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Abstract

As an alternative to correlation-based techniques widely used in conventional speckle metrology, we propose a new technique that makes use of phase singularities in the complex analytic signal of a speckle pattern as indicators of local speckle displacements. The complex analytic signal is generated by vortex filtering the speckle pattern. Experimental results are presented that demonstrate the validity and the performance of the proposed optical vortex metrology with nano-scale resolution.

Fig. 4. Variation of the peak positions and peak heights of the displacement histograms of phase singularities, with the amount of voltages applied to piezoelectric transducer. (Unit pixel corresponds to 578nm.)