EE Times Europe article: Adapting test strategies to IoT

In a recent article for EE Times Europe, Mike Bartley (founder and CEO) and Declan O’Riordan, Head of Security Testing, TVS shared their perspective on Adapting test strategies to IoT. A short abstract of the article is outlined below. To read the full article visit EETimes Europe.

The internet of things (IoT) brings with it the ability to build more flexible and responsive control systems in which devices from many different vendors are brought together to deliver more functionality than is possible with traditional, standalone embedded systems.

The IoT will do much to increase the level of automated intelligence around us. It will also, because of this, change the way embedded systems developers handle validation and verification.