Description

The B2200A reduces the cost of test by enabling characterization tests to be automated, without compromising the measurement performance of the semiconductor parameter analyzer. It supports a 4-SMU, full-Kelvin configuration and a capacitance meter, with room for future expansion. Includes 14 inputs, each with a unique internal measurement path, and a distinctive capacitance measurement compensation feature for two of the inputs. Provides front panel control via keypad or optional light pen, and supports instruments such as pulse generators.

Industry Challenges

Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must bring down the cost of test. Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested. This reduces both test time and cost.

Many available switching matrices have inherent limitations. For example, many switching matrices degrade the low-current measurement performance of a semiconductor parameter analyzer and become the weakest link in the measurement chain. A switching matrix with an insufficient number of internal paths cannot support both a 4-terminal, full-Kelvin measurement and a capacitance meter, requiring time-consuming manual cabling changes each time measurement changes from IV to CV. Lastly, when a switching matrix cannot compensate capacitance measurements for the measurement distortion created by path length, results will be inaccurate.

Summary

Unsurpassed switching matrix performance

The B2200A fA leakage Switch Mainframe provides exceptional low-current leakage and capacitance measurement performance, without the limitations imposed by alternative solutions. The ability to support 1 fA measurements means that it does not detract from the high-performance of the semiconductor parameter analyzer. Inputs are sufficient to support a 4-SMU, full-Kelvin configuration. All 14 inputs correspond to unique internal paths, so all inputs can be used simultaneously. Unlike competitive solutions, capacitance measurement results are not distorted by the inherent error introduced by each channel's varying path lengths; additionally, the system provides the parameters and algorithms necessary to compensate for such variances. Flexible use is provided by a modular structure that supports 12, 24, 36 or 48 output configurations. The 30 MHz bandwidth supports the use of instruments such as pulse generators. Flexible operator control is provided by the supplemental LED display and front panel control via keypad or optional light pen.

Keep pace with the performance of semiconductor parameter analyzers
State-of-the-art semiconductor parameter analyzers have reached new levels of performance. With the ability to support 1 fA measurement resolution, the B2200A Switching Matrix keeps pace with the capabilities of your semiconductor parameter analyzer without any compromise in measurement performance.

Avoid measurement limitations of multiplexing
Avoid delays and time-consuming manual switching with the B2200A's 14 internal measurement paths. Every input has its own unique internal path, enabling you to use all inputs simultaneously.

Accurate capacitance measurements
When measuring capacitance, the cable length, which includes the path through the matrix, has a significant impact on measurement results. When using the two BNC inputs that are optimized for capacitance measurement, the B2200A Switching Matrix Mainframe -- unlike competitive solutions -- corrects for the error introduced by the matrix's internal path lengths, supplying compensation parameters to enable undistorted measurement results.

Features and Benefits

Feature

Benefit

1 femtoamp resolution current measurement capability

Switching matrix does not degrade the measurement performance of the semiconductor parameter analyzer.