The software models statistical variations of PICs and provides a schematic-driven PIC design framework that can incorporate statistical variations in one or more circuit elements

New features include an improved frequency-domain calculation engine that can compute circuit performance faster; a custom s-parameter element that accepts measured or simulated data of arbitrary complexity, including complete characterization data for multimode, many-port elements; and a yield calculator that produces Monte Carlo performance estimates based on statistical variations of one or more circuit parameters.

The software supports device and circuit designers and can be used to design ring resonators, waveguide Bragg gratings, arrayed waveguide gratings and fiber grating couplers, and to study the performance of components within simple circuits.

Designers also can compose conceptual schematic representations of PICs from interconnected multiport elements. Each circuit element can be described by analytic expressions, semi-empirical models or user-defined custom descriptions.

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