Nanocharacterization and Scanning Probe Microscopy Platform

Purpose

With the continuous scale decrease at the heart of device processes, material growth and structure synthesis, scanning probe microscopy is the answer to the needs of the research groups for a 3 dimensional nanoscale imaging tool, complementary to the conventional imaging techniques. Additionally, this technique provides physical characterization (electrical, mechanical, chemical,..) of new materials, nanostructures and devices at the nanometer scale.