In Praise ofVLSI Test Principles and Architectures: Design for TestabilityTesting techniques for VLSI circuits are today facing many exciting and complex challenges.In the era of large systems embedded in a single system-on-chip (SOC) and fabricated incontinuously shrinking technologies, it is important to ensure correct behavior of the wholesystem. Electronic design and test engineers of today have to deal with these complex andheterogeneous systems (digital, mixed-signal, memory), but few have the possibility to studythe whole field in a detailed and deep way. This book provides an extremely broad knowledgeof the discipline, covering the fundamentals in detail, as well as the most recent and advancedconcepts.It is a textbook for teaching the basics of fault simulation, ATPG, memory testing, DFT andBIST. However, it is also a complete testability guide for an engineer who wants to learn thelatest advances in DFT for soft error protection, logic built-in self-test (BIST) for at-speedtesting, DRAM BIST, test compression, MEMS testing, FPGA testing, RF testing, etc.

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