Sign up to receive free email alerts when patent applications with chosen keywords are publishedSIGN UP

Abstract:

According to one embodiment, a diagnostic device (8) for identifying a
defect in an LED light string includes a probe (18) and a polarity
selector switch (16). The LED light string includes a conductor provided
within an insulation layer. The probe (18) is configured to penetrate the
insulation layer and contact the conductor of an LED light string. The
polarity selector switch (16) is electrically coupled to the probe (18)
and configured to control the polarity of an electrical waveform provided
to the probe (18).

Claims:

1-80. (canceled)

81. A diagnostic device for identifying a defect in a light emitting
diode (LED) light string, the LED light string including a conductor
disposed within an insulation layer and a plurality of light emitting
diodes, the diagnostic device comprising: a power source configured to
provide a DC electrical power; a power conversion module electrically
coupled to the power source, the power conversion module being configured
to receive the DC electrical power, convert the DC electrical power to an
AC electrical power, and provide the AC electrical power to a first
output and a second output, the AC electrical power being configured to
illuminate one or more of the plurality of light emitting diodes; a probe
electrically coupled to the first output of the power conversion module;
and an electrical socket electrically coupled to the second output of the
power conversion module, wherein the probe is configured to electrically
couple to the conductor of the LED light string and the electrical socket
is configured to electrically couple to a plug of the LED light string
such that a first portion of the LED light string is illuminated and a
second portion of the LED light string is not illuminated in response to
the AC electrical power provided to the LED light string when the probe
is electrically coupled to the conductor of the LED light string and the
electrical socket is electrically coupled to the plug of the LED light
string, the first portion omitting the defect in the LED light string and
the second portion including the defect in the LED light string.

82. The diagnostic device of claim 81, further comprising: a housing
including a light-string-receiving portion configured to receive the
insulation layer and the conductor of the LED light string; and a door
having an open position for providing access to the
light-string-receiving portion and a closed position for inhibiting
access to the light-string-receiving portion.

83. The diagnostic device of claim 82, wherein the probe extends from a
front end of the door.

84. The diagnostic device of claim 83, wherein the door includes a
peripheral surface that extends across an opening in the
light-string-receiving portion when the door is in the closed position,
the front end of the door having a curved profile such that the
peripheral surface extends over a tip of the probe.

85. The diagnostic device of claim 83, further comprising a trigger for
actuating the door between the open position and the closed position.

86. The diagnostic device of claim 85, wherein the probe is retractably
disposed in the door, the trigger, the door, and the probe being
configured such that the probe protracts form the door in response to
actuation of the trigger.

87. The diagnostic device of claim 81, wherein the probe is configured to
penetrate the insulation layer and contact the conductor of the LED light
string.

88. The diagnostic device of claim 81, wherein the probe is configured to
couple to an LED socket of the LED light string to contact the conductor
of the LED light string.

89. The diagnostic device of claim 88, further comprising a shroud, the
probe being disposed within an interior space of the shroud.

90. The diagnostic device of claim 88, wherein the probe has a generally
conical shape.

91. The diagnostic device of claim 88, wherein the probe has a shape that
generally corresponds to the shape of a plug of one of the plurality
light emitting diodes.

92. A diagnostic device for identifying a defect in a light emitting
diode (LED) light string, the LED light string including a conductor
disposed within an insulation layer and a plurality of light emitting
diodes, the diagnostic device comprising: a probe configured to
electrically couple to the conductor of the LED light string; a polarity
selector switch electrically coupled to the probe, the polarity selector
switch being configured to control the polarity of an electrical waveform
provided to the probe; a power conversion module configured to be
selectively coupled to the polarity selector switch at a positive output
and a negative output, the power conversion module being configured to
provide a positive polarity waveform at the positive output and a
negative polarity waveform at the negative output, the polarity selector
switch including a negative position in which the probe is electrically
coupled to the negative output, and the polarity selector switch
including a positive position in which the probe is electrically coupled
to the positive output; and a plug configured to electrically couple the
power conversion module to an AC electrical power source, wherein the
probe, the polarity selector switch, the power conversion module, and the
plug are configured such that when the LED light string is electrically
coupled to the power source, the plug is electrically coupled to the
power source, and the probe is electrically coupled to the conductor: a
first portion of the LED light string is illuminated if the polarity
selector switch is in the positive position and a second portion of the
LED light string contains the defect, the second portion of the LED light
string is illuminated if the polarity selector switch is in the negative
position and the first portion of the LED light string contains the
defect, and the first portion and the second portion of the LED light
string are not illuminated if the polarity selector switch is in the
positive position and the first portion of the LED light string contains
the defect or the polarity selector switch is in the negative position
and the second portion of the LED light string contains the defect.

93. The diagnostic device of claim 92, wherein the power conversion
module includes a diode bridge configured to provide full-wave
rectification, a first resistor electrically coupled to the positive
output, and a second resistor electrically coupled to the negative
output.

94. The diagnostic device of claim 93, wherein the polarity selector
switch includes a center-off position in which the probe is not
electrically coupled to the positive output and the probe is not
electrically coupled to the negative output.

95. The diagnostic device of claim 94, wherein the positive position of
the polarity selector switch relative to the center-off position
corresponds to a direction of illumination of the LED light string
relative to diagnostic device when no defect exists in the direction.

96. The diagnostic device of claim 92, further comprising: a housing
including a light-string-receiving portion configured to receive the
insulation layer and the conductor of the LED light string; a door having
an open position for providing access to the light-string-receiving
portion and a closed position for inhibiting access to the
light-string-receiving portion; and a trigger for actuating the door
between the closed position and the open position.

97. The diagnostic device of claim 92, further comprising an alignment
indicia on the housing for indicating an alignment of the diagnostic
device relative to the LED light string.

98. The diagnostic device of claim 92, wherein the probe is configured to
penetrate the insulation layer and contact the conductor of the LED light
string.

99. A method of identifying a defect in a light emitting diode (LED)
light string having a first end and a second end, comprising: providing a
LED light string having a plug, a plurality of light emitting diodes
between the first end and the second end, and a conductor disposed within
an insulation layer extending from the first end to the second end;
coupling the plug of the LED light string to a power source; providing a
diagnostic device that includes: a probe configured to be electrically
coupled to the conductor disposed within the insulation layer of the LED
light string, and a power conversion module for providing an electrical
power configured to illuminate one or more of the plurality of light
emitting diodes via the probe; coupling the probe to the conductor of the
LED light string at a testing location on the LED light string between
the first end and the second end; providing the electrical power from the
power conversion module to the conductor of the LED light string at the
testing location to cause one of a first portion of the LED light string
between the testing location and the first end or a second portion of the
LED light string between the testing location and the second end to be
illuminated while the other remains not illuminated; in response to the
providing the electrical power, determining the location of the defect
based on whether the first portion of the LED light string or the second
portion of the LED light string is illuminated, the defect of the LED
light string being located in the one of the first portion or the second
portion that is not illuminated.

100. The method of claim 99, wherein the power conversion module is
configured to receive the DC electrical power, convert the DC electrical
power to an AC electrical power, and provide the AC electrical power to a
first output and a second output, the AC electrical power being
configured to illuminate one or more of the plurality of light emitting
diodes, the power conversion module further including an electrical
socket coupled to the second output of the power conversion module,
coupling the plug of the LED light string to a power source including
coupling the plug of the LED light string to the electrical socket of the
diagnostic device.

101. The method of claim 99, wherein the diagnostic device further
includes a polarity selector switch electrically coupled to the probe,
the polarity selector switch being configured to control the polarity of
an electrical waveform provided to the probe, the power conversion module
being configured to be selectively coupled to the polarity selector
switch at a positive output and a negative output, the power conversion
module being further configured to provide a positive polarity waveform
at the positive output and a negative polarity waveform at the negative
output, the polarity selector switch including a negative position in
which the probe is electrically coupled to the negative output, and the
polarity selector switch including a positive position in which the probe
is electrically coupled to the positive output, the power source being an
AC electrical power source, the diagnostic device further including a
diagnostic-device plug configured to electrically couple the power
conversion module to the AC electrical power source, the method further
including coupling the diagnostic-device plug to the AC electrical power
source.

102. The method of claim 99, wherein the probe is configured to penetrate
the insulation layer and contact the conductor of the LED light string.

103. The method of claim 99, further comprising: coupling the probe to a
second testing location near a middle of the one of the first portion or
the second portion that was not illuminated in response to the providing
the electrical power; providing the electrical power from the power
conversion module to the conductor of the LED light string at the second
testing location to cause one of a third portion of the LED light string
between the second testing location and the first end or a fourth portion
of the LED light string between the second testing location and the
second end to be illuminated while the other remains not illuminated; and
determining the location of the defect based on whether the third portion
of the LED light string or the fourth portion of the LED light string is
illuminated.

104. The method of claim 103, further comprising marking the testing
location with a marker.

105. The method of claim 99, further comprising repairing the defect by
attaching a repair device to the conductor on opposing sides of the
location of the defect, the repair device including: a repair device
housing, and a resistor disposed within the repair housing, the resistor
including a first wire-piercing element and a second wire-piercing
element, the first wire-piercing element and the second wire-piercing
element penetrating the insulation layer and contacting the conductor of
the LED light string.

106. The method of claim 99, further comprising repairing the defect by
attaching a repair device to the conductor on opposing sides of the
location of the defect, the repair device including: a repair device
housing, and a repair-device light emitting diode disposed within the
repair housing, the repair-device light emitting diode including a first
wire-piercing element and a second wire-piercing element, the first
wire-piercing element and the second wire-piercing element penetrating
the insulation layer and contacting the conductor of the LED light
string, the repair-device light emitting diode being exposed within an
aperture of the repair device housing.

Description:

TECHNICAL FIELD

[0001] The following disclosure relates generally to devices and methods
for identifying and repairing defects in decorative LED light strings.

