A theoretical model using Weibull distribution and maximum likelihood estimation (MLE) was established to statistically analyze the test data, which were obtained by three groups of constant stress accelerated life tests. The life prediction software was applied to simplify the calculation and achieve organic light-emitting device (OLED) life estimation. The results indicate that the Weibull distribution is fit to describe white OLED life, and the precise accelerated parameter β is particularly useful to predict the white OLED life within a shorter time, which provides significant guidelines to help engineers make decisions in design and manufacturing strategy from the aspect of reliability life.

Author Information:

Zhang, Jian-ping School of Thermal Power and Environmental Engineering, Shanghai Univ. of Electric Power, Shanghai,

Wu, Jiong-lei School of Thermal Power and Environmental Engineering, Shanghai Univ. of Electric Power, Shanghai,