Electron Microscopy

Electron microscopy is a powerful technique which uses an accelerated beam of electrons for sample imaging. Types of electron microscopy include transmission electron microscopy (TEM) and scanning electron microscopy (SEM) which includes FESEM and STEM. Electron microscopes have specific magnification and resolution. The type of EM determines the sample preparation and detectors required.

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The Agilent 8500 FE-SEM is a compact system that offers researchers a field emission scanning electron microscope (FE-SEM) right in their own laboratory. The innovative 8500 has been optimized for low-voltage imaging, extremely high surf... Read more...

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Field Emission-SEM for advanced analytical microscopy The SIGMA series of Field Emission Scanning Electron Microscopes (FE-SEM) delivers advanced analytical microscopy with the high performance you expect from Carl Zeiss. Equipped with ... Read more...

Speed up your tomography runs: use up to 100 nA FIB current with excellent spot profile to bridge the gap between micro- and nanopatterning.
With Crossbeam you combine the imaging and analytical performance of the GEMINI column with t... Read more...

Within ZEISS Crossbeam Family you have the choice between Crossbeam 340 or Crossbeam 550. Exploit the variable pressure capabilities of Crossbeam 340. Or use Crossbeam 550 for your most demanding characterizations and choose the chamber si... Read more...

ParticleSCAN VP: A New Dimension in Process Control ParticleSCAN VP is an exciting addition to the Carl Zeiss portfolio of scanning electron microscopes (SEM). ParticleSCAN has been developed for a range of industrial environments ei... Read more...

The CLUE (Cathodo-Luminescence Universal Extension) series is designed for use in materials science, mineralogy, geology, life sciences and forensics applications. They interface with any Scanning Electron Microscopes (SEM) and dual SEM/F... Read more...