BACKGROUND

[0002] One of the most common uses of series-connected light strings is
for decoration and display purposes, particularly during Christmas and
other holidays. Such light strings are particularly popular for the
decoration of the residential, commercial, and industrial buildings,
trees, shrubbery, and the like.

[0003] In the past, decorative light strings typically included a number
of incandescent bulbs connected in series. More recently, however,
decorative light strings often include light emitting diodes (hereinafter
"LEDs") instead. LED decorative light strings typically require less
electricity to operate, generate less heat, and last longer than
incandescent bulb light strings. Despite these improvements, LEDs still
have a limited lifespan or can otherwise fail due to broken wires,
overload currents, corroded leads, or related issues. At some point, one
or more of the LEDs will burn out or fail, and the defective LED must be
replaced.

[0004] Because the LEDs of many LED light strings are connected in series,
the failure of one or more LEDs may cause a portion or all of the
remaining LEDs (depending on the configuration of the light string) to no
longer illuminate. In light strings having replaceable LEDs, the
defective LED can be replaced with a new LED; however, a significant
problem thus exists in that usually many LEDs have to be checked to find
the defective LED. In fact, in many instances, the frustration and
time-consuming efforts are so great as to cause one to completely discard
and replace the string with a new string. Additionally, replacement does
not offer a practical solution if the lights are on an already decorated
Christmas tree where removal would cause damage to the ornaments or on
wire frame yard decorations where the lights have many clips and wire
ties holding them to the frame. Moreover, in light strings that do not
have replaceable LEDs, the problem of identifying and repairing a
defective LED is significantly more complicated, inconvenient, and
impractical for the average light string owner.

SUMMARY

[0005] According to one embodiment, a diagnostic device for identifying a
defect in an LED light string includes a probe and a polarity selector
switch. The LED light string includes a conductor provided within an
insulation layer. The probe is configured to penetrate the insulation
layer and contact the conductor of an LED light string. The polarity
selector switch is electrically coupled to the probe and configured to
control the polarity of an electrical waveform provided to the probe.

[0006] According to another embodiment, a diagnostic device for
identifying a defect in an LED light string includes a probe and a
polarity selector switch. The LED light string includes a conductor
provided within an insulation layer. The LED light string further
includes a plurality of LEDs each coupled to a respective one of a
plurality of LED sockets. The probe is configured to couple to an LED
socket to contact the conductor of an LED light string. The polarity
selector switch is electrically coupled to the probe and configured to
control the polarity of an electrical waveform provided to the probe.

[0007] According to another embodiment, a method is provided for
identifying a defect in an LED light string. The LED light string
includes a conductor provided within an insulation layer. The method
includes providing a diagnostic device that includes a probe configured
to penetrate the insulation layer of the LED light string and
electrically couple to the conductor of the LED light string, and a
polarity selector switch configured to control the polarity of a waveform
provided by the probe to the conductor of the LED light string. The
method further includes penetrating the insulation layer on the LED light
string with the probe to electrically couple the probe with the conductor
of the LED light string at a testing location. Additionally, the method
includes providing a first electrical waveform from the probe to the
conductor of the LED light string, and providing a second electrical
waveform from the probe to the conductor of the LED light string. The
first electrical waveform has a positive polarity and the second
electrical waveform has a negative polarity.

[0008] According to a further embodiment, a method is provided for
identifying a defect in an LED light string. The LED light string
includes a conductor provided within an insulation layer. The LED light
string also includes a plurality of LEDs coupled to a respective one of a
plurality of LED sockets. The method includes providing a diagnostic
device that includes a probe configured to couple to an LED socket to
electrically couple to the conductor of the LED light string, and a
polarity selector switch configured to control the polarity of a waveform
provided by the probe to the conductor of the LED light string. The
method further includes coupling the probe to the LED socket to
electrically couple the probe to the conductor of the LED light string at
a testing location. Additionally, the method includes providing a first
electrical waveform from the probe to the conductor of the LED light
string, and providing a second electrical waveform from the probe to the
conductor of the LED light string. The first electrical waveform having a
positive polarity and the second electrical waveform has a negative
polarity.

[0009] According to a further embodiment, a kit for identifying and
repairing a defect in an LED light string includes a diagnostic device
and a repair device. The diagnostic device includes a probe, a polarity
selector switch, and a power conversion module. The probe is configured
to penetrate an insulation layer and contact a conductor of an LED light
string. The polarity selector switch is electrically coupled to the probe
and configured to control the polarity of an electrical waveform provided
to the probe. The power conversion module is configured to be selectively
coupled to the polarity selector switch at a positive output and a
negative output. The power conversion module is also configured to
provide a positive polarity waveform at the positive output and a
negative polarity waveform at the negative output. The repair device
includes a repair device housing, and a resistor disposed within the
repair housing. The resistor includes a first wire-piercing element and a
second wire-piercing element. The first wire-piercing element and the
second wire-piercing element are configured to penetrate the insulation
layer and contact the conductor of the LED light string.

[0010] According to yet another embodiment, a diagnostic device for
identifying a defect in an LED light string includes a probe, a polarity
selector switch, a power conversion module, and a plug. The LED light
string includes a conductor provided within an insulation layer. The
probe is configured to penetrate the insulation layer and contact the
conductor of an LED light string. The polarity selector switch is
configured to be electrically coupled to the probe and configured to
control the polarity of an electrical waveform provided to the probe. The
power conversion module is configured to be selectively coupled to the
polarity selector switch at a positive output and a negative output. The
power conversion module is configured to provide a positive polarity
waveform at the positive output and a negative polarity waveform at the
negative output. The power conversion module includes a diode bridge
configured to provide full-wave rectification, a first resistor coupled
to the positive output, and a second resistor coupled to the negative
output. The plug is configured to electrically couple the power
conversion module to an AC electrical power source. The polarity selector
switch includes a center-off position in which the probe is not
electrically coupled to the positive output and the probe is not
electrically coupled to the negative output. The polarity selector switch
further includes a negative position in which the probe is electrically
coupled to the negative output, and the polarity selector switch includes
a positive position in which the probe is electrically coupled to the
positive output.

[0011] According to another embodiment, a diagnostic device for
identifying a defect in an LED light string. The LED light string
includes a conductor provided within an insulation layer. The diagnostic
device includes a power source configured to provide a DC electrical
power. The diagnostic device also includes a power conversion module
coupled to the power source. The power conversion module is configured to
receive the DC electrical power, change the DC electrical power to an AC
electrical power, and provide the AC electrical power to a first output
and a second output. The diagnostic device further includes a probe
coupled to the first output of the power conversion module. The probe is
configured to electrically couple to the conductor of an LED light
string. Additionally, the diagnostic device includes an electrical socket
coupled to the second output of the power conversion module. The
electrical socket is configured to couple to a plug of the LED light
string.

[0012] According to another embodiment, a method is provided for
identifying a defect in an LED light string. The LED light string
includes a conductor provided within an insulation layer. The method
includes coupling the LED light string to a diagnostic device. The
diagnostic device includes a power source configured to provide a DC
electrical power, a power conversion module coupled to the power source,
a probe coupled to the power conversion module and configured to
electrically couple to the conductor of an LED light string, and an
electrical socket coupled to the power conversion module and configured
to couple to a plug of the LED light string. The method further includes
receiving, at the power conversion module, the DC electrical power from
the power source, and converting, via the power conversion module, the DC
electrical power to an AC electrical power. The method also includes
providing the AC electrical power to a first output and a second output
of the power conversion module. The probe is coupled to the first output
and the electrical socket is coupled to the second output. The method
further includes electrically coupling the probe with the conductor of
the LED light string at a testing location and providing the AC
electrical power from the probe to the conductor of the LED light string.

[0013] The above summary is not intended to represent each embodiment or
every aspect of the present invention(s). The detailed description and
Figures will describe many of the embodiments and aspects of the present
invention(s).

BRIEF DESCRIPTION OF THE DRAWINGS

[0014] FIG. 1 is a diagram of a diagnostic device circuit according to
aspects of the present invention.

[0015] FIG. 2 is an illustration of an exemplary diagnostic device for the
circuit diagram illustrated in FIG. 1.

[0016] FIG. 3A is an illustration of the diagnostic device of FIG. 2
coupled to a decorative LED light string with a polarity selector switch
in a center-off position.

[0017] FIG. 3B is a circuit diagram of the diagnostic device and
decorative LED light string illustrated in FIG. 3A.

[0018] FIG. 4A is an illustration of the diagnostic device of FIG. 2
coupled to a decorative LED light string with a polarity selector switch
in a positive position.

[0019] FIG. 4B is a circuit diagram of the diagnostic device and
decorative LED light string illustrated in FIG. 4A.

[0020] FIG. 5A is an illustration of the diagnostic device of FIG. 2
coupled to a decorative LED light string with a polarity selector switch
in a negative position.

[0021] FIG. 5B is a circuit diagram of the diagnostic device and
decorative LED light string illustrated in FIG. 5A.

[0022] FIG. 6 is a flowchart of a process for identifying a defective LED
in a decorative LED light string according to some aspects of the present
invention.

[0023] FIGS. 7A-7E illustrate an exemplary repair device for repairing a
decorative LED light string having a defective LED according to some
aspects of the present invention.

[0024] FIGS. 8A-8E illustrate another exemplary repair device for
repairing a decorative LED light string having a defective LED according
to some aspects of the present invention.

[0025] FIGS. 9A-9E illustrate another exemplary repair device for
repairing a decorative LED light string having a defective LED according
to some aspects of the present invention.

[0026] FIG. 10A is an illustration of a top view of another exemplary
diagnostic device according to aspects of the present invention.

[0027] FIG. 10B is an illustration of a side view of the diagnostic device
illustrated in FIG. 10A with a door in a closed position.

[0028] FIG. 10C is an illustration of a side view of the diagnostic device
illustrated in FIG. 10A with a door in an open position.

[0029] FIG. 10D-10F are illustrations of a partial side view of the
diagnostic device illustrated in FIG. 10A and a wire of a decorative LED
light string.

