An Engineer's Guide to Automated Testing of High-Speed Interfaces

4.11 - 1251 ratings - Source

Providing a complete introduction to the state-of-the-art in high-speed digital testing with automated test equipment (ATE), this practical resource is the first book focus exclusively on this increasingly important topic. Featuring clear examples, this one-stop reference covers all critical aspects of the subject, from high-speed digital basics, ATE instrumentation for digital applications, and test and measurements, to production testing, support instrumentation and text fixture design. This in-depth volume also discusses at advanced ATE topics, such as multiplexing of ATE pin channels and testing of high-speed bi-directional interfaces with fly-by approaches.One of the major challenges of the HDMI/TMDS interface is its AVcc voltage level
of 3.3 V. This level might pose a challenge for testing HDMI ... [8] H. Werkmann, a
PCI Express: ATE Requirements and DFT Features for Functional Test
Optimization, a IEEE European Test Workshop, May 2003. ... [11] B. Holden, J.
Trodden, and D. Anderson, HyperTransport 3.1 Interconnect Technology. ... 2009
. http://www.hypertransport.org/docs/twgdocs/HTC20051222-0046-
0033_changes.pdf.

Title

:

An Engineer's Guide to Automated Testing of High-Speed Interfaces

Author

:

Jose Moreira, Hubert Werkmann

Publisher

:

Artech House - 2010

ISBN-13

:

You must register with us as either a Registered User before you can Download this Book. You'll be greeted by a simple sign-up page.

Once you have finished the sign-up process, you will be redirected to your download Book page.