Usage Guidelines

This command can only be applied to an existing test access point (TAP) connection.

Caution For this command to be applicable, first create the TAP using the ED-<MOD_PATH> command. Intrusive test access modes are traffic-affecting. If a facility/path is connected to a TAP in an intrusive test access mode, it is forced to go into the Out of Service, Maintenance (OOS-MT) state. The forced transition could be traffic-affecting. The present state of the facility/path is stored by the network element (NE) and is restored when the TAP connection is terminated. Test access connections are dropped automatically if the TL1 session is terminated or is timed out.

Note • If there is no TAP connection, a DENY error message is returned.

If a requested condition already exists, a SRCN error message is returned.

If a requested access configuration is invalid, a SRAC error message is returned.

If a requested TAP does not exist, a RTEN error message is returned.

Category

Troubleshooting and Test Access

Security

Maintenance

Input Format

CHG-ACCMD-<MOD_TACC>:[<TID>]:<TAP>: <CTAG>::<MD>;

Input Example

CHG-ACCMD-STS1:CISCO:8:123::MONE;

Input Parameters

<TAP>

The test access point number. The TAP number must be an integer with a range of 1 to 999. It is a string.

Note This command only supports changing the mode for a single TAP number at a time.

Splits both the A and B paths. Connect the line incoming from the E direction to the line outgoing in the E direction, and connect this looped configuration to the FAD. The line outgoing in the F direction will have a QRS connected, and the line incoming from the F direction will be terminated by the nominal characteristic impedance of the line. Intrusive test access mode.

LOOPF

Splits both the A and B paths. Connect the line incoming from F direction to the line outgoing in the F direction, and connect this looped configuration to the FAD. The line outgoing in the E direction will have a QRS connected, and the line incoming from the E direction will be terminated by the nominal characteristic impedance of the line. Intrusive test access mode.

MONE

Indicates that a monitor connection will be provided from the FAD to the A transmission path of the accessed circuit.

MONEF

Indicates that a monitor connection will be provided for the following:

From the FAD1 to a dual FAD (DFAD), or from the odd pair of a facility access path (FAP) to the A transmission path

From the FAD2 of the same DFAD or the even pair of a FAP, to the B transmission path of the accessed circuit

MONF

Indicates that a monitor connection will be provided from the FAD to the B transmission path of the accessed circuit.

SPLTA

Indicates that a connection will be provided from both the E and F sides of the A transmission path of the circuit under test to the FAD and split the A transmission path. Intrusive test access mode.

SPLTB

Indicates that a connection will be provided from both the E and F sides of the B transmission path of the circuit under test to the FAD and split the B transmission path. Intrusive test access mode.

SPLTE

Splits both the A and B paths and connect the E side of the accessed circuit to the FAD. The line outgoing in the F direction will have a QRS connected, the line incoming from the F direction will have a QRS connected, and the line incoming from the E direction will be terminated by the nominal characteristic impedance of the line. Intrusive test access mode.

SPLTEF

Splits both the A and B paths, and connect the E side of the accessed circuit to FAD1 and the F side to FAD2. Intrusive test access mode.

SPLTF

Splits both the A and B paths, and connect the F side of the accessed circuit to the FAD. The line outgoing in the E direction will have a QRS connected, the line incoming in the E direction will have a QRS connected, and the line incoming from the E direction will be terminated by the nominal characteristic impedance of the line. Intrusive test access mode.