Home » Measurement of ac conductivity of gold nanofilms at microwave frequencies

TITLE

Measurement of ac conductivity of gold nanofilms at microwave frequencies

AUTHOR(S)

Yin Poo; Rui-xin Wu; Xin Fan; Xiao, John Q.

PUB. DATE

June 2010

SOURCE

Review of Scientific Instruments;Jun2010, Vol. 81 Issue 6, p064701

SOURCE TYPE

Academic Journal

DOC. TYPE

Article

ABSTRACT

We proposed an application of the open-terminal method to measure the alternating current (ac) conductivity of metallic nanometer thick films at microwave frequencies. An explicit expression of the conductivity as a function of reflection has been derived. Using the application, we experimentally measured the complex conductivity of gold nanometer films in microwave X band. The results are in good agreement with those obtained by other techniques. We find that the filmâ€™s surface morphology affects not only the magnitude but also the frequency dependence of the ac conductivity. In some cases, the direct current conductivity can be lower than the ac conductivity deviating from the Drude model, which can be well qualitatively explained by a circuit model for the granular films.

Phase-shift angle 0 dependences for alternating current as well as capacity C~, in (Co45Fe45Zr10)x(Al2O3)(100-x) nanocomposites of the metallic phase content of x = 49.5 at.% have been investigated within the presented paper. The nanostructure has been produced by an ion-sputtering method with...

Wet-etching with an organic alkaline solution was monitored in situ in semi-real time by optical reflection spectroscopy to achieve high resolution thickness control of hydrogenated amorphous silicon (a-Si:H) film for use in wire waveguides. Isotropic etching resulting from the intrinsic...

An introduction is presented in which the editor discusses various reports within the issue on topics including complex systems that integrate micro and nanoscale, novel materials and manipulation at nano-scale and carbon nano-materials for optical applications.

The growth and resulting crystallography of Cu nanowire arrays fabricated using glancing angle deposition are studied. On native oxide Si(100), the nanowires exhibited a strong (110) texture for a deposition angle Î¸=75Â° with rotational symmetry of the low energy Cu[111] about the long...

We have studied the ex-situ annealing effects on the surface morphology and electrical transport of gapless semiconductors, PbPdO2 and Pb(Pd,Co)O2 thin films, with varying annealing temperature and time. The annealing process gives rise to better surface morphology in both samples. The optimal...

We describe a phenomenon of reach-through band bending in thin film semiconductors. It occurs through generation of defects that change the semiconductor work function. This translates the effect of the metal presence through the semiconductor film and induces a Schottky barrier in another...

In this paper, we study the electrical conductivity of nanostructured C-modified aluminum, and the possibility of optimizing its electrical and mechanical properties. The model proposed allows estimating the electrical conductivity of the material at low surface filling factor. A number of...