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3 Test Power Toggle rate in test mode may be significantly higher than that in functional mode  Excessive accumulated power -> permanent damage  Excessive instantaneous power -> test yield loss Excessive test power is a major concern!

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6 Observations and Motivation Test patterns’ power consumptions vary significantly Only a few “care-bits” necessary for a test pattern to detect all the faults covered by it Applying high-power patterns at a partitioned subcircuit containing all their care-bits reduces test power without fault coverage loss