Abstract

Reflection high‐energy electron diffraction(RHEED) intensity oscillations were observed for the molecular‐beam epitaxialgrowth of Pb1−xEuxTe. For the first time, the influence of vapor composition and surface condition on the damping of the intensity oscillations was studied in ternary IV‐VI compounds. The shape of the RHEED intensity oscillations is found to depend critically not only on the Eu‐to‐Te2 beam‐flux ratio, but also on the initial state and the stoichiometry of the surface. For growth on a Te‐stabilized surface with Te‐rich beam‐flux composition, optimum growth conditions were found with up to N=380 oscillation periods.