Register for this webinar by logging in or signing up below.

In a research fields investigating the chemistry and interaction of delicate, organic samples, analytical tools like X-ray crystallography, Cryo-EM, and NMR are often employed to study a “snapshot” of these materials and processes.

Unfortunately, many of the characterization tools typically available to life science and biology researchers are incapable of delivering in situ data about dynamic interactions and nanoscale structural changes in real time. With the dawn of liquid cell TEM, it is now possible to image biological samples in their native, hydrated environment at resolutions sufficient to glean information about their structural and chemical evolution in real time. This technique has already been utilized to study the RNA transcription of rotovirus particles inside the TEM, where the liquid environment inside the microscope was able to mimic temperature and chemical conditions inside the human body. In other studies, real time observation of therapeutic nanoparticle migration across the cell wall provided insights into current and future drug delivery opportunities.

In this webinar, researchers Deb Kelly and Madeline Dukes will present these and other findings on how liquid cell TEM offers unprecedented opportunities for uncovering new insights in the fields of life science and material science. They will overview the basics of liquid cell TEM, present applications and results from their research, and provide insight on the past, present, and future of life science research tools.

· Find out why you should be using liquid cell EM to accelerate your research

Register for this webinar by logging in or signing up below.

The $16.3 billion catalyst market continues to grow to support the expanding needs of the petroleum refinery, polymer and chemical synthesis industries. With this growth a greater emphasis is being placed on improving catalyst properties at the nanoscale.

Research aimed at understanding the structural changes that heterogeneous catalysts undergo during chemical reaction under realistic conditions is crucial. However, the hot, gaseous environments required for these reactions generally preclude direct observation of these changes in great detail.

With the advent of “closed-cell” in situ TEM holders it is now possible to image single atoms in catalyst materials at 1 atm of pressure and at temperatures exceeding 900 °C. This functionality has been used to great effect in recent work performed by researchers at University of Michigan, Stanford University, and University of California at Irvine.

The focus of this work was on a TiO2-supported Pd catalyst, well known to exhibit the strong metal support interaction (SMSI), which causes the catalyst to be very sensitive to temperature and gas environment changes that can lead to dramatic fluctuations in performance.

Researchers at the University of Michigan, using the Protochips Atmosphere system, were able to directly observe the atom-by-atom migration of TiOx onto and off the surface of Pd nanoparticles under realistic gas environments. This was the first time this reaction sequence was directly observed at atomic resolution and demonstrates the profound capabilities available using in-situ microscopy with atmospheric control. Under reducing conditions they found that as the catalyst is heated, an amorphous TiOx layer forms on the Pd surface initially, then transitions into a crystalline, impermeable TiOx layer at 500 °C. Because this layer shields the Pd from surrounding gas, the performance of the TiO2-supported Pd catalyst is markedly reduced.

Learn how leading researchers are pioneering the use of in-situ TEM microscopy to advance our understanding of catalyst materials.

Explore the challenges of developing modern catalysts and how in-situ TEM studies can be a powerful and cost effective technique to meet the diverse needs of researchers.

Learn about how any modern TEM can be used to study materials at pressure up to 1 atm and at temperatures up to 1000C.

Listen to experts who explain what is required for modern catalysis research and answer questions about their research and yours

Speakers:

Dr. George W. Graham, Adjunct Professor at the University of Michigan and Project Scientist in the Department of Chemical Engineering and Materials Science at the University of California – Irvine.

Shuyi Zhang, University of Michigan.

Ben Jacobs, Protochips.

Joe D'angelo, (Moderator), Materials Science Publisher, Elsevier.

When you register for this webinar your registration details will be passed to the sponsor who will provide you with information relevant to this topic.

Watch this on-demand free webinar by Logging In or Signing Up below.

In nature, biomineralization is a widespread and evolutionarily ancient phenomenon. It’s the molecular basis for the formation of pearls, bones, exoskeletons of crustaceans, teeth, molluscan shells, kidney stones and many other biological structures. To build structural features organisms from bacteria to humans use many varieties of minerals such as hydroxyapatite, calcium carbonates and phosphate, silica and magnetite.

