This website uses cookies to deliver some of our products and services as well as for analytics and to provide you a more personalized experience. Click here to learn more. By continuing to use this site, you agree to our use of cookies. We've also updated our Privacy Notice. Click here to see what's new.

This website uses cookies to deliver some of our products and services as well as for analytics and to provide you a more personalized experience. Click here to learn more. By continuing to use this site, you agree to our use of cookies. We've also updated our Privacy Notice. Click here to see what's new.

About Optics & Photonics TopicsOSA Publishing developed the Optics and Photonics Topics to help organize its diverse content more accurately by topic area. This topic browser contains over 2400 terms and is organized in a three-level hierarchy. Read more.

Topics can be refined further in the search results. The Topic facet will reveal the high-level topics associated with the articles returned in the search results.

Abstract

Using synchrotron radiation, we determined the optical constants of thin silicon films in the wavelength region near the silicon L2,3 absorption edge. The extinction coefficient was determined from the transmittance of a thin, unbacked silicon film. The refractive index was determined from the reflectance of a sample consisting of an evaporated silicon film on gold. The thickness of the evaporated silicon film was chosen so that an interference feature appeared in the wavelength region above the edge where the silicon is transmissive. The shape of the interference feature is sensitive to the optical constants of silicon near the edge.

References

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.