Imatest Master

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5.2 New Features and Enhancements:

ON Semiconductor DevwareX support for this advanced image sensor interface software, which replaces Devware. Support for the APbase image acquisition API.

Decompanding for the proper processing of piecewise linear (PWL) companded RAW files, which can extend sensor dynamic range by allowing different tonal curves for ranges of digital output values.

Contrast Detection Probability (CDP) from Contrast Resolution chart using low-contrast path triplets to calculate the draft IEEE P2020 metric. CDP is a metric for the distinguishability from two input light levels through an imaging system.

Dynamic Range (DR) Output Resistance to Flare Light – We can now detect conditions where flare light causes exaggerated DR measurements and can remedy the misleading measurements by limiting the quality-based DR to the slope based DR, which is defined by the scene density where the patch pixel-level stops decreasing.

Improved distortion calculation: Checkerboard and SFRplus modules support an enhanced set of distortion models, and provide faster and more accurate distortion coefficient and center of distortion estimations.