Raman Imaging in combination with Atomic Force Microscopy (AFM) or Scanning Electron Microscopy (SEM) can provide new insights into the fundamental processes by which organisms produce biocomposites containing crystallized minerals. After an understanding of the mechanisms of biomineralization is obtained, it should be possible to exploit them in technical applications.

In this webinar we will first introduce the principles of state-of-the-art confocal Raman imaging as a tool for analyzing the chemical and molecular characteristics of a sample.

Then we will show how this technique can be used in combination with AFM and SEM to correlate chemical information with structural features. Altogether it will demonstrate the advantages of microscopy systems that integrate Raman-AFM and Raman-SEM (RISE), respectively, in standalone hybrid instruments.

Hear from a leading manufacturer of confocal Raman microscopes how to perform Raman imaging and interprete Raman data.

Watch this on-demand free webinar by Logging In or Signing Up below.

Electron microscopes are by far the most versatile instruments for characterization of materials on multiple length scales – ranging from the micrometer down to the atomic scale. Rapid developments in electron optics and detector systems have led to extreme high flexibility in their current use, enabling to adjust the instruments to the specific requirements of various materials and applications. In particular, the acceleration voltage can be flexibly and accurately tuned over a wide range - in both TEM and STEM mode – e.g. to optimize contrast at reduced charging or beam damage without compromising resolution.

By opening the pole piece gap in aberration-corrected (S)TEM instruments, advanced in situ studies of materials processes and properties have been made possible. Combining these developments with state-of-the-art FIB-SEM technology for sample preparation and manipulation allows scientists the most complete set of characterization workflows for modern materials research.

Using these characterization workflows has enabled researchers from different disciplines at the University of Erlangen-Nürnberg to contribute to the development of novel materials and processes for emerging key technologies such as information and communication technology, catalysis, energy and transportation and explore the application of novel in situ and scattering techniques in materials research.

In this webinar, we will illustrate the most recent developments in aberration-corrected TEM/STEM instruments in combination with state-of-the-art FIB/SEM technology and their application in different fields of materials research. We will address a variety of materials classes and devices, including nanoparticles, organic solar cells, porous structures and high-temperature materials and also explore in situ materials characterization studies.

Hear from leading experts how state-of-the-art TEM and FIB-SEM technology work hand in hand in modern materials research

Learn how different operation and imaging modes can be advantageously combined to get the most information about your material

Hear about the opportunities of modern TEM/STEM instruments for in situ studies of materials processes and properties

Discuss your materials characterization challenges with experts

Speakers:

Christian Maunders, Product Marketing Manager, FEIErdmann Spiecker, Professor and Head of Institute of Micro- and Nanostructure Research & Center for Nanoanalysis and Electron Microscopy (CENEM), University of Erlangen-Nürnberg, Germany

Joe d’Angelo, (Moderator), Executive Publisher.

When you register for this webinar your registration details will be passed to the sponsor who will provide you with information relevant to this topic.

]]>Wed, 29 Jun 2016 15:00:00 GMThttps://www.materialstoday.com/characterization/webinars/modern-electron-microscopy-for-advanced-research/More than just roughness: AFM techniques for thin film analysishttps://www.materialstoday.com/characterization/webinars/afm-techniques-for-thin-film-analysis/
In this image the 3D surface represents the topography, and the color shows the tip-sample current for a (001) Bi(Fe0.5Mn0.5)O3 (BFMO) film deposited on a substrate of (001) SrTiO3 with 0.5% Nb. Acquired in conducting AFM (CAFM) mode, the image reveals that the boundaries between crystalline grains (yellow-white) generally have much higher conductivity than the crystallite interiors (purple). The multiferroic and spin glass properties of BFMO films make them attractive for novel electronic devices. Scan size 1 µm, imaged with MFP-3D AFM; sample courtesy Thin Film Spintronic Structures Group, Dept. of Applied Physics and Optics, University of Barcelona.

Watch this on-demand free webinar by Logging In or Signing Up below.

Thin films and coatings are critical in everything from common consumer products to next-generation photovoltaics and data storage. Regardless of application, enhanced film performance is increasingly achieved by controlling and manipulating materials on micro- and nanometer length scales. Thus the need to measure film structure and properties on similar scales has grown correspondingly important.

