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CST, a leading EM simulation software vendor for high-speed and Signal Integrity analysis and Anritsu, a leading provider of test instruments for SI and high-speed digital measurements, RF/microwave and wireless test solutions will be among the premier level EDI CON sponsors highlighting SI and high speed solutions in their submitted presentations to the technical conference, workshops and in-booth demos. Both will discuss the challenges of high speed interconnect characterization and the use of frequency based measurement/modeling approaches such as s-parameters in the time domain analyses favored by high-speed designer.

EDI CON is an industry-driven conference/exhibition targeting RF, microwave, EMC/EMI, and high-speed digital design engineers and system integrators developing products for today's communication, computing, RFID, wireless, navigation, aerospace and related markets. The technical program and exhibition includes the leading international RFIC, component and material manufacturers, semiconductor foundries, EDA software and test equipment/solution providers. This year’s conference features the most recent trends in high-frequency electronics and wireless communication technology, addressing all aspects of design, simulation and test verification through an understanding of system requirements for wireless communication networks such as small cell infrastructure, SATCOM and microwave backhaul.

For information on the conference program, ongoing updates and major announcements and to register for EDI CON 2013 visit:www.EDICONCHINA.com.

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