The design of the alpha300 S Scanning Near-field Optical Microscope features a Confocal Microscope (CM), a Scanning Near-Field Optical Microscope (SNOM) and an Atomic Force Microscope (AFM) in a single instrument. By simply rotating the objective turret, the user can choose from among Confocal Microscopy, SNOM or AFM.

The cantilever, employing the well established beam deflection principle for distance control, features a hollow pyramid with an aperture at its apex. This allows topography and optical images to be acquired simultaneously.

All standard optical modes such as transmission, reflection and fluorescence are available. When using AFM-cantilever tips, all standard AFM modes are readily accessible. The alpha300 S has a modular design, is very flexible and can be easily configured for a wide variety of applications and individual requirements.