In this webinar, we explore the powerful capabilities of today’s atomic force microscopes (AFMs) for characterizing thin films. For example, the AFM is well known for its high-resolution topographic imaging capabilities. But recent improvements in speed, sensitivity, and ease of use make it more valuable than ever for quantifying 3D roughness and texture. We cover the basic concepts of surface imaging and analysis, and show illustrative examples.

Research and instrumentation advances have also produced a variety of AFM techniques to characterize electrical, electromechanical, and other functional response. We overview these techniques and discuss in detail an example of their application to memory access devices in the semiconductor industry. New capabilities for nanomechanical imaging are also briefly introduced.

With examples that cover a wide range of systems, this webinar highlights the impact and versatility of advanced AFMs for thin-film research and development.

Register for this webinar by Logging In or Signing Up below.

The combination of Focused Ion Beams with Scanning Electron Microscopes (FIB/SEM) have enabled accessing microstructural information at and below the surface in 3D. The need is growing for imaging and analysis of larger grained materials and metals in 3D as well as processing larger volumes of data for better statistical accuracy. Until recently, the available technologies have limited the volumes and depths of materials that can be analyzed at high resolution, ultimately restricting the insight into structural, crystallographic, and chemical properties. This is no longer the case. The introduction of Xe Plasma FIB/SEM technology offers unrivaled access to regions of interest deep below the surface – combining serial section tomography with statistically relevant data analysis. This also means that large volumes of interest identified by X-ray CT can be investigated in great detail.

Xe Plasma FIB/SEM technology enables dramatically improved material removal rates compared to traditional methods - while maintaining exceptional surface quality and high-contrast, ultra-high resolution imaging performance. We will discuss how Xe Plasma FIB technology opens the doors to new research applications such as the visualization and analysis of large grained polycrystalline metal samples whilst maintaining nanoscale resolution to investigate further the grain boundaries of these materials.

In addition to the ultra-high-resolution capabilities, the webinar will examine the wider potential of Xe Plasma FIB technology for a variety of characterization techniques such as performing 3D tomography, 3D EBSD, 3D EDX, as well as correlative tomography.

Why should I attend the webinar?

Hear from expert speakers how large volume serial sectioning can help bridge the current gap in multiscale materials characterization

When you register for this webinar your registration details will be passed to the sponsor who will provide you with information relevant to this topic.

]]>Tue, 21 Jul 2015 15:00:00 GMThttps://www.materialstoday.com/characterization/webinars/opening-up-large-volumes-to-3d-electron-microscopy/Commercial catalyst behavior at operational temperatures and pressures via high-resolution in situ electron microscopyhttps://www.materialstoday.com/characterization/webinars/catalyst-behavior-at-operational-temperatures/
Register for this webinar by Logging In or Signing Up below.

Catalyst development relies on a number of analytical methods to characterize the structure and chemistry of the material at the atomic level and to understand the behavior of catalytic species during reaction processes. The advent of aberration-corrected electron microscopes with sub-Ångström resolution, coupled with methods to treat catalyst materials in situ, under gaseous environments and at elevated temperatures, now offers the ability to gain further knowledge of the atomic-level processes that occur during catalyst reactions. These techniques are now enabled by the recent introduction of highly stable “closed-cell” gas reaction specimen holders based on MEMS-fabricated heater devices that allow atomic structure imaging at temperatures up to 1000°C and at gas pressures up to a full atmosphere.

The webinar will cover research performed during collaborations between leading manufacturers in the automotive industry, the University of New Mexico, Oak Ridge National Laboratory and others on the development of advanced catalysis materials. The desire to reduce loadings, lower operating temperatures and increase conversion efficiencies present particularly stringent criteria for the development of commercial automotive catalysts. In situ methods and results will be presented that help elucidate, for example, the influence of Pd on the behavior of Pt nanoparticles during high temperature oxidation and reduction cycling treatments.

Watch this on-demand free webinar by Logging In or Signing Up below.

