Abstract

A new beam profile monitoring system for the small X-ray beam exiting from the SPring-8 front-end was developed and tested at BL13XU. This system is intended as a screen monitor and also as a position monitor even at beam currents of 100 mA by using photoluminescence of a chemical vapor deposition-grown diamond film. To cope with the challenge that the spatial distribution of the photoluminescence in the vertical direction is too flat to detect the beam centroid within a limited narrow aperture, a filter was installed that absorbs the fundamental harmonic concentrated in the beam center, which resulted in “de-flattening” of the vertical distribution. For the measurement, the filter crossed the photon beam vertically at high speed to withstand the intense heat flux of the undulator pink-beam. A transient thermal analysis, which can simulate the movement of the irradiation position with time, was conducted to determine the appropriate configuration and the required moving speed of the filter to avoid accidental melting. In a demonstration experiment, the vertically separated beam profile could be successfully observed for a 0.8 × 0.8 mm2 beam shaped by an XY slit and with a fundamental energy of 18.48 keV. The vertical beam centroid could be detected with a resolution of less than 0.1 mm.