Atomic force microscope can not only image in three-dimensional topography, but it also provides various types of surface measurements. It is powerful because an AFM can generate images at atomic resolution with angstrom scale resolution height information, with minimum sample preparation using CT (contact mode), NC (noncontact mode) and ICM (intermittent contact mode).

Sputter coating for SEM is a process of applying an ultra-thin coating of electrically-conducting metal onto a non-conducting or poorly conducting specimen.
Coating of samples is required to enable or improve the imaging of samples. Creation of a conductive layer of metal on the sample inhibits charging, reduces thermal damage and improves the secondary electron signal required for topographic examination in the SEM.
The coating technique that should be used depends on the required resolution and application.
Chromium sputtered surface has very fine grain size which is most useful for FESEM imaging. Gold target is excellent and most widely used target material for standard SEM coating. But it should be noted that grain size is visible at high magnifications.
Platinum/Paladium is also adequate for FESEM imaging. Its grain size is similar to Pt.