Energy Dispersive X-ray Microanalysis has a long history marked by major milestones in the technology. These advancements have accelerated the capabilities towards analytical solutions for many fields of science. As the technology evolves, system performance reaches new levels and the number of applications continues to grow.

This webinar will start with an introduction to the underlying fundamentals of x-ray microanalysis and will then lead into an overview of the evolution of system hardware and detector performance. The advancements in detector capabilities have opened the doors to new types of data collection and analysis. With an understanding of the benefits of the latest technology, the webinar will conclude with some examples of applications, which are now possible because of these state of the art new developments.

When you register for this webinar your registration details will be passed to the sponsor who will provide you with information relevant to this topic.

]]>Thu, 29 Jan 2015 16:00:00 GMThttps://www.materialstoday.com/materials-chemistry/webinars/the-evolution-of-xray-analysis-edax/MXenes: a new family of two-dimensional materialshttps://www.materialstoday.com/nanomaterials/webinars/mxenes-a-new-family-of-twodimensional-materials/
Watch this on-demand free webinar by Logging In or Signing Up below.

Two-dimensional (2D) materials are attracting significant attention due to their unique properties. The most famous example is graphene, an atomically thin layer of carbon atoms: but recently an entirely new family of 2D materials, early transition metal carbides and carbonitrides, was discovered.

The selective etching of the A-group element from a MAX phase results in the formation of these 2D layered materials, dubbed “MXenes”; of which eleven different carbides and carbonitrides have been reported to date. Not only are individual layers formed after exfoliation, but also multi-layer particles and conical scrolls with radii < 20 nm. DFT simulations have shown that the band gap of MXenes can be tuned from metallic to semiconductor (2 eV) by changing their surface termination, and their elastic constants along the basal plane are expected to be higher than that of the binary carbides. Oxygen or OH terminated MXenes are hydrophilic, but electrically conductive.

Recently, we reported on the intercalation of Ti3C2, Ti3CN and TiNbC with polar organic molecules, which resulted in an increase of the c lattice parameter of MXenes. When dimethyl sulfoxide was intercalated into Ti3C2, followed by sonication in water, that latter delaminated forming a stable colloidal solution that was filtered to produce MXene “paper”.

When you register for this webinar your registration details will be passed to the sponsor who will provide you with information relevant to this topic.

]]>Thu, 02 Oct 2014 15:00:00 GMThttps://www.materialstoday.com/nanomaterials/webinars/mxenes-a-new-family-of-twodimensional-materials/A new frontier in coatings analysishttps://www.materialstoday.com/optical-materials/webinars/new-frontier-coatings-analysis-agilent/
Watch this on-demand free webinar by Logging In or Signing Up below.

The complete characterization of coatings for precision optics usually involved normal and near normal incidence measurements. The simplicity of this approach, however, is not without compromise. Indeed, normal incidence transmission (T) measurements and near normal reflectance (R) measurements are typically conducted in two separate instruments with no guarantee that reflectance and transmission measurements are made from exactly the same patch on the sample.

A recent development by Agilent Technologies, the Cary 7000 Universal Measurement Spectrophotometer (UMS), combines both absolute reflection and transmission measurements from the same patch of a sample’s surface in a single automated platform for a wide range of angles of incidence. We will also describe a new use of a sample positioning control allowing for rotational and vertical motion, thereby providing for automated unattended multi-angle R/T analysis.

In this Webinar we will hear from leading experts who have successfully applied this new technology to improve optical coating design, development and measurement practices.

Why should I attend the webinar?

• Learn about the latest advances in high-volume testing and cost effective QA/QC of precision coatings.
• Hear from leading experts on the critical aspects of thin film design, development and reverse engineering practices.
• Listen to technology experts discuss the role of spectroscopy, and new solutions, that may help solve your everyday measurement challenges.

