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One of the questions we are commonly asked by new users, but also by users who have not used XJTAG for a while and are coming back to it, is about the differences between device categorisations in XJDeveloper. […]

XJTAG’s extension for Altium Designer is now available! It is called the XJTAG DFT Assistant and is aimed at board designers who want to improve the testability of their designs through boundary scan. […]

Having lots of information is great, but sometimes the most difficult thing is displaying that data in a meaningful way. We have created two new information overlays for Layout Viewer, allowing you to visualise test coverage statistics or live pin data from Analyser on your board layout. […]

The DFT Analysis screen in XJTAG version 2.4 has been completely redesigned to allow you to assess the test coverage of your circuit design more easily and in a more efficient way. This post highlights the most important new features. […]

This series of posts will cover how you can integrate XJTAG into your overall test system. This post is a quick reminder that you can use XJTAG as the focal point for your DFT analysis across all your test systems. […]

This post explores the wealth of information available on the XJTAG Support Webpage. Knowledge Base Answers to common questions we receive about XJTAG. Before contacting support it is a good idea to check here first to see if your question is answered. There will be future posts exploring some of these questions in more detail. […]

This post highlights the “Functional Tests” screen in XJDeveloper. The “Functional Tests” screen is in the “Design For Test” section in XJDeveloper. It is used to indicate to XJTAG that part of a board has been tested in some way outside of XJTAG. Doing this will make the DFT test coverage figures more accurate, and means you can use XJTAG as the focal point for all your DFT analysis across all your test systems. […]