[0030] FIGS. 11A-11C are illustrations of another exemplary diagnostic
device according to aspects of the present invention.

[0031] FIGS. 12A-12B are illustrations of yet another exemplary diagnostic
device according to aspects of the present invention.

[0032] FIG. 13 is an illustration of the diagnostic device illustrated in
FIG. 12A including a shroud.

[0033] FIG. 14 is a diagram of a diagnostic device circuit according to
additional aspects of the present invention.

[0034] FIG. 14A is a diagram of a diagnostic device circuit according to
additional aspects of the present invention.

[0035] FIG. 15A-15C are illustrations of an exemplary diagnostic device
for the circuit diagram illustrated in FIG. 14.

[0036] FIG. 16 is a flowchart of a process for identifying a defective LED
in a decorative LED light string according to some aspects of the present
invention.

[0037] FIGS. 17A-17D illustrate another exemplary repair device for
repairing a decorative LED light string having a defective LED according
to some aspects of the present invention.

[0038] While the invention(s) are susceptible to various modifications and
alternative forms, specific embodiments have been shown by way of example
in the drawings and will be described in detail herein. It should be
understood, however, that the invention(s) are not intended to be limited
to the particular forms disclosed. Rather, the invention(s) are to cover
all modifications, equivalents, and alternatives falling within the
spirit and scope of the invention.

DETAILED DESCRIPTION OF ILLUSTRATED EMBODIMENTS

[0039] FIG. 1 illustrates a diagram of an exemplary diagnostic device
circuit 8 for identifying defects in an LED light string. As shown in
FIG. 1, the diagnostic device circuit 8 includes a plug 12, a power
conversion module 14, a polarity selector switch 16, and a probe 18.

[0040] The plug 12 is configured to couple to an electrical power socket
(e.g., a standard AC electrical outlet) of an electrical power source
(e.g., an electrical power grid). The plug 12 includes two contacts 20a,
20b such as, for example, pins, prongs, and/or blades that mechanically
and electrically couple to corresponding holes and/or slots in the
electrical power socket. One of the contacts is a hot contact 20a, which
passes electrical power from the electrical power source to the
diagnostic device circuit 8, and the other contact is a neutral contact
20b, which returns electrical power from the diagnostic device circuit 8
to the electrical power source.

[0041] While the plug 12 illustrated in FIG. 1 includes two contacts, it
is contemplated that in some instances, the plug 12 can include two or
more hot contacts 20a and/or an additional contact for grounding the
housing of the plug 12. It is further contemplated that the contacts can
be configured according to any suitable configuration so as to allow for
mechanical and electrical coupling with a corresponding electrical power
socket. For example, the contacts of the plug 12 can be configured to
meet any domestic or international adapted and socket configuration
including, but not limited to, NEMA 1-15, NEMA 5-15, JIS C 8303, CEE
7/16, CEE 7/17, BS 4573, BS 546, CEE 7/4, Gost 7396, CEE 7/7, BS 1363, SI
32, AS 3112, CPCS-CCC, IRAIVI 2073, SEV 1011, CEI 23-16/VII, and CEI
23-5. Additionally, it is contemplated that the plug 12 can include holes
and/or slots for coupling to a socket that includes pins, prongs, and/or
blades. It is also contemplated that the plug 12 can include an indicator
light (not shown) to provide an indication as to whether the plug 12 is
receiving electrical power from the electrical power source.

[0042] The plug 12 is electrically coupled to the power conversion module
14. The power conversion module 14 includes electronic circuitry for
processing the electrical power received from the electrical power source
so as to provide an electrical power suitable for use by the diagnostic
device circuit 8. In particular, the power conversion module 14 is
configured to provide a positive waveform at a positive output 22a and a
negative waveform at a negative output 22b. For example, in the circuit
illustrated in FIG. 1, the power conversion module 14 includes a diode
bridge 24 that is configured to receive an AC power source from the plug
contacts 20a, 20b and provide a positive full-wave rectified waveform at
the positive output 22a and a negative full-wave rectified waveform at
the negative output 22b. However, it is contemplated that the waveform
provided at the positive output 22a and the negative output 22b need not
be a full-wave rectified waveform so long as the waveform at the positive
output 22a has a positive polarity and the waveform at the negative
output 22b has a negative polarity.

[0043] Additionally, the power conversion module 14 can include electronic
circuitry for limiting the magnitude of a current provided at the
positive output 22a and the negative output 22b of the power conversion
module 14. For example, in the circuit illustrated in FIG. 1, the power
conversion module 14 includes a resistor 26 electrically coupled between
each of the outputs of the diode bridge 24 and the positive and negative
outputs 22a, 22b. The resistors 26 limit the current levels of the
positive full-wave rectified waveform and the negative full-wave
rectified waveform to a suitable level for use with the diagnostic device
circuit 8. As one non-limiting example, the resistors 26 can be 8.2
kΩ resistors. However, any other suitable resistor value can be
utilized. According to some aspects, the magnitude of current can be
limited such that an LED of an LED light string is not subjected to a
current magnitude that is greater than the safe operating conditions of
an LED. For example, the value of the resistors 26 can be such that the
magnitude of the current at the positive output 22a and the negative
output 22b is in a range of approximately 1 mA to approximately 20 mA.
Additionally, for example, the magnitude of the current can be limited so
as to prevent or mitigate the risk of damage to an LED light string or
the diagnostic device 10 in a short circuit condition between the LED
light string and the diagnostic device 10 (e.g., if the probe 18 is
coupled to the wrong wire of an LED light string while powered). Limiting
the magnitude of the current can also mitigate risks of electrical shock
to a user or accidental destruction of LEDs due to currents having
excessive magnitudes.

[0044] The probe 18 is electrically coupled to the power conversion module
14 by the polarity selector switch 16. More particularly, the polarity
selector switch 16 is configured to electrically couple the probe 18 to
the positive output 22a of the power conversion module 14, to the
negative output 22b of the power conversion module 14, or to no output of
the power conversion module 14. As such, the polarity selector switch 16
has an open state when the probe 18 is not electrically coupled to either
the positive output 22a or the negative output 22b, a positive closed
state when the probe 18 is electrically coupled to the positive output
22a, and a negative closed state when the probe 18 is electrically
coupled to the negative output 22b.

[0045] Optionally, the diagnostic device circuit 8 can further include
electronic circuitry for protecting the diagnostic device from a current
overload condition. For example, in the illustrated embodiment of FIG. 1,
the diagnostic device circuit 8 includes a first fuse 28a and a second
fuse 28b electrically coupling the power conversion module 14 to the hot
contact 20a and the neutral contact 20b of the plug 12, respectively. The
first fuse 28a and the second fuse 28b can have any suitable maximum
current rating for protecting against an overload such as, for example, a
rating of three amps. It is contemplated that according to some aspects,
the first fuse 28a and the second fuse 28b can be replaceable.

[0046] FIG. 2 illustrates an exemplary diagnostic device 10 for
implementing the diagnostic device circuit 8 illustrated in FIG. 1. The
diagnostic device 10 includes a pair of levers 30a, 30b joined at a
fulcrum 32, defining a pair of opposing jaws 34a, 34b and a pair of
opposing handles 36a, 36b generally in the shape of pliers. A notch 38a,
38b is formed in an inner surface of each jaw 34a, 34b. The notches 38a,
38b are configured to receive a wire of an LED light string, as will be
described in detail below. In the embodiment illustrated in FIG. 2, the
handles 36a, 36b are outwardly biased by a spring element 40. However, it
is contemplated that the handles 36a, 36b can be outwardly biased by
other mechanisms or not biased at all. The levers 30a, 30b can be made
either partially or entirely from a non-conductive material(s) so as to
mitigate the risk of electrical shock to a user.

[0047] The probe 18 is positioned in one of the notches 38a formed in one
of the jaws 34a. More particularly, the probe 18 extends from the jaw 34a
into the space formed by the notch 38a. The probe 18 is configured to
penetrate an insulation layer and electrically couple to a conductor of a
wire of an LED light string. For example, the probe 18 can be made of a
conductive material and have a generally pin shape with a pointed tip at
the end extending into the space of the notch 38a. Additionally, the
probe 18 can have a diameter or other cross-sectional dimensions that are
sufficiently small so as to prevent or substantially inhibit any damage
to the insulation of the LED light string and sufficiently large so as to
withstand repeated couplings with an LED light string. As one
non-limiting example, the probe 18 can have a diameter of approximately
0.025 inches (i.e., approximately 0.635 millimeters).

[0048] In the embodiment illustrated in FIG. 2, the polarity selector
switch 16 is positioned on an exterior surface of one of the levers 30a.
However, it is contemplated that according to other embodiments, the
polarity selector switch 16 can be disposed within one of the levers 30a,
30b. The polarity selector switch 16 can be any mechanical or electronic
component suitable to close and open a circuit between the outputs of the
power conversion module 14 and the probe 18. Non-limiting examples of
suitable switches include a toggle switch, a rocker switch, a pushbutton
switch, a momentary switch, a slide switch, a biased switch, a latching
switch, a non-latching switch, a relay, or the like. The polarity
selector switch 16 shown in FIG. 2 is a momentary toggle switch having a
positive position corresponding to the positive closed state, a
center-off position corresponding to the open state, and a negative
position corresponding to the negative closed state. The polarity
selector switch 16 can be biased (e.g., by a spring) to the center-off
position.

[0049] The diagnostic device 10 further includes a plug housing 42. The
plug housing 42 includes the hot contact 20a and the neutral contact 20b
of the plug 12. Additionally, the power conversion module 14 is disposed
within the plug housing 42. It is contemplated that, according to other
embodiments, the power conversion module 14 can be disposed within one of
the levers 30a, 30b of the diagnostic device or in a separate housing
mounted to one of the levers 30a, 30b of the diagnostic device 10.