Tip-enhanced near-field optical microscopy has become a valuable method for nanoscale materials characterization, which enables optical spectroscopies to be performed with nanoscale spatial resolution, beyond the diffraction limit. At infrared frequencies, scattering-type scanning near-field optical microscopy (s-SNOM) based on field-enhancement at the apex of sharp metal tips enables, for example, the nanoscale mapping of free carriers in transistors and semiconductor nanowires, of the chemical compositions of polymers and biological objects, of strain in ceramics, and of plasmons in graphene.

s-SNOM typically employs standard metal-coated atomic force microscope (AFM) tips, which are not optimized for optical and infrared imaging. In this webinar, we will report the fabrication of infrared-resonant antenna probes using FIB/SEM (Helios NanoLab DualBeam) and validate their function by electron energy loss spectroscopy (EELS), Fourier transform infrared spectroscopy (FTIR) and nanoscale topograpy and infrared imaging s-SNOM. We will review the fabrication steps of the antennas and describe how their length can be controlled to tune their resonance.

Additional insights into the range of 3D functional nanodevices that can be rapidly fabricated using FIB/SEM will be provided.

When you register for this webinar your registration details will be passed to the sponsor who will provide you with information relevant to this topic.

]]>Wed, 12 Feb 2014 16:00:00 GMThttps://www.materialstoday.com/nanomaterials/webinars/focused-ion-beam-fabrication-fei/Integrated AFM-Raman for materials science researchhttps://www.materialstoday.com/characterization/webinars/integrated-afm-raman-for-materials-science-researc/
Atomic force microscopy (AFM) and Raman spectroscopy both provide complementary information about the surface of a sample: the former provides structural and topographic surface imaging on the nanometer scale, while the latter uses molecular vibrations to reveal chemical and morphological information about a material.

Combining AFM and Raman into an integrated solution enables multifaceted analysis of advanced materials, allowing for correlating chemical information with other physical, electrical, and magnetic properties with nanoscale resolution. The system is capable of both co-localized measurements and tip-enhanced Raman spectroscopy (TERS) which allows chemical resolution down to the tens or hundreds of nanometers scale.

The Thermo Scientific™ DXR™ Raman microscope and NT-MDT™ Ntegra™ atomic force microscope is a unique AFM-Raman solution, combining easy-to-use and reliable Raman with high performance AFM. Through both an optimized optical coupling and a simple and single control interface, this AFM-Raman approach allows researchers to focus on their materials rather than the instrumental technique. The system provides significant signal enhancement, detailed chemical /structural information, and nanoscale sample resolution that will allow researchers to achieve new insights about materials, quickly and confidently.

Why should I attend the webinar?

Hear from expert speakers on surface probe and Raman microscopies

Discover solutions for the analysis of graphene and other advanced materials including: Raman, co-localized Raman-AFM and TERS

When you register for this webinar your registration details will be passed to the sponsor who will provide you with information relevant to this topic.

]]>Thu, 12 Dec 2013 16:00:00 GMThttps://www.materialstoday.com/characterization/webinars/integrated-afm-raman-for-materials-science-researc/Atomic layer deposition for medical and biological applications https://www.materialstoday.com/biomaterials/webinars/atomic-layer-deposition-medical-bio-applications/
Take part in this free webinar by Logging In or Signing Up below.

Over the past four decades, atomic layer deposition has been successfully utilized for the growth of thin films of many classes of materials, including metal oxides, metals, polymers, and inorganic-organic hybrid materials. This talk will review the use of atomic layer deposition for growth of conformal thin films on medical device materials and biologically-derived materials. In particular, recent advances involving the use of atomic layer deposition for the development of biosensors, drug delivery devices, and implants will be considered. The commercialization of atomic layer deposition technology for medical applications will also be discussed.

This presentation was part of the Materials Today Virtual Conference: Biomaterials (19-21 November, 2013).

Speakers

Roger Narayan, University of North Carolina and North Carolina State University

When you register for this webinar your registration details will be passed to the sponsor who will provide you with information relevant to this topic.

While at one point materials science may have been synonymous with metals, alloys, glasses, composites, and polymers; there can be no denying that the softer and smaller materials now play a critical role. Just as with nanomaterials, the field of biomaterials exploded onto the scene during the first few years of the previous decade, continuing to grow rapidly year-on-year.

At the interface between the life sciences and physical sciences, biomaterials is at the forefront of 21st century research; including topics such as regenerative medicine, tissue engineering, implantable devices, drug delivery systems, and DNA manipulation.

