Dr. Daniel Haufe on “Take a look at the wafer” – application of optical metrology at Infineon –

Research meets industry! We give a warm welcome to our former colleague Dr. Haufe who will hold a speech “Take a look at the wafer” – application of optical metrology at Infineon – within our lecture series (Tue, 10th April, 7p.m., Club HängeMathe e.V.). We are looking forward to get insights into optical metrology at Infineon 🙂

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Today at 12 am our Chapter member and officer Julian will speak at the Photonic Lunch break initiated by @MPS_Photonics! You can register under https://t.co/JeFJh3fXmu, participate and join the discussion afterwards! @SPIEstudents #Photonics

The new year starts quite exciting with an industry presentation by aSpect Systems GmbH from Dresden. CEO Philipp Gottesleben will present his company, specialized in industrial imaging and test solutions. The presentation will take place at @tudresden_de in room BAR 17 at 7 pm.

Two weeks ago our chapter hosted Prof. Zeev Zalevsky at @tudresden_de . In the context of the @SPIEstudents lecturing program he gave us a most interesting and inspiring insight in his work on nanoscopy, micro-endoscopy and biomedical sensing.

A highlight this year was our meeting with the SPIE chapter from #Jena! We were very happy to be in exchange with other young scientists. @SPIEstudents @Leibniz_IPHT @ingTUDresden @tudresden_de @unijena