Abstract:

This report documents a reliability evaluation of a particular implementation of package-on-package (PoP) high-density electronic packaging technology. Package-on-package is just one of several new high density packaging technologies that offer significant reductions in overall required PCB board area while allowing for significant and often unique increases in device performance and functionality. The particular PoP technology tested for this report was provided by Interconnect Systems, Inc. (ISI). ISI utilizes standard, readily available device packaging methods in which high-density packaging is achieved through a combination of several