[0050] FIG. 3A shows the diagnostic device 10 being coupled to an
exemplary LED light string 50 to identify a defect in the LED light
string 50. FIG. 3B shows a circuit diagram corresponding to the
diagnostic device 10 and the LED light string 50 shown in FIG. 3A. The
LED light string 50 shown in FIGS. 3A and 3B, is a half-wave LED light
string. As such, the LEDs would only illuminate on positive half-cycles
of an AC electrical power source if no defects existed in the LED light
string 50. The half-wave LED light string type is used herein for ease of
illustration and description purposes only. It will be understood by
those skilled in the art that the present concepts can be applied to
other types of decorative LED light strings such as, for example,
full-wave LED light strings, LED light strings having control modules
with an all-on function, etc. Similarly, it will be understood by those
skilled in the art that the light string 50 can have various alternative
configurations such as, for example, a net configuration, a rope
configuration, a cluster configuration, an icicle configuration, a
curtain configuration, etc.

[0051] The LED light string 50 includes a plug 52 for receiving electrical
power from an electrical power source 54 at a first end of the LED light
string 50 and an electrical socket 56 for providing electrical power to
another electrical device (e.g., the diagnostic device 10) at a second
end of the LED light string 50. The LED light string 50 further includes
a first wire 58a having a first conductor 60a within a layer of
insulation, a second wire 58b having a second conductor 60b within a
layer of insulation, and a third wire 58c having a third conductor 60c
within a layer of insulation. The first conductor 60a is electrically
coupled to a supply contact 62a of the plug 52 at the first end of the
LED light string 50 and a supply contact 64a of the socket 56 at the
second end of the LED light string 50. The second conductor 60b is
electrically coupled to a return contact 62b of the plug 52 at the first
end of the LED light string 50 and a return contact 64b of the socket 56
at the second end of the LED light string 50. The third conductor 60c
includes a plurality of LEDs 66 connected in series between the first
conductor 60a and the second conductor 60b.

[0052] To identify a defect in the LED light string 50, the diagnostic
device 10 and the LED light string 50 are coupled to a common electrical
power source 54 (i.e., the same electrical power source 54). For example,
as shown in FIGS. 3A and 3B, the plug 52 of the LED light string 50 is
coupled to a socket of an electrical power source 54 (e.g., a standard AC
outlet) and the plug 12 of the diagnostic device 10 is coupled to the
socket 56 of the LED light string 50. It will be understood by those
skilled in the art that there are other ways to electrically couple the
diagnostic device 10 and the LED light string 50 to a common power source
54. For example, the plug 12 of the diagnostic device 10 also can be
coupled to another socket of the electrical power source 54 instead of
the socket 56 of the LED light string 50.

[0053] Once the LED light string 50 and the diagnostic device 10 have been
connected to the electrical power source 54, the probe 18 of the
diagnostic device 10 is coupled to the third conductor 60c of the LED
light string 50 at a first testing location 68. For example, in FIG. 3A,
the third wire 58c of the LED light string 50 is positioned between the
notches 38a, 38b of the diagnostic device 10 and the jaws 34a, 34b are
closed by actuating the handles 36a, 36b. As the jaws 34a, 34b close, the
probe 18 penetrates through the insulation and contacts the third
conductor 60c of the third wire 58c.

[0054] Although the LED light string 50 and the diagnostic device 10 are
coupled to the electrical power source 54 in FIG. 3A, the LEDs 66 are not
illuminated when there is a defect (i.e., an open circuit condition)
along the third wire 58c because there is no complete path from the
supply contact 62a of the light string plug 52 through the LEDs 66 to the
return contact 62a of the light string plug 52. In other words, because
the LEDs 66 are connected in series and an open circuit condition exists
on the third conductor 60c, the LEDs 66 are not illuminated as no current
can flow through the LEDs 66. Also, because the polarity selector switch
16 is in the center-off position in FIG. 3A (corresponding to the open
state in FIG. 3B), no current flows to the LEDs 66 of the third conductor
60c via the probe 18 of the diagnostic device 10.

[0055] FIGS. 4A and 4B show the diagnostic device 10 coupled to the LED
light string 50 and a corresponding circuit diagram with the polarity
selector switch 16 in the positive position. As shown in FIG. 4B, with
the polarity selector switch 16 in the positive position (corresponding
to the positive closed state), the probe 18 is electrically coupled to
the positive output 22a of the power conversion module 14 and a positive
full-wave rectified waveform is provided to the probe 18.

[0056] Assuming the defect is located to the right (i.e., towards the
light string socket 56) of the first testing location 68 (i.e., the
location on the third conductor 60c where the probe 18 is coupled), a
closed loop is formed as indicated by the bold line in FIG. 4B for a
positive half-wave cycle of the AC electrical power source 54. Using a
conventional model of current flow (i.e., current flows from positive
electrical potential to negative electrical potential), during a positive
half-wave cycle of the electrical power source 54, current flows through
the resulting closed loop as follows. From the electrical power source
54, the current flows to the supply contact 62a of the light string plug
52 and along the first conductor 60a to the supply contact 64a of the
light string socket 56. From the supply contact 64a of the light string
socket 56, the current flows to the hot contact 20a of the diagnostic
device plug 12 and through the diode bridge 24 to the positive output 22a
of the power conversion module 14. From the positive output 22a of the
power conversion module 14, the current flows through the polarity
selector switch 16 to the probe 18. The current then flows from the probe
18, through the LEDs 66 along the third conductor 60c to the second
conductor 60b, to the return contact 62b of the light string plug 52 and
the electrical power source 54.

[0057] Accordingly, when the polarity selector switch 16 is in the
positive position and the defect is to the right of the first testing
location 68, current flows through the LEDs 66 to the left (i.e., towards
the light string plug 52) of the first testing location 68 and those LEDs
66 are illuminated, as shown in FIG. 4A. However, when the polarity
selector switch 16 is in the positive position and the defect is located
to the left of the first testing location 68, there is no closed loop
because the defect creates an open circuit condition that prevents
current from flowing from the probe 18 to the second conductor 60b (and,
thus, the return contact 62b of the light string plug 52). Thus, if the
LEDs 66 to the left of the first testing location 68 are illuminated when
the polarity selector switch 16 is in the positive position, it can be
determined that the defect is located to the right of the first testing
location 68.

[0058] Regardless of where the defect is located on the third wire 58c,
the LEDs 66 to the right of the first testing location 68 will not be
illuminated when the polarity selector switch 16 is in the positive
position due to the defect on the third conductor 60c and the positive
full-wave rectified waveform at the junction 68 between the probe 18 and
the third conductor 60c.

[0059] FIGS. 5A and 5B show the diagnostic device 10 coupled to the LED
light string 50 and a corresponding circuit diagram with the polarity
selector switch 16 in the negative position. As shown in FIG. 5B, with
the polarity selector switch 16 in the negative position (corresponding
to the negative closed state), the probe 18 is electrically coupled to
the negative output 22b of the power conversion module 14 and a negative
full-wave rectified waveform is provided to the probe 18.

[0060] Assuming the defect is located to the left of the first test
location 68, a closed loop is formed as indicated by the bold line in
FIG. 5B for a positive half-wave cycle of the AC electrical power source
54. Using the conventional model of current flow, during a positive
half-wave cycle of the electrical power source 54, current flows through
the resulting closed loop as follows. From the electrical power source
54, the current flows to the supply contact 62a of the light string plug
52 and along the first conductor 60a to the junction of the first
conductor 60a and the third conductor 60c. The current flows from the
first conductor 60a through the third conductor 60c to the probe 18. From
the probe 18, the current flows to the negative output 22b of the power
conversion module 14 through the diode bridge 24 to the neutral contact
20b of the diagnostic device plug 12. From the neutral contact 20b of the
diagnostic device plug 12, the current flows to the return contact 64b of
the light string socket 56 and then along the second conductor 60b to the
return contact 62b of the light string plug 52 and the electrical power
source 54.

[0061] Accordingly, when the polarity selector switch 16 is in the
negative position and the defect is to the left of the first testing
location 68, current flows through the LEDs 66 to the right of the first
testing location 68 and those LEDs 66 are illuminated, as shown in FIG.
5A. However, when the polarity selector switch 16 is in the negative
position and the defect is located to the right of the first testing
location 68, there is no closed loop because the defect creates an open
circuit condition that prevents current from flowing from the first
conductor 60a to the probe 18. Thus, if the LEDs 66 to the right of the
first testing location 68 are illuminated when the polarity selector
switch 16 is in the negative position, it can be determined that the
defect is located to the left of the first testing location 68.

[0062] Regardless of where the defect is located on the third wire 58c,
the LEDs 66 to the left of the first testing location 68 will not be
illuminated when the polarity selector switch 16 is in the negative
position due to the defect on the third conductor 60c and the negative
full-wave rectified waveform at the junction 68 between the probe 18 and
the third conductor 60c.

[0063] As demonstrated by FIGS. 4A-5B, the polarity selector switch 16
controls the polarity of the full-wave rectified waveform provided to
probe 18 so that current is supplied to the portion of the LED light
string 50 on one side of the probe 18 when the switch 16 is in the
positive position and to the portion of the LED light string 50 on the
other side of the probe 18 when the switch 16 is in the negative
position. The portion of the LED light string 50 having the defect is
thus identified as the portion of the LED light string 50 that was not
illuminated after the polarity selector switch 16 was moved to the
positive position and the negative position. The defect can be precisely
and efficiently located by coupling the diagnostic device 10 to
successive testing locations along the non-illuminated portion of the LED
light string 50 and repeating the process.

