Transmission Electron Microscopy

The capabilities of the Transmission Electron Microscope (TEM) are applicable to a wide variety of materials, including, but not limited to, nanomaterials, polymers/composites, minerals, glass delamination, pharmaceuticals, and metals and ceramics. In the TEM, a beam of high-energy electrons is transmitted through a thin (<100 nm) sample. Interaction of the primary beam electrons with electrons in the sample atoms produce a variety of x-ray and electron signals that can be collected as images, diffraction patterns and energy spectra.'

The TEM is unique in its ability to provide information about size, morphology, composition, crystallinity and electronic state of a sample, all with extremely high spatial resolution. Because a thin specimen is required, specialized sample preparation techniques such as ultramicrotomy, ion milling or electropolishing are sometimes required. Powders, small particles and colloidal suspensions can often be dispersed on TEM grids with minimal preparation.

Current capabilities include:

A 3 nm probe for high spatial resolution analysis in all modes of operation