Abstract

In this work, structural features and optical properties of CuPcF16 films deposited by physical vapour deposition have been investigated. Thin films of two different thicknesses (22 and 198 nm) were characterized by ellipsometry, optical absorption spectroscopy and scanning electron microscopy. Film morphology and optical properties are found to depend on film thickness. Absorption spectra of CuPcF16, films were compared with those of unsubstituted copper phthalocyanine. The sensor response of CuPcF16 film to ammonia was studied using surface plasmon resonance measurements. It was stated that strong electron-withdrawing fluorine substituents make this compound sensitive to reducing gases such as NH3 while unsubstituted CuPc is practically insensitive to this gas.