Scanning Electron Microscopy / Micro-Analysis

Our Scanning Electron Microscope and Energy Dispersive X-Ray Spectrometer (SEM/EDS) can examine and analyze samples at magnifications can be typically from 5X to 20,000X. Both the microstructure and fracture surface are analyzed.

The fracture surface topography revealed at high magnification indicates:

type of stress (tensile, shear, torsional)

mode of fracture (ductile, brittle, fatigue,
overload)

direction of fracture propagation

area and mechanism of fracture initiation

manufacturing or repair related factors contributing to the failure

other factors related to cause of failure

MTi has two commercial SEM/EDS systems and is one of very few labs with these systems that is strictly dedicated to metallurgical analysis and corrosion-investigations in the Southeast.

SEM/EDS Chemical Analysis

The Elemental composition of fine to microscopic particles or regions on a surface of samples are analyzed using a energy dispersive x-ray spectrometer (EDS) attached to the SEM. EDS micro analysis is performed by measuring the energy and intensity of the signals generated by a focused electron beam scanned across the specimen.