Abstract

Ferroelectric domain orientations have been mapped using piezo-force microscopy, allowing the calculation and statistical analysis of interfacial polarization angles, the head-to-tail or head-to-head configuration, and any cross-coupling terms. Within 1 µm2 of an epitaxial (001)p-oriented BiFeO3film, there are >40 µm of linear domain boundary based on over 500 interfaces. 71° domain walls dominate the interfacial polarization angles, with a 2:1 preference for uncharged head-to-tail versus charged head-to-head boundary types. This mapping technique offers a unique perspective on domain boundary distributions, important for ferroelectric and multiferroic applications where domain wall parameters are critical.

Received 21 July 2011Accepted 25 August 2011Published online 17 October 2011

Acknowledgments:

BDH and JD recognize support from the Department of Energy, Grant No. DE-SC-0005037. JFI, TH, and DGS were supported by the Army Research Office, Grant No. W911NF-08-2-0032. Sandia National Laboratories is a multi-program laboratory managed and operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Corporation, for the U.S. Department of Energy’s National Nuclear Security Administration, Contract No. DE-AC04-94AL85000.