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This paper provides an overview of a method to assess the health of electronic circuits by non-invasively monitoring the electromagnetic emissions. Two phases of laboratory testing have been done to date, during which subtle functional degradations were added to circuitry to simulate several “soft” electronic failure mechanisms which progressively lead to reduced circuitry performance prior to becoming a “hard” failure, detectable by standard built-in tests. The hardware tested included a desktop PC power supply during initial concept feasibility activities, followed by subsequent testing of a COTS triplex channel, distributed, digital flight control system. Lab testing details, data analysis results, and algorithm development are described.