Improved wavelength division multiplexing/demultiplexing devices are disclosed. In the case of an improved wavelength division multiplexing device having a diffraction grating for combining a plurality of monochromatic optical beams into a multiplexed, polychromatic optical beam, the improvement comprises employing a plurality of patterned optical input components corresponding to the plurality of monochromatic optical beams, wherein each of the plurality of patterned optical input components introduces a first patterned phase delay into a corresponding one of the plurality of monochromatic optical. beams. The improvement also comprises employing a patterned optical output component for introducing a second patterned phase delay into the multiplexed, polychromatic optical beam, wherein the first patterned phase delay and the second patterned phase delay are added so as to reshape the passband of the improved wavelength division multiplexing device.

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Revendications(64)

What is claimed is:

1. An improved wavelength division multiplexing device having a diffraction grating for combining a plurality of monochromatic optical beams into a multiplexed, polychromatic optical beam, the improvement comprising:

a plurality of patterned optical input components corresponding to the plurality of monochromatic optical beams, each of the plurality of patterned optical input components for introducing a first patterned phase delay into a corresponding one of the plurality of monochromatic optical beams; and

a patterned optical output component for introducing a second patterned phase delay into the multiplexed, polychromatic optical beam;

wherein the first patterned phase delay and the second patterned phase delay are added so as to reshape the passband of the improved wavelength division multiplexing device.

a plurality of patterned phase masks, each of the plurality of patterned phase masks for introducing the first patterned phase delay into a corresponding one of the plurality of monochromatic optical beams.

3. The improved wavelength division multiplexing device as defined in claim 2, wherein each of the plurality of patterned phase masks is formed on a corresponding collimating microlens.

4. The improved wavelength division multiplexing device as defined in claim 3, wherein each corresponding collimating microlens contributes to a widening of the passband of the improved wavelength division multiplexing device.

5. The improved wavelength division multiplexing device as defined in claim 2, wherein each of the plurality of patterned phase masks is formed in a corresponding collimating microlens.

6. The improved wavelength division multiplexing device as defined in claim 5, wherein each corresponding collimating microlens contributes to a widening of the passband of the improved wavelength division multiplexing device.

a plurality of collimating microlenses, each of the plurality of collimating microlenses for collimating a corresponding one of the plurality of monochromatic optical beams.

8. The improved wavelength division multiplexing device as defined in claim 7, wherein each of the plurality of collimating microlenses contributes to a widening of the passband of the improved wavelength division multiplexing device.

9. The improved wavelength division multiplexing device as defined in claim 2, wherein each of the plurality of patterned phase masks has a periodic phase profile.

10. The improved wavelength division multiplexing device as defined in claim 9, wherein the passband of the improved wavelength division multiplexing device is a gaussian-shaped passband having a peak, wherein the periodic phase profile of each patterned phase mask contributes to a flattening of the peak of the gaussian-shaped passband of the improved wavelength division multiplexing device.

11. The improved wavelength division multiplexing device as defined in claim 9, wherein the passband of the improved wavelength division multiplexing device is a gaussian-shaped passband having sideband slopes, wherein the periodic phase profile of each patterned phase mask contributes to a steepening of the sideband slopes of the gaussian-shaped passband of the improved wavelength division multiplexing device.

12. The improved wavelength division multiplexing device as defined in claim 2, wherein each of the plurality of patterned phase masks has a non-periodic phase profile.

13. The improved wavelength division multiplexing device as defined in claim 12, wherein the passband of the improved wavelength division multiplexing device is a gaussian-shaped passband having a peak, wherein the non-periodic phase profile of each patterned phase mask contributes to a flattening of the peak of the gaussian-shaped passband of the improved wavelength division multiplexing device.

14. The improved wavelength division multiplexing device as defined in claim 12, wherein the passband of the improved wavelength division multiplexing device is a gaussian-shaped passband having sideband slopes, wherein the non-periodic phase profile of each patterned phase mask contributes to a steepening of the sideband slopes of the gaussian-shaped passband of the improved wavelength division multiplexing device.

15. The improved wavelength division multiplexing device as defined in claim 2, wherein each of the plurality of patterned phase masks has a modulated periodic phase profile.

a patterned phase mask for introducing the second patterned phase delay into the multiplexed, polychromatic optical beam.

17. The improved wavelength division multiplexing device as defined in claim 16, wherein the patterned phase mask is formed on a focusing microlens.

18. The improved wavelength division multiplexing device as defined in claim 17, wherein the focusing microlens contributes to a widening of the passband of the improved wavelength division multiplexing device.

19. The improved wavelength division multiplexing device as defined in claim 16, wherein the patterned phase mask is formed in a focusing microlens.

20. The improved wavelength division multiplexing device as defined in claim 19, wherein the focusing microlens contributes to a widening of the passband of the improved wavelength division multiplexing device.

a focusing microlens for focusing the multiplexed, polychromatic optical beam.

22. The improved wavelength division multiplexing device as defined in claim 21, wherein the focusing microlens contributes to a widening of the passband of the improved wavelength division multiplexing device.

24. The improved wavelength division multiplexing device as defined in claim 23, wherein the passband of the improved wavelength division multiplexing device is a gaussian-shaped passband having a peak, wherein the periodic phase profile of the patterned phase mask contributes to a flattening of the peak of the gaussian-shaped passband of the improved wavelength division multiplexing device.

25. The improved wavelength division multiplexing device as defined in claim 23, wherein the passband of the improved wavelength division multiplexing device is a gaussian-shaped passband having sideband slopes, wherein the periodic phase profile of the patterned phase mask contributes to a steepening of the sideband slopes of the gaussian-shaped passband of the improved wavelength division multiplexing device.

27. The improved wavelength division multiplexing device as defined in claim 26, wherein the passband of the improved wavelength division multiplexing device is a gaussian-shaped passband having a peak, wherein the non-periodic phase profile of the patterned phase mask contributes to a flattening of the peak of the gaussian-shaped passband of the improved wavelength division multiplexing device.

28. The improved wavelength division multiplexing device as defined in claim 26, wherein the passband of the improved wavelength division multiplexing device is a gaussian-shaped passband having sideband slopes, wherein the non-periodic phase profile of the patterned phase mask contributes to a steepening of the sideband slopes of the gaussian-shaped passband of the improved wavelength division multiplexing device.

30. The improved wavelength division multiplexing device as defined in claim 1, wherein the plurality of patterned optical input components and the patterned optical output component cause either constructive or destructive interference to occur as wavelength varies over the passband of the improved wavelength division multiplexing device beam when the first patterned phase delay and the second patterned phase delay are added.

31. The improved wavelength division multiplexing device as defined in claim 1, wherein the plurality of monochromatic optical beams and the multiplexed, polychromatic optical beam are arranged in input and output arrays, respectively, wherein each of the plurality of patterned optical input components and the patterned optical output component has a patterned phase mask, and wherein each patterned phase mask is oriented at an angle relative to the input and output arrays.

32. The improved wavelength division multiplexing device as defined in claim 1, wherein at least the plurality of patterned optical input components or the patterned optical output component are formed adjacent to a plurality of non-patterned optical input components or a non-patterned optical output component, respectively.

33. An improved wavelength division demultiplexing device having a diffraction grating for separating a multiplexed, polychromatic optical beam into a plurality of monochromatic optical beams, the improvement comprising:

a patterned optical input component for introducing a first patterned phase delay into the multiplexed, polychromatic optical beam; and

a plurality of patterned optical output components corresponding to the plurality of monochromatic optical beams, each of the plurality of patterned optical output components for introducing a second patterned phase delay into a corresponding one of the plurality of monochromatic optical beams;

wherein the first patterned phase delay and the second patterned phase delay are added so as to reshape the passband of the improved wavelength division demultiplexing device.

a patterned phase mask for introducing the first patterned phase delay into the multiplexed, polychromatic optical beam.

