Abstract

The structure of conducting oxide has been studied as a function of temperature up to by neutron powderdiffraction. The structure is found to remain orthorhombic, in space group , over the entire temperature range. The structural rigidity is evidenced by the fact that the octahedral tilt angles change by only over the entire temperature range. The absence of any structural phase transition in this temperature range and retention of its conducting properties make more useful compared to its counterpart with regard to its application as metallic-interface/electrode/substrate material in epitaxialthin film devices to be used at high temperatures.