Cross Sectioning of Ni/Cu on Steel for EBSD

Application Note for Leica EM TIC 3X - Material Research

PurposeElectron Backscattered Diffraction (EBSD) is a surface technique creating a diffraction pattern (Kikuchi-bands). It can be used for crystal orientation mapping, defect studies, phase identification, grain boundary studies and morphology studies. The information depth is just a few nm. Therefore a good sample preparation is very important.