35. The improved wavelength division demultiplexing device as defined in claim 34, wherein the patterned phase mask is formed on a collimating microlens.

36. The improved wavelength division demultiplexing device as defined in claim 35, wherein the collimating microlens contributes to a widening of the passband of the improved wavelength division demultiplexing device.

37. The improved wavelength division demultiplexing device as defined in claim 34, wherein the patterned phase mask is formed in a collimating microlens.

38. The improved wavelength division demultiplexing device as defined in claim 37, wherein the collimating microlens contributes to a widening of the passband of the improved wavelength division demultiplexing device.

a collimating microlens for collimating the multiplexed, polychromatic optical beam.

40. The improved wavelength division demultiplexing device as defined in claim 39, wherein the collimating microlens contributes to a widening of the passband of the improved wavelength division demultiplexing device.

42. The improved wavelength division demultiplexing device as defined in claim 41, wherein the passband of the improved wavelength division demultiplexing device is a gaussian-shaped passband having a peak, wherein the periodic phase profile of the patterned phase mask contributes to a flattening of the peak of the gaussian-shaped passband of the improved wavelength division demultiplexing device.

43. The improved wavelength division demultiplexing device as defined in claim 41, wherein the passband of the improved wavelength division demultiplexing device is a gaussian-shaped passband having sideband slopes, wherein the periodic phase profile of the patterned phase mask contributes to a steepening of the sideband slopes of the gaussian-shaped passband of the improved wavelength division demultiplexing device.

45. The improved wavelength division demultiplexing device as defined in claim 44, wherein the passband of the improved wavelength division demultiplexing device is a gaussian-shaped passband having a peak, wherein the non-periodic phase profile of the patterned phase mask contributes to a flattening of the peak of the gaussian-shaped passband of the improved wavelength division demultiplexing device.

46. The improved wavelength division demultiplexing device as defined in claim 44, wherein the passband of the improved wavelength division demultiplexing device is a gaussian-shaped passband having sideband slopes, wherein the non-periodic phase profile of the patterned phase mask contributes to a steepening of the sideband slopes of the gaussian-shaped passband of the improved wavelength division demultiplexing device.

a plurality of patterned phase masks, each of the plurality of patterned phase masks for introducing the second patterned phase delay into a corresponding one of the plurality of monochromatic optical beams.

49. The improved wavelength division demultiplexing device as defined in claim 48, wherein each of the plurality of patterned phase masks is formed on a corresponding focusing microlens.

50. The improved wavelength division demultiplexing device as defined in claim 49, wherein each corresponding focusing microlens contributes to a widening of the passband of the improved wavelength division demultiplexing device.

51. The improved wavelength division demultiplexing device as defined in claim 48, wherein each of the plurality of patterned phase masks is formed in a corresponding focusing microlens.

52. The improved wavelength division demultiplexing device as defined in claim 51, wherein each corresponding focusing microlens contributes to a widening of the passband of the improved wavelength division demultiplexing device.

a plurality of focusing microlenses, each of the plurality of focusing microlenses for focusing a corresponding one of the plurality of monochromatic optical beams.

54. The improved wavelength division demultiplexing device as defined in claim 53, wherein each of the plurality of focusing microlenses contributes to a widening of the passband of the improved wavelength division demultiplexing device.

55. The improved wavelength division demultiplexing device as defined in claim 48, wherein each of the plurality of patterned phase masks has a periodic phase profile.

56. The improved wavelength division demultiplexing device as defined in claim 55, wherein the passband of the improved wavelength division demultiplexing device is a gaussian-shaped passband having a peak, wherein the periodic phase profile of each patterned phase mask contributes to a flattening of the peak of the gaussian-shaped passband of the improved wavelength division demultiplexing device.

57. The improved wavelength division demultiplexing device as defined in claim 55, wherein the passband of the improved wavelength division demultiplexing device is a gaussian-shaped passband having sideband slopes, wherein the periodic phase profile of each patterned phase mask contributes to a steepening of the sideband slopes of the gaussian-shaped passband of the improved wavelength division demultiplexing device.

58. The improved wavelength division demultiplexing device as defined in claim 48, wherein each of the plurality of patterned phase masks has a non-periodic phase profile.

59. The improved wavelength division demultiplexing device as defined in claim 58, wherein the passband of the improved wavelength division demultiplexing device is a gaussian-shaped passband having a peak, wherein the non-periodic phase profile of each patterned phase mask contributes to a flattening of the peak of the gaussian-shaped passband of the improved wavelength division demultiplexing device.

60. The improved wavelength division demultiplexing device as defined in claim 58, wherein the passband of the improved wavelength division demultiplexing device is a gaussian-shaped passband having sideband slopes, wherein the non-periodic phase profile of each patterned phase mask contributes to a steepening of the sideband slopes of the gaussian-shaped passband of the improved wavelength division demultiplexing device.

61. The improved wavelength division demultiplexing device as defined in claim 48, wherein each of the plurality of patterned phase masks has a modulated periodic phase profile.

62. The improved wavelength division demultiplexing device as defined in claim 33, wherein the patterned optical input component and the plurality of patterned optical output components cause either constructive or destructive interference to occur as wavelength varies over the passband of the improved wavelength division demultiplexing device when the first patterned phase delay and the second patterned phase delay are added.

63. The improved wavelength division demultiplexing device as defined in claim 33, wherein the multiplexed, polychromatic optical beam and the plurality of monochromatic optical beams are arranged in input and output arrays, respectively, wherein each of the patterned optical input component and the plurality of patterned optical output components has a patterned phase mask, and wherein each patterned phase mask is oriented at an angle relative to the input and output arrays.

64. The improved wavelength division demultiplexing device as defined in claim 33, wherein at least the patterned optical input component or the plurality of patterned optical output components are formed adjacent to a non-patterned optical input component or a plurality of non-patterned optical output components, respectively.

Optical communication technology relies on wavelength division multiplexing (WDM) to provide increased bandwidth over existing installed fiber, as well as newly deployed fiber installations. Several technologies exist to provide the technical solution to WDM: array waveguide gratings (AWG's), fiber Bragg grating based systems, interference filter based systems, Mach-Zehnder interferometric based systems, and diffraction grating based systems, to name a few. Each system has advantages and disadvantages over the others.

Diffraction grating based systems have the advantage of parallelism, which yields higher performance and lower cost for high channel count systems. One drawback to traditional diffraction grating based systems, however, is an insertion loss that rises quickly and monotonically as the source illumination drifts off of the center of the desired communication channel wavelength. That is, traditional diffraction grating based systems invariably suffer from a variation in transmission efficiency across a wavelength channel. This variation in transmission efficiency with wavelength creates deleterious effects on modulated signals. For analog signals it creates harmonic distortion, for digital signals it increases the bit-error-rates at higher modulation bandwidths.

Also, most traditional diffraction grating based systems have an inherently gaussian-shaped passband profile. Such a gaussian-shaped passband profile is generally very narrow with a single peak and steep passband edges. Thus, even when a communication channel drifts off of its center wavelength by only a slight amount, signal coupling with a receiving fiber is often severely detrimentally affected.

At least one attempt has been made to alleviate at least one aspect of the above-described shortcomings. For example, as described by D. Wisely in “High Performance 32 Channel HDWDM Multiplexer with 1 nm Channel Spacing and 0.7 nm Bandwidth”, SPIE, Vol. 1578, Fiber Networks for Telephony and CATV (1991), a microlens may be employed at the end of an input fiber in a WDM device so as to widen the gaussian-shaped passband profile of the WDM device. That is, by widening the gaussian-shaped passband profile of the WDM device, there is less susceptibility to wavelength drift in communication channels. However, widening the gaussian-shaped passband profile of a WDM device may increase the chances of channel crosstalk. Thus, a tradeoff determination must be made when deciding whether or not to implement the above-described technique.

