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1 February 2018

Tannlin invests in a Scanning Electron Microscope

Commitment to the achieving the highest accuracy in manufacturing led to Tannlin’s decision to invest in a Scanning Electron Microscope (SEM). The instrument, a Hitachi TM3030Plus Table Top Microscope allows magnification of ×15 to ×60,000 (Up to ×240,000 with digital zoom) and Roughness Analysis. The addition of the SEM will allow Tannlin to measure within submicron parameters, rigorously inspect laser-cut edges and take detailed, three-dimensional images.

The image featured above was taken on the SE Microscope and depicts a sample single lamination that was cut for Southern Manufacturing.