Figure 1: A custom-made tip-enhanced Raman spectroscopy setup comprising a Horiba Labram HR800 Raman Spectrometer and Agilent 5520 AFM has been developed in our team. The device is operated in the side illumination/collection configuration which allows the study of all kinds of surfaces regardless of their electrical conductivity or optical transparency.

Figure 2: One of the most critical components of any TERS experiment is the tip. In our group we have developed the technology to fabricate fully functional all-metal cantilevers that can also be used for electrical measurements in AFM. These tips completely overcome the main limitation of traditional metal-coated probes.

Figure 3: Two-dimensional materials beyond graphene are a main topic in our research. Thanks to the nanocharacterization capabilities that we are continuously developing, it is possible and convenient accessing information about the conductivity, photoluminescence, and Raman response of these nanomaterials.

Abhishek Honnavalli Puttaiah from India is a Chemnitz University of Technology graduate who, with support from the university’s Career Service, has found employment in Hannover, with one of Germany’s largest automotive suppliers – however, getting there was a rocky path …