Terahertz near-field microscopy at 30nm spatial resolution

Due to their long wavelengths, terahertz radiation runs into difficulties when detecting extremely small structures. However, by combining terahertz radiation with a near-field microscope, it is possible to increase the lateral resolution into the nanometer range. neaspec GmbH and Fraunhofer IPM have developed a ready-to-use terahertz system that is capable of achieving a spatial resolution of <30 nanometers in combination with neaspec’s neaSNOM near-field microscope. neaspec GmbH presented the results at the German THz Conference 2015 in Dresden from June 8–10.