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Curve Trace System

IC Screening for Failure Analysis Laboratories

Utilizing industry-standard PXI hardware and LabVIEW software, Bloomy's Curve Trace System provides high density, high speed and fully automated IC electrical characterization. Current versus voltage curves can be generated for any combination of pins to characterize a large assortment of ICs. The system can also rapidly identify faults in semiconductor devices by automatically comparing against a known good device's profile. The standard Curve Trace System uses a high resolution source measurement unit (SMU) with a -20V to a +20V range to perform I-V sweeps on selected IC pins (up to 1024) in tens of milliseconds. High-speed switching enables up to 500 curve traces per minute.

Configurations

The standard Curve Trace System supports 4 busses and up to 1024 pins with a single Vdd. Customized Curve Trace System configurations are available to meet your exact needs, with more busses, power, and/or higher or lower pin count. The system application can be modified to provide additional curve trace modes, new reporting options, database integration, and more.