Materials Today is delighted to invite you to take part in our next free, online-only event, covering all aspects of biomaterials. Just complete the form below to take part.

Invited presenters

Bioresorbable electronicsJohn A. Rogers, University of Illinois at Urbana-Champaign

A characteristic feature of modern silicon integrated circuit technology is its ability to operate in a stable, reliable fashion, almost indefinitely for practical purposes. Recent work demonstrates that carefully selected sets of materials and device designs enable a class of silicon electronics that have the opposite behavior -- it physically disappears in water or biofluids, in a controlled manner, at programmed times. This talk summarizes recent work on this type of ‘transient’ electronics technology, ranging from basic studies of dissolution of the key materials, to development of components and systems with radio frequency operation, to invention of schemes for externally ‘triggering’ transient behavior. Emphasis is on bioresorbable forms of such devices, for use in non-antibiotic bacteriocides and other applications of relevance to clinical healthcare.

Biocomposites and devices with naturally derived polysaccharides
Marco Rolandi, University of Washington

The ability to precisely assemble biological and bioinspired molecules into organized structures has contributed to significant advances in bionanotechnology. These advances include materials, structures, and devices that interface with biological systems. Here, I will present three such examples with chitin nanofibers and derivatives. The first example is chitin nanofiber ink — a solution of squid pen β-chitin that self-assembles into ultrafine α-chitin nanofibers upon drying. The second example is chitin nanofiber ink fabrication — chitin nanofiber micro- and nanostructures made with airbrushing, replica molding, and microcontact printing. The third example is bioprotonics — complementary field effect transistors with proton-conducting chitin derivatives containing acid and base functional groups.

Atomic layer deposition for medical and biological applicationsRoger Narayan, University of North Carolina and North Carolina State University

Over the past four decades, atomic layer deposition has been successfully utilized for the growth of thin films of many classes of materials, including metal oxides, metals, polymers, and inorganic-organic hybrid materials. This talk will review the use of atomic layer deposition for growth of conformal thin films on medical device materials and biologically-derived materials. In particular, recent advances involving the use of atomic layer deposition for the development of biosensors, drug delivery devices, and implants will be considered. The commercialization of atomic layer deposition technology for medical applications will also be discussed.

While nanomaterials have shown great potential for electronic and photonic applications, it has been difficult to organize them onto surfaces for incorporation into functional devices. To address some of these challenges, we have focused on assembling nanoscale materials on surfaces with control over material location and crystallographic orientation. The first part of this talk will highlight our recent efforts in directing and patterning single-stranded DNA and DNA templates on substrates with micro- and nanoscale resolution. A number of different substrates were patterned by optical and e-beam lithography to create highly parallel arrays of meso- and macroscale DNA “origami” scaffolds. Using DNA templates encoded with multiple nanometer recognition sites, hierarchical assemblies were generated consisting of both organic and inorganic nanoscale materials. The latter half of the talk will highlight our current research efforts in developing high yielding chemistries to attach DNA to surface and biomaterials for biosensing applications and also the use of DNA to create switchable nanoparticle based probes.

Platforms for engineering functional three-dimensional tissuesSuwan Jayasinghe, University College London

The ability to manipulate and distribute living mammalian cells with control presents fascinating possibilities for a plethora of applications in healthcare. These range from possibilities in tissue engineering and regenerative biology/medicine, to those of a therapeutic nature. The physical sciences are increasingly playing a pivotal role in this endeavor by both advancing existing cell engineering technology and pioneering new protocols for the creation of biologically viable structures. The presentation will briefly introduce leading technologies, which have been fully validated from a physical, chemical and biological stand point for completely demonstrating their inertness for directly handling the most intricate advanced material known to humankind. A few selected biotechnological applications will be presented where these protocols could undergo focused exploration.

]]>Tue, 19 Nov 2013 14:00:00 GMThttps://www.materialstoday.com/biomaterials/webinars/materials-today-virtual-conference-biomaterials/Innovations in high precision thin film mechanical property characterizationhttps://www.materialstoday.com/mechanical-properties/webinars/innovations-in-high-precision-thin-film-mechanical/
Advances in thin film deposition technologies and material development have enabled innovations in a wide range of industries. Examples of this are evident in microelectronics, display, energy, optoelectronics, bio-medical, and many other industries.

