Pocket Type Tester For Silicon Wafers, Ingots and Pot Scrap

21st Century New Design incorporates a computerized brain with a highly reliable three point probe head. Integrated probe head with replaceable low cost pins. Pins have low spring force to minimize contact damage to wafers. Allows you to test type on Silicon Wafers and Pot Scrap. Bicolor LED shows you the type (N, P). Portable tester; ideal for travel. Reports type down to .05 ohms on most materials.