Yield Explorer

A complement to the Synopsys TetraMAX diagnostics solution, Yield Explorer is a timely answer to the complex challenges faced by today’s product engineering teams. With the widest possible range of data at their disposal, users achieve unsurpassed clarity in root cause analysis when faced with systematic yield limiters. Correlating output from ATE test to wafer parametric data on one side, and DRC flags or timing distribution on the other, is now easily possible. Yet Yield Explorer achieves this with an order of magnitude advantage in analysis speed in the most complex of use cases - for example, 10X faster volume diagnostics analysis of ATPG output.