Automated Test Technology Webinar Series

National Instruments invites you to the Automated Test Technology Webinar Series, a 6-part online seminar series from during June 2014.

Test engineering faces expanding requirements and unprecedented business constraints that affect time to market, cost of test, and staffing levels. As devices become more complex, engineers need to increase the throughput of their test systems, reduce maintenance costs, and explore lower cost solutions.

About the Sessions

Keynote: Test is Changing. Are you Ready ?

We are challenged to keep up with the pace of innovation and resulting complexities. Today, design, test, and production require an entire ecosystem of functionality, applications, and technology. It’s not good enough to build a system for today. Learn how to implement a system that will last.

Advanced Technologies for Automated Test

Selecting the Right Digitizer or Oscilloscope for Your Application

Discover the difference between digitizers and oscilloscopes and the properties of these devices such as spurious-free dynamic range, effective number of bits, sampling speed, and the Nyquist criteria.

Advancements in Software-Designed I/O for Test

NI FlexRIO is one of the most powerful products based on the LabVIEW reconfigurable I/O (RIO) architecture. Learn how to leverage this architecture to design, develop, and deploy high-performance embedded applications.

Evaluating Software Tools and Architectures to Design Test Systems

An important piece of an automated test system is the software framework, which runs the tests, stores the data, and evaluates the results. Learn about a four-layer architecture, the variety of software tools available, and how to choose the best tool for your application.

6 Disruptive Technologies for Design, Test, and Control You Should Know About

One of the biggest challenges for design, test, and control engineers and managers is staying current on technology trends. Learn about the six upcoming technologies that have the potential to be disruptive in the area of electronic design, test, and control.