[0064] For example, referring to FIG. 6, a flowchart for a process 100 of
identifying a defective LED 66 in the LED light string 50 is illustrated.
At block 110, the LED light string 50 and the diagnostic device 10 are
electrically coupled to the common electrical power source 54. At block
112, the probe 18 of the diagnostic device 10 is electrically coupled to
the third conductor 60c of the LED light string 50 between two LEDs 66.
At block 114, the polarity selector switch 16 is moved to the positive
position and the negative position. Additionally, at block 114, the LEDs
66 that are illuminated in response to the polarity selector switch 16
being in the positive position and the negative position are identified.
At block 116, the diagnostic device 10 is coupled to the third conductor
60c between two LEDs 66 that have not been illuminated during the process
100. At block 118, the polarity selector switch 16 is moved to the
positive position and the negative position and the LEDs 66 that are
illuminated are identified. At decision block 120, it is determined
whether there is only one LED 66 that has not been previously illuminated
during the process 100. If it is determined that more than one LED 66 has
not been previously illuminated, the process 100 returns to block 116. If
it is determined that only one LED 66 has not been previously illuminated
at block 120, then that LED 66 is identified as the defective LED at
block 122.

[0065] Accordingly, the diagnostic device 10 allows for significantly more
efficient and rapid identification of a defect in an LED light string 50
than previously possible. To further optimize the efficiency of the
defect identification process 100, it is contemplated that the first
testing location can be at the midpoint of the LED light string 50 and
each successive testing location can be at a midpoint of each successive
non-illuminated portion of the LED light string 50. Additionally, to aid
a user in the identification of LEDs that were illuminated during the
defect identification process 100, it is contemplated that markers such
as, for example, a clip can be placed at one or more of the testing
locations along the LED light string 50 during the process 100.

[0066] Once the defect is identified, the defect can be repaired. Some LED
light strings 50 have replaceable LEDs. In replaceable LED light strings,
the defective LED is removed and a replacement LED is connected to the
light string in its place. If, however, there are no replacement LEDs
available or the LED light string has non-replaceable LEDs, the defective
LED can be cut out from the third conductor 60c of the LED light string
50 and the cut ends of the third conductor 60c directly or indirectly
coupled to each other. When the cut ends of the third conductor 60c are
directly coupled to each other, the magnitude of the current flowing
through the remaining LEDs 66 increases because the removal of the
defective LED lowers the total resistance of the LED light string 50.
Because the magnitude of current flowing through the remaining LEDs 66 is
increased, the lifespan of the remaining LEDs 66 will be reduced.

[0067] FIGS. 7A-7E illustrate a repair device 200 that addresses such
problems by coupling a resistor 210 between the cut ends of the third
conductor 60c. The repair device 200 includes a housing 212 made entirely
or at least partially from a non-conductive material. The housing 212 has
a top portion 214a and a bottom portion 214b. In the illustrated
embodiment, the top portion 214a of the housing 212 is hingedly coupled
to the bottom portion 214b by, for example, a living hinge 216. The hinge
216 facilitates opening and closing of the top portion 214a and the
bottom portion 214b of the housing 212. FIG. 7A shows the repair device
200 in an open position and FIGS. 7B, 7C, and 7E show the repair device
200 in a closed position. To secure the top portion 214a to the bottom
portion 214b in the closed position, the top portion 214a and the bottom
portion 214b include corresponding securement features. For example, the
top portion 214a can include captive self-threading screws 218a and the
bottom portion 214b can include corresponding threaded bores 218b. It is
contemplated that any other suitable attachment features can be provided
such as, for example, screws, bolts, latches, clamps, or the like.
Additionally, it is contemplated that, according to other embodiments,
the top portion 214a can be separate from the bottom portion 214b.

[0068] The top portion 214a and the bottom portion 214b are configured to
form a first wire-receiving cavity 220a and a second wire-receiving
cavity 220b when the top portion 214a and the bottom portion 214b are in
the closed position (see FIGS. 7B and 7E). For example, the top portion
214a and the bottom portion 214b can include recessed surfaces 222
separated by a stop 224 on opposing sides of the top portion 214a and the
bottom portion 214b. As such, when the top portion 214a and the bottom
portion 214b are coupled in the closed position, the first wire-receiving
cavity 220a extends from a first side of the housing 212 to the stop 224
and the second wire-receiving cavity 220b extends from a second, opposing
side of the housing 212 to the stop 224. The stop 224 assists in
inserting wires into the first wire-receiving cavity 220a and the second
wire-receiving cavity 220b without directly coupling the inserted wires
to each other.

[0069] The resistor 210 is coupled to or disposed in the top portion 214a
of the housing 212. According to other embodiments, it is contemplated
that the resistor 210 can be coupled to or disposed in the bottom portion
214b of the housing 212. The resistor 210 is coupled to a first
wire-piercing element 226a on one side and a second wire-piercing element
226b on the other side. The first wire-piercing element 226a and the
second wire-piercing element 226b are configured to penetrate an
insulation layer of a wire and electrically couple to a conductor within
the insulation layer. For example, the first wire-piercing element 226a
and the second wire-piercing element 226b can be made of a conductive
material and have a generally pin shape with a pointed tip extending into
the first wire-receiving cavity 220a and the second wire-receiving cavity
220b when in the closed position, as shown in FIGS. 7D-7E.

[0070] The repair device 200 can be coupled to the LED light string 50 as
follows. When the third conductor 60c is cut to remove a defective LED, a
first cut end 228a and a second cut end 228b are formed in the third
conductor 60c. With the repair device 200 in the open position, the first
cut end 228a and the second cut end 228b of the third conductor 60c are
received in the opposing recessed surfaces 222 of the bottom portion 214b
of the repair device 200, as shown in FIG. 7A. To ensure that the first
cut end 228a and the second cut end 228b will be sufficiently inserted in
the wire-receiving cavities 220a, 220b when the repair device 200 is
closed, the first cut end 228a and the second cut end 228b can be
received in the recessed surfaces 222 of the bottom portion 214b such
that the first cut end 228a and the second cut end 228b abut the stop
224. The top portion 214a is closed and secured to the bottom portion
214b by the securement features 218a, 218b. As the repair device 200 is
closed, the first wire-piercing element 226a penetrates the insulation at
or adjacent to the first cut end 228a and the second wire-piercing
element 226b penetrates the insulation at or adjacent to the second cut
end 228b. The first wire-piercing element 226a electrically couples to
the third conductor 60c at or adjacent to the first cut end 228a and the
second wire-piercing element 226b electrically couples to the third
conductor 60c at or adjacent to the second cut end 228b. As a result, the
first cut end 228a of the third conductor 60c is electrically coupled to
the second cut end 228b of the third conductor 60c by the resistor 210.

[0071] The resistor 210 can have any suitable value for limiting the
current passing through the third conductor 60c. For example, the
resistor 210 can be a quarter of a Watt resistor. It is contemplated
that, according to some embodiments, the resistor 210 can have a
resistance value that is approximately equivalent to the effective
resistance value of the defective LED that was removed from the third
conductor 60c. Because a resistance is provided between the first cut end
228a and the second cut end 228b, the current passing through the
remaining LEDs 66 can be maintained at an appropriate level that does not
prematurely burn out the remaining LEDs 66 or lead to other undesirable
issues. Additionally, the repair device 200 is advantageous even for
replaceable LED light strings in that the user need not look for
replacement LEDs 66.

[0072] It is contemplated that according to alternative embodiments, an
LED can be coupled to or disposed in the housing 212 instead of a
resistor 210 (e.g., as described below with respect to FIGS. 10A-E).
Additionally, it is contemplated that according to alternative
embodiments, the repair device 200 can be coupled to the third conductor
60c of an LED light string 50 without first cutting a defective LED out
of the LED light string. For example, the repair device 200 can be
configured to the LED light string 50 such that the resistor 210 of the
repair device 200 is coupled in parallel with a defective LED (e.g., as
described below with respect to FIGS. 9A-E).

[0073] Referring now to FIGS. 8A-8E, another exemplary repair device 300
is shown. The repair device 300 is substantially similar to the repair
device 200 illustrated in and described with respect to FIGS. 7A-7E,
except the repair device 300 can be coupled to the third conductor 60c of
an LED light string 50 without first cutting a defective LED out of the
LED light string 50. The repair device 300 includes a housing 312 made
entirely or at least partially from a non-conductive material. The
housing 312 has a top portion 314a and a bottom portion 314b. In the
illustrated embodiment, the top portion 314a of the housing 312 is
hingedly coupled to the bottom portion 314b by, for example, a living
hinge 316. The hinge 316 facilitates opening and closing of the top
portion 314a and the bottom portion 314b of the housing 312. FIG. 8A
shows the repair device 300 in an open position and FIGS. 8B, 8C, and 8E
show the repair device 300 in a closed position. To secure the top
portion 314a to the bottom portion 314b in the closed position, the top
portion 314a and the bottom portion 314b include corresponding securement
features. For example, the top portion 314a can include captive
self-threading screws 318a and the bottom portion 314b can include
corresponding threaded bores 318b. It is contemplated that any other
suitable attachment features can be provided such as, for example,
screws, bolts, latches, clamps, or the like. Additionally, it is
contemplated that, according to other embodiments, the top portion 314a
can be separate from the bottom portion 314b (i.e., without the hinge
316).

[0074] The top portion 314a and the bottom portion 314b are configured to
form a first wire-receiving cavity 320a and a second wire-receiving
cavity 320b when the top portion 314a and the bottom portion 314b are in
the closed position (see FIGS. 8B and 8E). For example, the top portion
314a and the bottom portion 314b can include recessed surfaces 322
extending across inner surfaces of the top portion 314a and the bottom
portion 314b. As such, when the top portion 314a and the bottom portion
314b are coupled in the closed position, the first wire-receiving cavity
320a and the second wire-receiving cavity 320b extend from a first side
of the housing 312 to a second side, opposing side of the housing.

[0075] The resistor 310 is coupled to or disposed in the top portion 314a
of the housing 312. According to other embodiments, it is contemplated
that the resistor 310 can be coupled to or disposed in the bottom portion
314b of the housing 312. The resistor 310 is coupled to a first
wire-piercing element 326a on one side and a second wire-piercing element
326b on the other side. The first wire-piercing element 326a and the
second wire-piercing element 326b are configured to penetrate an
insulation layer of a wire and electrically couple to a conductor within
the insulation layer. For example, the first wire-piercing element 326a
and the second wire-piercing element 326b can be made of a conductive
material and have a generally pin shape with a pointed tip extending into
the first wire-receiving cavity 320a and the second wire-receiving cavity
320b when in the closed position, as shown in FIGS. 8D-8E. However, it is
contemplated that wire-piercing elements 326a, 326b can have any other
suitable shape for penetrating the insulation layer of a wire and
electrically coupling to the conductor within the insulation layer (e.g.,
fork, blade, etc.).

