XUV

The vacuum measurement chamber of devices in the XUV® range enables the verification of light materials from sodium onwards by means of X-ray fluorescence analysis (RFA). Because of the radiation-absorbing properties of room air, it is normally not possible to use this method. For this reason the instrument is ideal for very demanding coating thickness measurement and material analysis tasks.

Features:

Particularly suitable for research and development with their low detection limits, repeatable precision and universally upgradable measurement possibilities