Over deze norm

Status

Ingetrokken

Aantal pagina's

37

Commissie

Halfgeleiders

Gepubliceerd op

01-04-1995

Taal

Engels, Frans

The object of the quality assessment system for electronic components is to define quality assessment procedures in such a manner that electronic components released by one participating country as conforming with the requirements of an applicable specification are equally acceptable in all other participating countries without the need for further testing. This blank detail specification is one of a series of blank detail specifications for semi-conducter devices.