Nikon Metrology introduces the XT V 130C

29-05-2013

A VERSATILE X-RAY INSPECTION WORKHORSE FOR ELECTRONICS QUALITY ASSURANCE FOR TODAY AND TOMORROW

Nikon Metrology announces the introduction of the XT V 130C, an upgradeable X-ray system that can be tailored to the users’ needs. This highly flexible electronics and semiconductor inspection system provides cost-effective, future-proof entry into CT technology.

The SMZ25/SMZ18 is ideally suited for both industrial tasks as well as bioscience and medical applications. The extremely large zoom range and high resolution allows users to image the sample from its entirety down to its microscopic details.

Nikon Metrology introduces new ALTERA range of CMMs

13-05-2013

The new ALTERA range of bridge coordinate measuring machines (CMMs) from Nikon Metrology have been developed to meet the varying needs of manufacturers, both today and in the future. Improved productivity, enhanced metrology and greater flexibility are the hallmarks of this new generation of premium quality CMMs from Nikon Metrology, notably the first from Nikon Metrology with the Nikon insignia.