Abstract

A digital speckle pattern interferometer based on a complementary metal-oxide semiconductor
(CMOS) camera is described. The temporal evolution of dynamic deformation is measured using
interframe phase stepping. The flexibility of the CMOS detector is used to identify regions of
interest with full-field time-averaged measurements and then to interrogate those regions with
time-resolved measurements sampled at up to
70
kHz. A numerical and analytical investigation
shows that the maximum surface velocity that can be reliably measured with interframe phase
stepping corresponds to ±0.3 times the surface velocity at which the interferogram is sampled at
the Nyquist limit.

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