Decreasing film thicknesses and manufacturing complexities pose new challenges for academic and industrial researchers. As coatings become thinner, material properties such as elastic modulus, hardness, adhesion, and friction become increasingly difficult to measure. These difficulties are particularly relevant for industrial process and quality control, where reliable characterization of film properties during and after production is critical to ensuring high yield and a consistent final product.

Oxide films for dielectrics, metals and nitrides for electrodes and interconnects, and diamond-like carbon films for abrasion resistance are just a few prime examples where thin films are already employed and must be characterized. Controlled engineering of these thin films is essential and presents a challenge. Highly precise force, displacement, and positioning control are requirements for continued improvement in the measurement of properties and performance of these advanced materials systems.

In this webinar we will review many of the current challenges in thin film mechanical characterization and analysis and present new and existing techniques that offer significant benefits for such challenging problems.

Who should attend?

Researchers involved in the development, production, or mechanical characterization of thin films and coatings.

When you register for this webinar your registration details will be passed to the sponsor who will provide you with information relevant to this topic.

]]>Thu, 14 Nov 2013 16:00:00 GMThttps://www.materialstoday.com/mechanical-properties/webinars/innovations-in-high-precision-thin-film-mechanical/Advances in integrated EDS and EBSD microanalysishttps://www.materialstoday.com/characterization/webinars/advances-in-integrated-eds-and-ebsd-microanalysis/
Advances in Energy Dispersive Spectroscopy (EDS) and Electron Backscatter Diffraction (EBSD) have enhanced the capabilities of microanalytical characterization, particularly for multi-phase material analysis. Used independently, EDS and EBSD may provide an incomplete description of the microstructure and phase distribution of single and multi-phase materials; but by simultaneously collecting and analyzing EDS and EBSD data, the speed and accuracy of microstructural analysis can be greatly improved.

In this webinar, the latest developments in integrated EDS and EBSD will be presented; examining both the technical achievements and the applications for aerospace, photovoltaic, semiconductor, and geological materials.

Why should I attend the webinar?

Discover the unique capabilities of integrated EDS/EBSD

Find out about cutting edge microanalytical characterization

Learn about real examples from industry leaders

When you register for this webinar your registration details will be passed to the sponsor who will provide you with information relevant to this topic.

]]>Thu, 24 Oct 2013 00:00:00 GMThttps://www.materialstoday.com/characterization/webinars/advances-in-integrated-eds-and-ebsd-microanalysis/Advanced materials analysis with micro-XRF for SEMhttps://www.materialstoday.com/electronic-properties/webinars/advanced-materials-analysis-with-micro-xrf-for-sem/
Element analysis of samples using scanning electron microscopes (SEM) is widespread in materials science. A scanning electron microscope (SEM) provides not only topological information via surface images but also compositional information. In most cases, the microscopist will use energy-dispersive X-ray spectrometers (EDS) to analyze sample radiation created through the microscope’s electron beam.

This webinar discusses a complementary method: The use of a separate X-ray source equipped with polycapillary optics attached to the SEM to excite the sample and to evaluate the fluorescence radiation produced. This is known as micro-X-ray fluorescence spectrometry, or micro-XRF for short. Bruker’s Micro-XRF for SEM uses the EDS’ silicon drift detector and signal processing chain to form a complete micro-XRF spectrometer.

Although this method has been known for a number of years, its use in combination with a SEM is not very common, even though it has a range of benefits to offer. Our experts will explain this powerful addendum to EDS, which allows users to combine

the light-element sensitivity of EDS with trace element analysis in the mid to heavy element range by micro-XRF to improve the accuracy of quantification, and

the surface sensitivity of EDS with the volume analysis capabilities of micro-XRF.

The discussion of the technique will be complemented by the presentation of a number of application examples. Participants will have the chance to take part in a Q&A session at the end of the webinar.

Why should I attend?

