The Dual Beam FIB consists of a high resolution field emission electron column and gallium source ion column combined within the same instrument for nanoscale prototyping, machining, characterization, and analysis of structures below 100 nm.more details »

Used in elemental composition and depth profiling of samples with the combination of AES analysis and inert ion bombardment. Typically used for the analysis of metals, semiconductors, glasses and ceramics.more details »

LMCC is located within the Materials Department of Loughborough University. The purpose of the centre is to provide a high quality materials characterisation facility to support research within Loughborough University, the wider academic community anmore details »

The TEM uses thin samples to examine internal microstructure at a resolution down to the sub-nanometre level. A combination of imaging, electron diffraction and EDX analysis allows detailed characterisation to be carried out.more details »