Parametric Test

Integrated circuit devices continue to shrink in size, increase in density, and improve in performance every year. Manufacturing and testing these devices while simultaneously maintaining and improving yield has become increasingly difficult. Nevertheless, Keysight Technologies' parametric test solutions continue to meet these challenges and to provide users with consistently accurate and highly automated test solutions for better process monitoring. Our award winning parametric test systems are a de facto industry standard, with over 4,000 systems installed worldwide. With a history of over 70 years of innovation and leadership in the Test and Measurement industry, Keysight knows what it takes to meet the stringent demands of parametric test customers.

4080 Series of Parametric Test Systems

Solves both current and next-generation parametric test challenges with features such as a faster architecture, parallel test capabilities, support for high-voltage semiconductor pulse generator units, and an optional 8x10 RF matrix.