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Agilent (News - Alert) Technologies Inc. (NYSE: A) today announced the latest release
of Genesys
2014, its industry-leading, affordable RF simulation and synthesis
software. Designed for circuit and system designers, the Agilent EEsof
EDA software features breakthrough modulated RF analysis as well as
enhancements to its powerful, custom-filter direct synthesis technology.

Using Genesys (News - Alert) 2014, designers can now simulate digitally modulated RF
signals like those found in today's defense and consumer wireless
applications as easily as they do traditional analog RF signals. Unlike
other simulators that provide only single-value results for EVM, BER or
ACPR, Genesys 2014 delivers breakthrough system budget analysis of these
digital modulation metrics for every component in the system block
diagram, all in a single pass. This provides RF designers the
unprecedented ability to immediately identify culprit components causing
digital performance failures.

Powering Genesys 2014's accurate digital modulation analysis is a new,
embedded numeric dataflow simulator that also enables easy verification
against the latest wireless standards for WLAN 802.11ac and LTE (News - Alert)-3GPP.
With the appropriate defaults conveniently set up and ready for use in
the software's test menus, RF designers no longer need struggle with
setting unfamiliar and complex dataflow parameters to verify their
circuits or systems against wireless standards.

"When designing the new Genesys 2014 modulated RF capability, we wanted
to make it extremely intuitive for RF designers," said How-Siang Yap (News - Alert),
Genesys product planning manager with Agilent EEsof EDA. "We
accomplished this goal by mimicking what RF designers already do on the
bench with vector sources and analyzers. Genesys 2014 is now able to
automatically take care of all the complexity of dataflow sources, sinks
and their parameters behind the scenes."

Additional Software Enhancements

Genesys 2014 revamps its most powerful direct-synthesis technology for
seamless workspace integration to allow multiple custom filters to be
interactively designed together. Doing so enables the exacting design of
diplexers, multiplexers and notched filters. Powerful equivalent network
transforms can then be used, allowing designers to realize their designs
in lumped and/or distributed printed circuit boards.

Genesys 2014 also now features the industry's largest collection of
vendor X-parameters* models for se in nonlinear circuit and system
simulation. Such functionality further establishes the software as the
most affordable, accurate and ease-to-use RF simulation and synthesis
solution in the industry.

Agilent's Genesys 2014 will be demonstrated, along with 20 of its newest
design and measurement solutions, at IEEE (News - Alert) MTT-S International Microwave
Symposium 2014 (Booth 1133), June 1-6, in Tampa, Florida. Agilent
Partners, co-located around the Agilent booth, will demonstrate
solutions for modeling and device characterization; semiconductor
foundries; IC, wafer, and PCB design, test, and prototyping; antenna
measurement systems and test chambers; and custom systems. In addition,
Agilent's Dr. Robert Shimon, an R&D manager in the company's High
Frequency Technology Center, will provide insight on "How Digital
Markets are Driving Microwave Technology" at the MicroApps Theater on
Tuesday, June 3, from 10:05 to 10:45 a.m.

Agilent Technologies Inc. (NYSE: A) is the world's premier measurement
company and a technology leader in chemical analysis, life sciences,
diagnostics, electronics and communications. The company's 20,600
employees serve customers in more than 100 countries. Agilent had
revenues of $6.8 billion in fiscal 2013. Information about Agilent is
available at www.agilent.com.

On Sept. 19, 2013, Agilent announced plans to separate into two publicly
traded companies through a tax-free spinoff of its electronic
measurement business. The new company is named Keysight Technologies,
Inc. The separation is expected to be completed in early November 2014.

*X-parameters is a trademark and registered trademark of Agilent
Technologies in the US, EU, JP, and elsewhere. The X-parameters format
and underlying equations are open and documented. For more information,
visit www.agilent.com/find/eesof-x-parameters-info.

NOTE TO EDITORS: Further technology, corporate citizenship and executive
news is available at www.agilent.com/go/news.

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