[0076] The repair device 300 can be coupled to the LED light string 50 as
follows. As shown in FIG. 8A, the third wire 58c of the LED light string
50 includes a first portion 328a and a second portion 328b coupled on
opposing sides of a defective LED 66a. With the repair device 300 in the
open position, the first portion 328a and the second portion 328b are
each received in a respective one of the recessed surfaces 322 of the
bottom portion 314b of the repair device 300, as shown in FIG. 8A. The
top portion 314a is closed and secured to the bottom portion 314b by the
securement features 318a, 318b. As the repair device 300 is closed, the
first wire-piercing element 326a penetrates the insulation of the first
portion 328a and the second wire-piercing element 326b penetrates the
insulation of the second portion 328b. The first wire-piercing element
326a electrically couples to the third conductor 60c of the first portion
328a and the second wire-piercing element 326b electrically couples to
the third conductor 60c of the second portion 328b. As a result, the
first portion 328a of the third conductor 60c is electrically coupled to
the second portion 322b of the third conductor 60c by the resistor 310.
In other words, the resistor 310 is coupled in parallel to the defective
LED 66 to provide a bypass for electrical current to flow past the
defective LED 66a. Significantly, the repair device 300 can thus be used
to repair a defect in an LED light string 50 without having to cut out a
defective LED. As described above, the resistor 310 can have any suitable
value for limiting the current passing through the third conductor 60c.
Because a resistance is provided between the first portion 328a and the
second portion 328b, the current passing through the remaining LEDs 66
can be maintained at an appropriate level that does not prematurely burn
out the remaining LEDs 66 or lead to other undesirable issues.

[0077] Referring now to FIGS. 9A-9E, yet another exemplary repair device
400 is shown. The repair device 400 is substantially similar to the
repair device 200 illustrated in and described with respect to FIGS.
7A-7E, except the repair device 400 includes a replacement LED 410
instead of the resistor 210 included in the repair device 200.
Accordingly, the repair device includes a housing 412 having a top
portion 414a coupled to a bottom portion 414b by a hinge 416, securement
features 418a and 418b, and a first wire-receiving cavity 420a and a
second wire-receiving cavity 420b formed by a plurality of recessed
surfaces 422 and separated by a stop 424, as described above for like
features for the repair device 200.

[0078] As shown in FIGS. 9A-9E, the replacement LED 410 is coupled to or
disposed in the top portion 414a of the repair device 400. In particular,
the replacement LED 410 is coupled to or disposed in the top portion 414a
of the housing 412 so as to be visibly exposed from the exterior of the
repair device 400. For example, the top portion 414a can include an
aperture through which the replacement LED 410 extends or is otherwise
visible. According to other embodiments, it is contemplated that the
replacement LED 410 can be coupled to or disposed in the bottom portion
414b of the housing 412.

[0079] The replacement LED 410 is coupled to a first wire-piercing element
426a on one side and a second wire-piercing element 426b on the other
side. The first wire-piercing element 426a and the second wire-piercing
element 426b are configured to penetrate an insulation layer of a wire
and electrically couple to a conductor within the insulation layer. For
example, the first wire-piercing element 426a and the second
wire-piercing element 426b can be made of a conductive material and have
a generally pin shape with a pointed tip extending into the first
wire-receiving cavity 420a and the second wire-receiving cavity 420b when
in the closed position, as shown in FIGS. 9D-9E. However, it is
contemplated that wire-piercing elements 426a, 426b can have any other
suitable shape for penetrating the insulation layer of a wire and
electrically coupling to the conductor within the insulation layer (e.g.,
fork, blade, etc.).

[0080] The repair device 400 can be coupled to the LED light string 50 as
described above with respect to the repair device 200 so that the first
cut end 428a of the third conductor 60c is electrically coupled to the
second cut end 428b of the third conductor 60c by the replacement LED
410. As such, when current is provided to the third conductor 60c, the
replacement LED 410 will be visibly illuminated along with the remaining
LEDs 66 of the LED light string 50. Accordingly, the repair device 400
advantageously repairs a defect in an LED light string 50 without forming
a noticeably large gap between the LEDs 66 of the repaired LED light
string 50.

[0081] Because some replacement LEDs 410 will only illuminate with the
correct electrical polarity provided to the replacement LED 410, the
repair device 400 can optionally include a polarity indicia to ensure
that the cut ends 428a, 428b are inserted in the correct wire-receiving
cavity 420a, 420b. For example, the polarity indicia can indicate to
which side of the repair device 400 the light string plug and the light
string socket should be, or the polarity indicia can correspond to
indicia on a diagnostic device to provide an indication of polarity.
Alternatively, a dual polarity replacement LED, which illuminates with
both positive and negative polarity, can be used to mitigate orientation
issues. It is also contemplated that the repair device 300 illustrated
and described with respect to FIGS. 8A-8E can similarly include a
replacement LED instead of the resistor 310.

[0082] Referring now to FIGS. 10A-10F, another exemplary diagnostic device
500 for implementing a diagnostic device circuit (e.g., the diagnostic
device circuit 8 illustrated in FIG. 1) is shown. The diagnostic device
500 includes a portable, hand-held housing 510 having a
light-string-receiving portion 512. The light-string-receiving portion
512 is defined by a cutout space within the housing 510 that is
configured to receive a wire of an LED light string (e.g., the LED light
string 50), as will be described in detail below. The housing 510 can be
made partially or entirely from a non-conductive material(s) so as to
mitigate the risk of electrical shock to a user.

[0083] The diagnostic device 500 further includes a door 514 disposed
within the light-string-receiving portion 512 of the housing 510. The
door 514 is configured to move between a closed position and an open
position. As shown in FIG. 10B, when the door 514 is in the closed
position, the door 514 inhibits or prevents access to the
light-string-receiving portion 512. As shown in FIG. 10C, when the door
514 is in the open position, access to the light-string-receiving portion
512 is provided. A front end 516 of the door 514 has a generally curved
or concave profile configured to receive the wire 58c of the LED light
string 50, as will be explained in detail below.

[0084] The door 514 is operatively connected to a trigger 520 such that
when the trigger 520 is actuated from a first position (as shown in FIG.
10B) to a second position (as shown in FIG. 10C), the door 514 moves from
the closed position to the open position. In the embodiment illustrated
in FIGS. 10A-10F, the door 514 is integrally formed with the trigger 520;
however, according to other aspects, it is contemplated that the door 514
can be operatively connected to the trigger 520 in other ways such as,
for example, by one or more separate components. The trigger 520 can be
biased towards the first position so as to correspondingly bias the door
514 to the closed position. For example, the trigger 520 can be biased by
a spring member (not shown) towards the first position. While actuation
of the trigger 520 causes the door 514 to move from the closed position
to the open position in the embodiment illustrated in FIGS. 10A-10F, it
is contemplated that, according to other aspects, actuation of the
trigger 520 can cause the door 514 to move from the open position to the
closed position (e.g., as illustrated and described below with respect to
FIGS. 11A-11C and FIGS. 15A-15C).

[0085] The probe 18 is positioned within the door 514 so as to partially
extend into a space defined by the generally curved or concave surface of
the front end 516 of the door 514. As explained above with respect to
FIG. 2, the probe 18 is configured to penetrate an insulation layer and
electrically couple to a conductor of a wire 58c of an LED light string
50. Advantageously, a portion of the top surface 517 and/or the front end
516 of the door 514 can extend beyond a tip of the probe 18 to protect a
user from accidental injury on the pointed tip of the probe 18 when the
door 514 moved between the closed position and the open position.
Additionally, to further mitigate the risk of injury to the user due to
the pointed tip of the probe 18, the front end 516 of the door 514 and
the probe 18 can extend into a cavity of the housing 510 when the door
514 is in the closed position (as shown in FIG. 10B), and the front end
516 of the door 514 and the probe 18 can be retracted within the housing
510 when the door 514 is in the open position (as shown in FIGS. 10C and
10D).

[0086] In other words, the diagnostic device 500 can include safety
features to inhibit or prevent the risk of injury by minimizing the
exposure of the probe 18 within the light-string-receiving portion 512.
It is contemplated that, according to other embodiments, the diagnostic
device 500 can include other safety features such as, for example, a
probe 18 that is retractable (e.g., as illustrated and described below
with respect to FIGS. 11A-11C and 15A-15C) and/or a probe 18 that is
disposed in material that is configured to expose the probe 18 only when
pressure is applied to the material. Additionally, it is contemplated
that such safety features can be included in the embodiment described and
illustrated above with respect to FIG. 2.

[0087] The probe 18 is electrically coupled to a polarity selector switch
16, which is positioned on a top surface of the housing 510 as shown in
FIG. 10A. It is contemplated that, according to other embodiments, the
polarity selector switch 16 can be positioned on any other surface of the
diagnostic device 500. The polarity selector switch 16 is biased to a
center-off position and includes a positive position to the left
(relative to the top view shown in FIG. 10A) of the center-off position
and a negative position to the right of the center-off position, as
explained above with respect to FIGS. 1-5B. The polarity selector switch
16 is electrically coupled to the power conversion module 14, and the
power conversion module 14 is electrically coupled to the plug 16. The
power conversion module 14 can be disposed in the housing 510, a plug
housing (not shown), or a separate housing on an exterior of the housing
510 or along a cord between the housing 510 and a plug housing.

[0088] Optionally, the diagnostic device 500 can further include a storage
compartment 522 for storing replacement LEDs or replacement fuses, an LED
tester 525 including metal contacts for individually testing an LED
(e.g., a replacement LED), an LED puller device 524 to assist in the
removal of replacement LEDs from an LED light string, a fuse tester 526
including metal contacts for testing fuses of an LED light string, and an
indicator light 528 for providing an indication of whether a fuse
connected to the fuse tester is defective or in good working condition.
These optional features can also be implemented for the diagnostic device
10 illustrated in FIG. 2.

