Abstract

The theoretical investigation of the off-axis z-scan technique for the measurement of nonlinear optical refraction in materials is presented. The normalized transmittance is calculated for different aperture radii and positions. The dependence of both the normalized transmittance amplitude
(ΔTpv) and the distance between maximum and minimum
(Δzpv) on the aperture radius is analyzed. A condition for the applicability of the pinhole approximation is given.

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