Thin films of the charge-ordered Pr[sub 0.5]Ca[sub 0.5]MnO₃ (PCMO) compound have been deposited on (001)-oriented ferroelectric (1−x)Pb(Mg[sub ⅓]Nb[sub ⅔])O₃−xPbTiO₃ (x~0.3)(PMN-PT) single-crystal substrates. The resistance of the PCMO films in the charge-ordered state and paramagnetic state can be modulated by applying dc or ac
electric fields across the PMN-PT substrates. Piezoelectric displacement and x-ray diffraction measurements indicate that the electric field induces lattice strains in the PMN-PT substrates via the converse piezoelectric effect, which subsequently changes the strain state and resistance of the PCMO films. Quantitative relationships between the resistance of the PCMO films and the electric-field induced lattice strains in the PMN-PT substrates have been established, which would be important for designing converse piezoelectric effect based functional devices.

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