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Abstract:

Motherboard voltage testing device includes a power supply module for
supplying a DC voltage, an illuminating module, and a switching module
for detecting a DC voltage of a motherboard. A first terminal of the
switching module is coupled to the power supply module, and a second
opposite terminal of the switching module is coupled to the illuminating
module. When the switching module detects the DC voltage of the
motherboard is in the motherboard, the illuminating module is configured
to receive the DC voltage of the power supply module to emit light, and
when the switching module detects there is no remaining DC voltage on the
motherboard, the illuminating module cannot receive the DC voltage from
the motherboard and the illuminating module is power off and does not
emit light.

Claims:

1. A motherboard voltage testing device comprising: a power supply module
configured to supply a DC voltage; an illuminating module; and a
switching module configured to detect a DC voltage of a motherboard; a
first terminal of the switching module coupled to the power supply
module, and a second opposite terminal of the switching module coupled to
the illuminating module; wherein when the switching module detects the DC
voltage of the motherboard is on the motherboard, the illuminating module
is configured to receive the DC voltage of the power supply module to
emit light, and when the switching module detects there is not rest DC
voltage on the motherboard, the illuminating module cannot receive the DC
voltage from the power supply module and the illuminating module is power
off and does not emit light.

2. The motherboard voltage testing device of claim 1, wherein the power
supply module comprises a schottky diode, a first input terminal of the
schottky diode is coupled to a battery, a second input terminal of the
schottky diode is coupled to the motherboard, and a output terminal of
the schottky diode is coupled to the power supply.

3. The motherboard voltage testing device of claim 2, wherein the first
input terminal is configured to receive a first DC voltage of the
battery, and the second input terminal is configured to receive a second
DC voltage of the motherboard.

4. The motherboard voltage testing device of claim 3, wherein the first
DC voltage is less than the second DC voltage.

5. The motherboard voltage testing device of claim 1, wherein the
switching module comprises a Field Effect Transistor (FET), a drain
electrode of the FET is coupled to the power supply module, a source
electrode of the FET is coupled to the illuminating module, and a grid
electrode of the FET is coupled to the motherboard via a first resistor.

6. The motherboard voltage testing device of claim 5, wherein a first
terminal of the first resistor is coupled to the grid electrode of the
FET, and a second opposite terminal of the first resistor is grounded via
a second resistor.

7. The motherboard voltage testing device of claim 5, further comprising
a selecting module, wherein the selecting module is coupled to the first
resistor via a node, and the selecting module is configured to select the
DC voltage of the motherboard to the switching module.

8. The motherboard voltage testing device of claim 7, wherein the
selecting module is a single-pole triple-throw switch which is coupled to
the motherboard, and the single-pole triple-throw switch is configured to
input the DC voltage of the motherboard to the grid electrode of the FET.

10. A motherboard voltage testing device comprising: a power supply
module configured to supply a first DC voltage and a second DC voltage;
an illuminating module; and a switching module configured to detect a DC
voltage of a motherboard; a first terminal of the switching module
coupled to the power supply module, and a second opposite terminal of the
switching module coupled to the illuminating module; wherein when the
switching module detects the DC voltage of the motherboard is on the
motherboard, the illuminating module is configured to receive the first
DC voltage or the second DC voltage to emit light, and when the switching
module detects there is not rest DC voltage on the motherboard, the
illuminating module cannot receive the first DC voltage or the second DC
voltage and the illuminating module is power off and does not emit light.

11. The motherboard voltage testing device of claim 10, wherein the power
supply module comprises a schottky diode, a first input terminal of the
schottky diode is coupled to a battery for receiving a first DC voltage,
a second input terminal of the schottky diode is coupled to the
motherboard for receiving a second DC voltage, and a output terminal of
the schottky diode is coupled to the power supply.

12. The motherboard voltage testing device of claim 11, wherein the first
DC voltage is less than the second DC voltage.

13. The motherboard voltage testing device of claim 10, wherein the
switching module comprises a Field Effect Transistor (FET), a drain
electrode of the FET is coupled to the power supply module, a source
electrode of the FET is coupled to the illuminating module, and a grid
electrode of the FET is coupled to the motherboard via a first resistor.

14. The motherboard voltage testing device of claim 13, wherein a first
terminal of the first resistor is coupled to the grid electrode of the
FET, and a second opposite terminal of the first resistor is grounded via
a second resistor.

15. The motherboard voltage testing device of claim 13, further
comprising a selecting module, wherein the selecting module is coupled to
the first resistor via a node, and the selecting module is configured to
select the DC voltage of the motherboard to the switching module.

