tag: Dynamic Voltage Frequency Scaling

Fully-depleted silicon-on-insulator ([getkc id="220" kc_name="FD-SOI"]) manufacturing technology reached of point of readiness for mass production at the end of March. Along with that, it’s now clear that while there are some impacts on the design flow, those impacts are not game changers.
For one thing, the tools required are the same ones currently used for 28nm planar bulk CMOS. The onl... » read more

Whenever more than one clock is employed in an SoC (which is all SoCs), the risk of errors from clock domain crossings (CDC) – signals (or groups of signals) that are generated in one clock domain and consumed in another – is incredibly high. Unfortunately, CDC bugs are nearly impossible to catch with conventional simulations. Thus, all too often they escape into silicon. Debugging them in ... » read more