Test and Measurement

ASIC Design and Verification

Astek was founded to provide services to companies developing ASICs, in today's market there are fewer new ASIC designs, however Astek is still able to do such designs if your application requires it, we can also provide consulting to help you determine if an ASIC is the right solution, or if you should use an ASSP, FPGA or CPLD. With today's semiconductors reaching the extremes of density and speed, you may find a standard part is a lower-cost solution. On the other hand, Astek can help you combine digital and analog functions into a single part for unique applications that can cover the cost of NRE and require a very low per-unit incremental cost.

DRAM Test ChipFeatures: Created a 1MB DRAM test chip for testing next generation DRAM storage materials. Control signals were directly connected to external pins to facilitate testing and characterization of the new storage materials. Special test structures added to memory array to allow characterization of individual memory cells. Full custom layout performed and probe points added to top level for additional debug/characterization.