[0089] FIGS. 10D-10F show the diagnostic device 500 being coupled to the
third wire 58c of the LED light string 50. FIG. 10D shows the trigger 520
in the second position and the door 514 in the open position. With the
door 514 in the open position, access is provided to the
light-string-receiving portion 512 of the housing 510. The third wire 58c
of the LED light string 50 is placed in the light-string-receiving
portion 512. As shown in FIG. 10E, when the trigger 520 is released so as
to move from the second position to the first position, the door 514 and
the probe 18 also move from the open position towards the closed
position. The door 514 and the probe 18 contact the third wire 58c of the
LED light string 50 as the door 514 and probe 18 move towards the closed
position, thereby moving the third wire 58c towards a contact surface 530
within the light-string-receiving portion 512 of the housing 510. As
shown in FIG. 10F, when the third wire 58c contacts the contact surface
530 of the light-string-receiving portion 512, further movement of the
third wire 58c is prevented or substantially inhibited. The continued
force of the door 514 and the probe 18 on the third wire 58c causes the
probe 18 to penetrate the insulation of the third wire 58c and contact
the third conductor 60c of the third wire 58c. The defect identification
process and repair of the LED light string can then be performed as
described above with respect to FIGS. 3A-7E.

[0090] Referring now to FIGS. 11A-11C, yet another exemplary diagnostic
device 600 for implementing a diagnostic device circuit (e.g., the
diagnostic device circuit 8 illustrated in FIG. 1) is shown. The
diagnostic device 600 includes a portable, hand-held housing 810 having a
light-string-receiving portion 612, a door 614, a trigger 620, a polarity
switch 16, and a probe 18, which operate in a substantially similar
manner to the corresponding features of the diagnostic device 500
described above with respect to FIGS. 10A-10F. However, in the exemplary
embodiment of FIGS. 11A-11C, the door 614 is operatively connected to the
trigger 620 such that when the trigger 620 is actuated from a first
position (as shown in FIG. 11A) to a second position (as shown in FIG.
11B), the door 614 moves from an open position (providing access to the
light-string-receiving portion 412) to a closed position (preventing or
inhibiting access to the light-string-receiving portion 412).
Additionally, the diagnostic device 600 is configured such that the probe
18 is retracted within the door 614 when the door 614 is in the open
position (as shown in FIG. 11A) and the probe 18 is extended from the
door 614 when the door 614 is in the closed position (as shown in FIG.
11B). As shown in FIG. 11C, the diagnostic device 600 also includes a
storage compartment 622 for storing replacement LEDs or replacement
fuses, an LED tester 625 including metal contacts for individually
testing an LED (e.g., a replacement LED), an LED puller device 624 to
assist in the removal of replacement LEDs from an LED light string, a
fuse tester 626 including metal contacts for testing fuses of an LED
light string, and an indicator light 628 for providing an indication of
whether a fuse connected to the fuse tester is defective or in good
working condition.

[0091] In the embodiments illustrated and described above for FIGS. 1-5B
and 10A-11C, the probe 18 is configured to penetrate the insulation layer
and contact the conductor of an LED light string; however, it is
contemplated that according to other aspects a probe can be configured to
contact the conductor of an LED light string without penetrating the
insulation layer of an LED light string. For example, according to some
embodiments, a probe can be configured to contact the conductor of an LED
light string within an LED socket from which a replaceable LED light bulb
is removed. Accordingly, in such embodiments, the probe can have a shape
and a size suitable to facilitate insertion of the probe in an LED socket
and facilitate electrical coupling of the probe to the conductor within
the LED socket. As non-limiting examples, the probe can have a generally
cylindrical shape, a generally conical shape, a shape corresponding to
the shape of an LED socket, or a shape similar to the shape of a portion
of a replaceable LED.

[0092] FIGS. 12A and 12B illustrate one non-limiting example of a
diagnostic device 700 having a probe 718 configured to be received in an
LED socket 770 of an LED light string 50 to contact a conductor 60c of
the LED light string 50. In the illustrated embodiment, the probe 718 has
a generally conical shape. The diagnostic device 700 further includes a
housing 710 and a polarity switch 16, which operate with the probe 718 in
a manner similar to that described above. FIG. 12B shows the diagnostic
device 700 being coupled to the conductor 60c of the LED light string 50
via the LED socket 770 from which a replaceable LED (not shown) was
removed. As shown in FIG. 12B, the probe 718 is configured to contact and
electrically couple to the conductor 60c within the LED socket 770.

[0093] The defect identification process thus can be performed by removing
a replaceable LED from the light string 50 at a testing location,
coupling the probe 718 to the conductor 60c via the LED socket 770 of the
removed replaceable LED, operating the polarity selector switch 16,
reinserting the removed replaceable LED in the LED socket 770, and
repeating at other testing locations until the defect is identified as
described above.

[0094] The diagnostic device 700 can optionally include any of the other
features described above (e.g., a storage compartment, an LED tester, an
LED puller device, a fuse tester, etc.). Additionally, while the probe
718 is located at a distal end of the housing 710 in the illustrated
embodiment, it is contemplated that the probe 718 can be disposed at any
other suitable location on the housing including, for example, within a
light-string-receiving portion of the housing 710.

[0095] It is contemplated that according to some aspects, a trigger 720
can be optionally included to, for example, control the electrical power
provided to the probe 718 and/or to retract or extend the probe 718 from
the housing 710. Thus, a trigger 720 can be provided as an additional
safety feature to prevent or inhibit the user from accidentally
contacting a live electrical circuit via the probe 718 when the probe 718
is not inserted in an LED socket 770.

[0096] Another optional safety feature is shown in FIG. 13. As shown in
FIG. 13, the diagnostic device 700 can optionally include a shroud 772
within which the probe 718 is disposed. The shroud 772 is configured to
inhibit access to the probe 718 yet still permit the probe 718 to couple
to an LED socket 770. For example, the shroud 772 can be configured to
receive the LED socket 770 within the shroud 772 when the probe 718 is
coupled to the LED socket 770.

[0097] While the probe 718 of the illustrated embodiment is generally
conical in shape, it is contemplated that the probe 718 can have any
other suitable shape, as explained above. In one alternative
configuration, the probe 718 can be plug-shaped (i.e., a shape
corresponding to the shape of the LED socket 770 and/or the shape of a
portion of a replaceable LED). In such embodiments, a two-pole switch can
be included in the diagnostic device circuit (e.g., the diagnostic device
circuit 8 illustrated and described for FIG. 1) so that the polarity is
reversed simultaneously on both portions of the conductor 60c within the
LED socket 770 when coupled to the probe 718.

[0098] Referring now to FIG. 14, a diagram of another exemplary diagnostic
device circuit 808 for identifying defects in an LED light string is
illustrated. The diagnostic device circuit 808 includes a power source
813, a power conversion module 814, a probe 818, and an electrical socket
819. The power source 813 is configured to provide DC electrical power to
the power conversion module 814. As one non-limiting example, the power
source 813 can include a 9 V battery. According to some embodiments, the
power source 813 can be electrically coupled to the power conversion
module 813 and optional features such as, for example, an LED tester 825,
a fuse tester 826, a power-indicator light 828, and a power-control
switch 829. The power-control switch 829 can be communicatively coupled
with a trigger, a switch, a button, combinations thereof, or the like to
provide a safety feature and also preserve the life of the power source
813.

[0099] The power conversion module 814 includes electronic circuitry for
processing the electrical power received from the power source 813 so as
to provide a power source suitable for use by the diagnostic device
circuit 8. In particular, the power conversion module 814 is configured
to receive the DC electrical power from the power source 814 and provide
an AC electrical power to the probe 818 and the electrical socket 819,
which are electrically coupled to outputs 822 of the power conversion
module 814. For example, in the exemplary circuit 808 illustrated in FIG.
14, the power conversion module 814 includes an inverter circuit for
changing the DC electrical power to an AC electrical power. However, it
is contemplated that, according to other embodiments, the power
conversion module 814 can include any other suitable circuitry such as,
for example, an integrated circuit configured to change the DC electrical
power to the AC electrical power. Another non-limiting example of a
circuit 814a for implementing the power conversion module 814 is
illustrated in FIG. 14A.

[0100] In one non-limiting example, the inverter circuit can be configured
to change the received DC electrical power signal to an AC electrical
power signal on the order of approximately 100 VRMS (with no load)
and approximately 5 mA. According to other non-limiting examples, the
inverter circuit can be configured to provide a current in a range of
approximately 1 mA to approximately 20 mA or in a range of approximately
5 mA to approximately 10 mA. Still further it is contemplated that the
magnitude of the current provided by the power conversion module 814 to
the probe 818 and the electrical socket 819 can be limited to mitigate
risks of a current magnitude that is greater than the safe operating
conditions of an LED, risks of damage to an LED light string or the
diagnostic device 800 in a short condition, and/or risks of electrical
shock to a user or accidental destruction of LEDs.

[0101] FIGS. 15A-C illustrate an exemplary diagnostic device 900 for
implementing the diagnostic device circuit 808 illustrated in FIG. 14.
The diagnostic device 900 includes a portable, hand-held housing 910
having a light-string-receiving portion 912 located on a lower periphery
surface of the housing 910. The housing 910 can be made partially or
entirely from a non-conductive material(s) so as to mitigate the risk of
electrical shock to a user. The diagnostic device 900 also includes the
optional LED tester 825, fuse tester 826, and power-indicator light 828.
The diagnostic device 900 can also optionally include a cover 980 for
accessing a compartment in which the power source 813 is disposed.