While no other known attempts have been made to alleviate one or more aspects of the above-described shortcomings, it is presumed that such other attempts, if made, would also require certain tradeoffs to be made. Thus, in view of the foregoing, it would be desirable to provide a WDM device which overcomes the above-described inadequacies and shortcomings with minimal or no tradeoffs in an efficient and cost effective manner.

OBJECTS OF THE INVENTION

The primary object of the present invention is to provide wavelength division multiplexing/demultiplexing devices which overcome the above-described inadequacies and shortcomings with minimal or no tradeoffs in an efficient and cost effective manner.

The above-stated primary object, as well as other objects, features, and advantages, of the present invention will become readily apparent to those of ordinary skill in the art from the following summary and detailed descriptions, as well as the appended drawings. While the present invention is described below with reference to preferred embodiment(s), it should be understood that the present invention is not limited thereto. Those of ordinary skill in the art having access to the teachings herein will recognize additional implementations, modifications, and embodiments, as well as other fields of use, which are within the scope of the present invention as disclosed and claimed herein, and with respect to which the present invention could be of significant utility.

SUMMARY OF THE INVENTION

According to the present invention, improved wavelength division multiplexing/demultiplexing devices are provided. In the case of an improved wavelength division multiplexing device having a diffraction grating for combining a plurality of monochromatic optical beams into a multiplexed, polychromatic optical beam, the improvement comprises employing a plurality of patterned optical input components corresponding to the plurality of monochromatic optical beams, wherein each of the plurality of patterned optical input components introduces a first patterned phase delay into a corresponding one of the plurality of monochromatic optical beams. The improvement also comprises employing a patterned optical output component for introducing a second patterned phase delay into the multiplexed, polychromatic optical beam, wherein the first patterned phase delay and the second patterned phase delay are added so as to reshape the passband of the improved wavelength division multiplexing device.

In accordance with other aspects of the present invention, the plurality of patterned optical input components comprises a plurality of patterned phase masks, wherein each of the plurality of patterned phase masks introduce the first patterned phase delay into a corresponding one of the plurality of monochromatic optical beams. Each of the plurality of patterned phase masks is preferably formed on/in a corresponding collimating microlens. Alternatively, the plurality of patterned optical input components also comprises a plurality of collimating microlenses, wherein each of the plurality of collimating microlenses collimates a corresponding one of the plurality of monochromatic optical beams. In either case, each corresponding collimating microlens or each of the plurality of collimating microlenses contributes to a widening of the passband of the improved wavelength division multiplexing device.

In accordance with further aspects of the present invention, each of the plurality of patterned phase masks has a periodic phase profile. A benefit to this aspect is that the passband of the improved wavelength division multiplexing device is typically a gaussian-shaped passband having a peak, and the periodic phase profile of each patterned phase mask contributes to a flattening of the peak of the gaussian-shaped passband of the improved wavelength division multiplexing device. Another benefit to this aspect is that the passband of the improved wavelength division multiplexing device is a gaussian-shaped passband having sideband slopes, and the periodic phase profile of each patterned phase mask contributes to a steepening of the sideband slopes of the gaussian-shaped passband of the improved wavelength division multiplexing device.

In accordance with still further aspects of the present invention, each of the plurality of patterned phase masks has a non-periodic phase profile. A benefit to this aspect is that the passband of the improved wavelength division multiplexing device is a gaussian-shaped passband having a peak, and the non-periodic phase profile of each patterned phase mask contributes to a flattening of the peak of the gaussian-shaped passband of the improved wavelength division multiplexing device. Another benefit to this aspect is that the passband of the improved wavelength division multiplexing device is a gaussian-shaped passband having sideband slopes, and the non-periodic phase profile of each patterned phase mask contributes to a steepening of the sideband slopes of the gaussian-shaped passband of the improved wavelength division multiplexing device.

In accordance with other aspects of the present invention, the patterned optical output component comprises a patterned phase mask for introducing the second patterned phase delay into the multiplexed, polychromatic optical beam. The patterned phase mask is preferably formed on/in a focusing microlens. Alternatively, the patterned optical output component also comprises a focusing microlens for focusing the multiplexed, polychromatic optical beam. In either case, the focusing microlens contributes to a widening of the passband of the improved wavelength division multiplexing device.

In accordance with further aspects of the present invention, the patterned phase mask has a periodic phase profile. A benefit to this aspect is that the passband of the improved wavelength division multiplexing device is a gaussian-shaped passband having a peak, and the periodic phase profile of the patterned phase mask contributes to a flattening of the peak of the gaussian-shaped passband of the improved wavelength division multiplexing device. Another benefit to this aspect is that the passband of the improved wavelength division multiplexing device is a gaussian-shaped passband having sideband slopes, and the periodic phase profile of the patterned phase mask contributes to a steepening of the sideband slopes of the gaussian-shaped passband of the improved wavelength division multiplexing device.

In accordance with still further aspects of the present invention, the patterned phase mask has a non-periodic phase profile. A benefit to this aspect is that the passband of the improved wavelength division multiplexing device is a gaussian-shaped passband having a peak, and the non-periodic phase profile of the patterned phase mask contributes to a flattening of the peak of the gaussian-shaped passband of the improved wavelength division multiplexing device. Another benefit to this aspect is that the passband of the improved wavelength division multiplexing device is a gaussian-shaped passband having sideband slopes, and the non-periodic phase profile of the patterned phase mask contributes to a steepening of the sideband slopes of the gaussian-shaped passband of the improved wavelength division multiplexing device.

In accordance with other aspects of the present invention, the plurality of patterned optical input components and the patterned optical output component cause either constructive or destructive interference to occur as wavelength varies over the passband of the improved wavelength division multiplexing device when the first patterned phase delay and the second patterned phase delay are added. Also, the plurality of monochromatic optical beams and the multiplexed, polychromatic optical beam are beneficially arranged in input and output arrays, respectively, wherein each of the plurality of patterned optical input components and the patterned optical output component has a patterned phase mask, and wherein each patterned phase mask is oriented at an angle relative to the input and output arrays. Further, at least the plurality of patterned optical input components or the patterned optical output component are beneficially formed adjacent to a plurality of non-patterned optical input components or a non-patterned optical output component, respectively.

In the case of an improved wavelength division demultiplexing device having a diffraction grating for separating a multiplexed, polychromatic optical beam into a plurality of monochromatic optical beams, the improvement comprises employing a patterned optical input component for introducing a first patterned phase delay into the multiplexed, polychromatic optical beam. The improvement also comprises employing a plurality of patterned optical output components corresponding to the plurality of monochromatic optical beams, wherein each of the plurality of patterned optical output components introduces a second patterned phase delay into a corresponding one of the plurality of monochromatic optical beams. The first patterned phase delay and the second patterned phase delay are added so as to reshape the passband of the improved wavelength division demultiplexing device.

In accordance with other aspects of the present invention, the patterned optical input component comprises a patterned phase mask for introducing the first patterned phase delay into the multiplexed, polychromatic optical beam. The patterned phase mask is preferably formed on/in a collimating microlens. Alternatively, the patterned optical output component further comprises a collimating microlens for collimating the multiplexed, polychromatic optical beam. In either case, the collimating microlens contributes to a widening of the passband of the improved wavelength division demultiplexing device.

In accordance with further aspects of the present invention, the patterned phase mask has a periodic phase profile. A benefit to this aspect is that the passband of the improved wavelength division demultiplexing device is a gaussian-shaped passband having a peak, and the periodic phase profile of the patterned phase mask contributes to a flattening of the peak of the gaussian-shaped passband of the improved wavelength division demultiplexing device. Another benefit to this aspect is that the passband of the improved wavelength division demultiplexing device is a gaussian-shaped passband having sideband slopes, and the periodic phase profile of the patterned phase mask contributes to a steepening of the sideband slopes of the gaussian-shaped passband of the improved wavelength division demultiplexing device.

