Test: activity in which a system, device, component or signal is executed under specified conditions, the results are observed or recorded, and an evaluation is made of some aspect of the tested element.

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12-slot chassis with management controller unit and power supply. Holds up to 6 ports of 100G, 12 ports of 40G, or 144 ports of 10-GigE and 1 GigE. Every chassis is covered by a free 12 month hardware warranty, free tech support for the lifetime of the product, free software and 3 years'' free software upgrades.

Test Expert is the most widely used test programming and design for test (DFT) software application in the electronics manufacturing industry today. Test Expert (formerly Fabmaster) is a fully integrated solution that allows electronics manufacturers to go from design to test and inspection in a matter of minutes or hours, rather than days. With its fast, user-programmable nail/probe selection routine and complementary interactive tools, Test Expert offers complete flexibility and control during fixture design for in-circuit test (ICT) and advanced flying probe selection.

Test terminal integration and interoperability. FIME manufactures and distributes test cards for acquirers to test the proper integration of their terminals in the MasterCard® and Visa environments. These test cards provide the framework to evaluate if the network and terminal payment applications comply with MasterCard and Visa terminal requirements. The test cards are suitable for any kind of terminal (POS, ATM, integrated-POS) and may be used in conjunction with a MasterCard or Visa simulator. FIME also provides additional specific test cards on demand, such as DCC or virtual cards for most payment schemes.

* Front-end test development services and test consultation services * Wafer test, including testing of bumped wafers and known good die (KGD) solutions for assembly of stacked die into a single package * Final testing of simple and advanced packages using advanced test technology and automatic control of the test process that restricts yield losses to hard failures in the silicon itself * A full suite of optimized post test services for rapid delivery of the final products to the end customer

TESCO introduced the original Meter Test Switch in the early 1920's. TESCO's current line of Test Switches have been designed with the intention to combine the best features of tried and proven switching methods with improvements in materials and construction.

All of the software needed for complete, efficient, cost-effective test development and execution is contained in the Test EZ® Development Suite. This software toolkit primarily features an easy to use operating system (Test Executive) and a software coding tool (Code Assist). Additional support tools are provided for picture probing (Probe Assist), archive management (Archive Manager) and test documentation (Doc Assist).

Product Test Automation - Our core business is helping our clients develop the proper test solution to not only verify the product is working as designed, but to perform that test in the quickest possible manner to increase test throughout and line production. Tired of paying those tech support contracts? When you choose Vidac Solutions for your test equipment, you own the code. While we appreciate the support business and provide a warranty for all of our work, we know how important project ownership is to our customers. When we finish startup, we turn the code and drawings over to you. Should you need to make a change, it can be done quickly by your equipment maintenance group or another integrator.

The Boundary-Scan Test (BST) Development Software is one of the several configurations of the ScanWorks boundary-scan (JTAG) test and on-board programming environment. Test engineers can quickly develop interconnect tests and device-programming actions for use on first prototype board to accelerate the board bring-up process. Then tests can be exported for use in manufacturing and repair facilities.

Through its patent-pending Active Matrix™ and sixth-generation Tester-Per-Site® architecture, it delivers breakthrough cost-of-test, parallelism and yield for engineering, wafer sort and final test of both Flash and DRAM. The versatility allows testing of Flash and DRAM on the same test solution.

With access to thousands of catalog test and measurement instruments, we develop unique test solutions that are cost-effective without compromising performance. Our partnerships with leading suppliers allows us to take advantage of the latest technology and ensure long-term operability.