Category Archives: Test-Measurement

LM331 is a Voltage-to-Frequency Converters and 74C926 is a 4 Digit Counter. The first part of the circuit converts the amplified DC analog value from a shunt to pulses. The Second counts the pulses and Displays it on a Seven segment LED display.

In Electroplating, the time taken will determine the plating thickness which is both related to cost and quality. More current also means more metal has been used so it has to be monitored to control and deliver cost effective electro plating quality.

A high current with low voltage is applied on special electrodes. One of the electrodes will have the job to be plated. The Medium is an Electrolyte. This is a part of Electrochemistry, Battery, Cells, Electrolytic Capacitors all belong to this branch.

This is a Test Circuit for Logic Analyzer software, with the Simple port circuit. The VB Logic Analyzer works, but is just an example program to test and learn.

The speed at which the logic state changes say like 10 M Hz while probing even a PIC or 89C51, is too fast for this circuit. For that, the incoming data has to be spooled or stored in RAM at real time, by the external Hardware itself.

As this is a Parallel Port Interface, an Embedded High Speed Digital RAM Storage of Multiple Logic input Channels with Signal Conditioning in the front end, could do the job. This is the minimum, if you want to program the rest of the instrument on Computer Software. Here is one you can see from Bitscope using USB or Ethernet.