Design for Test Guidelines and Considerations

Improving
Test Coverage

100% test coverage is what everyone strives for, but is
extremely difficult and expensive to achieve. These
suggestions will help anyone looking to add test coverage
into their products using boundary-scan testing.

The
ScanIO-300LV module provides a total of 300 fully
bidirectional test channels with virtually unlimited memory
depth per pin. Each line is independently controlled and can
be individually configured as an input or output. During
testing, the programming and control of the test channels is
automatically performed by the ScanExpress™
tools without any user intervention. The voltage level of
the I/O and JTAG interfaces is programmable from 1.25V to
3.3V and supports either single ended or low voltage
differential (LVDS) signaling.

ScanPCI

Even for those
PCI and Compact PCI cards that have been designed with
boundary-scan testing in mind, the circuitry between the PCI
or Compact PCI card edge itself and the PCI interface
devices, which typically have JTAG capability, is usually
not fully boundary-scan testable. The Corelis ScanPCI™
provides a way to quickly and easily access these hard to
reach connections and increase the boundary-scan test
coverage of the Unit Under Test (UUT).

ScanDimm

Through the use
of boundary-scan technology, the ScanDIMM Tester provides
fully bi-directional test signals. A boundary-scan Test
Access Port (TAP) connects to a host computer which provides
virtually unlimited memory depth for testing each of the
DIMM socket(s) pins.

Transceiver Testing

Loopback Cables

Cluster Testing

Clock Oscillators

Single Alternating Test Vector

Use Re-run Test Step if Failed Option in ScanExpress
Runner

Real Time Clocks

Two separate cluster tests

1st cluster test sets the seconds register on RTC

2nd cluster test reads and compares the seconds register
after a specific amount of time

Use Stop on Last Test Vector and Wait Option in
ScanExpress Runner on 1st cluster test