In accordance with still further aspects of the present invention, the patterned phase mask has a non-periodic phase profile. A benefit to this aspect is that the passband of the improved wavelength division demultiplexing device is a gaussian-shaped passband having a peak, and the non-periodic phase profile of the patterned phase mask contributes to a flattening of the peak of the gaussian-shaped passband of the improved wavelength division demultiplexing device. Another benefit to this aspect is that the passband of the improved wavelength division demultiplexing device is a gaussian-shaped passband having sideband slopes, and the non-periodic phase profile of the patterned phase mask contributes to a steepening of the sideband slopes of the gaussian-shaped passband of the improved wavelength division demultiplexing device.

In accordance with other aspects of the present invention, the plurality of patterned optical output components comprises a plurality of patterned phase masks, wherein each of the plurality of patterned phase masks introduces the second patterned phase delay into a corresponding one of the plurality of monochromatic optical beams. Each of the plurality of patterned phase masks is preferably formed on/in a corresponding focusing microlens. Alternatively, the plurality of patterned optical output components also comprises a plurality of focusing microlenses, wherein each of the plurality of focusing microlenses focuses a corresponding one of the plurality of monochromatic optical beams. In either case, each corresponding focusing microlens or each of the plurality of focusing microlenses contributes to a widening of the passband of the improved wavelength division demultiplexing device.

In accordance with further aspects of the present invention, each of the plurality of patterned phase masks has a periodic phase profile. A benefit to this aspect is that the passband of the improved wavelength division demultiplexing device is a gaussian-shaped passband having a peak, and the periodic phase profile of each patterned phase mask contributes to a flattening of the peak of the gaussian-shaped passband of the improved wavelength division demultiplexing device. Another benefit to this aspect is that the passband of the improved wavelength division demultiplexing device is a gaussian-shaped passband having sideband slopes, and the periodic phase profile of each patterned phase mask contributes to a steepening of the sideband slopes of the gaussian-shaped passband of the improved wavelength division demultiplexing device.

In accordance with still further aspects of the present invention, each of the plurality of patterned phase masks has a non-periodic phase profile. A benefit to this aspect is that the passband of the improved wavelength division demultiplexing device is a gaussian-shaped passband having a peak, and the non-periodic phase profile of each patterned phase mask contributes to a flattening of the peak of the gaussian-shaped passband of the improved wavelength division demultiplexing device. Another benefit to this aspect is that the passband of the improved wavelength division demultiplexing device is a gaussian-shaped passband having sideband slopes, and the non-periodic phase profile of each patterned phase mask contributes to a steepening of the sideband slopes of the gaussian-shaped passband of the improved wavelength division demultiplexing device.

In accordance with other aspects of the present invention, the patterned optical input component and the plurality of patterned optical output components cause either constructive or destructive interference to occur as wavelength varies over the passband of the improved wavelength division demultiplexing device when the first patterned phase delay and the second patterned phase delay are added. Also, the multiplexed, polychromatic optical beam and the plurality of monochromatic optical beams are beneficially arranged in input and output arrays, respectively, wherein each of the patterned optical input component and the plurality of patterned optical output components has a patterned phase mask, and wherein each patterned phase mask is oriented at an angle relative to the input and output arrays. Further, at least the patterned optical input component or the plurality of patterned optical output components are formed adjacent to a non-patterned optical input component or a plurality of non-patterned optical output components, respectively.

The present invention will now be described in more detail with reference to exemplary embodiments thereof as shown in the appended drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

In order to facilitate a fuller understanding of the present invention, reference is now made to the appended drawings. These drawings should not be construed as limiting the present invention, but are intended to be exemplary only.

FIG. 1a is a side view of a preferred embodiment of a wavelength division multiplexing device employing patterned optical components in accordance with the present invention.

FIG. 1b is a top view of the wavelength division multiplexing device shown in FIG. 1a.

FIG. 1c is an end view of the optical fibers and the corresponding patterned optical components, along section A—A of FIGS. 1a and 1b.

FIG. 2a is a perspective view of a coupling device containing a plurality of laser diodes for replacing the plurality of optical input fibers in the multiplexing device shown in FIGS. 1a and 1b.

FIG. 2b is a perspective view of a coupling device containing a plurality of photodetectors for replacing the plurality of optical fibers in the demultiplexing device shown in FIGS. 3a and 3b.

FIG. 3a is a side view of a preferred embodiment of a wavelength division demultiplexing device employing patterned optical components in accordance with the present invention.

FIG. 3b is a top view of the wavelength division demultiplexing device shown in FIG. 3a.

FIG. 4a is side view of a first embodiment of one of the plurality of patterned optical input components shown in FIG. 1.

FIG. 4b is a side view of a first embodiment of the patterned optical output component shown in FIGS. 1a and 1b.

FIG. 5a is a side view of a bi-convex collimating/focusing microlens having a pure convex surface on one side and a patterned phase mask convex surface on the opposite side in accordance with the present invention.

FIG. 5b is a side view of a plano-convex collimating/focusing microlens having a pure planar surface on one side and a patterned phase mask convex surface on the opposite side in accordance with the present invention.

FIG. 6 is a front view of a substrate having an array of patterned and non-patterned microlenses formed therein in accordance with the present invention.

FIG. 7 is a plot of the gaussian-shaped passband profile of the improved wavelength division demultiplexing device of FIGS. 3a and 3b that is widened as a result of the use of non-phase masked microlenses.

FIG. 8 is a plot of the profile of a cosinusoidal patterned phase mask in accordance with the present invention.

FIG. 9 is a plot of the passband profile of the improved wavelength division demultiplexing device of FIGS. 3a and 3b that is flattened as a result of the use of cosinusoidal patterned phase mask microlenses in accordance with the present invention.

FIG. 10a indicates how the periodic wavefront profiles that are formed from the cosinusoidal patterned phase mask microlenses described in FIG. 8 are constructively added to each other when they are completely in phase on center channel, thereby diffracting the maximum amount of energy out of the receiving fiber core, in accordance with the present invention.

FIG. 10b indicates how the periodic wavefront profiles that are formed from the cosinusoidal patterned phase mask microlenses described in FIG. 8 are destructively canceled when they are 180 degrees out of phase off center channel in accordance with the present invention.

FIG. 11 shows a plot of the widened gaussian-shaped passband profile shown in FIG. 7 in comparison to a plot of the widened and flattened passband profile shown in FIG. 9.

FIG. 12 is a plot of the profile of a chirped patterned phase mask in accordance with the present invention.

FIG. 13 is a plot of the passband profile of the improved wavelength division demultiplexing device of FIGS. 3a and 3b that is flattened as a result of the use of chirped patterned phase mask microlenses in accordance with the present invention.

DETAILED DESCRIPTION OF EXEMPLARY EMBODIMENT(S)

Referring to FIGS. 1a and 1b, there are shown a side view and a top view, respectively, of a preferred embodiment of a wavelength division multiplexing device 10 employing patterned optical components in accordance with the present invention. The multiplexing device 10 comprises a plurality of optical input fibers 12, a corresponding plurality of patterned optical input components 14, a collimating/focusing lens 16, a reflective diffraction grating 18, a patterned optical output component 20, and a corresponding optical output fiber 22. All of the above-identified components of the multiplexing device 10 are disposed along an optical axis Z—Z of the multiplexing device 10, as will be described in more detail below.

At this point it should be noted that the optical input fibers 12 and the optical output fibers 22, as well as any other optical fibers described herein, are single mode optical fibers. Of course, however, this does not limit the present invention to use with only single mode optical fibers. For example, the present invention can also be used with multimode optical fibers.