[0102] The diagnostic device 900 further includes a door 914 disposed
within the light-string-receiving portion 912 of the housing 910. Similar
to the diagnostic device 400 described above, the door 914 is operatively
connected to a trigger 920 such that when the trigger 920 is actuated
from a first position (as shown in FIG. 15B) to a second position (as
shown in FIG. 15C), the door 914 moves from an open position (providing
access to the light-string-receiving portion 912) to a closed position
(preventing or inhibiting access to the light-string-receiving portion
912). In other words, the door 914 is biased towards the open position.
Also, as described above, the door 914 can include a generally curved or
concave profile configured to receive a wire of the LED light string 50.

[0103] In the illustrated embodiment, the trigger 920 is also configured
to actuate the power-control switch 829. In particular, when the trigger
920 is actuated from the first position to the second position, the
power-control switch 829 is actuated from an open circuit condition to a
closed circuit condition. Accordingly, the trigger 920 can be configured
to control whether the DC electrical power is provided from the power
source 813 to the power conversion module 814.

[0104] The probe 818 is operatively coupled to the trigger 920 such that
the probe 818 is retracted within the door 914 when the door 914 is in
the open position (as shown in FIG. 15B) and the probe 818 is extended
from the door 914 into the light-string-receiving portion 912 when the
door 914 is in the closed position (as shown in FIG. 15C). The probe 818
is configured to penetrate an insulation layer and electrically couple to
a conductor of a wire of an LED light string. For example, as described
above, the probe 818 can be made of a conductive material and have a
generally pin shape with a pointed tip. Additionally, the probe 818 can
have a diameter or other cross-sectional dimensions that are sufficiently
small so as to prevent or substantially inhibit any damage to the
insulation of the LED light string and sufficiently large so as to
withstand repeated couplings with an LED light string. As one
non-limiting example, the probe 818 can have a diameter of approximately
0.025 inches (i.e., approximately 0.635 millimeters).

[0105] Similar to the embodiments described above, to identify a defect in
an LED light string (e.g., the LED light string 50 illustrated in FIG.
3A), the LED light string and the diagnostic device 900 are coupled to a
common power source (i.e., the power source 813). As explained above, the
diagnostic device 900 includes the power source 813 for providing
electrical power to the diagnostic device circuitry 808. The LED light
string also can be coupled to the power source 813 via the electrical
socket 819. In particular, the plug of the LED light string (e.g., the
plug 52 of the light string 50) can be electrically coupled to the
electrical socket 819 to couple the LED light string to the power source
813.

[0106] Once the LED light string is coupled to the power source 813, the
probe 818 of the diagnostic device 900 is coupled to the conductor of the
LED light string at a testing location by placing a wire of the LED light
string in the light-string-receiving portion 912 and actuating the
trigger 920. Actuating the trigger 920 causes the probe 818 to penetrate
the insulation of the wire of the LED light string and contact the
conductor of the LED light string. Actuating the trigger 920 also causes
the power-control switch 829 to close, providing the DC electrical power
from the power source 813 to the power conversion module 814. The power
conversion module 814 changes the DC electrical power to an AC electrical
power and provides the AC electrical power to the probe 818 and the
electrical socket 819 via the outputs 822. With the probe 818 coupled to
the conductor of the LED light string and the LED light string coupled to
the socket 819, the AC electrical power flows to the conductor (which
includes the LEDs) of the LED light string.

[0107] Because the electrical power provided to the LED light string via
the probe 818 and the socket 819 is an AC electrical power, current flows
through the portion of the conductor on one side of the probe 818 for the
positive half-wave cycle of the AC electrical power and current flows
through the portion of the conductor on the other side of the probe 818
for the negative half-wave cycle of the AC electrical power. In other
words, both sides of the LED light string (relative to the probe 818) are
tested because an electrical signal having both positive and negative
polarities is provided to the conductor of the LED light string via the
probe 818 and the electrical socket 819. As such, the LED light string
can be tested without the use of a polarity selector switch.

[0108] It is contemplated that the alternative and optional features
described above with respect to FIGS. 1-5B and 10A-13 can also be
implemented for the diagnostic device 900 of FIGS. 15A-C. For example,
the diagnostic device 900 illustrated and described with respect to FIGS.
15A-C can include the probe 718 and/or the shroud 770 described and
illustrated with respect to FIGS. 12A-13. Similarly, for example, the
diagnostic device 900 can include a light-string-receiving portion 912
that is disposed on an upper periphery surface of the housing 910, the
door 914 can be biased to a closed position, the trigger may not be
coupled to the power-selector switch 829, etc.

[0109] It is further contemplated that the diagnostic devices 10, 500,
600, 700 and 900 can optionally include alignment indicia to assist a
user with properly aligning the diagnostic device. For example, the
alignment indicia can indicate to which side of the diagnostic device the
light string plug and the light string socket should be so that the
positions of the polarity selector switch correspond to the sides of the
light sting to which current is provided.

[0110] Referring to FIG. 16, a flowchart for a process 1000 of identifying
a defective LED in the LED light string is illustrated. At block 1010,
the LED light string is electrically coupled to the electrical socket 819
of the diagnostic device 900. At block 1012, the probe 818 of the
diagnostic device 900 is electrically coupled to the conductor of the LED
light string between two LEDs. At block 1014, the AC electrical power is
provided to the conductor of the light string (e.g., by actuating the
trigger 920). Additionally, at block 1014, the LEDs that are illuminated
in response to the AC electrical power being provided to the conductor of
the LED light string are identified. At block 1016, the diagnostic tool
900 is coupled to the conductor between two LEDs that have not been
illuminated during the process 1000. At block 1018, the AC electrical
power is provided to the conductor of the LED light string (e.g., by
actuating the trigger 920) and the LEDs that are illuminated are
identified. At decision block 1020, it is determined whether there is
only one LED that has not been previously illuminated during the process
1000. If it is determined that more than one LED has not been previously
illuminated, the process 1000 returns to block 1016. If it is determined
that only one LED has not been previously illuminated at block 1020, then
that LED is identified as the defective LED at block 1022.

[0111] Referring now to FIGS. 17A-D, another exemplary repair device 1100
is shown. The repair device 1100 includes a housing 1112 and a cap 1111.
FIG. 17A shows the repair device 1100 in an open position and FIGS. 17B-D
show the repair device 1100 in a closed position. The cap 1111 includes a
threaded portion 1113 on an internal surface of the cap 1111. The housing
1112 includes a first portion 1114a and a second portion 1114b. In the
illustrated embodiment, the first portion 1114a is hingedly coupled to
the second portion 1114b by, for example, a living hinge 1116. The first
portion 1114a and the second portion 1114b each include a threaded
section 1115, which are configured to be threadably coupled to the
threaded portion 1113 of the cap 1111 when the repair device 1100 is in
the closed position as shown in FIGS. 17B-D.

[0112] The first portion 1114a and the second portion 111b each include
recessed surfaces 1122 that define a first wire-receiving cavity 1120a
and a second wire-receiving cavity 1120b when the repair device 1100 is
in the closed position. The first portion 1114a further includes a stop
1124 to assist in inserting wires into the first wire-receiving cavity
1120a and the second wire-receiving cavity 1120b. The first portion 1114a
also includes a first wire-piercing element 1126a and a second
wire-piercing element 1126b coupled to a resistor 1110. It is
contemplated that, according to other embodiments, an LED can be coupled
to the first wire-piercing element 1126a and the second wire-piercing
element 1126b instead of or in addition to the resistor 1110, as
explained above with respect to FIGS. 9A-E. The first wire-piercing
element 1126a and the second wire-piercing element 1126b each include a
notch 1117 aligned with the first wire-receiving cavity 1120a and the
second wire-receiving cavity 1120b, respectively. The notches 1117 are
configured to receive a wire, penetrate an insulation layer of the wire,
and electrically couple to a conductor within the insulation layer.

[0113] The second portion 1114b includes coupling-assist structures 1119
that assist in coupling a wire to the first wire-piercing element 1126a
and the second wire-piercing element 1126b. To couple the repair device
1100 to an LED light string (e.g., the LED light string 50), the cut ends
of a wire of the LED light string are positioned on the recessed surfaces
1122 of the first portion 1114a and above the notches 1119. The first
portion 1114a and the second portion 1114b are closed and the cap 1111 is
threadably coupled to the housing 1112. As the first portion 1114a and
the second portion 1114b are closed, the coupling-assist structures 1119
engage the wire in the wire-receiving cavities 1120a and 1120b, causing
the cut ends of the wires to be forced into the notches 1119. As a
result, the first wire-piercing element 1126a and the second
wire-piercing element 1126b penetrate the insulation layer and
electrically couple to the conductor of the wire. The cut ends of the
wire are thus electrically coupled to one another via the resistor 1110.

[0114] It is contemplated that the cap 1111 and/or the threaded sections
1115 of the housing 1112 can be configured such that removal of the cap
1111 from the housing 1112 is substantially inhibited or prevented once
the cap 1111 is threadably coupled to the threaded sections 1115 of the
housing 1112. Additionally, it is contemplated that the repair device
1100 can include any of the features described or illustrated above with
respect to the repair devices 200, 300, and 400, and vice versa. For
example, the repair devices 200, 300, and 400 can include the
wire-piercing elements 1126a and 1126b.

[0115] It is contemplated that a kit can include a diagnostic device
(e.g., the diagnostic devices 10, 500, 600, 700, 900, or any combination
of features thereof) and a repair device (e.g., the repair device 200,
300, 400, 1100, or any combination of features thereof). Additionally, it
is contemplated that the kit can further comprise one or more of a
replacement LED and a marker for marking the testing locations. Moreover,
it will be understood by those skilled in the art that the features of
the diagnostic devices disclosed herein can have different locations,
shapes, sizes, and/or configurations than those illustrated.

[0116] While the present invention(s) have been described with reference
to one or more particular embodiments, those skilled in the art will
recognize that many changes may be made thereto without departing from
the spirit and scope of the present invention(s). Each of these
embodiments and obvious variations thereof is contemplated as falling
within the spirit and scope of the invention(s), which are set forth in
the following alternate embodiments.