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Abstract

This paper presents an efficient approach for the analysis of graded-index profile waveguides. The variation
of the index of refraction is modeled considering a sufficient number of concentric dielectric layers, each with a
different index of refraction. The propagation constant in the layered structure is calculated by setting up a
full-wave equivalent circuit, which allows the derivation of the system equation for the whole structure. Two
examples are given, including validation with the commercial software Ansoft HFSS.

References

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