The plurality of optical input fibers 12, as well as the corresponding plurality of patterned optical input components 14, are arranged into one-dimensional input arrays (e.g., 1×33 arrays). The patterned optical output component 20, as well as the corresponding optical output fiber 22, are also arranged into one-dimensional output arrays (i.e., 1×1 arrays). For ease of alignment, each of the plurality of patterned optical input components 14 may be secured to the end of a corresponding one of the plurality of optical input fibers 12, but the present invention is not limited in this regard. For example, each of the plurality of patterned optical input components 14 may be aligned with, but separated from, the end of a corresponding one of the plurality of optical input fibers 12. Similarly, for ease of alignment, the patterned optical output component 20 may be secured to the end of the corresponding optical output fiber 22, but the present invention is not limited in this regard. For example, the patterned optical output component 20 may be aligned with, but separated from, the end of the corresponding optical output fiber 22. For purposes of ease of optical fiber handling and precision placement, both the plurality of optical input fibers 12 and the optical output fiber 22 may be secured within, for example, silicon V-groove assemblies.

Referring to FIG. 1c, there is shown an end view of the plurality of optical input fibers 12, as well as the corresponding plurality of patterned optical input components 14, along section A—A of FIGS. 1a and 1b. Each of the plurality of optical input fibers 12 is aligned with a corresponding one of the plurality of patterned optical input components 14. Both the plurality of optical input fibers 12 and the corresponding plurality of patterned optical input components 14 are arranged as 1×33 arrays.

Also referring to FIG. 1c, there is shown an end view of the patterned optical output component 20, as well as the corresponding optical output fiber 22, along section A—A of FIG. 1a and 1b. The patterned optical output component 20 is aligned with the corresponding optical output fiber 22. Both the patterned optical output component 20 and the corresponding optical output fiber 22 are arranged as 1×1 arrays.

Returning to FIGS. 1a and 1b, each of the plurality of optical input fibers 12 transmits a single, monochromatic optical input beam 24, while the optical output fiber 22 receives a single, multiplexed, polychromatic optical output beam 26. Each of the monochromatic optical input beams 24 being transmitted from the plurality of optical input fibers 12 is carrying a single channel of data at a unique wavelength, which is preferably, but not required to be, within the infrared (IR) region of the electromagnetic spectrum. The single channel of data that is being carried by each monochromatic optical input beam 24 is superimposed on each corresponding unique wavelength by means (e.g., laser diodes connected to the plurality of optical input fibers 12), which are not shown here and which do not form a part of this invention, but are well known in the art. The unique wavelengths of the monochromatic optical input beams 24 are appropriately preselected such that the data channels generally do not interfere with each other (i.e., there is sufficient channel spacing), and the optical transmission losses through both the optical input fibers 12 and the optical output fiber 22 are low, as is also well known in the art.

The multiplexed, polychromatic optical output beam 26 being received by the optical output fiber 22 is carrying a plurality of channels of data at the unique wavelengths of corresponding ones of the plurality of monochromatic optical input beams 24. That is, the multiplexed, polychromatic optical output beam 26 is carrying a plurality of channels of data (e.g., 33 channels of data) at the unique wavelengths of the monochromatic optical input beams 24 that are transmitted from the optical input fibers 12. The plurality of monochromatic optical input beams 24 are combined into the multiplexed, polychromatic optical output beam 26 through the combined operation of the collimating/focusing lens 16 and the reflective diffraction grating 18, as will be described in more detail below.

At this point it should be noted that the plurality of optical input fibers 12 (as well as the corresponding plurality of patterned optical input components 14) and the patterned optical output component 20 (as well as the corresponding optical output fiber 22) are disposed offset from, but symmetrically about, the optical axis Z—Z of the multiplexing device 10 so as to insure that the multiplexed, polychromatic optical output beam 26 is directed to the patterned optical output component 20 and the corresponding optical output fiber 22, and not to anywhere else. This offset spacing of the plurality of optical input fibers 12 (as well as the corresponding plurality of patterned optical input components 14) and the patterned optical output component 20 (as well as the corresponding optical output fiber 22) is determined based upon the focusing power of the collimating/focusing lens 16, as well as the characteristics of the diffraction grating 18 and the wavelengths of each of the monochromatic optical input beams 24.

Each of the plurality of monochromatic optical input beams 24 is transmitted from its corresponding optical input fiber 12 through a corresponding one of the plurality of patterned optical input components 14 and into the air space between the plurality of patterned optical input components 14 and the collimating/focusing lens 16. Within this air space, the plurality of monochromatic optical input beams 24 expand in diameter until they become incident upon the collimating/focusing lens 16. The collimating/focusing lens 16 collimates each of the plurality of monochromatic optical input beams 24, and then transmits each collimated, monochromatic optical input beam 24′ to the reflective diffraction grating 18.

At this point it should be noted that the optical axis of the collimating/focusing lens 16 coincides with the optical axis Z—Z of the multiplexing device 10 so as to insure that the multiplexed, polychromatic optical output beam 26 is directed to the patterned optical output component 20 and the corresponding optical output fiber 22, and not to anywhere else, as will be described in more detail below.

The reflective diffraction grating 18 operates to angularly disperse the plurality of collimated, monochromatic optical input beams 24′ by an amount that is dependent upon the wavelength of each of the plurality of collimated, monochromatic optical input beams 24′. Also, the reflective diffraction grating 18 is oriented at a special angle (i.e., the Littrow diffraction angle, αi) relative to the optical axis Z—Z of the multiplexing device 10 in order to obtain the Littrow diffraction condition for an optical beam having a wavelength that lies within or near the wavelength range of the plurality of collimated, monochromatic optical input beams 24′. The Littrow diffraction condition requires that an optical beam be incident on and reflected back from a reflective diffraction grating at the exact same angle. Therefore, it will be readily apparent to one skilled in the art that the reflective diffraction grating 18 is used to obtain near-Littrow diffraction for each of the plurality of collimated, monochromatic optical input beams 24′.

The Littrow diffraction angle, αi, is determined by the well-known diffraction grating equation,

mλ=2d(sin αi)

wherein m is the diffraction order, λ is the wavelength, d is the diffraction grating groove spacing, and αi is the common angle of incidence and reflection. It will be readily apparent to one skilled in the art that the Littrow diffraction angle, αi, depends upon numerous variables, which may be varied as necessary to optimize the performance of the multiplexing device 10. For example, variables affecting the Littrow diffraction angle, αi, include the desired grating diffraction order, the grating line pitch, and the wavelength range of the multiplexing device 10, among others.

At this point it should be noted that the reflective diffraction grating 18 can be formed from a variety of materials and by a variety of techniques. For example, the reflective diffraction grating 18 can be formed by a three-dimensional hologram in a polymer medium, or by replicating a mechanically ruled master with a polymer material. In both cases, the polymer is preferably overcoated with a thin, highly reflective metal layer such as, for example, gold or aluminum. Alternatively, the reflective diffraction grating 18 can be formed by chemically etching into a planar material such as, for example, glass or silicon, which is also preferably overcoated with a thin, highly reflective metal layer such as, for example, gold or aluminum.

At this point it should be noted that the plurality of optical input fibers 12 could be replaced in the multiplexing device 10 by a corresponding plurality of laser diodes 28 secured within a coupling device 30, such as shown in FIG. 2a (although FIG. 2a shows only a single 1×4 array). The coupling device 30 serves to precisely group the plurality of laser diodes 28 into a one-dimensional input array. The plurality of laser diodes 28 are used in place of the plurality of optical input fibers 12 to transmit the plurality of monochromatic optical input beams 24 to the multiplexing device 10. The array of laser diodes 28, as well as the plurality of optical input fibers 12, may operate alone, or may be used with appropriate focusing lenses (not shown) to provide the best coupling and the lowest amount of signal loss and channel crosstalk.

