Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar
Mika, Filip; Pokorná, Zuzana
2018 - English
The origins of the seminar “Recent Trends in Charged Particle Optics and Surface Physics Instrumentation” date back into the eighties, when as a part of the isolated “Eastern Bloc”, we were short of English-language books, papers and conferences. In 1990, at the second Seminar, there were as many as 30 participants from 5 countries. The third Seminar in 1992 was moved to hotel Skalský dvur in the Bohemian-Moravian Highlands where it has been held as a biannual meeting ever since.\nThe Seminar takes place in a secluded lakeside hotel surrounded by beautiful nature and calm forests, so all participants have a great possibility to see each other every day and to discuss their topics of interest in more detail. This is a great advantage compared to the huge bustling conferences with their many parallel sections, which are a lively celebration of science but\nsometimes it is difficult to meet there the person with whom you want to discuss a particular scientific topic in more detail.\nFrom the very beginning, the Seminar has been conceived as a meeting devoted more to asking questions not answered yet, than to reporting results. This spirit is usually less present in the introductory presentations and posters but is dominant in the following discussions.\n
Keywords:
charged particle optics; surface physics; instrumentationAvailable at various institutes of the ASCRRecent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar

The origins of the seminar “Recent Trends in Charged Particle Optics and Surface Physics Instrumentation” date back into the eighties, when as a part of the isolated “Eastern Bloc”, we were short of ...

Mika, Filip; Pokorná, Zuzana
Ústav přístrojové techniky, 2018

Very low energy electron transmission spectromicroscopy
Daniel, Benjamin; Radlička, Tomáš; Piňos, Jakub; Mikmeková, Šárka; Konvalina, Ivo; Frank, Luděk; Müllerová, Ilona
2018 - English
For more than 25 years, Scanning Low Energy Electron Microscopy (SLEEM) has been\ndeveloped at the Institute of Scientific Instruments (ISI), with several commercially available SEMs adapted with a cathode lens for SLEEM use, as well as a dedicated self-built UHVSLEEM setup.\nFor a better understanding of contrast formation at low energies, especially at very low energies below 50 eV, where the local density of states plays an important role, more general knowledge about the interaction of (very) low energy electrons with solids is required. This will be achieved using a newly developed ultra-high vacuum (UHV SLEEM) setup which includes several enhancements compared to other available machines. Data processing is presented in, and processed data will be further used and tested with the Monte Carlosimulation package BRUCE, which is being developed by Werner et al. at TU Vienna.
Keywords:
low energy scanning electron microscopy; electron microscopy; time of flight; electron energy lost spectroscopyAvailable at various institutes of the ASCRVery low energy electron transmission spectromicroscopy

For more than 25 years, Scanning Low Energy Electron Microscopy (SLEEM) has been\ndeveloped at the Institute of Scientific Instruments (ISI), with several commercially available SEMs adapted with a ...

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