16. The motherboard voltage testing device of claim 15, wherein the
selecting module is a single-pole triple-throw switch which is coupled to
the motherboard, and the single-pole triple-throw switch is configured to
input the DC voltage of the motherboard to the grid electrode of the FET.

18. A motherboard voltage testing device comprising: a power supply
module connectable to the motherboard and having a DC voltage supply; an
illuminating module connected to the power supply module, with the
illuminating module emitting light when supplied DC voltage from the DC
power supply module; and a switching module having a first terminal
connected to power supply module and a second opposite terminal connected
to the illuminating module, the switching module being connectable to the
motherboard; wherein, when the power supply module and the switching
module are connected to a motherboard and the DC voltage of the
motherboard is greater than the DC voltage of the power supply module,
the DC voltage of the power supply module is supplied to the illuminating
module.

Description:

FIELD

[0001] The subject matter herein generally relates to a voltage testing
device for detecting a DC voltage of a motherboard.

BACKGROUND

[0002] Motherboards need to under go a plurality of tests before leaving
the factory. When testing the motherboard, the motherboard can be coupled
to a plurality of electronic components to power on, so that the
functions of the motherboard can be tested. Usually, when the motherboard
is power off, a rest DC voltage can be still be retained which can damage
the motherboard.

BRIEF DESCRIPTION OF THE DRAWINGS

[0003] Implementations of the present technology will now be described, by
way of example only, with reference to the attached figures.

[0004] FIG. 1 is a block diagram of an embodiment of a motherboard voltage
testing device.

[0005] FIG. 2 is a circuit diagram of an embodiment of the motherboard
voltage testing device of FIG. 1.

DETAILED DESCRIPTION

[0006] It will be appreciated that for simplicity and clarity of
illustration, where appropriate, reference numerals have been repeated
among the different figures to indicate corresponding or analogous
elements. In addition, numerous specific details are set forth in order
to provide a thorough understanding of the embodiments described herein.
However, it will be understood by those of ordinary skill in the art that
the embodiments described herein can be practiced without these specific
details. In other instances, methods, procedures and components have not
been described in detail so as not to obscure the related relevant
feature being described. Also, the description is not to be considered as
limiting the scope of the embodiments described herein. The drawings are
not necessarily to scale and the proportions of certain parts may be
exaggerated to better illustrate details and features of the present
disclosure.

[0007] Several definitions that apply throughout this disclosure will now
be presented.

[0008] The term "coupled" is defined as connected, whether directly or
indirectly through intervening components, and is not necessarily limited
to physical connections. The connection can be such that the objects are
permanently connected or releasably connected. The term "comprising,"
when utilized, means "including, but not necessarily limited to"; it
specifically indicates open-ended inclusion or membership in the
so-described combination, group, series and the like.

[0009] The present disclosure is described in relation to a motherboard
voltage testing device. The motherboard voltage testing device comprises
a power supply module for supplying a DC voltage, an illuminating module,
and a switching module for detecting a DC voltage of a motherboard. A
first terminal of the switching module is coupled to the power supply
module, and a second opposite terminal of the switching module is coupled
to the illuminating module. When the switching module detects the DC
voltage of the motherboard, the illuminating module is configured to
receive the DC voltage from the power supply module to emit light, and
when the switching module detects there is no remaining DC voltage in the
motherboard, the illuminating module cannot receive the DC voltage from
the motherboard and the illuminating module is power off and does not
emit light.

[0010] FIG. 1 illustrates an embodiment of the motherboard voltage testing
device 100 used to detect a voltage of a motherboard (not shown). The
motherboard voltage testing device 100 comprises a power supply module
10, a switching module 30, a selecting module 40 coupled to the switching
module 30, and an illuminating module 50. The power supply module 10 is
coupled to a first terminal of the switching module 10, and the
illuminating module 50 is coupled to a second opposite terminal of the
switching module 10. In at least one embodiment, the illuminating module
50 is a light emitting diode.

[0011] FIG. 2 illustrates the circuit diagram of the motherboard voltage
testing device 100. The power supply module 10 can comprise a Schottky
diode D1. A first input terminal of the Schottky diode D1 is coupled to a
battery 15, a second input terminal of the Schottky diode D1 is coupled
to a power supply (not shown) of the motherboard by a first plug (not
shown) for receiving a DC voltage from the motherboard. The battery 15 is
grounded by a second plug. In at least one embodiment, the battery 15 can
supply a 3V DC voltage, a first DC voltage input to the first input
terminal 11 of the power supply module 10 is less than a second DC
voltage input to the second input terminal 12 of the power supply module
10, such as, the first DC voltage can be 3V DC voltage supplied by the
battery 15, and the second DC voltage can be 3.3V DC voltage, or 5V DC
voltage, or 12V DC voltage supplied by the motherboard. An output
terminal 13 of the Schottky diode D1 is coupled to the switching module
30.

