P. Kumar and D. Eisenhauer and M. M. K. Yousef and Q. Shi and A. S. G. Khalil and M. R. Saber and C. Becker and T. Pullerits and K. J. KarkiPhotoimpedance Spectroscopy Analysis of Planar and NanoTextured ThinFilm Silicon Solar Cells57 - 612018122International Journal of Mathematical, Computational, Physical, Electrical and Computer Engineeringhttp://waset.org/publications/10008888http://waset.org/publications/134World Academy of Science, Engineering and TechnologyIn impedance spectroscopy (IS) the response of a photoactive device is analysed as a function of ac bias. It is widely applied in a broad class of material systems and devices. It gives access to fundamental mechanisms of operation of solar cells. We have implemented a method of IS where we modulate the light instead of the bias. This scheme allows us to analyze not only carrier dynamics but also impedance of device locally. Here, using this scheme, we have measured the frequencydependent photocurrent response of the thinfilm planar and nanotextured Si solar cells using this method. Photocurrent response is measured in range of 50 Hz to 50 kHz. Bode and Nyquist plots are used to determine characteristic lifetime of both the cells. Interestingly, the carrier lifetime of both planar and nanotextured solar cells depend on back and front contact positions. This is due to either heterogeneity of device or contacts are not optimized. The estimated average lifetime is found to be shorter for the nanotextured cell, which could be due to the influence of the textured interface on the carrier relaxation dynamics.International Science Index 134, 2018