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"Atomic-force Microscopy and Its Applications" ed. by Tomasz Tański, Marcin Staszuk, Boguslaw Ziebowicz
ITExLi | 2019 | ISBN: 178985170X 9781789851700 1789851696 9781789851694 | 101 pages | PDF | 16 MB
This book is not only for students but also for professional engineers who are working in the industry as well as specialists. This book aims to provide the reader with a comprehensive overview of the new trends, research results and development of atomic force microscopy.

Atomic force microscopy is a surface analytical technique used in air, liquids or a vacuum to generate very high-resolution topographic images of a surface, down to atomic resolution.
The chapters for this book have been written by respected and well-known researchers and specialists from different countries. After studying this book, you will have objective knowledge about the possible uses of atomic force microscopy in many scientific aspects of our civilisation.

Contents
1 Introductory Chapter: Why Atomic Force Microscopy (AFM) is One of the Leading Methods of Surface Morphology Research of all Engineering Material Groups
2 Characterization of Single Polymer Molecules
3 Forensic Potential of Atomic Force Microscopy with Special Focus on Age Determination of Bloodstains
4 Scanning Probe Techniques for Characterization of Vertically Aligned Carbon Nanotubes
5 Characterization of Multiblock (Segmented) Copolyurethane-Imides and Nanocomposites Based Thereof Using AFM, Nanotribology, and Nanoindentation Methods
6 High-Magnification SEM Micrograph of Siloxanes