TSU Work for research - Current Integrator

Above is part a system built for the Solid State Devices and Ion Beam
Technology Group to measure ion beam currents flowing from the silicon
target wafers.
The current (down to as low as 100 pico-amps) is measured to about 1%
accuracy and then 'integrated' (using a VCO and a counter) to give an
indication of the total dose, or charge accumulated.