Company Description

Rudolph Technologies, Inc. designs, develops, manufactures supports defect inspection, advanced packaging lithography, thin film metrology, and data analysis systems and software used by microelectronics device manufacturers. The company provides yield management solutions used in both wafer processing and final manufacturing through a family of standalone systems for macro-defect inspection, test systems, and transparent and opaque thin film measurements. It is comprised of three main lines of business: Inspection Business Unit, Metrology Business Unit, and Data Analysis & Review Business Unit. The company was founded by Otto Curt Rudolph in 1940 and is headquartered in Flanders, NJ.