At this point it should be noted that the multiplexing device 10, as well as all of the multiplexing devices described herein, may be operated in a converse configuration as a demultiplexing device 40, such as shown in FIGS. 3a and 3b. The demultiplexing device 40 is physically identical to the multiplexing device 10, and is therefore numerically identified as such. However, the demultiplexing device 40 is functionally opposite to the multiplexing device 10. That is, a multiplexed, polychromatic optical input beam 42 is transmitted from the optical fiber 22, and a plurality of monochromatic optical output beams 44 are transmitted to the plurality of optical fibers 12, wherein each one of the plurality of monochromatic optical output beams 44 is transmitted to a corresponding one of the plurality of optical fibers 12. The multiplexed, polychromatic optical input beam 42 is simultaneously carrying a plurality of channels of data, each at a unique wavelength which is preferably, but not required to be, within the infrared (IR) region of the electromagnetic spectrum. The plurality of monochromatic optical output beams 44 are each carrying a single channel of data at a corresponding one of the unique wavelengths of the multiplexed, polychromatic optical input beam 42. The multiplexed, polychromatic optical input beam 42 is separated into the plurality of monochromatic optical output beams 44 through the combined operation of the collimating/focusing lens 16 and the reflective diffraction grating 18. Thus, the collimating/focusing lens 16 and the reflective diffraction grating 18 operate to perform a demultiplexing function.

At this point it should be noted that the plurality of optical fibers 12 could be replaced in the demultiplexing device 40 by a corresponding plurality of photodetectors 48 secured within a coupling device 50, such as shown in FIG. 2b (although FIG. 2b shows only a single 1×13 array). The coupling device 50 serves to precisely group the plurality of photodetectors 48 into a one-dimensional input array. The plurality of photodetectors 48 are used in place of the plurality of optical fibers 12 to receive the plurality of monochromatic optical output beams 44 from the demultiplexing device 40. The array of photodetectors 48, as well as the plurality of optical fibers 12, may operate alone, or may be used with appropriate focusing lenses (not shown) to provide the best coupling and the lowest amount of signal loss and channel crosstalk.

At this point it is appropriate to describe in more detail the plurality of patterned optical input components 14 and the patterned optical output component 20, and the function thereof. Referring to FIG. 4a, there is shown a first embodiment of one of the plurality of patterned optical input components 14 comprising a collimating microlens 60 and a first patterned phase mask 62. In the case of the multiplexing device 10, the monochromatic optical input beam 24 is transmitted from the core 13 of a corresponding optical input fiber 12 to the collimating microlens 60. During this period, the monochromatic optical input beam 24 has a generally spherical wavefront 64 and is expanding due to gaussian beam diffraction.

The collimating microlens 60 collimates the monochromatic optical input beam 24 and then transmits the monochromatic optical input beam 24 to the first patterned phase mask 62. During this period, the monochromatic optical input beam 24 is still slightly expanding due to gaussian beam diffraction, but the monochromatic optical input beam 24 has a generally planar wavefront 66 due to the effect of the collimating microlens 60. Also, the collimating microlens 60 causes a widening of the gaussian-shaped passband profile of the multiplexing device 10, as described in more detail below.

The first patterned phase mask 62 introduces a first patterned phase delay into the monochromatic optical input beam 24 and then transmits the monochromatic optical input beam 24 to the collimating/focusing lens 16 (not shown). During this period, the monochromatic optical input beam 24 is still slightly expanding due to gaussian beam diffraction, but the monochromatic optical input beam 24 also has a first patterned wavefront 68 due to the first patterned phase delay that is introduced into the monochromatic optical input beam 24 by the first patterned phase mask 62. In accordance with the present invention, the first patterned wavefront 68, and hence the first patterned phase delay, contribute to a flattening of the peak of the gaussian-shaped passband profile of the multiplexing device 10, as described in more detail below.

Referring to FIG. 4b, there is shown a first embodiment of the patterned optical output component 20 comprising a focusing microlens 70 and a second patterned phase mask 72. Again in the case of the multiplexing device 10, the multiplexed, polychromatic optical output beam 26 is transmitted from the collimating/focusing lens 16 (not shown) to the second patterned phase mask 72. During this period, the multiplexed, polychromatic optical output beam 26 is being focused by the collimating/focusing lens 16 (not shown). Also during this period, the multiplexed, polychromatic optical output beam 26 has a first patterned wavefront 68 due to the first patterned phase delay that is introduced into the monochromatic optical input beam 24 (as well as all other monochromatic optical input beams 24 that are combined into the multiplexed, polychromatic optical output beam 26 through the combined operation of the collimating/focusing lens 16 and the reflective diffraction grating 18) by the first patterned phase mask 62.

The second patterned phase mask 72 introduces a second patterned phase delay into the multiplexed, polychromatic optical output beam 26 and then transmits the multiplexed, polychromatic optical output beam 26 to the focusing microlens 70. During this period, the multiplexed, polychromatic optical output beam 26 is still being focused as a result of the collimating/focusing lens 16 (not shown). Also during this period, the second patterned phase delay that is introduced into the multiplexed, polychromatic optical output beam 26 by the second patterned phase mask 72 is added to the first patterned phase delay that is introduced into the monochromatic optical input beam 24 (as well as all other monochromatic optical input beams 24 that are combined into the multiplexed, polychromatic optical output beam 26 through the combined operation of the collimating/focusing lens 16 and the reflective diffraction grating 18) by the first patterned phase mask 62. The addition of the second patterned phase delay to the first patterned phase delay is wavelength dependent. That is, the second patterned phase mask 72 and the first patterned phase mask 62 are designed such that the addition of the second patterned phase delay to the first patterned phase delay results in either constructive or destructive interference in the multiplexed, polychromatic optical output beam 26 depending upon the actual wavelength of each communication channel signal in relation to the expected unique center wavelength of that communication channel. Thus, during this period, the wavefront of the multiplexed, polychromatic optical output beam 26 may vary from a second patterned wavefront 78 as a result of the second patterned phase delay and the first patterned phase delay constructively adding to each other when they are completely in phase, to a generally planar wavefront 76 as a result of the second patterned phase delay and the first patterned phase delay destructively canceling each other when they are 180 degrees out of phase. The constructive adding, or interference, results in more diffracted energy (and thus a greater reduction in the amount of total energy at selected locations in the passband profile), while the destructive canceling, or interference, results in less diffracted energy (and thus a lesser reduction in the amount of total energy at selected locations in the passband profile). The actual wavelength of each communication channel signal may drift off the expected unique center wavelength of that communication channel for a number of reasons, including, for example, temperature and laser diode modulation. In this particular embodiment, the second patterned phase mask 72 and the first patterned phase mask 62 are designed so as to result in a flattening of the peak of the gaussian-shaped passband profile of the multiplexing device 10, as described in more detail below.

The focusing microlens 70 focuses the multiplexed, polychromatic optical output beam 26 and then transmits the multiplexed, polychromatic optical output beam 26 toward the optical output fiber 22. During this period, the multiplexed, polychromatic optical output beam 26 varies between a generally spherical wavefront 77 and a converging patterned wavefront 79 due to the effect of the focusing microlens 70 on the multiplexed, polychromatic optical output beam 26. Also during this period, certain portions of the multiplexed, polychromatic optical output beam 26 are slightly more focused on the core 23 of the optical output fiber 22 as a result of the focusing microlens 70 and due to the above-described destructive interference (or lack of the above-described constructive interference) on certain portions of the multiplexed, polychromatic optical output beam 26, while certain other portions of the multiplexed, polychromatic optical output beam 26 are scattered due to the above-described constructive interference. Thus, those portions of the multiplexed, polychromatic optical output beam 26 that are not scattered due to the above-described constructive interference are more likely to be coupled into the core 23 of the optical output fiber 22 for transmission therethrough.

