Equipment information:

The HUNTRON TRACKER® is a special type of CRT display and
signal processing instrument that can be used to determine
the quality of certain types of electronic components.
Components are tested with a two terminal system of test
leads that are placed across the component under test. The
test leads are inserted into the TRACKER® front panel. The
TRACKER® is used to test components in a power-off
condition, and can be used to test components mounted on
printed circuit boards or other in-circuit conditions even
with components bridged by various types of resistive values.
Devices that are normally tested by the TRACKER® include the
following: semiconductor diodes, bipolar transistors, and
field effect transistors; bipolar and MOS integrated
circuits, including both analog and digital; certain types
of capacitors and inductors.
Included as standard equipment with each TRACKER® is a set
of HUNTRON® MICRO PROBES™. The MICRO PROBE™ leads plug into
the front panel test jacks. MICRO PROBES™ have special tips
so that they can be used to contact very small component
terminals and small PCB etchings without the danger of
shorting adjacent terminals and leads. Also included as
standard equipment is a common test lead which is used with
the TRACKER® in the “Comparatrace” mode.

This manual is provided for the operator of the Huntron
Tracker. The information contained within this manual
familiarizes the reader first with the tracker and its
principles of operation, and then with its specific uses. A
working knowledge of the tracker’s operating principles
greatly assists the user in evaluating the tracker’s
display, especially when using the instrument for
troubleshooting purposes.
The manual is divided into sections. Each section contains
information pertinent to a certain application of the unit.
The sections contain the following information.
Section l - GENERAL INFORMATION
This section provides a description of the tracker and lists
its specifications. It also describes the principles on
which the tracker operates, using a pure resistance and a
diode as examples.
Section 2 - TRACKER OPERATION
This section describes the front panel controls of the
tracker. It also describes the tracker’s comparative testing
feature.
Section 3 - DIODE TESTING
This section describes the characteristics of the diode
(showing its voltage-to-current relationship), which is
essential to understanding the tracker display. This section
also illustrates and describes tracker displays produced
when the test leads are connected to (or across) circuits
containing the following devices: silicon diodes, high
voltage silicon diodes, zener diodes, bridging diodes, and
light-emitting diodes.
Section 4 - TRANSISTOR TESTING
This section illustrates and describes tracker displays
produced when the test leads are connected to (or
across) circuits containing the following devices: NPN and
PNP transistors, Darlington pairs, germanium transistors,
MOSFET’s, J-FET’s, and unijunction transistors.
Section 5 - PASSIVE COMPONENTS
This section describes and illustrates tracker displays
produced when the test leads are connected to capacitive,
inductive, and resitive circuits or devices.
Section 6 - TESTING MULTIPLE COMPONENT CIRCUITS
This section covers the testing of diode/resistor
combinations. diode/capacitor combinations, and
capacitor/resistor combinations.
Section 7 - TESTING INTEGRATED CIRCUITS
This section discusses integrated circuit technology
followed by testing information for linear devices such as
operational amplifiers and voltage regulators. Testing
information is also provided for the LM555 Timer as well as
TTL. LS TTL, and CMOS devices.
Section 8 - TESTING RECTIFIERS
This section describes the testing of silicon-controlled
rectifiers and TRIAC devices.
Section 9 - TESTING POWER SUPPLIES
This describes how to use the tracker to test the typical
transformer/full-wave bridge type'power supply.
Section 10 - TESTING COMPONENTS BY COMPARISON
This section provides tracker displays for defective
components as compared to known good devices. The tracker is
used in the alternate mode to check a high voltage
transistor, a high voltage diode, an electrolytic capacitor,
an op-amp, and a regulator.