Recently, the field of prognostics for electronic products has
received increased attention due to the potential to provide early
warning of system failures, forecast maintenance as needed, and
reduce life cycle costs. In response to the subject's growing
interest among industry, government, and academic professionals,
this book provides a road map to the current challenges and
opportunities for research and development in Prognostics and
Health Management (PHM).

The book begins with a review of PHM and the techniques being
developed to enable a prognostics approach for electronic products
and systems. building on this foundation, the book then presents
the state of the art in sensor systems for in-situ health and usage
monitoring. Next, it discusses the various models and algorithms
that can be utilized in PHM. Finally, it concludes with a
discussion of the opportunities in future research.

Readers can use the information in this book to:

Detect and isolate faults

Reduce the occurrence of No Fault Found (NFF)

Provide advanced warning of system failures

Enable condition-based (predictive) maintenance

Obtain knowledge of load history for future design,
qualification, and root cause analysis

Increase system availability through an extension of
maintenance cycles and/or timely repair actions

Subtract life cycle costs of equipment from reduction in
inspection costs, down time, and inventory

Prognostics and Health Management of Electronics is an
indispensable reference for electrical engineers in manufacturing,
systems maintenance, and management, as well as design engineers in
all areas of electronics.

Michael G. Pecht, PHD, has an MS in electrical engineering and a PhD in engineering mechanics. He is a Professional Engineer, an IEEE Fellow, an ASME Fellow, and an IMAPS Fellow. He was editor of the IEEE Transactions on Reliability for eight years. He is now editor for Microelectronics Reliability. He is a Chair Professor and the Director of the CALCE Electronic Products and Systems Center at the University of Maryland. He has written more than 20 books on electronic products development and reliability, and over 400 technical articles. In 2008, he was awarded the highest reliability honor, the IEEE Reliability Society's Lifetime Achievement Award.

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