At this point it should be noted that the focusing microlens 70 causes a further widening of the gaussian-shaped passband profile of the multiplexing device 10. That is, the combination of the effect of the collimating microlens 60 on the monochromatic optical input beam 24 (as well as all other monochromatic optical input beams 24 that are combined into the multiplexed, polychromatic optical output beam 26 through the combined operation of the collimating/focusing lens 16 and the reflective diffraction grating 18), and the effect of the focusing microlens 70 on the multiplexed, polychromatic optical output beam 26 causes an overall widening of the gaussian-shaped passband profile of the multiplexing device 10.

At this point it should be noted that the first patterned phase mask 62 may be integrated into the collimating microlens 60, and the second patterned phase mask 72 may be integrated into the focusing microlens 70. For example, referring to FIG. 5a, there is shown a bi-convex collimating/focusing microlens 80 having a pure convex surface 82 on one side and a patterned phase mask convex surface 84 on the opposite side. Alternatively, referring to FIG. 5b, there is shown a plano-convex collimating/focusing microlens 90 having a pure planar surface 92 on one side and a patterned phase mask convex surface 94 on the opposite side.

At this point it should be noted that other types of microlenses may be used in accordance with the present invention. For example, microlenses having concave or diffractive optic imaging surfaces may be used in accordance with the present invention, and patterned phase masks may be formed on any of these imaging surfaces.

At this point it is appropriate to describe in more detail the manner in which the first patterned phase mask 62 and the second patterned phase mask 72 operate to achieve a flattening of the peak of the gaussian-shaped passband profile of the multiplexing device 10. First, it is preferred that the microlenses 60 and 70 (and/or the combined microlens/phase mask) be placed at the focus of the collimating/focusing lens 16 so that the phase mask is imaged back onto its own plane. Hence, if the monochromatic optical input beams 24 or the multiplexed, polychromatic optical output beam 26 are not truncated or aberrated by the optical system, the phase of the initial wavefront is preserved as Fresnel diffraction terms vanish.

Second, since the collimating/focusing lens 16 is preferably of telecentric design, the wavefront of the monochromatic optical input beams 24 or the multiplexed, polychromatic optical output beam 26 returning from the optical system only translates across the receiving microlens aperture as the illumination wavelength varies over the passband range (i.e., there is no tilt). Hence, the overlap integral of the source and receiver amplitude distributions can be reduced to an integral over spatial dimensions, without needing an integration over angle.

Third, the mathematical operation of the input microlens aperture amplitude distribution translating over the receiving microlens aperture amplitude distribution is a cross-correlation. With no phase mask, the amplitude distribution is given by the gaussian mode field diameter multiplied by the truncation due to the micro-lens physical aperture. Thus, let, G(x,y)≡gaussianamplitudedistribution=-[(xa)2+(ya)2]

wherein a is equal to 1/e (amplitude mode field radius), and let,

R(x,y)≡Rectangular Aperture Function={1:x,y≦L,O otherwise}

wherein L is equal to ½ (aperture width).

The amplitude distribution at the microlens with no phase mask is,

Apo(x,y)=G(x,y)R(x,y)

The amplitude distribution at the microlens with a phase mask is,

APm(x,y)=G(x,y)R(x,y)P(x)=Apo(x,y)P(x)

wherein P(x) never is greater than 1 or less than −1. Hence, the amplitude and therefore coupled energy into the fiber is never greater than the non-phase masked case for the same gaussian profile and aperture.

wherein φ is the amplitude of the phase profile (i e., 0.1π), and L is the half-width of the aperture.

The sinusoidal phase function can be expanded into a Jacobi series in order to determine the amplitude of each diffracted order from the coarse phase grating mask. The amplitude for the nth diffracted order is given by an nth order Bessel function coefficient. The energy coupled into the receiving fiber is given by the 0th order.

The resultant amplitude distribution after the receiver phase mask, as the wavelength is varied over the passband, can be calculated by multiplying the source and receiver amplitude profiles together with a lateral shift of the source on the receiver corresponding to the location within the passband. A one-dimensional cross-correlation of Ap*(x,y)source with Ap(x,y)receiver computes the fiber coupling amplitude overlap integral as a function of location in the passband (square result to get energy): A(u)=∫-LL∫-L/2L/2ApS(x,y)ApR(x+u,y)yx=ApS*(x,y)⊗ApR(x,y)

Letting the source and receiver phase masks be equal, and retaining only the first order diffraction terms from the series expansion, the resultant amplitude of the source multiplied by the receiver, as the source is shifted by Δx is: A(x,y,Δx)=Apo(x,y)Apo(x+Δx,y)·[J02(φ)+2i·J1(φ)J0(φ)[sin(2π(2.5L)x)+sin(2π(2.5L)(x+Δx))]+2J12(φ)[cos(2π(2.5L)(2x+Δx))-2J12(φ)[cos(2π(2.5L)(2x+Δx))-cos(2π(2.5L)(-Δx))]]

Integrating the above over x and y as a function of Δx, and squaring to give intensity, gives the passband for the sinusoidal phase mask.

By increasing the spatial frequency at the edge of the aperture and increasing the amplitude of the phase modulation with respect to the center, steeper slopes in the rejection region can also be obtained. Also, orienting the phase grating at an angle with respect to the fiber array direction will cause the unwanted diffraction orders to fall out-of-line to the fiber array, potentially improving cross-talk rejection. It should be noted, however, that the spatial frequency component in the v-groove direction needs to be equal to the nominal case. Further, placing phase masked microlenses directly adjacent to non-phase masked microlenses can ease manufacturing alignment and reduce part count logistics. For example, referring to FIG. 6, there is shown a substrate 100 having an array of microlenses formed therein. The array of microlenses is arranged into a first column 102 and a second column 104. The microlenses in the first column 102 have patterned phase masks formed therein/on, while the microlenses in the second column 104 do not have patterned phase mask formed therein/on. Thus, the substrate 100 can be shifted such that the microlenses in either the first column 102 or the second column 104 are aligned with the plurality of optical input fibers 12, as well as the corresponding plurality of patterned optical input components 14, which are arranged into one-dimensional input arrays (e.g., 1×33 arrays).

At this point it is appropriate to describe a specific working example of the demultiplexing device 40 as described above in FIG. 3 that incorporates the present invention passband profile reshaping concepts just described. Assume that the demultiplexing device 40 proposes 100 Ghz channel spacing, which results in approximately 0.8 nanometers separation between communication channels near a 1550 nanometer center wavelength. The combination of the collimating/focusing lens 16 and the reflective diffraction grating 18 creates a 55 micron focus spot spacing between the communication channels at the focal plane of the collimating/focusing lens 16. Standard optical fibers (SMF-28) have a gaussian 1/e-squared mode field diameter (MFD) of 10.6 microns at the end of optical fiber 22. The optical system of the multiplexing device 10 creates a 55 micron shift of focus spot with a 0.8 nanometer change of incident wavelength. As a result of the small ratio of 10.6 micron MFD out of 55 micron spacing, there are large gaps in coupling between communication channels and the region over which coupling is high is quite narrow. As described above, the shape of the coupling with respect to wavelength is called the passband.

