Versatile sCMOS Camera

The fast scan (standard) produces a low read noise of only 1.9 electrons rms (1.3 electrons median), which is suitable for most experiments. The slow scan with read noise of 1.5 electrons rms (0.9 electrons median) is designed for experiments where lower noise is more important than raw speed. Another new feature is the „Lightsheet Readout Mode“, which allows seamless integration of the camera with light sheet microscopy systems. In this readout method, the „Gen II“ sCMOS sensor is read out in one sweep across the sensor from top to bottom or bottom to top. This enables the best speeds and synchronization for light sheet microscopy. A third new feature is „ImageConductor connectivity“, which enables for both USB 3.0 (default) and CameraLink connectivity. The default USB 3.0 camera configuration is perfect for 30 frames/s imaging at the full 4-megapixel resolution. If a faster frame rate is needed now or later, adding a high-speed CameraLink board and cable is easy to do, allowing the camera to achieve 100 frames/s at full resolution. Other features include high quantum efficiency (over 70% at 600 nm and 50% at 750 nm) and a global reset function. The global reset allows camera users to acquire global exposures and choose to have either an external source or the camera be master of the timing.

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2015 Impact Factors Out Now!

Olympus White Paper: The Role of Light Microscopy in Cultural Heritage

At the department of Conservation Studies at the University of Antwerp (Belgium), researcher Dr. Olivier Schalm is employing the latest high-resolution light microscopy to reveal interesting new avenues of exploration within cultural heritage.

EMRS Fall Meeting 2015

New Essential Knowledge Briefing: Electron Probe Microanalysis

Electron probe microanalysis (EPMA) is an analytical technique widely used for determining the elemental composition of solid specimens.

This new guide begins with a detailed explanation of the operation of the EPMA instrument and outlines the major steps in EPMA development. It also details various practical issues related to the instrument, describes potential problems that may arise and how to solve them.

Advanced Materials journal family

Discover the Advanced Materials journal family and enjoy free access to a selection of articles - click here now.

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