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To accommodate visitors to campus for the Total Solar Eclipse, WKU has delayed the start of classes on all campuses until 4pm on Monday, August 21, 2017. Offices at all WKU campuses will observe regular hours that day. For more information, visit wku.edu/eclipse.

WKU NOVA Center

Inside view of the Large Chamber Scanning Electron Microscope (LCSEM)

Positioning of the microscope on an item inside the LCSEM

A colorized scan of an item taken in the LCSEM

A colorized scan of an item taken inside the LCSEM

The Large Chamber Scanning Electron Microscope has great potential for observations
of deformation behavior of materials, as well as for relatively small production processes
in the field of micro-system techniques.

The Large Chamber SEM also makes it possible to perform “interrupted monitoring” experiments
for larger engineering parts. The parts can be in service for a specific period of
time followed by an investigation of the part in the LC-SEM and returned to service
immediately after the investigation is complete.

This way of monitoring a system will open a very broad field for engineering applications
that will allow a more detailed understanding for preventative maintenance.

Precision Analysis

The Large Chamber Scanning Electron Microscope (LC-SEM) will accommodate a sample
up to 40 inches in diameter, 40 inches tall and up to 650 pounds (large enough for
an automobile engine block) eliminating the need to cut samples into small pieces
for examination.

Equipped with a positioning system that allows views from different angles the LC-SEM
gives an extended view of an object being tested. By moving the electron gun and detectors
around the object the LC-SEM is capable of generating images with a resolution of
better than 10nm and a magnification up to 300,000X.

Nondestructive Analysis (NDA) is used to evaluate properties of a material, component
or system without causing damage. NDA does not permanently alter the article being
inspected and can save both money and time in product research, evaluation, and troubleshooting.