Using non-phase masked microlenses (i.e., using no patterned phase masks either separate from or integrated with the microlenses) in front of both the optical fibers 12 and the optical fiber 22, the diameter of each of the plurality of monochromatic optical output beams 44 can be optically re-formed to a larger size. For example, the full angle divergence in radians of a gaussian beam is given by: θ=4π·λd

wherein λ is equal to wavelength and d is equal to MFDfaber. For a microlens focal length of 200 microns, a larger apparent mode field diameter of 37 microns can be produced as follows: MFD=θ·f=4π·1.5510.6·200=37

The gaussian-shaped passband profile that is widened as a result of the above-described use of non-phase masked microlenses is shown in FIG. 7. The widened gaussian-shaped passband profile shown in FIG. 7 has the characteristics of:

Passband (1 dB down): 0.25 nm, 31 GHz

Adjacent Channel Isolation at 1 dB down point: −36.5 dB

In accordance with the present invention, a patterned phase mask is formed on/in (or added in series with) the microlenses so as to flatten the peak of the gaussian-shaped passband profile of the demultiplexing device 40. For example, a periodic patterned phase mask may be formed on/in (or added in series with) the microlenses so as to flatten the peak of the gaussian-shaped passband profile of the demultiplexing device 40. More specifically, a cosinusoidal patterned phase mask having a period of 22 microns and amplitude of 0.1 n is formed on/in (or added in series with) the microlenses. The profile of the cosinusoidal patterned phase mask is given by the following equation: Phase(x)=i·0.1πcos(x222π)

and is shown in FIG. 8, wherein arg is equal to: 0.1π·cos(x22·2π)

The passband profile that is flattened as a result of the above-described use of cosinusoidal patterned phase mask microlenses is shown in FIG. 9. The widened and flattened passband profile shown in FIG. 9 has the characteristics of:

Passband (1 dB down): 0.338 nm, 42 GHz

Adjacent Channel Isolation at 1 dB down point: −29.7 dB

Referring to FIG. 10a, the periodic wavefront profiles that are formed from the cosinusoidal patterned phase mask microlenses are shown constructively adding to each other when they are completely in phase on center channel, thereby diffracting the maximum amount of energy out of the receiving fiber core. Referring to FIG. 10b, the periodic wavefront profiles are shown destructively canceling each other when they are 180 degrees out of phase off center channel. In this scenario, the image of the input phase pattern impinges out of phase on the output phase pattern. When the amount of off-center wavelength shift corresponds to a 180 degree shift of the phase pattern profile, the patterns cancel, thereby coupling all of the light into the receiving fiber core.

Referring to FIG. 11, a plot of the widened gaussian-shaped passband profile 106 as shown in FIG. 7 is shown in comparison to the widened and flattened passband profile 108 as shown in FIG. 9. As can be seen from this comparison, the addition of the cosinusoidal patterned phase masks to the microlenses also causes a steepening of the sideband slopes due to energy loss in certain diffraction orders. The points where the two plots intersect (identified by the X's in FIG. 11) are where the periodic wavefront profiles destructively cancel each other when they are 180 degrees out of phase off center channel.

In accordance with the other aspects of the present invention, a non-periodic patterned phase mask may alternatively be formed on/in (or added in series with) the microlenses so as to flatten the peak of the gaussian-shaped passband profile of the demultiplexing device 40. More specifically, a chirped patterned phase mask having increasing amplitude and spatial frequency at the periphery may alternatively be formed on/in (or added in series with) the microlenses. The profile of the chirped patterned phase mask is given by the following equation: Phase(x)=i·0.1π[1+(160x)3]·[sin[x·(1+12,000x3)27.5]·2π]

and is shown in FIG. 12, wherein arg is equal to: 0.1π[1+(160x)3]·[sin[x·(1+12,000x3)27.5]·2π]

The passband profile that is flattened as a result of the above-described use of chirped patterned phase mask microlenses is shown in FIG. 13. The widened and flattened passband profile shown in FIG. 13 has the characteristics of:

Passband (1 dB down): 0.316 nm, 39.5 GHz

Adjacent Channel Isolation at 1 dB down point: −35.8 dB

In view of the foregoing, it follows that there are many variations of periodic (e.g., sinusoidal, cosinusoidal, triangular, square, etc.), modulated periodic (e.g., combinations of periodic functions having more than one frequency), and nonperiodic (e.g., chirped, random, etc.) patterns that can be formed on/in (or added in series with) the microlenses in accordance with the present invention. Also, the depth and width of the patterned phase masks can be varied to control the amount of diffracted energy in accordance with the present invention. Further, the patterned phase masks may be designed in accordance with the present invention so as to result in the reshaping of the passband profiles of multiplexing devices in other ways than the flattening of the peak of a gaussian-shaped passband profile or the steepening of the sideband slopes of a gaussian-shaped passband profile.

At this point it should be noted that it is within the scope of the present invention to provide wavelength division multiplexing/demultiplexing devices in accordance with the present invention using any or all of the concepts and/or features described in U.S. Pat. No. 5,999,672, issued Dec. 7, 1999; U.S. Pat. No. 6,011,884 ,issued Jan. 4, 2000; U.S. patent application Ser. No. 09/257,045 filed Feb. 25, 1999; U.S. patent application Ser. No. 09/323,094, filed Jun. 1, 1999; U.S. patent application Ser. No. 09/342,142, filed Jun. 29, 1999; U.S. patent application Ser. No. 09/382,492, filed Aug. 25, 1999; U.S. patent application Ser. No. 09/382,624, filed Aug. 25, 1999; U.S. patent application Ser. No. 09/363,041, filed Jul. 29, 1999; U.S. patent application Ser. No. 09/363,042, filed Jul. 29, 1999; U.S. patent application Ser. No. 09/392,670, filed Sep. 8, 1999; and U.S. patent application Ser. No. 09/392,831, filed Sep. 8, 1999; all of which are hereby incorporated herein by reference. For example, an wavelength division multiplexing/demultiplexing device in accordance with the present invention may be wholly or partially integrated, and different types of lenses and lens configurations may be used.

In summary, the present invention comprises patterned phase masks that are formed in/on or added in series with microlenses that are attached or disposed adjacent to the ends of optical fibers in wavelength division multiplexing/demultiplexing devices. In any case, the patterned phase masks are preferably placed at the focus of the main collimating/focusing lens of the wavelength division multiplexing/demultiplexing device.

The microlenses are used to widen a gaussian-shaped passband profile. The patterned phase masks cause energy to be diffracted in certain locations within the passband profile, thereby selectively reducing the amount of energy that is coupled into the core of the receiving optical fiber. That is, at certain locations within the passband profile, the patterned phase masks cause either constructive or destructive interference to occur as incident wavelength varies over the passband profile. The constructive interference results in more diffracted energy (and thus a greater reduction in the amount of total energy at selected locations in the passband profile), while the destructive interference results in less diffracted energy (and thus a lesser reduction in the amount of total energy at selected locations in the passband profile). Also, the depth and width of the patterned phase masks can be varied to control the amount of diffracted energy.

In the specific exemplary embodiment described herein, constructive interference is used to reduce the transmitted energy efficiency at the center and edges of the passband profile, thereby flattening the peak of a gaussian-shaped passband profile and steepening the sideband slopes of a gaussian-shaped passband profile. That is, energy is discarded at the center and edges of the gaussian-shaped passband profile with respect to the shoulders of the desired passband shape. The amount of energy that is discarded at the center of the passband profile is tailored to match the inverse of the peak of the gaussian-shaped passband profile. Despite the particular application and results described above, the overall advantage of the present invention is the ability to vary the amount of the effect over the width of the passband profile.

The present invention is not to be limited in scope by the specific embodiments described herein. Indeed, various modifications of the present invention, in addition to those described herein, will be apparent to those of ordinary skill in the art from the foregoing description and accompanying drawings. Thus, such modifications are intended to fall within the scope of the following appended claims. Further, although the present invention has been described herein in the context of a particular implementation in a particular environment for a particular purpose, those of ordinary skill in the art will recognize that its usefulness is not limited thereto and that the present invention can be beneficially implemented in any number of environments for any number of purposes. Accordingly, the claims set forth below should be construed in view of the full breath and spirit of the present invention as disclosed herein.