Although considerable reductions in line widths and spacings have been accomplished through advancements in standard subtractive print-and-etch processing, further miniaturization necessitates thinner substrates and line widths and spacings too fine for the capabilities of subtractive print-and-etch processing with standard buildup materials. READ MORE...

AltiumLive: Empathy Sparking PCB Design Innovation

A youthful exuberance was palpable at Altium’s annual users conference. But what else would you expect when the keynote speaker wants engineers to “go crazy?” READ MORE...

SMT 4.0 and CTF

Increased use and power of artificial intelligence-aided electronics manufacturing, such as Industry 4.0, creates the opportunity and need to revisit how one manages and improves quality and defect rates. AI Industry 4.0-aided manufacturing should incorporate critical to function (CTF) quality methodology. READ MORE...

If You Want to Know the Future of CAD, Look to the Past

The bustling show for design engineers and manufacturers highlighted Wally Rhines’ funny, poignant retrospective of the ECAD industry, which also offered a glimpse of what the future might look like. READ MORE...

Enabling IPX Level 7/8 PCB Waterproof Protection

A “no mask” category of surface treatment has emerged as a result of some recent discoveries made in R&D in the chemistry of conformal coatings. READ MORE...

Homepage Slideshow

Achieving Fine Lines and Spaces Using MSAP

Although considerable reductions in line widths and spacings have been accomplished through advancements in standard subtractive print-and-etch processing, further miniaturization necessitates thinner substrates and line widths and spacings too fine for the capabilities of subtractive print-and-etch processing with standard buildup materials.

Increased use and power of artificial intelligence-aided electronics manufacturing, such as Industry 4.0, creates the opportunity and need to revisit how one manages and improves quality and defect rates. AI Industry 4.0-aided manufacturing should incorporate critical to function (CTF) quality methodology.