June 28 /PRNewswire/ -- Packard-Hughes Interconnect said its new IC Membrane Test Probe for at-speed testing of ICs at the wafer level has achieved breakthroughs in terms of performance and price over competing wafer probing technologies during recent beta testing at leading semiconductor manufacturers.

the market leader in embedded software development tools and royalty-free real-time operating systems (RTOS), today announced support of the TimeMachine 4-D debugger and SuperTrace probe for the Motorola MPC5554, a 32-bit PowerPC controller for advanced automotive and industrial systems.

The new Agilent HF-CV solution for the Agilent 4070 Series, integrates the UF300A wafer prober made by ACCRETECH, a dedicated probe card made by Micronics Japan and the Agilent 4294A Precision Impedance Analyzer and the Agilent 42941A Impedance Probe for high-volume measurements.

Teradyne has been jointly working with a broad range of prober, probe card, and probe card metrology tool suppliers, for more than two years, to develop a revolutionary new interface to meet the needs of highly parallel wafer probe for high-volume DRAM and other memory devices," said Simon Longson, Interface Design Manager.

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