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Published on

08 Aug 2014

Abstract

Crystalline films grown epitaxially on substrates consisting of a different crystalline material are of considerable interest in optoelectronic devices and the semiconductor industry. The film and substrate have in general different lattice parameters. This lattice mismatch affects the quality of interfaces and can lead to very high densities of misfit dislocations. Here we study the strengthening of a thin film on a substrate. In particular we consider the motion of a dislocations gliding on its slip plane within the film and their interaction with the substrate.

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Marisol Koslowski's group in Mechanical Engineering Purdue University

Sponsored by

This work was sponsored by NSF's NCN. The underlying dislocation dynamics code was developed with support from the US Department of Energy, Office of Basic Energy Sciences under contract DEFG-02-07ER47398