Chroma ATE has announced its state-of-the-art design of Laser Diode Characterization System (Model 58620) that is a full turnkey system designed specifically for testing Laser Diodes.

May 19, 2015 - Taoyuan City, Taiwan - Chroma ATE, one of the world’s leading suppliers of electronic test, measurement and automation production, has announced its state-of-the-art design of Laser Diode Characterization System - Model 58620. It is a full turnkey system designed specifically for testing laser diodes. Its features are ranged from macro inspection of the facette or aperture active area to a full suite of electro-optical parametric tests.

Ultra-Precision Carrier Design

Chroma's high precision carriers can be adapted to suit multiple form factors such as Chip on Carrier, Submounts and Laser-Bar's. The innovative bi-lateral design is symmetrical with components placed on both sides to allow for a larger volume of components. The carrier is multi-layered to allow for components to be easily placed in their respective pockets and secured once the other layers are mounted. The thermal interface structure allows for efficient component thermal contact along with a high degree of temperature control during heating and cooling cycles. An operator can perform full-scale automated testing once a carrier has been inserted at the touch of a button.

Auto Alignment Fiber With AOI Assistance

One of the primary uses of high performance laser diodes is in the fields of optical data and telecommunications where the requirements for fiber coupling are quite stringent. If most DC parametric and optical characteristics are understood before a laser diode is inserted into the final product, there is a greater cost savings and higher degree of in-field reliability. The Chroma 58620 is equipped with a fully automated alignment station to simulate a real-world fiber package coupling test to predict coupling efficiencies and spectral performance.

High Precision TEC Control Platform

Externally and internally induced thermal stresses on laser diodes strongly influence spectral and other electro-optical characteristics. Due to these issues, the Chroma 58620 includes a temperature control platform using a high precision Chroma 54130-300W TEC Controller and a Chroma 51101 Data Logger. These are regarded as high class instruments to ensure the uniformity of the carrier temperature and the devices under test.

PXI Test Platform

Chroma's PXI turnkey test solutions product offerings are open and flexible platforms that can be rapidly integrated into production. High performance test instruments such as the Chroma 52400 series 4-Quadrant current/voltage Source Measurement Unit (SMU) along with the Chroma 52961 Optical Power Meter (with various wavelength detectors) can perform an ultra-fast current source and detection sweep with a high dynamic range (80dB) for testing various laser diodes demonstrating a wide range of output power and irradiance characteristics.

The Chroma 58620 features with high performance as follows:

Full turn-key automated test for edge-emitting laser diodes

High precision and large capacity carrier, interchangeable with other automated equipment

Founded in 1984, Chroma is one of the world’s leading manufacturers of complete Electronic Test and Measurement Solutions for commercial, automotive, military and government industries. Utilizing in-house automated handling and Manufacturing Execution System (MES) expertise, Chroma is specialized in integrated and fully automated turn-key electronic test and manufacturing solutions for green technologies including LED, solar cell / module and Electric Vehicle (EV) as well as battery formation, test & grading production solutions. For more information, visit Chroma’s website at http://www.chromaate.com.