Pb(Mg1/3Nb2/3)O3-based X7R multilayer ceramic capacitors (MLCs) were placed in 0.01 M NaOH solution to deposit hydrogen on their termination electrodes through the electrolysis of water. The treatment led to great increases in the dielectric loss and the leakage current of the MLCs, and the dielectric properties of the MLCs also showed a strong aging behavior, with the capacitance and dielectric loss first inceased, and then gradually decreased. It was proposed that hydrogen from the electrolysis of water entered into Pb(Mg1/3Nb2/3)O3 lattice and existed at interstial lattice sites. The observed degradation could be explained by free electrons formed through ionization of interstitial hydrogen. Hydrogen-induced degradation happens in Pb(Mg1/3Nb 2/3)O3-based MLCs during electroplating and in service and much attention should be paid to prevent hydrogen-induced degradation in them.

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