Lens testing

KaleoMultiWAVE

The KaleoMultiWAVE bench is an advantageous alternative to the purchase of several interferometers, the system offers a measurement accuracy comparable to interferometry. The KaleoMultiWAVE works at different wavelengths to perform qualification of the optics and coating at the working wavelengths of the coating.

Introduction

The Kaleo-MultiWAVE bench is a unique instrument that delivers wavefront error at multiple wavelengths. Optics such as lenses, filters or mirrors can be characterized at their working wavelength. Moreover optics having a coating can be measured without selective absorption issues.

The bench offers a superior accuracy similar to interferometry and a very great dynamics over large diameter.

Measurement are done in double pass, either in transmission or reflection.

Key Features

POLYCHROMATICMultiple wavelengths on the same bench

Standard: 625nm – 780nm – 1050nm

Custom wavelengths on demand: UV – 400-1100nm – SWIR

HIGH DYNAMICSMore than 20µm PtV

10 µm PtV dynamics over large diameter

Highly aberrated wavefront measurement

UPPER PRECISIONInterferometric level

Accuracy similar to an interferometer

Very high repeatability

Very low noise

APPLICATIONS

Surface measurements

Coating (AR, Dielectric, Metallic)

Interference filters…

MARKETS

Optical manufacturers

Filter manufacturers

Space & Defense

COMPLIANCE

Compliant with ISO 5725 standard

MetroPro format compatible

ISO 10110 format available

Specifications

Configuration

Double pass

Standard Wavelengths

625 / 780 / 1050 nm

Custom Wavelengths

400 to 1100 nm

Clear Aperture

5.1" (130 mm)

Repeatability (ISO 5725)

<5 nm RMS

Reproducibility (ISO 5725)

<7 nm RMS

Dynamics (Defocus) RWE

10µm PtV

Dynamics (Defocus) TWE

200 nm RMS

Accuracy (RWE)

<80 nm RMS

Accuracy (TWE)

<20 nm RMS

RESULT SIMILAR TO INTERFEROMETER

NBP-780 filter – The difference of RWE between the 2 measurements on the same pupil is below 40 nm PtV