XPS

XPS

X-Ray Photoelectron Spectrometer

Kratos axis HS XPS system

The x-ray photoelectron spectrometer is a surface elemental analysis instrument and can penetrate the sample surface of up to 30 Au deep. It can do surface chemical mapping and depth profiling of metallic, semi-metallic, and non-metallic samples as deep as 1 nm. The system is equipped with five detectors and has a charge neutralization system for insulated samples. This instrument has dual x-ray guns Mg/Al source or the Al monochromatic source. It also has an ion etch gun for performing depth profiling.