Abstract

Multiferroic double-layered thin films on were fabricated using the pulsed-laser deposition technique. The films showed greatly enhanced ferroelectric and ferromagnetic properties. The values of the remanent polarization and coercive field were and at a maximum applied voltage of , respectively. The value of the magnetic moment was found to be . The enhancement of the polarization originated from the with working as a barrier layer. The enhancement of the magnetization is from the structural distortion of , due to partial epitaxialgrowth on the bismuth titanate surface.