of less than 10-12. The following tools will help you characterize and analyze your designs in detail. Keysight - achieve your best design.

This application note is for R&D designers and engineers working on high-speed digital designs. It addresses jitter measurements in digital circuits, how the different measurement techniques are best applied, and how these decisions may change as the data rates increase.

In this product note examples are given for advanced, automated HDMI compliance tests and characterization based on a high bandwidth oscilloscope, a TMDS Signal Generator and the Test Automation Software Platform.

This application note describes the N4903A BERT characterization solution for emerging serial gigabit devices: it helps engineers make quick and accurate jitter tolerance tests, which have been complicated and hard to do in the past.

This white paper describes how various jitter analysis techniques give dissimilar results. Which is right? We built a precision jitter transmitter to compare results of different techniques where test sets were exposed to known levels of jitter.

Traditionally, bit error rate testing compares the bits from a Device Under Test (DUT) against a reference data set, called the expected data. The user of Bit Error Ratio Tester (BERT) has to provide this expected data and load it into the tester.