Find out information on recent developments in this analytical technique

Learn more about how micro-XRF can extend the analytical capabilities of an SEM

Expand your knowledge in element analysis

Discuss your own applications with experts

When you register for this webinar your registration details will be passed to the sponsor who will provide you with information relevant to this topic.

]]>Wed, 16 Oct 2013 00:00:00 GMThttps://www.materialstoday.com/electronic-properties/webinars/advanced-materials-analysis-with-micro-xrf-for-sem/Mobile infrared spectrometry on polymeric materials: Qualification, verification and counterfeit detectionhttps://www.materialstoday.com/polymers-soft-materials/webinars/mobile-infrared-spectrometry-on-polymeric-material/
In order to ensure product quality and safety, many manufacturers are conducting increasing numbers of tests upon their materials. This may be incoming material inspection or testing to guarantee materials specifications, or for service and warranty this may be defect analysis or counterfeit identification. In all cases, portable and hand-held infrared spectrometers allow for better materials characterization using non-destructive tests. Fourier Transform Infrared (FTIR) spectrometers provide vital information on material identity. Hand-held and portable FTIR is particularly suited to plastic, polymer, elastomeric and composite materials and it gives information related to the molecular composition. The technique is both quantitative and qualitative allowing it to be used for both screening and contamination purposes as well as identification.

This webinar will focus on the applications of this new technology. Attendees will learn about non-destructive testing of incoming materials for both identification and screening for restricted components. Examples will be included as well of counterfeit analysis accomplished by a similar technique. We will touch on other non-destructive uses of hand held FTIR as well, such as end product QC and damage assessment. Attendees should leave with a strong understanding of this new technology and an appreciation of the many types of material analysis which are capable with mobile infrared spectrometers.

Why should I attend the webinar?

• Discover the latest techniques for material verification and authenticity
• Find out how screening can be used to cut testing cost and insure product quality
• Learn about recent advances in hand-held and mobile instrumentation
• See how mobile spectroscopy can be used to improve manufacturing and service processes

When you register for this webinar your registration details will be passed to the sponsor who will provide you with information relevant to this topic.

]]>Tue, 24 Sep 2013 00:00:00 GMThttps://www.materialstoday.com/polymers-soft-materials/webinars/mobile-infrared-spectrometry-on-polymeric-material/Advanced high temperature mechanical testing: New innovations in materials characterization part IIhttps://www.materialstoday.com/characterization/webinars/advanced-high-temperature-mechanical-testing-new-i/
Researchers in many industries face significant issues in studying mechanical properties of a broad range of materials at high temperatures that represent operating or processing conditions. Accurate quantitative data adds significantly to the process of materials property modeling. Oxidation, thermal drift, sample/tip temperature gradients, and many other issues make it difficult to acquire accurate nanomechanical data at elevated temperatures.

Recent developments have resulted in a new solution for highly accurate nano-mechanical testing over a broad temperature range. This webinar demonstrates how a combination of new tools and techniques can create significant benefits for researchers of materials such as ceramics, composites, super alloys, and other metallic compounds. Applications include: aerospace, semiconductor, automotive, construction materials, nuclear, and other energy related applications. This webinar will illustrate how the combination of a new high temperature stage (xSol™), combined with nanoscale Dynamic Mechanical Analysis (nanoDMA® III), can be utilized for complex temperature and time dependent characterization creep of materials at temperatures up to 800 °C.

Who should attend?
Researchers involved with a broad range of materials that exhibit temperature dependent mechanical properties.

When you register for this webinar your registration details will be passed to the sponsor who will provide you with information relevant to this topic.

]]>Thu, 05 Sep 2013 00:00:00 GMThttps://www.materialstoday.com/characterization/webinars/advanced-high-temperature-mechanical-testing-new-i/Successful grant writing: Getting it righthttps://www.materialstoday.com/materials-chemistry/webinars/successful-grant-writing-getting-it-right/
Grantsmanship is a skill that is learned over the course of a career in research: there are no sure-fire recipes for success, but it is possible to avoid common pitfalls. In this webinar, Aleksandr Noy (Lawrence Livermore National Laboratory, USA) takes us through the essential stages in applying for research funding; from generating an idea, right through to submitting your work.