Capacitor and Resistor with extended operating temperature range

Following ESA contract awarded by ALTER technology, evaluation of capacitors and resistors to ‘out of the standard temperature space range’ was performed in our laboratories especially aimed to cover future necessities on Silicon Carbide (SiC) and Galium Nitride (GaN) applications.

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The cross-sectioning process provides access to the device internal structure, its materials and design. Such components as diodes and capacitors and silicon dice are often subjected to cross-sectioning to detect the defects which could not be found using other testing techniques.