[0012] The switching module 30 is used to detect the DC voltage of the
motherboard, and when a DC voltage is detected by the switching module
30, the illuminating module 50 can receive a DC voltage from the power
supply module 10 to light. The switching module 30 can comprises a Field
Effect Transistor (FET) Q1, a first resistor R1 and a second resistor R2.
A drain electrode D of the FET Q1 is coupled to the output terminal 13 of
the power supply module 10, a source electrode S of the FET Q1 is coupled
to the illuminating module 50, and the illuminating module 50 is
grounded. A grid electrode G of the FET Q1 is coupled to a first terminal
of the first resistor R1, and a second opposite terminal of the first
resistor R2 is grounded by the second resistor R2.

[0013] Because the first DC voltage input to the first input terminal 11
of the power supply module 10 is less than the second DC voltage input to
the second input terminal 12 of the power supply module 10, when the FET
Q1 is switched on and the power supply module 10 receives the first DC
voltage via the first input terminal 11 and the second DC voltage via the
second input terminal 12, the illuminating module 50 receives the second
DC voltage from the power supply module 10 to light. When the FET Q1 is
switched on and the power supply module 10 only receives the first DC
voltage via the first input terminal 11, the illuminating module 50
receives the first DC voltage from the power supply module 10 to light.

[0014] The selecting module 40 is used to couple to the motherboard and
can comprise a first input terminal 41, a second input terminal 42, a
third input terminal 43, and an output terminal 45 which can be selected
to couple to one of the first input terminal 41, the second input
terminal 42 and the third input terminal 43. The first input terminal 41
is coupled to a fourth resistor R4, the second input terminal 42 is
coupled to a fifth resistor R5. The selecting module 40 can be coupled to
the motherboard via a third plug (not shown) for receiving the DC voltage
from the motherboard. The output terminal 45 is coupled to the first
resistor R1 and the second resistor R2 via a node. When the grid
electrode G of the FET Q1 is received the DC voltage of the motherboard
via the output terminal 45, the FET Q1 is switched on, and the
illuminating module 50 receives the DC voltage from the power supply
module 10 to light. When the DC voltage of the motherboard is drained,
the FET Q1 is switched off, and the illuminating module 50 goes out
because the illuminating module 50 cannot receive the DC voltage from the
power supply module 10. In at least one embodiment, the selecting module
40 is a single-pole triple-throw switch.

[0015] In use, a final dropped DC voltage of the motherboard can be
detected by an oscilloscope, such as a 3.3V DC voltage. Then, the first
input terminal 41 is coupled to the output terminal 45, and the selecting
module 40 is coupled to the motherboard. The motherboard is powered on,
and the DC voltage output by the output terminal 45 is 3.3V, the grid
electrode G of the FET Q1 receives the 3.3V DC voltage for allowing the
FET Q1 to switch on. The first input terminal 11 of the power supply
module 10 receives the 3V DC voltage of the battery 15, the second input
terminal 12 of the power supply module 10 receives the 3.3V DC voltage
from the motherboard, and the illuminating module 50 receives the 3.3V DC
voltage from the motherboard to light. The motherboard is powered off, a
remaining DC voltage can remain in the motherboard, and the FET Q1 can
still be switched on. The 3.3V DC voltage input to the second input
terminal 12 is dropped, and the illuminating module 50 can receive the 3V
DC voltage from the battery 15 to light for warning the user not to
operate the motherboard. When the remaining DC voltage on the motherboard
is dropped, the grid electrode G of the FET Q1 cannot receive the DC
voltage, and the FET Q1 is switched off. The illuminating module 50
cannot receive the DC voltage and the illuminating module 50 is powered
off and does not emit light for informing the user to operate the
motherboard.

[0016] The embodiments shown and described above are only examples. Many
details are often found in the art such as the other features of a
motherboard. Therefore, many such details are neither shown nor
described. Even though numerous characteristics and advantages of the
present technology have been set forth in the foregoing description,
together with details of the structure and function of the present
disclosure, the disclosure is illustrative only, and changes may be made
in the detail, especially in matters of shape, size and arrangement of
the parts within the principles of the present disclosure up to, and
including the full extent established by the broad general meaning of the
terms used in the claims. It will therefore be appreciated that the
embodiments described above may be modified within the scope of the
claims.