Staff, Rohde & Schwarz GmbH

Modern mobile phones can support cellular and noncellular wireless communications standards at the same time. This means, however, that the subsystems must operate in very close proximity to each other within a single device (in-device coexistence). The resulting high level of reciprocal leakage can at times cause considerable interference. This application note employs preliminary theoretical analysis and demonstrates how the problems of in-device coexistence can be measured. Exemplary, the effects of LTE and Bluetooth(r) traffic on the WLAN performance of a commercially available smartphone are examined. These examples will also enable the reader to design tests for complementary scenarios.

With the RTO-K17/RTE-K17 High Definition Option the user will see more signal details with up to 16 bit vertical resolution. In combination with the superior analog front end of the RTO and RTE, the user has a versatile instrument in his hands to analyze a wide range of applications. From Switch Mode Power Supplies to Radar RF, the user can inspect all with one scope.

Increased competition, more dense designs and integration of different technologies in a small space combined with market regulatory pressures are creating new challenges for original equipment manufacturers. As a result, implementing the necessary transient immunity protections to prevent application malfunction due to transients on power and signal lines is becoming ever more challenging. The impact of increasing microcontroller (MCU) sensitivity and low-cost application design is being felt in all markets: consumer, industrial, automotive, etc. While there are significant differences in the design and use of products for these markets, the susceptibilities induced in all microcontroller-based applications are essentially the same. Typical susceptibilities include unexpected state changes on input pins (reset, interrupt request, or general purpose inputs) and corruption of on-chip clock signals, which can all cause various operational issues on the design itself, in addition to resulting in failure to meet regional compliance regulations for electromagnetic compatibility (EMC).

This application note presents methods for integrating Rohde and Schwarz test and measurement (T and M) instruments into The MathWorks MATLAB(r) applications. This allows you to remote-control Rohde and Schwarz instruments for T and M applications from MATLAB(r).